Class information for:
Level 1: ELECTRON BEAM INDUCED CURRENT//EBIC//ELECTRON BEAM APPLICATIONS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
11412 983 16.6 42%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
648 2             OXYGEN PRECIPITATION//OXYGEN PRECIPITATES//GETTERING 13601
11412 1                   ELECTRON BEAM INDUCED CURRENT//EBIC//ELECTRON BEAM APPLICATIONS 983

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ELECTRON BEAM INDUCED CURRENT authKW 294045 3% 35% 27
2 EBIC authKW 118334 3% 15% 25
3 ELECTRON BEAM APPLICATIONS authKW 86747 1% 31% 9
4 LEHRSTUHL ELEKT address 83855 1% 30% 9
5 SEMICONDUCTOR MATERIAL MEASUREMENTS authKW 82829 0% 67% 4
6 PHYS CHEM STUDIES MAT LEPCM address 62124 0% 100% 2
7 PHYS RADIAT THEIR INTERACT MATTER PRIMA address 62124 0% 100% 2
8 SCANNING DEEP LEVEL TRANSIENT SPECTROSCOPY authKW 62124 0% 100% 2
9 SEMICONDUCTOR STRUCTURE MEASUREMENT authKW 62124 0% 100% 2
10 TRANSPORT IMAGING authKW 55909 0% 60% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 14068 13% 0% 128
2 Physics, Applied 4499 44% 0% 432
3 Physics, Condensed Matter 3794 33% 0% 328
4 Physics, Multidisciplinary 2148 22% 0% 221
5 Materials Science, Multidisciplinary 702 21% 0% 209
6 Engineering, Electrical & Electronic 367 14% 0% 134
7 Instruments & Instrumentation 181 5% 0% 50
8 Materials Science, Characterization, Testing 102 1% 0% 14
9 Crystallography 84 3% 0% 31
10 Nanoscience & Nanotechnology 20 3% 0% 25

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 LEHRSTUHL ELEKT 83855 1% 30% 9
2 PHYS CHEM STUDIES MAT LEPCM 62124 0% 100% 2
3 PHYS RADIAT THEIR INTERACT MATTER PRIMA 62124 0% 100% 2
4 MICROELECT TECHNOL PROBLEM 41415 0% 67% 2
5 RECH NANOSCI EA4682 41415 0% 67% 2
6 SPACE MAT SCI 36227 1% 17% 7
7 HBEREICH ELEKTROTECHN INFORMATIONSTECHN 31062 0% 100% 1
8 IN2MP 31062 0% 100% 1
9 INRS ENERGIC MAT TELECOMMUN 31062 0% 100% 1
10 INTEGRATED CIRCUIT FAILURE ANAL RELIABILL 31062 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 INSTITUTE OF PHYSICS CONFERENCE SERIES 20852 8% 1% 81
2 IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA 18258 5% 1% 54
3 SCANNING 13338 3% 2% 27
4 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 11611 9% 0% 87
5 IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA 8379 3% 1% 30
6 MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 6373 4% 1% 39
7 REVUE DE PHYSIQUE APPLIQUEE 6015 2% 1% 16
8 SCANNING MICROSCOPY 5544 2% 1% 15
9 SOLID STATE PHENOMENA 5064 2% 1% 19
10 JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES 4422 1% 2% 8

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 ELECTRON BEAM INDUCED CURRENT 294045 3% 35% 27 Search ELECTRON+BEAM+INDUCED+CURRENT Search ELECTRON+BEAM+INDUCED+CURRENT
2 EBIC 118334 3% 15% 25 Search EBIC Search EBIC
3 ELECTRON BEAM APPLICATIONS 86747 1% 31% 9 Search ELECTRON+BEAM+APPLICATIONS Search ELECTRON+BEAM+APPLICATIONS
4 SEMICONDUCTOR MATERIAL MEASUREMENTS 82829 0% 67% 4 Search SEMICONDUCTOR+MATERIAL+MEASUREMENTS Search SEMICONDUCTOR+MATERIAL+MEASUREMENTS
5 SCANNING DEEP LEVEL TRANSIENT SPECTROSCOPY 62124 0% 100% 2 Search SCANNING+DEEP+LEVEL+TRANSIENT+SPECTROSCOPY Search SCANNING+DEEP+LEVEL+TRANSIENT+SPECTROSCOPY
6 SEMICONDUCTOR STRUCTURE MEASUREMENT 62124 0% 100% 2 Search SEMICONDUCTOR+STRUCTURE+MEASUREMENT Search SEMICONDUCTOR+STRUCTURE+MEASUREMENT
7 TRANSPORT IMAGING 55909 0% 60% 3 Search TRANSPORT+IMAGING Search TRANSPORT+IMAGING
8 DIFFUSION LENGTH 46560 2% 8% 18 Search DIFFUSION+LENGTH Search DIFFUSION+LENGTH
9 SEMICONDUCTOR MATERIALS MEASUREMENTS 45672 1% 29% 5 Search SEMICONDUCTOR+MATERIALS+MEASUREMENTS Search SEMICONDUCTOR+MATERIALS+MEASUREMENTS
10 RELATIVE QUANTUM EFFICIENCY 41415 0% 67% 2 Search RELATIVE+QUANTUM+EFFICIENCY Search RELATIVE+QUANTUM+EFFICIENCY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 YAKIMOV, EB , (1998) MODULATION METHODS IN SCANNING ELECTRON MICROSCOPY (REVIEW).INDUSTRIAL LABORATORY. VOL. 64. ISSUE 7. P. 440 -449 34 100% 1
2 YAKIMOV, EB , (1992) ELECTRON-BEAM INDUCED CURRENT AND ITS APPLICATION FOR SEMICONDUCTOR STRUCTURE CHARACTERIZATION.IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA. VOL. 56. ISSUE 3. P. 31-44 49 75% 7
3 KURNIAWAN, O , ONG, VKS , (2008) CHARGE COLLECTION FROM WITHIN A COLLECTING JUNCTION WELL.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 55. ISSUE 5. P. 1220 -1228 21 100% 2
4 TAN, CC , ONG, VKS , (2010) AN ANALYTICAL EXPRESSION FOR CHARGE COLLECTION PROBABILITY FROM WITHIN A U-SHAPED JUNCTION WELL.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 57. ISSUE 11. P. 3068-3073 19 100% 1
5 TAN, CC , ONG, VKS , RADHAKRISHNAN, K , (2015) TCAD STUDIES ON THE DETERMINATION OF DIFFUSION LENGTH FOR THE PLANAR-COLLECTOR EBIC CONFIGURATION WITH ANY SIZE OF THE SCHOTTKY CONTACT.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 62. ISSUE 9. P. 3100 -3103 18 90% 1
6 KURNIAWAN, O , TAN, CC , ONG, VKS , LI, EP , HUMPHREYS, CJ , (2010) A DIRECT METHOD FOR CHARGE COLLECTION PROBABILITY COMPUTATION USING THE RECIPROCITY THEOREM.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 57. ISSUE 10. P. 2455-2461 16 100% 0
7 YAKIMOV, E , (1992) ELECTRON-BEAM INDUCED CURRENT INVESTIGATIONS OF ELECTRICAL INHOMOGENEITIES WITH HIGH SPATIAL-RESOLUTION.SCANNING MICROSCOPY. VOL. 6. ISSUE 1. P. 81-96 36 77% 22
8 LEDRA, M , EL HDIY, A , (2015) MONTE-CARLO SIMULATION OF NANO-COLLECTED CURRENT FROM A SILICON SAMPLE CONTAINING A LINEAR ARRANGEMENT OF UNCAPPED NANOCRYSTALS.JOURNAL OF APPLIED PHYSICS. VOL. 118. ISSUE 11. P. - 19 73% 0
9 DOAN, QT , EL HDIY, A , (2015) THE EFFECTS OF AN UNCAPPED NANOCRYSTAL ON A SIMULATED INDUCED CURRENT COLLECTED BY A NANO-CONTACT.JOURNAL OF APPLIED PHYSICS. VOL. 117. ISSUE 11. P. - 18 75% 0
10 DOAN, QT , EL HDIY, A , TROYON, M , (2011) THREE-DIMENSIONAL SIMULATION OF ELECTRON BEAM INDUCED CURRENT COLLECTED BY A NANO-CONTACT: DIFFUSION AND COLLECTION ANALYSIS.JOURNAL OF APPLIED PHYSICS. VOL. 110. ISSUE 12. P. - 21 68% 3

Classes with closest relation at Level 1


Rank Class id link
1 13429 INDIRECT BANDGAP SEMICONDUCTOR//D LINES//EBIC
2 37143 DAP AND BAND BAND RECOMBINATION//NINSB NPBTE NCDTE ISOTYPE STRUCTURE//NINSB NPBTE NCDTE STRUCTURE
3 10953 REBIC//HEAVILY DOPED POLYSILICON RESISTOR//MELTING SEGREGATION MODEL
4 26048 BELOW GAP EXCITATION//OPT PL SCI TECH INGN//PHOTON RECYCLING
5 17965 OBNINSK BRANCH FED STATE UNITARY ENTERPRISE//MAT SCI PL//MICROCATHODOLUMINESCENCE
6 32331 CL IMAGE CONTRAST//ELECTRO PHYSICAL MEASUREMENTS//FINE DISPERSED STRUCTURE
7 29635 SOVIET PHYSICS SEMICONDUCTORS-USSR//AIII B V//AMORPHOUS SILICON GERMANIUM MOBILITY GAP PROFILE
8 6450 MULTICRYSTALLINE SILICON//PHOTOLUMINESCENCE IMAGING//GETTERING
9 28325 OVAL DEFECTS//INDIRECT GAP ALGAAS EPILAYERS//SEEIE
10 14404 BACKSCATTERED ELECTRONS//DOPANT CONTRAST//SCANNING

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