Class information for:
Level 1: CONVERGENT BEAM ELECTRON DIFFRACTION//CBED//LATTICE PARAMETER DETERMINATION

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
12428 906 18.5 58%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
725 2             ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY 12666
12428 1                   CONVERGENT BEAM ELECTRON DIFFRACTION//CBED//LATTICE PARAMETER DETERMINATION 906

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CONVERGENT BEAM ELECTRON DIFFRACTION authKW 377028 4% 28% 40
2 CBED authKW 281050 3% 30% 28
3 LATTICE PARAMETER DETERMINATION authKW 196080 1% 73% 8
4 HOLZ LINE authKW 173323 1% 86% 6
5 ULTRAMICROSCOPY journal 170631 19% 3% 168
6 GEOMETRIC PHASE ANALYSIS GPA authKW 140423 1% 83% 5
7 MEMORY ANAL SCI ENGN GRP address 134804 1% 67% 6
8 MICROSCOPY WoSSC 129111 41% 1% 370
9 CONVERGENT BEAM ELECTRON DIFFRACTION CBED authKW 110280 1% 27% 12
10 CONVERGENT BEAM IMAGING authKW 101106 0% 100% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 129111 41% 1% 370
2 Physics, Applied 2458 35% 0% 314
3 Physics, Condensed Matter 1345 22% 0% 196
4 Materials Science, Multidisciplinary 1168 27% 0% 246
5 Metallurgy & Metallurgical Engineering 1029 12% 0% 109
6 Physics, Multidisciplinary 710 14% 0% 129
7 Materials Science, Characterization, Testing 503 3% 0% 28
8 Crystallography 189 5% 0% 41
9 Spectroscopy 28 2% 0% 20
10 Engineering, Electrical & Electronic 26 6% 0% 54

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MEMORY ANAL SCI ENGN GRP 134804 1% 67% 6
2 DEVICE ANAL GRP 67404 0% 100% 2
3 FC RD TEAM 67404 0% 100% 2
4 UPR 05 44935 0% 67% 2
5 AEROMAT ENGN 33702 0% 100% 1
6 AG CRYSTALLOG 33702 0% 100% 1
7 CENTRUM MIKROSTRUKTURANALYT 33702 0% 100% 1
8 CIENCIA MAT ING MET Q INORGAN 33702 0% 100% 1
9 D2NTGRE 33702 0% 100% 1
10 DRFMC SP2M ME 33702 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ULTRAMICROSCOPY 170631 19% 3% 168
2 INSTITUTE OF PHYSICS CONFERENCE SERIES 45727 13% 1% 115
3 JOURNAL OF ELECTRON MICROSCOPY 15247 3% 2% 29
4 PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES 14809 4% 1% 40
5 JOURNAL OF MICROSCOPY 13535 4% 1% 32
6 MICROSCOPY MICROANALYSIS MICROSTRUCTURES 10795 1% 3% 11
7 JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES 5917 1% 2% 9
8 MICROSCOPY AND MICROANALYSIS 4269 2% 1% 15
9 ACTA CRYSTALLOGRAPHICA SECTION A 3317 2% 1% 15
10 PHILOSOPHICAL MAGAZINE LETTERS 2610 2% 1% 15

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 CONVERGENT BEAM ELECTRON DIFFRACTION 377028 4% 28% 40 Search CONVERGENT+BEAM+ELECTRON+DIFFRACTION Search CONVERGENT+BEAM+ELECTRON+DIFFRACTION
2 CBED 281050 3% 30% 28 Search CBED Search CBED
3 LATTICE PARAMETER DETERMINATION 196080 1% 73% 8 Search LATTICE+PARAMETER+DETERMINATION Search LATTICE+PARAMETER+DETERMINATION
4 HOLZ LINE 173323 1% 86% 6 Search HOLZ+LINE Search HOLZ+LINE
5 GEOMETRIC PHASE ANALYSIS GPA 140423 1% 83% 5 Search GEOMETRIC+PHASE+ANALYSIS+GPA Search GEOMETRIC+PHASE+ANALYSIS+GPA
6 CONVERGENT BEAM ELECTRON DIFFRACTION CBED 110280 1% 27% 12 Search CONVERGENT+BEAM+ELECTRON+DIFFRACTION+CBED Search CONVERGENT+BEAM+ELECTRON+DIFFRACTION+CBED
7 CONVERGENT BEAM IMAGING 101106 0% 100% 3 Search CONVERGENT+BEAM+IMAGING Search CONVERGENT+BEAM+IMAGING
8 DARK FIELD ELECTRON HOLOGRAPHY DFEH 101106 0% 100% 3 Search DARK+FIELD+ELECTRON+HOLOGRAPHY+DFEH Search DARK+FIELD+ELECTRON+HOLOGRAPHY+DFEH
9 THIN FOIL RELAXATION 101106 0% 100% 3 Search THIN+FOIL+RELAXATION Search THIN+FOIL+RELAXATION
10 LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION 101100 1% 50% 6 Search LARGE+ANGLE+CONVERGENT+BEAM+ELECTRON+DIFFRACTION Search LARGE+ANGLE+CONVERGENT+BEAM+ELECTRON+DIFFRACTION

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 COOPER, D , DENNEULIN, T , BERNIER, N , BECHE, A , ROUVIERE, JL , (2016) STRAIN MAPPING OF SEMICONDUCTOR SPECIMENS WITH NM-SCALE RESOLUTION IN A TRANSMISSION ELECTRON MICROSCOPE.MICRON. VOL. 80. ISSUE . P. 145 -165 55 54% 2
2 ROUVIERE, JL , BARNES, JP , COOPER, D , BECHE, A , (2013) STRAIN MEASUREMENT AT THE NANOSCALE: COMPARISON BETWEEN CONVERGENT BEAM ELECTRON DIFFRACTION, NANO-BEAM ELECTRON DIFFRACTION, HIGH RESOLUTION IMAGING AND DARK FIELD ELECTRON HOLOGRAPHY.ULTRAMICROSCOPY. VOL. 131. ISSUE . P. 10 -23 25 89% 35
3 HYTCH, MJ , MINOR, AM , (2014) OBSERVING AND MEASURING STRAIN IN NANOSTRUCTURES AND DEVICES WITH TRANSMISSION ELECTRON MICROSCOPY.MRS BULLETIN. VOL. 39. ISSUE 2. P. 138-146 32 70% 8
4 BRUNETTI, G , BOUZY, E , FUNDENBERGER, JJ , MORAWIEC, A , TIDU, A , (2010) DETERMINATION OF LATTICE PARAMETERS FROM MULTIPLE CBED PATTERNS: A STATISTICAL APPROACH.ULTRAMICROSCOPY. VOL. 110. ISSUE 4. P. 269-277 20 91% 5
5 FAVIA, P , GONZALES, MB , SIMOEN, E , VERHEYEN, P , KLENOV, D , BENDER, H , (2011) NANOBEAM DIFFRACTION: TECHNIQUE EVALUATION AND STRAIN MEASUREMENT ON COMPLEMENTARY METAL OXIDE SEMICONDUCTOR DEVICES.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 158. ISSUE 4. P. H438 -H446 18 86% 17
6 YAMAZAKI, T , KASHIWAGI, A , KURAMOCHI, K , OHTSUKA, M , HASHIMOTO, I , WATANABE, K , (2008) QUANTITATIVE AND EASY ESTIMATION OF A CRYSTAL BENDING EFFECT USING LOW-ORDER CBED PATTERNS.JOURNAL OF ELECTRON MICROSCOPY. VOL. 57. ISSUE 6. P. 181-187 19 90% 2
7 COOPER, D , BERNIER, N , ROUVIERE, JL , (2015) COMBINING 2 NM SPATIAL RESOLUTION AND 0.02% PRECISION FOR DEFORMATION MAPPING OF SEMICONDUCTOR SPECIMENS IN A TRANSMISSION ELECTRON MICROSCOPE BY PRECESSION ELECTRON DIFFRACTION.NANO LETTERS. VOL. 15. ISSUE 8. P. 5289 -5294 20 71% 1
8 SAITOH, K , YASUDA, Y , HAMABE, M , TANAKA, N , (2010) AUTOMATED CHARACTERIZATION OF BENDING AND EXPANSION OF A LATTICE OF A SI SUBSTRATE NEAR A SIGE/SI INTERFACE BY USING SPLIT HOLZ LINE PATTERNS.JOURNAL OF ELECTRON MICROSCOPY. VOL. 59. ISSUE 5. P. 367-378 18 86% 1
9 PRZYBYLA, P , (2012) A PATTERN RECOGNITION METHOD FOR LATTICE DISTORTION MEASUREMENT FROM HRTEM IMAGES.JOURNAL OF MICROSCOPY. VOL. 245. ISSUE 2. P. 200-209 23 64% 0
10 UESUGI, F , HOKAZONO, A , TAKENO, S , (2011) EVALUATION OF TWO-DIMENSIONAL STRAIN DISTRIBUTION BY STEM/NBD.ULTRAMICROSCOPY. VOL. 111. ISSUE 8. P. 995 -998 18 78% 15

Classes with closest relation at Level 1


Rank Class id link
1 13334 PRECESSION ELECTRON DIFFRACTION//CONVERGENT BEAM ELECTRON DIFFRACTION//ELECTRON PRECESSION
2 2772 ULTRAMICROSCOPY//ABERRATION CORRECTION//MICROSCOPY
3 37216 AU MICROELECTRODE//FUEL CELL SOLID STATE CHEM//HOT STAGE
4 28322 ULTRAMICROTOMY//LOW ANGLE ION MILLING//MAT SCI PROD TECHNOL
5 13252 ELECTRON HOLOGRAPHY//OFF AXIS ELECTRON HOLOGRAPHY//LORENTZ MICROSCOPY
6 18266 CERAM PHYS//RIN//PIEZOSPECTROSCOPY
7 33176 ALPHA FRINGES//BODY TRANSLATION VECTOR//DIFFRACTION CONTRAST IMAGES
8 13904 ULTRAMICROSCOPY//PLAN VIEW IMAGING OF SURFACES//REFLECTION HIGH ENERGY ELECTRON DIFFRACTION RHEED
9 31836 REG PHYSICOCHEM ANAL//DOUBLE DIFFRACTION//KRISTALLOGRAFIYA
10 17895 MOIRE INTERFEROMETRY//ELECTRON BEAM MOIRE//GEOMETRIC PHASE ANALYSIS

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