Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 23119 | 358 | 15.9 | 37% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 314 | 3 | ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 39933 |
| 725 | 2 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY | 12666 |
| 23119 | 1 | SECONDARY EMISSION NOISE//ADVANCED LITHOGRAPHY//ALTERNATING APERTURE PHASE SHIFTING MASKS | 358 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | SECONDARY EMISSION NOISE | authKW | 272938 | 1% | 80% | 4 |
| 2 | ADVANCED LITHOGRAPHY | authKW | 266539 | 1% | 63% | 5 |
| 3 | ALTERNATING APERTURE PHASE SHIFTING MASKS | authKW | 255881 | 1% | 100% | 3 |
| 4 | BEASTLI | authKW | 255881 | 1% | 100% | 3 |
| 5 | CONTRAST TO GRADIENT | authKW | 255881 | 1% | 100% | 3 |
| 6 | SCANNING | journal | 219589 | 18% | 4% | 66 |
| 7 | DIGITAL SCAN | authKW | 191909 | 1% | 75% | 3 |
| 8 | INFORMATION PASSING CAPACITY | authKW | 191909 | 1% | 75% | 3 |
| 9 | ACTIVE IMAGE PROCESSING | authKW | 170587 | 1% | 100% | 2 |
| 10 | HYSTERESIS SMOOTHING | authKW | 170587 | 1% | 100% | 2 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Microscopy | 89954 | 54% | 1% | 194 |
| 2 | Instruments & Instrumentation | 1754 | 22% | 0% | 80 |
| 3 | Engineering, Electrical & Electronic | 121 | 13% | 0% | 47 |
| 4 | Physics, Multidisciplinary | 91 | 9% | 0% | 32 |
| 5 | Biology | 85 | 5% | 0% | 18 |
| 6 | Nanoscience & Nanotechnology | 67 | 6% | 0% | 20 |
| 7 | Physics, Applied | 63 | 11% | 0% | 41 |
| 8 | Engineering, Manufacturing | 46 | 2% | 0% | 8 |
| 9 | Optics | 35 | 6% | 0% | 20 |
| 10 | Crystallography | 12 | 2% | 0% | 8 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | AUTOMAT CONTROL MICRO MECHATRON SYST AS2M | 85294 | 0% | 100% | 1 |
| 2 | HITACHI TECHNO | 85294 | 0% | 100% | 1 |
| 3 | IC DESIGN HOUSE | 85294 | 0% | 100% | 1 |
| 4 | MED BIOMETR EPIDEMIOL COMP SCI | 85294 | 0% | 100% | 1 |
| 5 | NANO SCALE METROL GRP | 85294 | 0% | 100% | 1 |
| 6 | RUMENTS | 53300 | 1% | 13% | 5 |
| 7 | NANOTECHNOL PROD BUSINESS GRP | 34888 | 1% | 14% | 3 |
| 8 | INFORMAT DESIGN | 30319 | 1% | 9% | 4 |
| 9 | CD METROL | 28430 | 0% | 33% | 1 |
| 10 | ELECT BEAM | 28430 | 0% | 33% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | SCANNING | 219589 | 18% | 4% | 66 |
| 2 | MICRON AND MICROSCOPICA ACTA | 55553 | 3% | 5% | 12 |
| 3 | JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 26332 | 4% | 2% | 15 |
| 4 | JOURNAL OF ELECTRON MICROSCOPY | 24318 | 6% | 1% | 23 |
| 5 | JOURNAL OF MICROSCOPY-OXFORD | 10836 | 5% | 1% | 18 |
| 6 | JOURNAL OF MICROSCOPY | 6559 | 4% | 1% | 14 |
| 7 | ULTRAMICROSCOPY | 5496 | 5% | 0% | 19 |
| 8 | IEEE CIRCUITS AND DEVICES MAGAZINE | 5477 | 1% | 2% | 3 |
| 9 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 4213 | 6% | 0% | 22 |
| 10 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 2662 | 2% | 0% | 7 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | SECONDARY EMISSION NOISE | 272938 | 1% | 80% | 4 | Search SECONDARY+EMISSION+NOISE | Search SECONDARY+EMISSION+NOISE |
| 2 | ADVANCED LITHOGRAPHY | 266539 | 1% | 63% | 5 | Search ADVANCED+LITHOGRAPHY | Search ADVANCED+LITHOGRAPHY |
| 3 | ALTERNATING APERTURE PHASE SHIFTING MASKS | 255881 | 1% | 100% | 3 | Search ALTERNATING+APERTURE+PHASE+SHIFTING+MASKS | Search ALTERNATING+APERTURE+PHASE+SHIFTING+MASKS |
| 4 | BEASTLI | 255881 | 1% | 100% | 3 | Search BEASTLI | Search BEASTLI |
| 5 | CONTRAST TO GRADIENT | 255881 | 1% | 100% | 3 | Search CONTRAST+TO+GRADIENT | Search CONTRAST+TO+GRADIENT |
| 6 | DIGITAL SCAN | 191909 | 1% | 75% | 3 | Search DIGITAL+SCAN | Search DIGITAL+SCAN |
| 7 | INFORMATION PASSING CAPACITY | 191909 | 1% | 75% | 3 | Search INFORMATION+PASSING+CAPACITY | Search INFORMATION+PASSING+CAPACITY |
| 8 | ACTIVE IMAGE PROCESSING | 170587 | 1% | 100% | 2 | Search ACTIVE+IMAGE+PROCESSING | Search ACTIVE+IMAGE+PROCESSING |
| 9 | HYSTERESIS SMOOTHING | 170587 | 1% | 100% | 2 | Search HYSTERESIS+SMOOTHING | Search HYSTERESIS+SMOOTHING |
| 10 | PAMDLE | 170587 | 1% | 100% | 2 | Search PAMDLE | Search PAMDLE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | OHO, E , (2002) DIGITAL IMAGE-PROCESSING TECHNOLOGY USEFUL FOR SCANNING, ELECTRON MICROSCOPY AND ITS PRACTICAL APPLICATIONS.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 122. VOL. 122. ISSUE . P. 251-327 | 34 | 74% | 1 |
| 2 | SUZUKI, K , OHO, E , (2013) FEATURE EVALUATION OF COMPLEX HYSTERESIS SMOOTHING AND ITS PRACTICAL APPLICATIONS TO NOISY SEM IMAGES.SCANNING. VOL. 35. ISSUE 5. P. 292-301 | 14 | 100% | 1 |
| 3 | OHO, E , (1999) DIGITAL IMAGE PROCESSING TECHNOLOGY FOR SCANNING ELECTRON MICROSCOPY.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 105. VOL. 105. ISSUE . P. 77 -140 | 29 | 69% | 0 |
| 4 | GEBERT, A , PREISS, G , (1998) A SIMPLE METHOD FOR THE ACQUISITION OF HIGH-QUALITY DIGITAL IMAGES FROM ANALOG SCANNING ELECTRON MICROSCOPES.JOURNAL OF MICROSCOPY. VOL. 191. ISSUE . P. 297 -302 | 15 | 88% | 18 |
| 5 | SIM, KS , LIM, MS , YEAP, ZX , (2016) PERFORMANCE OF SIGNAL-TO-NOISE RATIO ESTIMATION FOR SCANNING ELECTRON MICROSCOPE USING AUTOCORRELATION LEVINSON-DURBIN RECURSION MODEL.JOURNAL OF MICROSCOPY. VOL. 263. ISSUE 1. P. 64 -77 | 8 | 100% | 0 |
| 6 | SIM, KS , NORHISHAM, S , (2016) NONLINEAR LEAST SQUARES REGRESSION FOR SINGLE IMAGE SCANNING ELECTRON MICROSCOPE SIGNAL-TO-NOISE RATIO ESTIMATION.JOURNAL OF MICROSCOPY. VOL. 264. ISSUE 2. P. 159 -174 | 10 | 77% | 0 |
| 7 | SIM, KS , NORHISHAM, S , (2016) AUTOREGRESSIVE LINEAR LEAST SQUARE SINGLE SCANNING ELECTRON MICROSCOPE IMAGE SIGNAL-TO-NOISE RATIO ESTIMATION.SCANNING. VOL. 38. ISSUE 6. P. 771 -782 | 9 | 82% | 0 |
| 8 | OHO, E , SUZUKI, K , (2012) HIGHLY ACCURATE SNR MEASUREMENT USING THE COVARIANCE OF TWO SEM IMAGES WITH THE IDENTICAL VIEW.SCANNING. VOL. 34. ISSUE 1. P. 43-50 | 8 | 100% | 1 |
| 9 | SIM, KS , TSO, CP , TAN, YY , LIM, WK , (2007) REAL-TIME IMAGE QUALITY ASSESSMENT WITH MIXED LAGRANGE TIME DELAY ESTIMATION AUTOREGRESSIVE (MLTDEAR) MODEL.JOURNAL OF MICROSCOPY-OXFORD. VOL. 226. ISSUE 3. P. 230-243 | 9 | 100% | 0 |
| 10 | KIANI, MA , SIM, KS , NIA, ME , TSO, CP , (2015) SIGNAL-TO-NOISE RATIO ENHANCEMENT ON SEM IMAGES USING A CUBIC SPLINE INTERPOLATION WITH SAVITZKY-GOLAY FILTERS AND WEIGHTED LEAST SQUARES ERROR.JOURNAL OF MICROSCOPY. VOL. 258. ISSUE 2. P. 140 -150 | 11 | 65% | 1 |
Classes with closest relation at Level 1 |