Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
20107 | 476 | 31.7 | 68% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
314 | 3 | ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 39933 |
725 | 2 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY | 12666 |
20107 | 1 | ELECTRON TOMOGRAPHY//3D CHEMICAL ANALYSIS//3D MICROANALYSIS | 476 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ELECTRON TOMOGRAPHY | authKW | 1442513 | 25% | 19% | 121 |
2 | 3D CHEMICAL ANALYSIS | authKW | 320744 | 1% | 100% | 5 |
3 | 3D MICROANALYSIS | authKW | 267285 | 1% | 83% | 5 |
4 | TILT SERIES | authKW | 230931 | 1% | 60% | 6 |
5 | TOMOGRAPHIC SPECTRAL IMAGING | authKW | 192447 | 1% | 100% | 3 |
6 | MISSING WEDGE | authKW | 135837 | 1% | 35% | 6 |
7 | 3D EDX | authKW | 128298 | 0% | 100% | 2 |
8 | ARBEITSGRP RONTGEN STREU TOPOG | address | 128298 | 0% | 100% | 2 |
9 | DISCRETE ALGEBRAIC RECONSTRUCTION TECHNIQUE DART | authKW | 128298 | 0% | 100% | 2 |
10 | QUANTITATIVE ELECTRON TOMOGRAPHY | authKW | 128298 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 58134 | 38% | 1% | 180 |
2 | Materials Science, Multidisciplinary | 828 | 31% | 0% | 147 |
3 | Nanoscience & Nanotechnology | 795 | 14% | 0% | 69 |
4 | Materials Science, Characterization, Testing | 733 | 5% | 0% | 24 |
5 | Physics, Applied | 397 | 21% | 0% | 99 |
6 | Metallurgy & Metallurgical Engineering | 215 | 8% | 0% | 38 |
7 | Chemistry, Physical | 146 | 14% | 0% | 69 |
8 | Physics, Condensed Matter | 118 | 10% | 0% | 49 |
9 | Chemistry, Multidisciplinary | 104 | 12% | 0% | 59 |
10 | Instruments & Instrumentation | 48 | 4% | 0% | 19 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ARBEITSGRP RONTGEN STREU TOPOG | 128298 | 0% | 100% | 2 |
2 | IMINDS VIS | 115448 | 3% | 15% | 12 |
3 | IBBT VIS | 109961 | 1% | 29% | 6 |
4 | ULTRAHIGH VOLTAGE ELE ON MICROSCOPY | 75340 | 2% | 11% | 11 |
5 | 3D MAT GRP | 64149 | 0% | 100% | 1 |
6 | BAM BUNDESANSTALT MAT PRUFUNG | 64149 | 0% | 100% | 1 |
7 | BERLIN SYNCHROTRON BESSY | 64149 | 0% | 100% | 1 |
8 | CORP PLANNING TEAM | 64149 | 0% | 100% | 1 |
9 | DISTRIBUTED SYST TECHNOL CRC | 64149 | 0% | 100% | 1 |
10 | DTSI SILICON TECHNOL | 64149 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 51623 | 14% | 1% | 67 |
2 | MICROSCOPY AND MICROANALYSIS | 20899 | 5% | 1% | 24 |
3 | JOURNAL OF MICROSCOPY | 15748 | 5% | 1% | 25 |
4 | JOURNAL OF ELECTRON MICROSCOPY | 15234 | 4% | 1% | 21 |
5 | MICRON | 9200 | 4% | 1% | 19 |
6 | MATERIALS TESTING | 4843 | 2% | 1% | 8 |
7 | IMAGE ANALYSIS & STEREOLOGY | 4766 | 1% | 2% | 3 |
8 | MICROSCOPY | 4416 | 1% | 2% | 4 |
9 | MATERIALS TODAY | 1735 | 1% | 1% | 4 |
10 | MATERIALS TESTING-MATERIALS AND COMPONENTS TECHNOLOGY AND APPLICATION | 1456 | 0% | 2% | 1 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ELECTRON TOMOGRAPHY | 1442513 | 25% | 19% | 121 | Search ELECTRON+TOMOGRAPHY | Search ELECTRON+TOMOGRAPHY |
2 | 3D CHEMICAL ANALYSIS | 320744 | 1% | 100% | 5 | Search 3D+CHEMICAL+ANALYSIS | Search 3D+CHEMICAL+ANALYSIS |
3 | 3D MICROANALYSIS | 267285 | 1% | 83% | 5 | Search 3D+MICROANALYSIS | Search 3D+MICROANALYSIS |
4 | TILT SERIES | 230931 | 1% | 60% | 6 | Search TILT+SERIES | Search TILT+SERIES |
5 | TOMOGRAPHIC SPECTRAL IMAGING | 192447 | 1% | 100% | 3 | Search TOMOGRAPHIC+SPECTRAL+IMAGING | Search TOMOGRAPHIC+SPECTRAL+IMAGING |
6 | MISSING WEDGE | 135837 | 1% | 35% | 6 | Search MISSING+WEDGE | Search MISSING+WEDGE |
7 | 3D EDX | 128298 | 0% | 100% | 2 | Search 3D+EDX | Search 3D+EDX |
8 | DISCRETE ALGEBRAIC RECONSTRUCTION TECHNIQUE DART | 128298 | 0% | 100% | 2 | Search DISCRETE+ALGEBRAIC+RECONSTRUCTION+TECHNIQUE+DART | Search DISCRETE+ALGEBRAIC+RECONSTRUCTION+TECHNIQUE+DART |
9 | QUANTITATIVE ELECTRON TOMOGRAPHY | 128298 | 0% | 100% | 2 | Search QUANTITATIVE+ELECTRON+TOMOGRAPHY | Search QUANTITATIVE+ELECTRON+TOMOGRAPHY |
10 | STEM HAADF IMAGING | 128298 | 0% | 100% | 2 | Search STEM+HAADF+IMAGING | Search STEM+HAADF+IMAGING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | LI, MH , YANG, YQ , HUANG, B , LUO, X , ZHANG, W , HAN, M , RU, JG , (2014) DEVELOPMENT OF ADVANCED ELECTRON TOMOGRAPHY IN MATERIALS SCIENCE BASED ON TEM AND STEM.TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA. VOL. 24. ISSUE 10. P. 3031 -3050 | 42 | 63% | 3 |
2 | BALS, S , GORIS, B , ALTANTZIS, T , HEIDARI, H , VAN AERT, S , VAN TENDELOO, G , (2014) SEEING AND MEASURING IN 3D WITH ELECTRONS.COMPTES RENDUS PHYSIQUE. VOL. 15. ISSUE 2-3. P. 140 -150 | 36 | 61% | 6 |
3 | BALS, S , GORIS, B , LIZ-MARZAN, LM , VAN TENDELOO, G , (2014) THREE-DIMENSIONAL CHARACTERIZATION OF NOBLE-METAL NANOPARTICLES AND THEIR ASSEMBLIES BY ELECTRON TOMOGRAPHY.ANGEWANDTE CHEMIE-INTERNATIONAL EDITION. VOL. 53. ISSUE 40. P. 10600 -10610 | 39 | 46% | 8 |
4 | FERNANDEZ, JJ , (2013) COMPUTATIONAL METHODS FOR MATERIALS CHARACTERIZATION BY ELECTRON TOMOGRAPHY.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 17. ISSUE 3. P. 93-106 | 34 | 54% | 9 |
5 | ZECEVIC, J , DE JONG, KP , DE JONGH, PE , (2013) PROGRESS IN ELECTRON TOMOGRAPHY TO ASSESS THE 3D NANOSTRUCTURE OF CATALYSTS.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 17. ISSUE 3. P. 115-125 | 36 | 47% | 21 |
6 | HAYASHIDA, M , MALAC, M , (2016) PRACTICAL ELECTRON TOMOGRAPHY GUIDE: RECENT PROGRESS AND FUTURE OPPORTUNITIES.MICRON. VOL. 91. ISSUE . P. 49 -74 | 50 | 35% | 0 |
7 | HABERFEHLNER, G , ORTHACKER, A , ALBU, M , LI, JH , KOTHLEITNER, G , (2014) NANOSCALE VOXEL SPECTROSCOPY BY SIMULTANEOUS EELS AND EDS TOMOGRAPHY.NANOSCALE. VOL. 6. ISSUE 23. P. 14563 -14569 | 28 | 56% | 17 |
8 | BURDET, P , SAGHI, Z , FILIPPIN, AN , BORRAS, A , MIDGLEY, PA , (2016) A NOVEL 3D ABSORPTION CORRECTION METHOD FOR QUANTITATIVE EDX-STEM TOMOGRAPHY.ULTRAMICROSCOPY. VOL. 160. ISSUE . P. 118 -129 | 17 | 59% | 7 |
9 | SLATER, TJA , JANSSEN, A , CAMARGO, PHC , BURKE, MG , ZALUZEC, NJ , HAIGH, SJ , (2016) STEM-EDX TOMOGRAPHY OF BIMETALLIC NANOPARTICLES: A METHODOLOGICAL INVESTIGATION.ULTRAMICROSCOPY. VOL. 162. ISSUE . P. 61 -73 | 14 | 67% | 7 |
10 | ROELANDTS, T , BATENBURG, KJ , BIERMANS, E , KUBEL, C , BALS, S , SIJBERS, J , (2012) ACCURATE SEGMENTATION OF DENSE NANOPARTICLES BY PARTIALLY DISCRETE ELECTRON TOMOGRAPHY.ULTRAMICROSCOPY. VOL. 114. ISSUE . P. 96 -105 | 18 | 75% | 21 |
Classes with closest relation at Level 1 |