Class information for:
Level 1: ULTRAMICROSCOPY//ABERRATION CORRECTION//MICROSCOPY

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
2772 2151 28.6 62%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
725 2             ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY 12666
2772 1                   ULTRAMICROSCOPY//ABERRATION CORRECTION//MICROSCOPY 2151

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 ULTRAMICROSCOPY journal 1040521 30% 11% 639
2 ABERRATION CORRECTION authKW 839288 6% 48% 124
3 MICROSCOPY WoSSC 570982 56% 3% 1198
4 HAADF authKW 272111 2% 46% 42
5 SPHERICAL ABERRATION CORRECTION authKW 236884 1% 76% 22
6 EXIT WAVE RECONSTRUCTION authKW 223124 1% 60% 26
7 DEPTH SECTIONING authKW 215896 1% 89% 17
8 STEM authKW 213726 7% 10% 154
9 SCANNING TRANSMISSION ELECTRON MICROSCOPY authKW 203701 4% 17% 86
10 Z CONTRAST authKW 175352 1% 46% 27

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Microscopy 570982 56% 3% 1198
2 Materials Science, Multidisciplinary 1181 19% 0% 412
3 Physics, Condensed Matter 1063 14% 0% 291
4 Crystallography 1018 6% 0% 139
5 Physics, Applied 989 16% 0% 352
6 Physics, Multidisciplinary 715 10% 0% 214
7 Metallurgy & Metallurgical Engineering 467 6% 0% 126
8 Materials Science, Characterization, Testing 182 1% 0% 28
9 Nanoscience & Nanotechnology 62 3% 0% 61
10 Instruments & Instrumentation 50 2% 0% 52

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MONASH ELE ON MICROSCOPY 44129 1% 14% 23
2 EPSRC SUPERSTEM IL 42582 0% 100% 3
3 TRIEBENBERG 34323 1% 17% 14
4 EMAT 33919 2% 5% 53
5 MENG 31935 0% 75% 3
6 ELE ON MICROSCOPY MAT SCI EMAT 30766 1% 14% 16
7 EO PLICAT 28388 0% 100% 2
8 TRIEBENBERG OR 28388 0% 100% 2
9 DEVICE MAT S 28376 0% 25% 8
10 ENGN INNOVAT 25730 2% 4% 50

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ULTRAMICROSCOPY 1040521 30% 11% 639
2 JOURNAL OF ELECTRON MICROSCOPY 111986 6% 7% 121
3 MICROSCOPY AND MICROANALYSIS 93652 5% 6% 108
4 MICROSCOPY 29572 1% 9% 22
5 ADVANCES IN IMAGING AND ELECTRON PHYSICS 27324 1% 7% 27
6 MICRON 26822 3% 3% 69
7 INSTITUTE OF PHYSICS CONFERENCE SERIES 19128 5% 1% 115
8 ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 16142 2% 3% 38
9 ACTA CRYSTALLOGRAPHICA SECTION A 13745 2% 2% 47
10 JOURNAL OF MICROSCOPY 11237 2% 2% 45

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 ABERRATION CORRECTION 839288 6% 48% 124 Search ABERRATION+CORRECTION Search ABERRATION+CORRECTION
2 HAADF 272111 2% 46% 42 Search HAADF Search HAADF
3 SPHERICAL ABERRATION CORRECTION 236884 1% 76% 22 Search SPHERICAL+ABERRATION+CORRECTION Search SPHERICAL+ABERRATION+CORRECTION
4 EXIT WAVE RECONSTRUCTION 223124 1% 60% 26 Search EXIT+WAVE+RECONSTRUCTION Search EXIT+WAVE+RECONSTRUCTION
5 DEPTH SECTIONING 215896 1% 89% 17 Search DEPTH+SECTIONING Search DEPTH+SECTIONING
6 STEM 213726 7% 10% 154 Search STEM Search STEM
7 SCANNING TRANSMISSION ELECTRON MICROSCOPY 203701 4% 17% 86 Search SCANNING+TRANSMISSION+ELECTRON+MICROSCOPY Search SCANNING+TRANSMISSION+ELECTRON+MICROSCOPY
8 Z CONTRAST 175352 1% 46% 27 Search Z+CONTRAST Search Z+CONTRAST
9 IMAGE SIMULATION 167723 2% 26% 46 Search IMAGE+SIMULATION Search IMAGE+SIMULATION
10 INFORMATION LIMIT 143122 1% 92% 11 Search INFORMATION+LIMIT Search INFORMATION+LIMIT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 OXLEY, MP , LUPINI, AR , PENNYCOOK, SJ , (2017) ULTRA-HIGH RESOLUTION ELECTRON MICROSCOPY.REPORTS ON PROGRESS IN PHYSICS. VOL. 80. ISSUE 2. P. - 172 74% 0
2 ALLEN, LJ , D'ALFONSO, AJ , FINDLAY, SD , (2015) MODELLING THE INELASTIC SCATTERING OF FAST ELECTRONS.ULTRAMICROSCOPY. VOL. 151. ISSUE . P. 11 -22 66 94% 12
3 HAWKES, PW , (2015) THE CORRECTION OF ELECTRON LENS ABERRATIONS.ULTRAMICROSCOPY. VOL. 156. ISSUE . P. A1 -A64 91 79% 1
4 KIRKLAND, EJ , (2016) COMPUTATION IN ELECTRON MICROSCOPY.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES. VOL. 72. ISSUE . P. 1 -27 108 65% 0
5 DWYER, C , (2013) ATOMIC-RESOLUTION CORE-LEVEL SPECTROSCOPY IN THE SCANNING TRANSMISSION ELECTRON MICROSCOPE.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 175. VOL. 175. ISSUE . P. 145 -199 76 85% 1
6 VAN AERT, S , DE BACKER, A , MARTINEZ, GT , DEN DEKKER, AJ , VAN DYCK, D , BALS, S , VAN TENDELOO, G , (2016) ADVANCED ELECTRON CRYSTALLOGRAPHY THROUGH MODEL-BASED IMAGING.IUCRJ. VOL. 3. ISSUE . P. 71 -83 61 68% 4
7 SMITH, DJ , (2008) DEVELOPMENT OF ABERRATION-CORRECTED ELECTRON MICROSCOPY.MICROSCOPY AND MICROANALYSIS. VOL. 14. ISSUE 1. P. 2 -15 66 86% 31
8 MACARTHUR, KE , (2016) THE USE OF ANNULAR DARK-FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY FOR QUANTITATIVE CHARACTERISATION A REVIEW OF TECHNIQUES DEVELOPED FOR A HIGH RESOLUTION STUDY OF BIMETALLIC CATALYSTS AND OTHER MATERIALS.JOHNSON MATTHEY TECHNOLOGY REVIEW. VOL. 60. ISSUE 2. P. 117 -131 59 69% 0
9 PENNYCOOK, SJ , (2012) SEEING THE ATOMS MORE CLEARLY: STEM IMAGING FROM THE CREWE ERA TO TODAY.ULTRAMICROSCOPY. VOL. 123. ISSUE . P. 28-37 70 57% 19
10 SMITH, DJ , (2008) PROGRESS AND PERSPECTIVES FOR ATOMIC-RESOLUTION ELECTRON MICROSCOPY.ULTRAMICROSCOPY. VOL. 108. ISSUE 3. P. 159-166 54 86% 11

Classes with closest relation at Level 1


Rank Class id link
1 12428 CONVERGENT BEAM ELECTRON DIFFRACTION//CBED//LATTICE PARAMETER DETERMINATION
2 13334 PRECESSION ELECTRON DIFFRACTION//CONVERGENT BEAM ELECTRON DIFFRACTION//ELECTRON PRECESSION
3 20107 ELECTRON TOMOGRAPHY//3D CHEMICAL ANALYSIS//3D MICROANALYSIS
4 13252 ELECTRON HOLOGRAPHY//OFF AXIS ELECTRON HOLOGRAPHY//LORENTZ MICROSCOPY
5 10021 MICROSCOPY//ULTRAMICROSCOPY//EFTEM
6 14076 VEELS//ELE ON NANOSCOPIES//ELECTRON ENERGY LOSS SPECTROSCOPY
7 13904 ULTRAMICROSCOPY//PLAN VIEW IMAGING OF SURFACES//REFLECTION HIGH ENERGY ELECTRON DIFFRACTION RHEED
8 23119 SECONDARY EMISSION NOISE//ADVANCED LITHOGRAPHY//ALTERNATING APERTURE PHASE SHIFTING MASKS
9 33176 ALPHA FRINGES//BODY TRANSLATION VECTOR//DIFFRACTION CONTRAST IMAGES
10 24440 CADMIUM YELLOW//ABSORPTION CORRECTION//ENGN 36

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