Class information for:
Level 1: CERAM PHYS//RIN//PIEZOSPECTROSCOPY

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
18266 559 22.6 61%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
1299 2             SIGE//STRAINED SI//VIRTUAL SUBSTRATE 8578
18266 1                   CERAM PHYS//RIN//PIEZOSPECTROSCOPY 559

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CERAM PHYS address 1070675 12% 29% 67
2 RIN address 353939 3% 36% 18
3 PIEZOSPECTROSCOPY authKW 264367 2% 44% 11
4 PIEZO SPECTROSCOPY authKW 205634 1% 47% 8
5 CONCENTRATED STRESS authKW 174795 1% 80% 4
6 AIR GAP TFTS authKW 109248 0% 100% 2
7 PIEZO SPECTROSCOPIC EFFECT authKW 109248 0% 100% 2
8 MEASURED STRESS authKW 72830 0% 67% 2
9 3ME PME address 54624 0% 100% 1
10 4H SIC METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR MOSFET authKW 54624 0% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 4023 54% 0% 303
2 Materials Science, Multidisciplinary 646 26% 0% 145
3 Materials Science, Ceramics 634 7% 0% 39
4 Physics, Condensed Matter 431 16% 0% 91
5 Instruments & Instrumentation 318 8% 0% 46
6 Materials Science, Characterization, Testing 300 3% 0% 17
7 Nanoscience & Nanotechnology 239 8% 0% 44
8 Spectroscopy 167 5% 0% 30
9 Engineering, Electrical & Electronic 137 12% 0% 65
10 Materials Science, Coatings & Films 117 4% 0% 21

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CERAM PHYS 1070675 12% 29% 67
2 RIN 353939 3% 36% 18
3 3ME PME 54624 0% 100% 1
4 AGCY ENERGY 54624 0% 100% 1
5 BUBAL EUB 54624 0% 100% 1
6 ELECT OPTOELECT GRP 54624 0% 100% 1
7 ENERGY PHOTOVOLTA IKF 5 54624 0% 100% 1
8 EQUIPE MIXTECNRS NANOPHYS SEMICOND 54624 0% 100% 1
9 EXCELLENCE NONOMAT NANOTRUCT SUR ES 54624 0% 100% 1
10 GAS SENSING TECHNOL CORP 54624 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF APPLIED PHYSICS 4206 16% 0% 91
2 ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY 4192 2% 1% 10
3 JAPANESE JOURNAL OF APPLIED PHYSICS 1492 4% 0% 21
4 APPLIED PHYSICS LETTERS 1440 10% 0% 55
5 ECS SOLID STATE LETTERS 1363 1% 1% 3
6 JOURNAL OF RAMAN SPECTROSCOPY 1344 2% 0% 12
7 JOURNAL OF THE AMERICAN CERAMIC SOCIETY 814 3% 0% 17
8 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 812 2% 0% 11
9 APPLIED SPECTROSCOPY 789 2% 0% 11
10 SOVIET MICROELECTRONICS 727 0% 1% 2

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 PIEZOSPECTROSCOPY 264367 2% 44% 11 Search PIEZOSPECTROSCOPY Search PIEZOSPECTROSCOPY
2 PIEZO SPECTROSCOPY 205634 1% 47% 8 Search PIEZO+SPECTROSCOPY Search PIEZO+SPECTROSCOPY
3 CONCENTRATED STRESS 174795 1% 80% 4 Search CONCENTRATED+STRESS Search CONCENTRATED+STRESS
4 AIR GAP TFTS 109248 0% 100% 2 Search AIR+GAP+TFTS Search AIR+GAP+TFTS
5 PIEZO SPECTROSCOPIC EFFECT 109248 0% 100% 2 Search PIEZO+SPECTROSCOPIC+EFFECT Search PIEZO+SPECTROSCOPIC+EFFECT
6 MEASURED STRESS 72830 0% 67% 2 Search MEASURED+STRESS Search MEASURED+STRESS
7 4H SIC METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR MOSFET 54624 0% 100% 1 Search 4H+SIC+METAL+OXIDE+SEMICONDUCTOR+FIELD+EFFECT+TRANSISTOR+MOSFET Search 4H+SIC+METAL+OXIDE+SEMICONDUCTOR+FIELD+EFFECT+TRANSISTOR+MOSFET
8 ALUMINA NANOCOMPOSITES 54624 0% 100% 1 Search ALUMINA+NANOCOMPOSITES Search ALUMINA+NANOCOMPOSITES
9 BALL ON RING JIG 54624 0% 100% 1 Search BALL+ON+RING+JIG Search BALL+ON+RING+JIG
10 CHANNEL STRAIN 54624 0% 100% 1 Search CHANNEL+STRAIN Search CHANNEL+STRAIN

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 KOSEMURA, D , TOMITA, M , USUDA, K , OGURA, A , (2012) EVALUATION OF ANISOTROPIC STRAIN RELAXATION IN STRAINED SILICON-ON-INSULATOR NANOSTRUCTURE BY OIL-IMMERSION RAMAN SPECTROSCOPY.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 51. ISSUE 2. P. - 28 68% 5
2 NDONG, G , PICARDI, G , LICITRA, C , ROUCHON, D , EYMERY, J , OSSIKOVSKI, R , (2013) DETERMINATION OF THE BIAXIAL STRESS IN STRAINED SILICON NANO-STRIPES THROUGH POLARIZED OBLIQUE INCIDENCE RAMAN SPECTROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 114. ISSUE 16. P. - 22 81% 1
3 TOMITA, M , NAGASAKA, M , KOSEMURA, D , USUDA, K , TEZUKA, T , OGURA, A , (2013) TENSOR EVALUATION OF ANISOTROPIC STRESS RELAXATION IN MESA-SHAPED SIGE LAYER ON SI SUBSTRATE BY ELECTRON BACK-SCATTERING PATTERN MEASUREMENT: COMPARISON BETWEEN RAMAN MEASUREMENT AND FINITE ELEMENT METHOD SIMULATION.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 52. ISSUE 4. P. - 22 73% 0
4 PEZZOTTI, G , ZHU, WL , (2015) RESOLVING STRESS TENSOR COMPONENTS IN SPACE FROM POLARIZED RAMAN SPECTRA: POLYCRYSTALLINE ALUMINA.PHYSICAL CHEMISTRY CHEMICAL PHYSICS. VOL. 17. ISSUE 4. P. 2608 -2627 21 66% 5
5 KOSEMURA, D , OGURA, A , (2011) QUANTITATIVE ANALYSIS OF STRESS RELAXATION IN TRANSMISSION ELECTRON MICROSCOPY SAMPLES BY RAMAN SPECTROSCOPY WITH A HIGH-NUMERICAL APERTURE LENS.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 50. ISSUE 4. P. - 18 90% 4
6 POBORCHII, V , TADA, T , USUDA, K , KANAYAMA, T , (2011) POLARIZED RAMAN MICROSCOPY OF ANISOTROPIC STRESS RELAXATION IN STRAINED-SI-ON-INSULATOR STRIPES.APPLIED PHYSICS LETTERS. VOL. 99. ISSUE 19. P. - 14 100% 7
7 ZHU, WL , PEZZOTTI, G , (2011) PHONON DEFORMATION POTENTIALS FOR THE CORUNDUM STRUCTURE OF SAPPHIRE.JOURNAL OF RAMAN SPECTROSCOPY. VOL. 42. ISSUE 11. P. 2015-2025 20 67% 6
8 MYERS, GA , MICHAELS, CA , COOK, RF , (2016) QUANTITATIVE MAPPING OF STRESS HETEROGENEITY IN POLYCRYSTALLINE ALUMINA USING HYPERSPECTRAL FLUORESCENCE MICROSCOPY.ACTA MATERIALIA. VOL. 106. ISSUE . P. 272 -282 23 47% 0
9 OGURA, A , KOSEMURA, D , TAKEI, M , UCHIDA, H , HATTORI, N , YOSHIMARU, M , MAYUZUMI, S , WAKABAYASHI, H , (2009) EVALUATION OF LOCAL STRAIN IN SI USING UV-RAMAN SPECTROSCOPY.MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS. VOL. 159-60. ISSUE . P. 206-211 16 76% 7
10 KOSEMURA, D , YAMAMOTO, S , TAKEUCHI, K , USUDA, K , OGURA, A , (2016) EXAMINATION OF PHONON DEFORMATION POTENTIALS FOR ACCURATE STRAIN MEASUREMENTS IN SILICON-GERMANIUM ALLOYS WITH THE WHOLE COMPOSITION RANGE BY RAMAN SPECTROSCOPY.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 55. ISSUE 2. P. - 21 49% 0

Classes with closest relation at Level 1


Rank Class id link
1 23664 007 MICROMETER TECHNOLOGIES//05 MICROMETER TECHNOLOGIES//5 LAYERS OF METAL
2 29202 CEA SPE OMETRIE PHYS//ATMEL ROUSSET//CMOS DEV
3 3619 SIGE//STRAINED SI//SILICON NANOSCI
4 12428 CONVERGENT BEAM ELECTRON DIFFRACTION//CBED//LATTICE PARAMETER DETERMINATION
5 23618 DISCRETE CRACK MODELS//OPT FILMS MAT//AEM GRP
6 13380 ARCHITECTURE TECH//3 DIMENSIONAL INTEGRATION//ELECTRON DEVICE LETTERS
7 3722 STRAINED SI//MOSFET//BALLISTIC TRANSPORT
8 34788 CERIUM MAGNETOPLUMBITE//EDS SPECTRA//ENAMEL INSERT RESTORATION
9 37148 SINTERED CARBIDES//COMPOSITE CASTS//EXTENDED FOCAL IMAGING
10 13851 TIP ENHANCED RAMAN SPECTROSCOPY//TERS//TIP ENHANCED RAMAN SPECTROSCOPY TERS

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