Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
34897 | 105 | 16.9 | 78% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
178 | 3 | GAN//PHYSICS, APPLIED//GALLIUM NITRIDE | 57874 |
20 | 2 | GAN//GALLIUM NITRIDE//NITRIDES | 36496 |
34897 | 1 | ALGAN GAN HBT//P INGAN//COMMON EMITTER | 105 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ALGAN GAN HBT | authKW | 872446 | 3% | 100% | 3 |
2 | P INGAN | authKW | 581627 | 4% | 50% | 4 |
3 | COMMON EMITTER | authKW | 373902 | 3% | 43% | 3 |
4 | A1GAN GAN HBT | authKW | 290815 | 1% | 100% | 1 |
5 | BLUE LOTUS MICRO DEVICES | address | 290815 | 1% | 100% | 1 |
6 | CMPD SEMICOND | address | 290815 | 1% | 100% | 1 |
7 | COMMON EMITTER OPERATION | authKW | 290815 | 1% | 100% | 1 |
8 | EMITTER REGION | authKW | 290815 | 1% | 100% | 1 |
9 | EXTRINSIC BASE REGROWTH | authKW | 290815 | 1% | 100% | 1 |
10 | GAN HBT | authKW | 290815 | 1% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 1396 | 72% | 0% | 76 |
2 | Engineering, Electrical & Electronic | 606 | 45% | 0% | 47 |
3 | Physics, Condensed Matter | 249 | 27% | 0% | 28 |
4 | Materials Science, Multidisciplinary | 64 | 20% | 0% | 21 |
5 | Crystallography | 53 | 7% | 0% | 7 |
6 | Materials Science, Coatings & Films | 12 | 3% | 0% | 3 |
7 | Materials Science, Characterization, Testing | 4 | 1% | 0% | 1 |
8 | Electrochemistry | 2 | 2% | 0% | 2 |
9 | Nanoscience & Nanotechnology | 1 | 2% | 0% | 2 |
10 | Optics | 0 | 2% | 0% | 2 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | BLUE LOTUS MICRO DEVICES | 290815 | 1% | 100% | 1 |
2 | CMPD SEMICOND | 290815 | 1% | 100% | 1 |
3 | NTT BAS S | 145405 | 2% | 25% | 2 |
4 | COMPOUND SEMICOND MICROELECT | 58157 | 3% | 7% | 3 |
5 | NTT BASIC S | 56831 | 16% | 1% | 17 |
6 | NIT BASIC S | 48468 | 1% | 17% | 1 |
7 | CPDS SEMICOND MICROELECT | 36350 | 1% | 13% | 1 |
8 | YOKOHAMA DEV S | 34892 | 3% | 4% | 3 |
9 | ELECT OPT SCI ENGN | 22369 | 1% | 8% | 1 |
10 | CPD SEMICOND | 20771 | 1% | 7% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SOLID-STATE ELECTRONICS | 9578 | 17% | 0% | 18 |
2 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | 2327 | 2% | 0% | 2 |
3 | APPLIED PHYSICS LETTERS | 1395 | 22% | 0% | 23 |
4 | IEEE ELECTRON DEVICE LETTERS | 1156 | 6% | 0% | 6 |
5 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 931 | 7% | 0% | 7 |
6 | ELECTROCHEMICAL AND SOLID STATE LETTERS | 608 | 3% | 0% | 3 |
7 | ELECTRONICS LETTERS | 467 | 8% | 0% | 8 |
8 | JOURNAL OF CRYSTAL GROWTH | 450 | 7% | 0% | 7 |
9 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 354 | 5% | 0% | 5 |
10 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 228 | 5% | 0% | 5 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ALGAN GAN HBT | 872446 | 3% | 100% | 3 | Search ALGAN+GAN+HBT | Search ALGAN+GAN+HBT |
2 | P INGAN | 581627 | 4% | 50% | 4 | Search P+INGAN | Search P+INGAN |
3 | COMMON EMITTER | 373902 | 3% | 43% | 3 | Search COMMON+EMITTER | Search COMMON+EMITTER |
4 | A1GAN GAN HBT | 290815 | 1% | 100% | 1 | Search A1GAN+GAN+HBT | Search A1GAN+GAN+HBT |
5 | COMMON EMITTER OPERATION | 290815 | 1% | 100% | 1 | Search COMMON+EMITTER+OPERATION | Search COMMON+EMITTER+OPERATION |
6 | EMITTER REGION | 290815 | 1% | 100% | 1 | Search EMITTER+REGION | Search EMITTER+REGION |
7 | EXTRINSIC BASE REGROWTH | 290815 | 1% | 100% | 1 | Search EXTRINSIC+BASE+REGROWTH | Search EXTRINSIC+BASE+REGROWTH |
8 | GAN HBT | 290815 | 1% | 100% | 1 | Search GAN+HBT | Search GAN+HBT |
9 | MG IONIZATION EFFICIENCY | 290815 | 1% | 100% | 1 | Search MG+IONIZATION+EFFICIENCY | Search MG+IONIZATION+EFFICIENCY |
10 | MG MEMORY EFFECT | 290815 | 1% | 100% | 1 | Search MG+MEMORY+EFFECT | Search MG+MEMORY+EFFECT |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | OSINSKY, A , PEARTON, SJ , REN, F , LEE, KP , DABIRAN, AM , CHOW, PP , (2004) TEMPERATURE DEPENDENCE OF PNP GAN/INGAN HBT PERFORMANCE.SOLID-STATE ELECTRONICS. VOL. 48. ISSUE 1. P. 37 -41 | 34 | 87% | 5 |
2 | LEE, KP , DABIRAN, A , OSINSKY, A , CHOW, PP , PEARTON, SJ , REN, F , (2003) RF PERFORMANCE OF GAN-BASED NPN BIPOLAR TRANSISTORS.SOLID-STATE ELECTRONICS. VOL. 47. ISSUE 9. P. 1501 -1506 | 34 | 83% | 2 |
3 | LEE, KP , REN, F , PEARTON, SJ , DABIRAN, AM , CHOW, PP , (2003) EFFECTS OF BASE STRUCTURE ON PERFORMANCE OF GAN-BASED HETEROJUNCTION BIPOLAR TRANSISTORS.SOLID-STATE ELECTRONICS. VOL. 47. ISSUE 6. P. 1031 -1036 | 33 | 85% | 0 |
4 | LEE, KP , REN, F , PEARTON, SJ , DABIRAN, AM , CHOW, PP , (2003) SIMULATIONS OF INGAN-BASE HETEROJUNCTION BIPOLAR TRANSISTORS.SOLID-STATE ELECTRONICS. VOL. 47. ISSUE 6. P. 1009 -1014 | 32 | 86% | 0 |
5 | LEE, KP , DABIRAN, A , CHOW, PP , PEARTON, SJ , REN, F , (2003) INFLUENCE OF LAYER DOPING AND THICKNESS ON PREDICTED PERFORMANCE OF NPNALGAN/GAN HBTS.SOLID-STATE ELECTRONICS. VOL. 47. ISSUE 6. P. 969-974 | 31 | 89% | 2 |
6 | TERANO, A , TSUCHIYA, T , MOCHIZUKI, K , (2014) CHARACTERISTICS OF GAN-BASED BIPOLAR TRANSISTORS ON SAPPHIRE SUBSTRATES WITH THE N-TYPE EMITTER REGION FORMED USING SI-ION IMPLANTATION.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 61. ISSUE 10. P. 3411 -3416 | 14 | 93% | 0 |
7 | LEE, YC , ZHANG, Y , LOCHNER, ZM , KIM, HJ , RYOU, JH , DUPUIS, RD , SHEN, SC , (2012) GAN/INGAN HETEROJUNCTION BIPOLAR TRANSISTORS WITH ULTRA-HIGH D.C. POWER DENSITY (> 3MW/CM(2)).PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 209. ISSUE 3. P. 497 -500 | 15 | 83% | 1 |
8 | NISHIKAWA, A , KUMAKURA, K , MAKIMOTO, T , (2007) TEMPERATURE DEPENDENCE OF CURRENT-VOLTAGE CHARACTERISTICS OF NPN-TYPE GAN/INGAN DOUBLE HETEROJUNCTION BIPOLAR TRANSISTORS.APPLIED PHYSICS LETTERS. VOL. 91. ISSUE 13. P. - | 15 | 88% | 4 |
9 | LEE, KP , ZHANG, AP , DANG, G , REN, F , HAN, J , CHU, SNG , HOBSON, WS , LOPATA, J , ABERNATHY, CR , PEARTON, SJ , ET AL (2001) SELF-ALIGNED PROCESS FOR EMITTER- AND BASE-REGROWTH GANHBTS AND BJTS.SOLID-STATE ELECTRONICS. VOL. 45. ISSUE 2. P. 243-247 | 13 | 100% | 6 |
10 | SHEN, SC , DUPUIS, RD , LOCHNER, Z , LEE, YC , KAO, TT , ZHANG, Y , KIM, HJ , RYOU, JH , (2013) WORKING TOWARD HIGH-POWER GAN/INGAN HETEROJUNCTION BIPOLAR TRANSISTORS.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 28. ISSUE 7. P. - | 14 | 67% | 2 |
Classes with closest relation at Level 1 |