Class information for:
Level 1: ELECTRON HOLOGRAPHY//OFF AXIS ELECTRON HOLOGRAPHY//LORENTZ MICROSCOPY

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
13252 851 21.7 57%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
725 2             ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY 12666
13252 1                   ELECTRON HOLOGRAPHY//OFF AXIS ELECTRON HOLOGRAPHY//LORENTZ MICROSCOPY 851

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ELECTRON HOLOGRAPHY authKW 3275153 21% 51% 179
2 OFF AXIS ELECTRON HOLOGRAPHY authKW 551230 3% 59% 26
3 LORENTZ MICROSCOPY authKW 546145 5% 33% 46
4 TRIEBENBERG address 482351 4% 41% 33
5 MEAN INNER POTENTIAL authKW 447112 2% 69% 18
6 STRUCT PHYS address 193323 4% 17% 32
7 ELECTRON BIPRISM authKW 184525 1% 86% 6
8 ULTRAMICROSCOPY journal 160677 19% 3% 158
9 ELECTRON OPTICAL PHASE SHIFT authKW 143521 0% 100% 4
10 FRESNEL FRINGES authKW 143517 1% 67% 6

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 91495 35% 1% 302
2 Physics, Applied 1606 29% 0% 251
3 Physics, Condensed Matter 564 15% 0% 130
4 Physics, Multidisciplinary 404 12% 0% 98
5 Materials Science, Characterization, Testing 293 2% 0% 21
6 Materials Science, Multidisciplinary 274 16% 0% 133
7 Optics 208 8% 0% 67
8 Metallurgy & Metallurgical Engineering 186 6% 0% 50
9 Nanoscience & Nanotechnology 73 4% 0% 35
10 Education, Scientific Disciplines 33 1% 0% 10

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 TRIEBENBERG 482351 4% 41% 33
2 STRUCT PHYS 193323 4% 17% 32
3 SEMICOND FAILURE ANAL 80729 0% 75% 3
4 CEMES INA CNRS 35880 0% 100% 1
5 CENT ILITY ELE ON MICROSCOPY 35880 0% 100% 1
6 ELECT PETER GRIINBERG 35880 0% 100% 1
7 ELECT PETER GUNBERG 35880 0% 100% 1
8 ELEKTRONEN MIKROSKOP 35880 0% 100% 1
9 ENVIRONM ENERGY TECHNOL DEV RD GRP 35880 0% 100% 1
10 ERATO ELE ON WAVEFRONT PROJECT 35880 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ULTRAMICROSCOPY 160677 19% 3% 158
2 JOURNAL OF ELECTRON MICROSCOPY 65061 7% 3% 58
3 MICROSCOPY 22248 1% 5% 12
4 OPTIK 7761 6% 0% 48
5 MICROSCOPY AND MICROANALYSIS 5175 2% 1% 16
6 INSTITUTE OF PHYSICS CONFERENCE SERIES 4209 4% 0% 34
7 ADVANCES IN IMAGING AND ELECTRON PHYSICS 2363 1% 1% 5
8 APPLIED PHYSICS LETTERS 1211 7% 0% 63
9 MICRON 1141 1% 0% 9
10 MATERIALS TRANSACTIONS 1105 2% 0% 15

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 ELECTRON HOLOGRAPHY 3275153 21% 51% 179 Search ELECTRON+HOLOGRAPHY Search ELECTRON+HOLOGRAPHY
2 OFF AXIS ELECTRON HOLOGRAPHY 551230 3% 59% 26 Search OFF+AXIS+ELECTRON+HOLOGRAPHY Search OFF+AXIS+ELECTRON+HOLOGRAPHY
3 LORENTZ MICROSCOPY 546145 5% 33% 46 Search LORENTZ+MICROSCOPY Search LORENTZ+MICROSCOPY
4 MEAN INNER POTENTIAL 447112 2% 69% 18 Search MEAN+INNER+POTENTIAL Search MEAN+INNER+POTENTIAL
5 ELECTRON BIPRISM 184525 1% 86% 6 Search ELECTRON+BIPRISM Search ELECTRON+BIPRISM
6 ELECTRON OPTICAL PHASE SHIFT 143521 0% 100% 4 Search ELECTRON+OPTICAL+PHASE+SHIFT Search ELECTRON+OPTICAL+PHASE+SHIFT
7 FRESNEL FRINGES 143517 1% 67% 6 Search FRESNEL+FRINGES Search FRESNEL+FRINGES
8 DOPANT PROFILING 115729 1% 32% 10 Search DOPANT+PROFILING Search DOPANT+PROFILING
9 CRYO LORENTZ ELECTRON MICROSCOPE 107641 0% 100% 3 Search CRYO+LORENTZ+ELECTRON+MICROSCOPE Search CRYO+LORENTZ+ELECTRON+MICROSCOPE
10 INTERACTION OF VORTICES WITH DISLOCATIONS 107641 0% 100% 3 Search INTERACTION+OF+VORTICES+WITH+DISLOCATIONS Search INTERACTION+OF+VORTICES+WITH+DISLOCATIONS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 POZZI, G , BELEGGIA, M , KASAMA, T , DUNIN-BORKOWSKI, RE , (2014) INTERFEROMETRIC METHODS FOR MAPPING STATIC ELECTRIC AND MAGNETIC FIELDS.COMPTES RENDUS PHYSIQUE. VOL. 15. ISSUE 2-3. P. 126 -139 89 72% 7
2 TANIGAKI, T , HARADA, K , MURAKAMI, Y , NIITSU, K , AKASHI, T , TAKAHASHI, Y , SUGAWARA, A , SHINDO, D , (2016) NEW TREND IN ELECTRON HOLOGRAPHY.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 49. ISSUE 24. P. - 80 55% 1
3 COOPER, D , (2016) OFF-AXIS ELECTRON HOLOGRAPHY FOR THE MEASUREMENT OF ACTIVE DOPANTS IN SILICON SEMICONDUCTOR DEVICES.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 49. ISSUE 47. P. 1 -21 59 81% 0
4 MCCARTNEY, MR , SMITH, DJ , (2007) ELECTRON HOLOGRAPHY: PHASE IMAGING WITH NANOMETER RESOLUTION.ANNUAL REVIEW OF MATERIALS RESEARCH. VOL. 37. ISSUE . P. 729-767 62 60% 65
5 MATTEUCCI, G , MISSIROLI, GF , POZZI, G , (2002) ELECTRON HOLOGRAPHY OF LONG-RANGE ELECTROSTATIC FIELDS.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 122. VOL. 122. ISSUE . P. 173 -249 55 83% 13
6 NEPIJKO, SA , SCHONHENSE, G , (2011) ELECTRON HOLOGRAPHY FOR ELECTRIC AND MAGNETIC FIELD MEASUREMENTS AND ITS APPLICATION FOR NANOPHYSICS.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 169. VOL. 169. ISSUE . P. 173 -240 45 80% 0
7 YAZDI, S , KASAMA, T , BELEGGIA, M , YEKTA, MS , MCCOMB, DW , TWITCHETT-HARRISON, AC , DUNIN-BORKOWSKI, RE , (2015) TOWARDS QUANTITATIVE ELECTROSTATIC POTENTIAL MAPPING OF WORKING SEMICONDUCTOR DEVICES USING OFF-AXIS ELECTRON HOLOGRAPHY.ULTRAMICROSCOPY. VOL. 152. ISSUE . P. 10 -20 29 88% 5
8 ZWECK, J , (2016) IMAGING OF MAGNETIC AND ELECTRIC FIELDS BY ELECTRON MICROSCOPY.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 28. ISSUE 40. P. - 55 49% 0
9 BELEGGIA, M , GONTARD, LC , DUNIN-BORKOWSKI, RE , (2016) LOCAL CHARGE MEASUREMENT USING OFF-AXIS ELECTRON HOLOGRAPHY.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 49. ISSUE 29. P. - 30 83% 0
10 SOMODI, PK , TWITCHETT-HARRISON, AC , MIDGLEY, PA , KARDYNAL, BE , BARNES, CHW , DUNIN-BORKOWSKI, RE , (2013) FINITE ELEMENT SIMULATIONS OF ELECTROSTATIC DOPANT POTENTIALS IN THIN SEMICONDUCTOR SPECIMENS FOR ELECTRON HOLOGRAPHY.ULTRAMICROSCOPY. VOL. 134. ISSUE . P. 160-166 29 81% 7

Classes with closest relation at Level 1


Rank Class id link
1 2772 ULTRAMICROSCOPY//ABERRATION CORRECTION//MICROSCOPY
2 12428 CONVERGENT BEAM ELECTRON DIFFRACTION//CBED//LATTICE PARAMETER DETERMINATION
3 14691 SINGLE ATOM TIP//SUR E MODIFICAT//FACETING
4 13442 MAGNETIC FORCE MICROSCOPY//MAGNETIC FORCE MICROSCOPY TIP//SCANNING HALL PROBE MICROSCOPY
5 20107 ELECTRON TOMOGRAPHY//3D CHEMICAL ANALYSIS//3D MICROANALYSIS
6 13904 ULTRAMICROSCOPY//PLAN VIEW IMAGING OF SURFACES//REFLECTION HIGH ENERGY ELECTRON DIFFRACTION RHEED
7 1124 MAGNETIC VORTEX//MICROMAGNETICS//MICROMAGNETIC SIMULATION
8 6553 FERMI WALKER REFERENCE FRAME//AHARONOV BOHM EFFECT//GLOBAL MONOPOLE
9 13334 PRECESSION ELECTRON DIFFRACTION//CONVERGENT BEAM ELECTRON DIFFRACTION//ELECTRON PRECESSION
10 33176 ALPHA FRINGES//BODY TRANSLATION VECTOR//DIFFRACTION CONTRAST IMAGES

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