Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
33176 | 128 | 26.8 | 21% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
314 | 3 | ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 39933 |
725 | 2 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY | 12666 |
33176 | 1 | ALPHA FRINGES//BODY TRANSLATION VECTOR//DIFFRACTION CONTRAST IMAGES | 128 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ALPHA FRINGES | authKW | 238559 | 1% | 100% | 1 |
2 | BODY TRANSLATION VECTOR | authKW | 238559 | 1% | 100% | 1 |
3 | DIFFRACTION CONTRAST IMAGES | authKW | 238559 | 1% | 100% | 1 |
4 | SUPPLEMENTARY DISPLACEMENT | authKW | 238559 | 1% | 100% | 1 |
5 | THIN TWINS | authKW | 238559 | 1% | 100% | 1 |
6 | BEAM CONVERGENCE | authKW | 119279 | 1% | 50% | 1 |
7 | PSEUDO SYMMETRIC CRYSTALS | authKW | 119279 | 1% | 50% | 1 |
8 | WEAK BEAM TECHNIQUE | authKW | 119279 | 1% | 50% | 1 |
9 | WEAK BEAM IMAGING | authKW | 106023 | 2% | 22% | 2 |
10 | ADVANCES IN IMAGING AND ELECTRON PHYSICS | journal | 30911 | 5% | 2% | 7 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 7693 | 27% | 0% | 34 |
2 | Physics, Condensed Matter | 501 | 34% | 0% | 43 |
3 | Physics, Applied | 453 | 39% | 0% | 50 |
4 | Materials Science, Multidisciplinary | 242 | 32% | 0% | 41 |
5 | Metallurgy & Metallurgical Engineering | 69 | 9% | 0% | 11 |
6 | Physics, Multidisciplinary | 37 | 9% | 0% | 12 |
7 | CYTOLOGY & HISTOLOGY | 30 | 1% | 0% | 1 |
8 | Biology | 16 | 4% | 0% | 5 |
9 | Materials Science, Characterization, Testing | 16 | 2% | 0% | 2 |
10 | Multidisciplinary Sciences | 8 | 2% | 0% | 2 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | LOE | 9540 | 1% | 4% | 1 |
2 | MED HIST | 2563 | 1% | 1% | 1 |
3 | HREM | 916 | 1% | 0% | 1 |
4 | AIDS CANC VIRUS PROGRAM | 780 | 1% | 0% | 1 |
5 | CEMES | 698 | 2% | 0% | 2 |
6 | CHARITE MED | 555 | 1% | 0% | 1 |
7 | COMPUTAT ENGN | 332 | 1% | 0% | 1 |
8 | FREDERICK CANC | 305 | 1% | 0% | 1 |
9 | PRECIS RUMENTS | 236 | 1% | 0% | 1 |
10 | MED VIROL | 109 | 1% | 0% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ADVANCES IN IMAGING AND ELECTRON PHYSICS | 30911 | 5% | 2% | 7 |
2 | ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS | 21757 | 4% | 2% | 5 |
3 | MICRON AND MICROSCOPICA ACTA | 17263 | 3% | 2% | 4 |
4 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 10701 | 23% | 0% | 30 |
5 | MICROSCOPE | 6625 | 1% | 3% | 1 |
6 | ULTRAMICROSCOPY | 3455 | 7% | 0% | 9 |
7 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 2954 | 9% | 0% | 11 |
8 | JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 2070 | 2% | 0% | 2 |
9 | PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1667 | 2% | 0% | 2 |
10 | CONTEMPORARY PHYSICS | 1348 | 2% | 0% | 2 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ALPHA FRINGES | 238559 | 1% | 100% | 1 | Search ALPHA+FRINGES | Search ALPHA+FRINGES |
2 | BODY TRANSLATION VECTOR | 238559 | 1% | 100% | 1 | Search BODY+TRANSLATION+VECTOR | Search BODY+TRANSLATION+VECTOR |
3 | DIFFRACTION CONTRAST IMAGES | 238559 | 1% | 100% | 1 | Search DIFFRACTION+CONTRAST+IMAGES | Search DIFFRACTION+CONTRAST+IMAGES |
4 | SUPPLEMENTARY DISPLACEMENT | 238559 | 1% | 100% | 1 | Search SUPPLEMENTARY+DISPLACEMENT | Search SUPPLEMENTARY+DISPLACEMENT |
5 | THIN TWINS | 238559 | 1% | 100% | 1 | Search THIN+TWINS | Search THIN+TWINS |
6 | BEAM CONVERGENCE | 119279 | 1% | 50% | 1 | Search BEAM+CONVERGENCE | Search BEAM+CONVERGENCE |
7 | PSEUDO SYMMETRIC CRYSTALS | 119279 | 1% | 50% | 1 | Search PSEUDO+SYMMETRIC+CRYSTALS | Search PSEUDO+SYMMETRIC+CRYSTALS |
8 | WEAK BEAM TECHNIQUE | 119279 | 1% | 50% | 1 | Search WEAK+BEAM+TECHNIQUE | Search WEAK+BEAM+TECHNIQUE |
9 | WEAK BEAM IMAGING | 106023 | 2% | 22% | 2 | Search WEAK+BEAM+IMAGING | Search WEAK+BEAM+IMAGING |
10 | HISTOTECHNOLOGY | 14908 | 1% | 6% | 1 | Search HISTOTECHNOLOGY | Search HISTOTECHNOLOGY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | HAWKES, PW , (2003) ELECTRON OPTICS AND ELECTRON MICROSCOPY: CONFERENCE PROCEEDINGS AND ABSTRACTS AS SOURCE MATERIAL.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 127. VOL. 127. ISSUE . P. 207 -379 | 17 | 47% | 2 |
2 | ANSTIS, GR , (1997) THE KINEMATIC THEORY OF SCATTERING BY STACKING FAULTS WITH SUPPLEMENTARY ATOMIC DISPLACEMENTS.MICRON. VOL. 28. ISSUE 2. P. 85-87 | 7 | 100% | 0 |
3 | WHELAN, MJ , (2010) THE DEVELOPMENT AND EARLY APPLICATIONS OF THE WEAK-BEAM TECHNIQUE.PHILOSOPHICAL MAGAZINE. VOL. 90. ISSUE 35-36. P. 4611-4622 | 4 | 100% | 0 |
4 | CHEN, CY , STOBBS, WM , (1996) BEAM CONVERGENCE EFFECTS IN THE WEAK-BEAM IMAGING OF INCLINED PLANAR DEFECTS.JOURNAL OF MICROSCOPY-OXFORD. VOL. 181. ISSUE . P. 36-44 | 7 | 88% | 0 |
5 | KIM, HS , SHEININ, SS , (1997) A TECHNIQUE FOR DETERMINING THE NUMBER OF ADJACENT INTRINSIC FAULTS IN MULTI-LAYERED STACKING FAULT CONFIGURATIONS USING COMPLEMENTARY STRONG AND WEAK BEAM ELECTRON MICROSCOPE IMAGES.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 161. ISSUE 2. P. 335-342 | 5 | 100% | 0 |
6 | KRUGER, DH , GELDERBLOM, HR , (2014) HELMUT RUSKA (1908-1973): HIS ROLE IN THE EVOLUTION OF ELECTRON MICROSCOPY IN THE LIFE SCIENCES, AND ESPECIALLY VIROLOGY.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 182. VOL. 182. ISSUE . P. 1 -94 | 7 | 41% | 1 |
7 | SOFRONOVA, RM , (1995) SYSTEM OF PLANE DEFECTS OF CRYSTAL-LATTICE AS INTERFEROMETER FOR ELECTRONS AND CORRECTION OF SCATTERING MODEL.FIZIKA METALLOV I METALLOVEDENIE. VOL. 79. ISSUE 3. P. 104-111 | 5 | 83% | 0 |
8 | BITHELL, EG , DONOVAN, PE , STOBBS, WM , (1989) THE RELATIVE EFFECTS OF SPECIMEN THICKNESS AND CONVERGENCE ON THE WEAK-BEAM CONTRAST OF STACKING-FAULTS.PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES. VOL. 59. ISSUE 1. P. 63-85 | 6 | 86% | 10 |
9 | KIM, HS , SHEININ, SS , (1989) THE MANY BEAM DYNAMICAL THEORY OF CONTRAST IN ELECTRON-MICROSCOPE IMAGES OF MICROTWINS FOR THE NON-SYMMETRICAL LAUE AND NON-COLUMN CASES.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 115. ISSUE 1. P. 51-60 | 5 | 100% | 0 |
10 | SHEININ, SS , KIM, HS , (1991) ON THE SYMMETRY CHARACTERISTICS OF DIFFRACTION CONTRAST IMAGES OF MICROTWINS.ULTRAMICROSCOPY. VOL. 37. ISSUE 1-4. P. 116-124 | 4 | 100% | 0 |
Classes with closest relation at Level 1 |