Class information for:
Level 1: CADMIUM YELLOW//ABSORPTION CORRECTION//ENGN 36

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
24440 311 20.4 30%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
725 2             ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY 12666
24440 1                   CADMIUM YELLOW//ABSORPTION CORRECTION//ENGN 36 311

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CADMIUM YELLOW authKW 294552 1% 100% 3
2 ABSORPTION CORRECTION authKW 200449 2% 29% 7
3 ENGN 36 address 110453 1% 38% 3
4 A1 L12 INTERFACE authKW 98184 0% 100% 1
5 AC EQUIPOS PROC address 98184 0% 100% 1
6 ATMOSPHERIC THIN WINDOW authKW 98184 0% 100% 1
7 ATOMIC LEVEL DETECTION authKW 98184 0% 100% 1
8 AUTOMATED ELECTRON PROBE MICROANALYZER PARTICLE ANALYSIS authKW 98184 0% 100% 1
9 BACKSCATTERING COEFFICIENT OF THIN FILMS authKW 98184 0% 100% 1
10 BICMOS TRANSISTOR authKW 98184 0% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 55433 46% 0% 142
2 Metallurgy & Metallurgical Engineering 268 11% 0% 33
3 Materials Science, Multidisciplinary 189 20% 0% 62
4 Physics, Multidisciplinary 181 13% 0% 39
5 Spectroscopy 157 7% 0% 21
6 Nuclear Science & Technology 132 7% 0% 21
7 Physics, Condensed Matter 30 7% 0% 23
8 Chemistry, Analytical 26 5% 0% 17
9 Physics, Applied 13 7% 0% 23
10 Instruments & Instrumentation 9 3% 0% 8

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ENGN 36 110453 1% 38% 3
2 AC EQUIPOS PROC 98184 0% 100% 1
3 MAT VITREOS CERAM 98184 0% 100% 1
4 MICROSCOPIA ELECT ULTRA ALTA OLUC UHREM L 98184 0% 100% 1
5 MKT PLICAT GRP 98184 0% 100% 1
6 SEKT EXPT VITEORETINALE CHIRURG 98184 0% 100% 1
7 CSIC GRP 49091 0% 50% 1
8 UNIDAD BERNARDO QUINTANA 49091 0% 50% 1
9 HIGH VOLTAGE ELE ON MICROSCOPY 44620 2% 9% 5
10 SOLID STATE PHYS MAT SCI 32727 0% 33% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ULTRAMICROSCOPY 37248 15% 1% 46
2 JOURNAL OF MICROSCOPY-OXFORD 26059 8% 1% 26
3 MICROSCOPY AND MICROANALYSIS 12494 5% 1% 15
4 JOURNAL OF MICROSCOPY 8674 5% 1% 15
5 SOUTH AFRICAN JOURNAL OF PHYSICS - SUID-AFRIKAANSE TYDSKRIF VIR FISIKA 8011 1% 4% 2
6 JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES 7672 2% 1% 6
7 NUCLEAR TECHNOLOGY 4258 5% 0% 14
8 MICROSCOPY MICROANALYSIS MICROSTRUCTURES 4159 1% 1% 4
9 INSTITUTE OF PHYSICS CONFERENCE SERIES 3617 6% 0% 19
10 JOURNAL OF ELECTRON MICROSCOPY 3377 3% 0% 8

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 CADMIUM YELLOW 294552 1% 100% 3 Search CADMIUM+YELLOW Search CADMIUM+YELLOW
2 ABSORPTION CORRECTION 200449 2% 29% 7 Search ABSORPTION+CORRECTION Search ABSORPTION+CORRECTION
3 A1 L12 INTERFACE 98184 0% 100% 1 Search A1+L12+INTERFACE Search A1+L12+INTERFACE
4 ATMOSPHERIC THIN WINDOW 98184 0% 100% 1 Search ATMOSPHERIC+THIN+WINDOW Search ATMOSPHERIC+THIN+WINDOW
5 ATOMIC LEVEL DETECTION 98184 0% 100% 1 Search ATOMIC+LEVEL+DETECTION Search ATOMIC+LEVEL+DETECTION
6 AUTOMATED ELECTRON PROBE MICROANALYZER PARTICLE ANALYSIS 98184 0% 100% 1 Search AUTOMATED+ELECTRON+PROBE+MICROANALYZER+PARTICLE+ANALYSIS Search AUTOMATED+ELECTRON+PROBE+MICROANALYZER+PARTICLE+ANALYSIS
7 BACKSCATTERING COEFFICIENT OF THIN FILMS 98184 0% 100% 1 Search BACKSCATTERING+COEFFICIENT+OF+THIN+FILMS Search BACKSCATTERING+COEFFICIENT+OF+THIN+FILMS
8 BICMOS TRANSISTOR 98184 0% 100% 1 Search BICMOS+TRANSISTOR Search BICMOS+TRANSISTOR
9 BREMSSTRAHLUNG HOLE COUNTS 98184 0% 100% 1 Search BREMSSTRAHLUNG+HOLE+COUNTS Search BREMSSTRAHLUNG+HOLE+COUNTS
10 CA P AND MG P CONCENTRATION RATIOS 98184 0% 100% 1 Search CA+P+AND+MG+P+CONCENTRATION+RATIOS Search CA+P+AND+MG+P+CONCENTRATION+RATIOS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 WATANABE, M , WILLIAMS, DB , (2006) THE QUANTITATIVE ANALYSIS OF THIN SPECIMENS: A REVIEW OF PROGRESS FROM THE CLIFF-LORIMER TO THE NEW ZETA-FACTOR METHODS.JOURNAL OF MICROSCOPY. VOL. 221. ISSUE . P. 89-109 24 71% 62
2 ARMIGLIATO, A , ROSA, R , (2009) X-RAY MICROANALYSIS COMBINED WITH MONTE CARLO SIMULATION FOR THE ANALYSIS OF LAYERED THIN FILMS: THE CASE OF CARBON CONTAMINATION.MICROSCOPY AND MICROANALYSIS. VOL. 15. ISSUE 2. P. 99-105 9 100% 4
3 WILLIAMS, DB , WATANABE, M , CARPENTER, DT , (1998) THIN FILM ANALYSIS AND CHEMICAL MAPPING IN THE ANALYTICAL ELECTRON MICROSCOPE.MIKROCHIMICA ACTA. VOL. . ISSUE . P. 49-57 12 100% 2
4 DRAPALA, J , KUBICEK, P , VLACH, O , (2010) COMPUTER SIMULATION OF DIFFUSION PROCESSES WITH MOVING INTERFACE BOUNDARY.MATHEMATICS AND COMPUTERS IN SIMULATION. VOL. 80. ISSUE 7. P. 1520-1535 10 83% 0
5 BOON, G , BASTIN, G , (2004) QUANTITATIVE ANALYSIS OF THIN SPECIMENS IN THE TEM USING A PHI(RHO Z)-MODEL.MICROCHIMICA ACTA. VOL. 147. ISSUE 3. P. 125-133 14 67% 5
6 CHIKAZAWA, Y , FARMER, M , GRANDY, C , (2008) TECHNOLOGY GAP ANALYSIS ON SODIUM-HEATED STEAM GENERATORS SUPPORTING ADVANCED BURNER REACTOR DEVELOPMENT.NUCLEAR TECHNOLOGY. VOL. 164. ISSUE 3. P. 410-432 12 63% 0
7 WATANABE, M , WILLIAMS, DB , (2003) QUANTIFICATION OF ELEMENTAL SEGREGATION TO LATH AND GRAIN BOUNDARIES IN LOW-ALLOY STEEL BY STEM X-RAY MAPPING COMBINED WITH THE XI-FACTOR METHOD.ZEITSCHRIFT FUR METALLKUNDE. VOL. 94. ISSUE 3. P. 307-316 11 61% 9
8 TANAKA, S , WATANABE, M , HORITA, Z , NEMOTO, M , (1998) APPLICATION OF ZETA-FACTOR METHOD TO TI-AL-CR SYSTEM IN ANALYTICAL ELECTRON MICROSCOPY.JOURNAL OF ELECTRON MICROSCOPY. VOL. 47. ISSUE 1. P. 9-15 8 100% 0
9 ARMIGLIATO, A , BALBONI, R , ROSA, R , (2007) APPLICATION OF THE PARAMETRIC BOOTSTRAP METHOD TO DETERMINE STATISTICAL ERRORS IN QUANTITATIVE X-RAY MICROANALYSIS OF THIN FILMS.JOURNAL OF MICROSCOPY. VOL. 228. ISSUE 1. P. 1-10 8 73% 0
10 KUBICEK, P , (1999) EVALUATION OF EXPERIMENTAL DATA OF DIFFUSION IN SEMIINFINITE TWO-PHASE SYSTEMS WITH NONSTATIONARY INTERPHASE BOUNDARY BY MEANS OF THERMAL POTENTIALS II. APPLICATION OF THE THEORY TO THE DIFFUSION CHARACTERISTICS DETERMINATION.CZECHOSLOVAK JOURNAL OF PHYSICS. VOL. 49. ISSUE 12. P. 1669-1684 7 100% 2

Classes with closest relation at Level 1


Rank Class id link
1 10021 MICROSCOPY//ULTRAMICROSCOPY//EFTEM
2 9414 MEAN PENETRATION DEPTH//ELECTRON PROBE MICROANALYSIS//STANDARDLESS ANALYSIS
3 3520 GRAIN BOUNDARY SEGREGATION//NON EQUILIBRIUM SEGREGATION//TEMPER EMBRITTLEMENT
4 2772 ULTRAMICROSCOPY//ABERRATION CORRECTION//MICROSCOPY
5 7245 HIGH PRESSURE FREEZING//FREEZE SUBSTITUTION//CRYOFIXATION
6 29658 COMPOSITION GRADIENT METHOD//COPPER PLATINUM ALLOY//1ST ORDER TRANSFORMATION
7 23315 THIN WINDOW EPMA//LOW Z PARTICLE EPMA//LOW Z PARTICLE ELECTRON PROBE X RAY MICROANALYSIS
8 15506 DISCONTINUOUS PRECIPITATION//DIFFUSION INDUCED RECRYSTALLIZATION//DIGM
9 12428 CONVERGENT BEAM ELECTRON DIFFRACTION//CBED//LATTICE PARAMETER DETERMINATION
10 36758 LIFE PREDICT TEAM//ALUMINUM BERYLLIUM//BE AL COMPOSITES

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