Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 24197 | 320 | 19.0 | 48% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 509 | 3 | LASER INDUCED BREAKDOWN SPECTROSCOPY//LIBS//LASER ABLATION | 21553 |
| 2618 | 2 | KVANTOVAYA ELEKTRONIKA//LASER COLOR MARKING//ZHURNAL TEKHNICHESKOI FIZIKI | 3557 |
| 24197 | 1 | UMR 662//CW LASER EXPOSURE//DEFECT DEFORMATION THEORY | 320 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | UMR 662 | address | 286267 | 1% | 100% | 3 |
| 2 | CW LASER EXPOSURE | authKW | 190845 | 1% | 100% | 2 |
| 3 | DEFECT DEFORMATION THEORY | authKW | 190845 | 1% | 100% | 2 |
| 4 | EPSRC NANOPHOTON PORTFOLIO | address | 113591 | 2% | 24% | 5 |
| 5 | ARMY AVIAT MISSILE RDE | address | 95422 | 0% | 100% | 1 |
| 6 | BIMODAL NANOPARTICLE ENSEMBLE | authKW | 95422 | 0% | 100% | 1 |
| 7 | BOLTZMANN PHYSICAL KINETICS | authKW | 95422 | 0% | 100% | 1 |
| 8 | BULK DEFECT DEFORMATION WAVES | authKW | 95422 | 0% | 100% | 1 |
| 9 | CRYSTAL LATTICE RESTRUCTURING | authKW | 95422 | 0% | 100% | 1 |
| 10 | DAMPING OF PLASMA WAVES | authKW | 95422 | 0% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 1734 | 48% | 0% | 152 |
| 2 | Physics, Condensed Matter | 657 | 25% | 0% | 80 |
| 3 | Optics | 308 | 14% | 0% | 45 |
| 4 | Physics, Multidisciplinary | 154 | 12% | 0% | 37 |
| 5 | Materials Science, Multidisciplinary | 47 | 12% | 0% | 38 |
| 6 | Engineering, Electrical & Electronic | 39 | 9% | 0% | 29 |
| 7 | Metallurgy & Metallurgical Engineering | 17 | 3% | 0% | 11 |
| 8 | Nanoscience & Nanotechnology | 9 | 3% | 0% | 9 |
| 9 | Nuclear Science & Technology | 4 | 2% | 0% | 6 |
| 10 | Physics, Atomic, Molecular & Chemical | 2 | 3% | 0% | 8 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | UMR 662 | 286267 | 1% | 100% | 3 |
| 2 | EPSRC NANOPHOTON PORTFOLIO | 113591 | 2% | 24% | 5 |
| 3 | ARMY AVIAT MISSILE RDE | 95422 | 0% | 100% | 1 |
| 4 | GEOSYST ENGNBUNKYO KU | 95422 | 0% | 100% | 1 |
| 5 | LASERS PLASMAS PHOTON | 95422 | 0% | 100% | 1 |
| 6 | M IENI | 95422 | 0% | 100% | 1 |
| 7 | MAT INNOVAT ENERGIEKONZEPTE | 95422 | 0% | 100% | 1 |
| 8 | MET MAT INSPECT | 95422 | 0% | 100% | 1 |
| 9 | QUIM ANALIT ANAL RUMENTAT | 95422 | 0% | 100% | 1 |
| 10 | SEMICOND ELECT GRP | 95422 | 0% | 100% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | PISMA V ZHURNAL TEKHNICHESKOI FIZIKI | 8359 | 7% | 0% | 21 |
| 2 | QUANTUM ELECTRONICS | 5121 | 5% | 0% | 15 |
| 3 | TECHNICAL PHYSICS LETTERS | 3304 | 5% | 0% | 15 |
| 4 | INTERNATIONAL JOURNAL OF NON-EQUILIBRIUM PROCESSING | 2805 | 0% | 3% | 1 |
| 5 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) | 2416 | 3% | 0% | 8 |
| 6 | LASER PHYSICS | 2114 | 3% | 0% | 9 |
| 7 | JOURNAL OF OVONIC RESEARCH | 1560 | 1% | 1% | 2 |
| 8 | SEMICONDUCTORS | 1402 | 3% | 0% | 10 |
| 9 | ZHURNAL TEKHNICHESKOI FIZIKI | 993 | 3% | 0% | 8 |
| 10 | KVANTOVAYA ELEKTRONIKA | 921 | 3% | 0% | 8 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | BRATFALEAN, RT , MARCONI, D , COLNITA, A , (2016) CHARACTERIZATION OF THE TOPOGRAPHY AND THICKNESS OF GALLIUM THIN FILMS BY SCANNING TUNNELING MICROSCOPY.INSTRUMENTATION SCIENCE & TECHNOLOGY. VOL. 44. ISSUE 6. P. 629 -641 | 21 | 91% | 0 |
| 2 | EMEL'YANOV, VI , VINTSENTS, SV , PLOTNIKOV, GS , (2007) MECHANISM OF THE FORMATION AND EVOLUTION OF PERIODIC SURFACE RELIEF NANOSTRUCTURES UNDER THE SCANNING LASER-INDUCED INELASTIC PHOTODEFORMATION OF SEMICONDUCTORS.JOURNAL OF SURFACE INVESTIGATION. VOL. 1. ISSUE 6. P. 667-673 | 14 | 93% | 0 |
| 3 | MACDONALD, KF , SOARES, BF , BASHEVOY, MV , ZHELUDEV, NI , (2006) CONTROLLING LIGHT WITH LIGHT VIA STRUCTURAL TRANSFORMATIONS IN METALLIC NANOPARTICLES.IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS. VOL. 12. ISSUE 3. P. 371 -376 | 17 | 74% | 6 |
| 4 | EMEL'YANOV, VI , (1999) SELF-ORGANISATION OF ORDERED DEFECT - DEFORMATION MICROSTRUCTURES AND NANOSTRUCTURES ON THE SURFACES OF SOLIDS UNDER THE ACTION OF LASER RADIATION.QUANTUM ELECTRONICS. VOL. 29. ISSUE 7. P. 561-577 | 21 | 60% | 12 |
| 5 | ZHELUDEV, NI , (2002) NONLINEAR OPTICS ON THE NANOSCALE.CONTEMPORARY PHYSICS. VOL. 43. ISSUE 5. P. 365-377 | 14 | 70% | 19 |
| 6 | FEDOTOV, VA , MACDONALD, KF , ZHELUDEV, NI , (2005) STRUCTURAL PHASE TRANSITION AS THE MECHANISM OF AN OPTICAL NONLINEARITY IN A NANOPARTICLE FILM.JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS. VOL. 7. ISSUE 2. P. S241-S243 | 9 | 100% | 1 |
| 7 | LIZZIT, S , BARALDI, A , GRUTTER, C , BILGRAM, JH , HOFMANN, P , (2009) THE SURFACE PHASE TRANSITION AND LOW-TEMPERATURE PHASE OF ALPHA-GA(010) STUDIED BY SPA-LEED.SURFACE SCIENCE. VOL. 603. ISSUE 21. P. 3222-3226 | 10 | 77% | 2 |
| 8 | VINTSENTS, SV , ZOTEEV, AV , PLOTNIKOV, GS , (2002) THRESHOLD OF INELASTIC STRAIN FORMATION IN SI AND GAAS SURFACE LAYERS UNDER MULTIPLE PULSED LASER IRRADIATION.SEMICONDUCTORS. VOL. 36. ISSUE 8. P. 841 -844 | 8 | 100% | 3 |
| 9 | VINTSENTS, SV , ZAITSEVA, AV , ZAITSEV, VB , PLOTNIKOV, GS , (2004) GENESIS OF NANOSCALE DEFECTS AND DAMAGE IN GAAS SUBJECTED TO MULTIPULSE QUASI-STATIC PHOTOSTRAINS IN MICROMETER-SIZED REGIONS OF SEMICONDUCTOR.SEMICONDUCTORS. VOL. 38. ISSUE 3. P. 245-252 | 12 | 60% | 4 |
| 10 | VINTSENTS, SV , ZAITSEVA, AV , PLOTNIKOV, GS , (2003) SELF-ORGANIZATION OF LASER-INDUCED POINT DEFECTS AT THE INITIAL STAGES OF INELASTIC PHOTODEFORMATION IN GERMANIUM.SEMICONDUCTORS. VOL. 37. ISSUE 2. P. 124-130 | 11 | 65% | 6 |
Classes with closest relation at Level 1 |