Class information for:
Level 1: TEXTURED INTERFACE//MICRORELIEF INTERFACE//BEIJING CONDENSD MATTER PHYS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
25791 272 13.6 47%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
47 3       PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER 93961
603 2             JOURNAL OF CRYSTAL GROWTH//PHYSICS, APPLIED//QUANTUM WELL INTERMIXING 14085
25791 1                   TEXTURED INTERFACE//MICRORELIEF INTERFACE//BEIJING CONDENSD MATTER PHYS 272

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 TEXTURED INTERFACE authKW 252588 1% 75% 3
2 MICRORELIEF INTERFACE authKW 224524 1% 100% 2
3 BEIJING CONDENSD MATTER PHYS address 112262 0% 100% 1
4 CONDUCTION OSCILLATIONS authKW 112262 0% 100% 1
5 CURRENT PLATEAUS authKW 112262 0% 100% 1
6 DAMAGED AND STRAIN LAYERS authKW 112262 0% 100% 1
7 DIFFUSION AND KINETICALLY CONTROLLED ETCHING WET ETCHING authKW 112262 0% 100% 1
8 DISORDER REGIONS authKW 112262 0% 100% 1
9 ELECTRICAL CONFINEMENT authKW 112262 0% 100% 1
10 EPITAXIAL MASK authKW 112262 0% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Materials Science, Coatings & Films 3433 26% 0% 70
2 Electrochemistry 1866 22% 0% 61
3 Physics, Applied 823 36% 0% 99
4 Materials Science, Multidisciplinary 309 26% 0% 70
5 Engineering, Electrical & Electronic 193 18% 0% 48
6 Physics, Condensed Matter 155 14% 0% 39
7 Instruments & Instrumentation 52 5% 0% 14
8 Nanoscience & Nanotechnology 42 5% 0% 14
9 Crystallography 26 3% 0% 9
10 Optics 21 5% 0% 14

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 BEIJING CONDENSD MATTER PHYS 112262 0% 100% 1
2 ISRCERC NBSKWANAK GU 112262 0% 100% 1
3 LEWIS GRP 21000 BROOKPARK RD 112262 0% 100% 1
4 NANOTECHNOL NANOSYST CNRS UMI LN2 3463 112262 0% 100% 1
5 PHYSICOTECH SCI PHYS SUN 112262 0% 100% 1
6 PHYSICOTECH SCI PROD ASSOC PHYS SUN 112262 0% 100% 1
7 POLARITON OPTOELECT 112262 0% 100% 1
8 PROC TECHNOL SOLUT 112262 0% 100% 1
9 CNRS FRE 2833 56130 0% 50% 1
10 LASHKARYOV SEMICOND PHYS 5 56130 0% 50% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF THE ELECTROCHEMICAL SOCIETY 13507 22% 0% 60
2 RCA REVIEW 2335 1% 1% 2
3 PHILIPS TECHNICAL REVIEW 1401 0% 1% 1
4 SOLAR ENERGY MATERIALS AND SOLAR CELLS 919 3% 0% 8
5 RESEARCH & DEVELOPMENT 836 0% 1% 1
6 MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS 741 1% 0% 4
7 MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 737 3% 0% 7
8 TECHNICAL PHYSICS 494 2% 0% 5
9 BULLETIN OF THE JAPAN SOCIETY OF PRECISION ENGINEERING 462 0% 0% 1
10 JOURNAL OF ELECTRONIC MATERIALS 406 2% 0% 6

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 TEXTURED INTERFACE 252588 1% 75% 3 Search TEXTURED+INTERFACE Search TEXTURED+INTERFACE
2 MICRORELIEF INTERFACE 224524 1% 100% 2 Search MICRORELIEF+INTERFACE Search MICRORELIEF+INTERFACE
3 CONDUCTION OSCILLATIONS 112262 0% 100% 1 Search CONDUCTION+OSCILLATIONS Search CONDUCTION+OSCILLATIONS
4 CURRENT PLATEAUS 112262 0% 100% 1 Search CURRENT+PLATEAUS Search CURRENT+PLATEAUS
5 DAMAGED AND STRAIN LAYERS 112262 0% 100% 1 Search DAMAGED+AND+STRAIN+LAYERS Search DAMAGED+AND+STRAIN+LAYERS
6 DIFFUSION AND KINETICALLY CONTROLLED ETCHING WET ETCHING 112262 0% 100% 1 Search DIFFUSION+AND+KINETICALLY+CONTROLLED+ETCHING+WET+ETCHING Search DIFFUSION+AND+KINETICALLY+CONTROLLED+ETCHING+WET+ETCHING
7 DISORDER REGIONS 112262 0% 100% 1 Search DISORDER+REGIONS Search DISORDER+REGIONS
8 ELECTRICAL CONFINEMENT 112262 0% 100% 1 Search ELECTRICAL+CONFINEMENT Search ELECTRICAL+CONFINEMENT
9 EPITAXIAL MASK 112262 0% 100% 1 Search EPITAXIAL+MASK Search EPITAXIAL+MASK
10 ETCHED LASER MIRRORS 112262 0% 100% 1 Search ETCHED+LASER+MIRRORS Search ETCHED+LASER+MIRRORS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 ELIAS, P , KOSTIC, I , SOLTYS, J , HASENOHRL, S , (2004) WET-ETCH BULK MICROMACHINING OF (100) INP SUBSTRATES.JOURNAL OF MICROMECHANICS AND MICROENGINEERING. VOL. 14. ISSUE 8. P. 1205-1214 16 55% 12
2 ELIAS, P , KOSTIC, I , SOLTYS, J , (2011) PATTERNING OF PYRAMIDAL RECESSES IN (1 0 0)INP SUBSTRATE.MICROELECTRONIC ENGINEERING. VOL. 88. ISSUE 1. P. 36-40 11 65% 0
3 BANUELOS, JG , BASIUK, EV , SANIGER-BLESA, JM , (2003) MORPHOLOGY OF PATTERNED SEMICONDUCTOR III-V SURFACES PREPARED BY SPONTANEOUS ANISOTROPIC CHEMICAL ETCHING.REVISTA MEXICANA DE FISICA. VOL. 49. ISSUE 4. P. 310-316 10 67% 4
4 ELIAS, P , MARTAUS, J , SOLTYS, J , KOSTIC, I , (2005) MICROMACHINING OF MESA AND PYRAMIDAL-SHAPED OBJECTS IN (100) INP SUBSTRATES.JOURNAL OF MICROMECHANICS AND MICROENGINEERING. VOL. 15. ISSUE 5. P. 1007 -1014 8 73% 3
5 KUNA, K , VANGALA, NK , DASGUPTA, A , DASGUPTA, N , (2001) EFFECT OF ETCH MASK AND ETCHING SOLUTION ON INP MICROMACHINING TO FORM V-GROOVES.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 148. ISSUE 4. P. C322-C326 6 100% 1
6 ELIAS, P , SOLTYS, J , KOSTIC, I , (2004) FORMATION OF MICRO- AND NANO-STRIATIONS AT (211)A FACETS DURING WET ETCHING OF INP IN HCL.SUPERLATTICES AND MICROSTRUCTURES. VOL. 36. ISSUE 1-3. P. 315-323 6 75% 1
7 MORISAWA, Y , KIKUMA, I , TAKAYAMA, N , TAKEUCHI, M , (1997) EFFECT OF SIO2 POWDER ON MIRROR POLISHING OF INP WAFERS.JOURNAL OF ELECTRONIC MATERIALS. VOL. 26. ISSUE 1. P. 34-36 6 86% 0
8 IKOSSIANASTASIOU, K , BINARI, SC , KELNER, G , BOOS, JB , KYONO, CS , MITTEREDER, J , GRIFFIN, GL , (1995) WET CHEMICAL ETCHING WITH LACTIC-ACID SOLUTIONS FOR INP-BASED SEMICONDUCTOR-DEVICES.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 142. ISSUE 10. P. 3558-3564 7 78% 6
9 KLOCKENBRINK, R , PEINER, E , WEHMANN, HH , SCHLACHETZKI, A , (1994) WET CHEMICAL ETCHING OF ALIGNMENT V-GROOVES IN (100) INP THROUGH TITANIUM OR IN0.53GA0.47AS MASKS.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 141. ISSUE 6. P. 1594-1599 6 86% 17
10 DMITRUK, NL , BORKOVSKAYA, OY , KOROVIN, AV , MAMONTOVA, IB , ROMANYUK, VR , SUKACH, AV , (2015) LOW-TEMPERATURE DIFFUSED P-N JUNCTION WITH NANO/MICRORELIEF INTERFACE FOR SOLAR CELL APPLICATIONS.SOLAR ENERGY MATERIALS AND SOLAR CELLS. VOL. 137. ISSUE . P. 124 -130 7 39% 1

Classes with closest relation at Level 1


Rank Class id link
1 22781 DEFECTS IN INP//FIR PC//HEAVILY DOPED N GAAS
2 37143 DAP AND BAND BAND RECOMBINATION//NINSB NPBTE NCDTE ISOTYPE STRUCTURE//NINSB NPBTE NCDTE STRUCTURE
3 23027 ACCEPTOR DIFFUSION//CHEM PHYS LUCAS HTS S//ZINC DIFFUSION
4 6674 IEEE JOURNAL OF QUANTUM ELECTRONICS//EMCORE//FLARED STRIPE
5 36016 DIFUSAO MAT//BI2O3 DOPED ZNO//HIGH RESOLUTION MASS SPECTRUM
6 26276 GAAS MMIC//POWER SENSOR//MICROWAVE POWER SENSOR
7 5846 FUJIMI KU//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//DRY ETCHING
8 27888 ETCHING FACTOR//SPRAY ETCHING//42 ALLOY
9 31409 SELF ORGANIZING PROCESSES//INGN OSTEOARTICULAIRE DENTU791//ROLE OF NATIVE OXIDE
10 15527 POROUS INP//POROUS SIC//LOW DIMENS SEMICOND STRUCT

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