Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
13904 | 806 | 22.4 | 51% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
314 | 3 | ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 39933 |
725 | 2 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY | 12666 |
13904 | 1 | ULTRAMICROSCOPY//PLAN VIEW IMAGING OF SURFACES//REFLECTION HIGH ENERGY ELECTRON DIFFRACTION RHEED | 806 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | journal | 198762 | 21% | 3% | 171 |
2 | PLAN VIEW IMAGING OF SURFACES | authKW | 113651 | 0% | 100% | 3 |
3 | REFLECTION HIGH ENERGY ELECTRON DIFFRACTION RHEED | authKW | 94105 | 3% | 10% | 26 |
4 | MICROSCOPY | WoSSC | 80081 | 34% | 1% | 275 |
5 | ELECTRON INTENSITY | authKW | 75767 | 0% | 100% | 2 |
6 | ELECTRON RONCHIGRAMS | authKW | 75767 | 0% | 100% | 2 |
7 | UHV REM | authKW | 75767 | 0% | 100% | 2 |
8 | REFLECTION ELECTRON MICROSCOPY REM | authKW | 69261 | 1% | 23% | 8 |
9 | REFINED BEAM UNIT | address | 50510 | 0% | 67% | 2 |
10 | ADV MICROSCOPE DESIGN | address | 37884 | 0% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 80081 | 34% | 1% | 275 |
2 | Physics, Condensed Matter | 2609 | 31% | 0% | 248 |
3 | Chemistry, Physical | 841 | 24% | 0% | 190 |
4 | Crystallography | 666 | 8% | 0% | 67 |
5 | Physics, Applied | 495 | 18% | 0% | 148 |
6 | Physics, Multidisciplinary | 300 | 10% | 0% | 84 |
7 | Anatomy & Morphology | 160 | 2% | 0% | 17 |
8 | Materials Science, Coatings & Films | 98 | 3% | 0% | 24 |
9 | Biology | 92 | 4% | 0% | 30 |
10 | Materials Science, Multidisciplinary | 75 | 10% | 0% | 83 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | REFINED BEAM UNIT | 50510 | 0% | 67% | 2 |
2 | ADV MICROSCOPE DESIGN | 37884 | 0% | 100% | 1 |
3 | BEIJING ELE ON MICROSCOPYSTATE KEY LA | 37884 | 0% | 100% | 1 |
4 | INORGAN MAT SCI TECHNOL | 37884 | 0% | 100% | 1 |
5 | PHYS CAVENDISH | 12627 | 0% | 33% | 1 |
6 | PL PHYS SHINJUKU KU | 12625 | 0% | 17% | 2 |
7 | PL COMP SCI | 5221 | 1% | 2% | 8 |
8 | ENGN QUANTUM ENGN CHIKUSA KU | 4208 | 0% | 11% | 1 |
9 | OPT ELE | 4208 | 0% | 11% | 1 |
10 | MAT SCI ENGN MIDORI KU | 3787 | 0% | 10% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 198762 | 21% | 3% | 171 |
2 | SURFACE SCIENCE | 26765 | 17% | 1% | 138 |
3 | ACTA CRYSTALLOGRAPHICA SECTION A | 12134 | 3% | 1% | 27 |
4 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 8904 | 6% | 0% | 48 |
5 | JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 8769 | 2% | 2% | 13 |
6 | CRITICAL REVIEWS IN SURFACE CHEMISTRY | 5410 | 0% | 14% | 1 |
7 | JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 5255 | 1% | 2% | 8 |
8 | JOURNAL OF ELECTRON MICROSCOPY | 4573 | 2% | 1% | 15 |
9 | ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 3605 | 1% | 1% | 11 |
10 | SURFACE REVIEW AND LETTERS | 3225 | 2% | 1% | 15 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | WANG, ZL , (1993) ELECTRON REFLECTION, DIFFRACTION AND IMAGING OF BULK CRYSTAL-SURFACES IN TEM AND STEM.REPORTS ON PROGRESS IN PHYSICS. VOL. 56. ISSUE 8. P. 997-1065 | 111 | 70% | 16 |
2 | DUDAREV, SL , WHELAN, MJ , (1996) RESONANCE SCATTERING OF HIGH ENERGY ELECTRONS BY A CRYSTAL SURFACE.INTERNATIONAL JOURNAL OF MODERN PHYSICS B. VOL. 10. ISSUE 2. P. 133-168 | 60 | 83% | 6 |
3 | LIU, J , COWLEY, JM , (1993) SCANNING REFLECTION ELECTRON-MICROSCOPY AND ASSOCIATED TECHNIQUES FOR SURFACE STUDIES.ULTRAMICROSCOPY. VOL. 48. ISSUE 4. P. 381-416 | 47 | 89% | 18 |
4 | MAKSYM, PA , (1997) COMPUTATIONAL THEORY OF REFLECTION HIGH ENERGY ELECTRON DIFFRACTION.SURFACE REVIEW AND LETTERS. VOL. 4. ISSUE 3. P. 513-524 | 26 | 90% | 11 |
5 | MITURA, Z , (1999) RHEED FROM EPITAXIALLY GROWN THIN FILMS.SURFACE REVIEW AND LETTERS. VOL. 6. ISSUE 3-4. P. 497 -516 | 34 | 62% | 4 |
6 | DUDAREV, SL , WHELAN, MJ , (1994) ANALYTICAL TREATMENT OF SURFACE RESONANCE DIFFRACTION OF HIGH-ENERGY ELECTRONS.SURFACE SCIENCE. VOL. 310. ISSUE 1-3. P. 373-389 | 29 | 76% | 5 |
7 | YAGI, K , (1993) REFLECTION ELECTRON-MICROSCOPY - STUDIES OF SURFACE-STRUCTURES AND SURFACE DYNAMIC PROCESSES.SURFACE SCIENCE REPORTS. VOL. 17. ISSUE 6. P. 305-362 | 43 | 45% | 49 |
8 | MITURA, Z , (2015) THEORETICAL ANALYSIS OF REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION (RHEED) AND REFLECTION HIGH-ENERGY POSITRON DIFFRACTION (RHEPD) INTENSITY OSCILLATIONS EXPECTED FOR THE PERFECT LAYER-BY-LAYER GROWTH.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES. VOL. 71. ISSUE . P. 513 -518 | 14 | 74% | 1 |
9 | WANG, ZL , (1996) STATISTICAL MULTIPLE DIFFUSE SCATTERING FROM ROUGH SURFACES IN RHEED - BEYOND THE DISTORTED-WAVE BORN APPROXIMATION.SURFACE SCIENCE. VOL. 366. ISSUE 2. P. 377-393 | 22 | 81% | 5 |
10 | DUDAREV, SL , WHELAN, MJ , (1997) THE ORIGIN OF RESONANCE SCATTERING IN RHEED: BEYOND THE TIGHT-BINDING MODEL.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 53. ISSUE . P. 63 -73 | 19 | 90% | 3 |
Classes with closest relation at Level 1 |