Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
14076 | 794 | 31.7 | 67% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
339 | 3 | METAMATERIALS//SURFACE PLASMONS//PLASMONICS | 37115 |
37 | 2 | METAMATERIALS//SURFACE PLASMONS//PLASMONICS | 32002 |
14076 | 1 | VEELS//ELE ON NANOSCOPIES//ELECTRON ENERGY LOSS SPECTROSCOPY | 794 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | VEELS | authKW | 483202 | 2% | 74% | 17 |
2 | ELE ON NANOSCOPIES | address | 153825 | 1% | 100% | 4 |
3 | ELECTRON ENERGY LOSS SPECTROSCOPY | authKW | 140526 | 8% | 6% | 66 |
4 | EELS | authKW | 126087 | 8% | 5% | 60 |
5 | QUANTUM NANOELECT ERCH | address | 115369 | 0% | 100% | 3 |
6 | SURFACE RESPONSE FUNCTION | authKW | 76912 | 0% | 100% | 2 |
7 | PHYS AG THEORET OPT PHOTON | address | 76908 | 1% | 50% | 4 |
8 | VALENCE ELECTRON ENERGY LOSS SPECTROSCOPY | authKW | 69219 | 0% | 60% | 3 |
9 | ELECTRON ENERGY LOSSES | authKW | 57681 | 0% | 50% | 3 |
10 | LOW LOSS EELS | authKW | 57681 | 0% | 50% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 37878 | 24% | 1% | 188 |
2 | Physics, Condensed Matter | 3640 | 36% | 0% | 287 |
3 | Nanoscience & Nanotechnology | 2111 | 18% | 0% | 143 |
4 | Physics, Applied | 1079 | 26% | 0% | 203 |
5 | Materials Science, Multidisciplinary | 866 | 25% | 0% | 201 |
6 | Chemistry, Physical | 336 | 16% | 0% | 130 |
7 | Physics, Multidisciplinary | 232 | 9% | 0% | 75 |
8 | Optics | 167 | 7% | 0% | 59 |
9 | Chemistry, Multidisciplinary | 122 | 11% | 0% | 87 |
10 | Materials Science, Characterization, Testing | 27 | 1% | 0% | 7 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ELE ON NANOSCOPIES | 153825 | 1% | 100% | 4 |
2 | QUANTUM NANOELECT ERCH | 115369 | 0% | 100% | 3 |
3 | PHYS AG THEORET OPT PHOTON | 76908 | 1% | 50% | 4 |
4 | MICROSCOPIA ELECT MAT | 43259 | 0% | 38% | 3 |
5 | ADV OPTOELECTTECHNOL | 38456 | 0% | 100% | 1 |
6 | AVANZADO NANOSCOPIA | 38456 | 0% | 100% | 1 |
7 | ELE ON BEAM ANAL | 38456 | 0% | 100% | 1 |
8 | ELEKT ELEKTRON SALIA | 38456 | 0% | 100% | 1 |
9 | ELEKTRIKA ELEKTRON SAILA ZIENTZI FAK | 38456 | 0% | 100% | 1 |
10 | EUSKAL HERRIKO UNIBERTSTITATEA | 38456 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 48603 | 11% | 2% | 84 |
2 | MICRON | 10318 | 3% | 1% | 26 |
3 | ACS PHOTONICS | 7049 | 2% | 2% | 12 |
4 | NANO LETTERS | 6630 | 6% | 0% | 46 |
5 | MICROSCOPY AND MICROANALYSIS | 4245 | 2% | 1% | 14 |
6 | JOURNAL OF ELECTRON MICROSCOPY | 4042 | 2% | 1% | 14 |
7 | PHYSICAL REVIEW B | 3692 | 16% | 0% | 128 |
8 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 2236 | 3% | 0% | 24 |
9 | NANOPHOTONICS | 2157 | 0% | 2% | 3 |
10 | SCANNING MICROSCOPY | 1947 | 1% | 1% | 8 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | VEELS | 483202 | 2% | 74% | 17 | Search VEELS | Search VEELS |
2 | ELECTRON ENERGY LOSS SPECTROSCOPY | 140526 | 8% | 6% | 66 | Search ELECTRON+ENERGY+LOSS+SPECTROSCOPY | Search ELECTRON+ENERGY+LOSS+SPECTROSCOPY |
3 | EELS | 126087 | 8% | 5% | 60 | Search EELS | Search EELS |
4 | SURFACE RESPONSE FUNCTION | 76912 | 0% | 100% | 2 | Search SURFACE+RESPONSE+FUNCTION | Search SURFACE+RESPONSE+FUNCTION |
5 | VALENCE ELECTRON ENERGY LOSS SPECTROSCOPY | 69219 | 0% | 60% | 3 | Search VALENCE+ELECTRON+ENERGY+LOSS+SPECTROSCOPY | Search VALENCE+ELECTRON+ENERGY+LOSS+SPECTROSCOPY |
6 | ELECTRON ENERGY LOSSES | 57681 | 0% | 50% | 3 | Search ELECTRON+ENERGY+LOSSES | Search ELECTRON+ENERGY+LOSSES |
7 | LOW LOSS EELS | 57681 | 0% | 50% | 3 | Search LOW+LOSS+EELS | Search LOW+LOSS+EELS |
8 | LOG RATIO METHOD | 51274 | 0% | 67% | 2 | Search LOG+RATIO+METHOD | Search LOG+RATIO+METHOD |
9 | LOW VOLTAGE EELS | 51274 | 0% | 67% | 2 | Search LOW+VOLTAGE+EELS | Search LOW+VOLTAGE+EELS |
10 | PLASMONIC FORCES | 51274 | 0% | 67% | 2 | Search PLASMONIC+FORCES | Search PLASMONIC+FORCES |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | DE ABAJO, FJG , (2010) OPTICAL EXCITATIONS IN ELECTRON MICROSCOPY.REVIEWS OF MODERN PHYSICS. VOL. 82. ISSUE 1. P. 209 -275 | 149 | 39% | 405 |
2 | COLLIEX, C , KOCIAK, M , STEPHAN, O , (2016) ELECTRON ENERGY LOSS SPECTROSCOPY IMAGING OF SURFACE PLASMONS AT THE NANOMETER SCALE.ULTRAMICROSCOPY. VOL. 162. ISSUE . P. A1 -A24 | 67 | 64% | 4 |
3 | KOCIAK, M , STEPHAN, O , GLOTER, A , ZAGONEL, LF , TIZEI, LHG , TENCE, M , MARCH, K , BLAZIT, JD , MAHFOUD, Z , LOSQUIN, A , ET AL (2014) SEEING AND MEASURING IN COLOURS: ELECTRON MICROSCOPY AND SPECTROSCOPIES APPLIED TO NANO-OPTICS.COMPTES RENDUS PHYSIQUE. VOL. 15. ISSUE 2-3. P. 158 -175 | 64 | 54% | 8 |
4 | LOSQUIN, A , ZAGONEL, LF , MYROSHNYCHENKO, V , RODRIGUEZ-GONZALEZ, B , TENCE, M , SCARABELLI, L , FORSTNER, J , LIZ-MARZAN, LM , DE ABAJO, FJG , STEPHAN, O , ET AL (2015) UNVEILING NANOMETER SCALE EXTINCTION AND SCATTERING PHENOMENA THROUGH COMBINED ELECTRON ENERGY LOSS SPECTROSCOPY AND CATHODOLUMINESCENCE MEASUREMENTS.NANO LETTERS. VOL. 15. ISSUE 2. P. 1229 -1237 | 36 | 71% | 22 |
5 | KOCIAK, M , STEPHAN, O , (2014) MAPPING PLASMONS AT THE NANOMETER SCALE IN AN ELECTRON MICROSCOPE.CHEMICAL SOCIETY REVIEWS. VOL. 43. ISSUE 11. P. 3865 -3883 | 32 | 80% | 44 |
6 | RIVACOBA, A , ZABALA, N , AIZPURUA, J , (2000) IMAGE POTENTIAL IN SCANNING TRANSMISSION ELECTRON MICROSCOPY.PROGRESS IN SURFACE SCIENCE. VOL. 65. ISSUE 1-2. P. 1 -64 | 62 | 72% | 31 |
7 | BERNASCONI, GD , BUTET, J , FLAURAUD, V , ALEXANDER, D , BRUGGER, J , MARTIN, OJF , (2017) WHERE DOES ENERGY GO IN ELECTRON ENERGY LOSS SPECTROSCOPY OF NANOSTRUCTURES?.ACS PHOTONICS. VOL. 4. ISSUE 1. P. 156 -164 | 43 | 62% | 0 |
8 | LOSQUIN, A , KOCIAK, M , (2015) LINK BETWEEN CATHODOLUMINESCENCE AND ELECTRON ENERGY LOSS SPECTROSCOPY AND THE RADIATIVE AND FULL ELECTROMAGNETIC LOCAL DENSITY OF STATES.ACS PHOTONICS. VOL. 2. ISSUE 11. P. 1619 -1627 | 31 | 70% | 14 |
9 | DE ABAJO, FJG , HOWIE, A , (2002) RETARDED FIELD CALCULATION OF ELECTRON ENERGY LOSS IN INHOMOGENEOUS DIELECTRICS.PHYSICAL REVIEW B. VOL. 65. ISSUE 11. P. - | 39 | 63% | 324 |
10 | BELLIDO, EP , MANJAVACAS, A , ZHANG, Y , CAO, Y , NORDLANDER, P , BOTTON, GA , (2016) ELECTRON ENERGY-LOSS SPECTROSCOPY OF MULTIPOLAR EDGE AND CAVITY MODES IN SILVER NANOSQUARES.ACS PHOTONICS. VOL. 3. ISSUE 3. P. 428 -433 | 25 | 69% | 4 |
Classes with closest relation at Level 1 |