Class information for:
Level 1: CERIUM MAGNETOPLUMBITE//EDS SPECTRA//ENAMEL INSERT RESTORATION

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
34788 106 18.2 36%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
474 2             FLASH MEMORY//SONOS//NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI 15884
34788 1                   CERIUM MAGNETOPLUMBITE//EDS SPECTRA//ENAMEL INSERT RESTORATION 106

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CERIUM MAGNETOPLUMBITE authKW 288072 1% 100% 1
2 EDS SPECTRA authKW 288072 1% 100% 1
3 ENAMEL INSERT RESTORATION authKW 288072 1% 100% 1
4 ENAMEL PATCH RESTORATION authKW 288072 1% 100% 1
5 HOT REPAIR authKW 288072 1% 100% 1
6 J PAUL GETTY MUSEUM authKW 288072 1% 100% 1
7 LEONARD LIMOSIN authKW 288072 1% 100% 1
8 LIMOGES PAINTED ENAMEL INVESTIGATION authKW 288072 1% 100% 1
9 LIQUID BRIGHT GOLD authKW 288072 1% 100% 1
10 NICKEL OXIDE 8YTTRIA STABILIZED ZIRCONIA authKW 288072 1% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 929 59% 0% 63
2 Materials Science, Coatings & Films 862 21% 0% 22
3 Physics, Condensed Matter 265 27% 0% 29
4 Materials Science, Multidisciplinary 163 29% 0% 31
5 Electrochemistry 144 10% 0% 11
6 Engineering, Electrical & Electronic 78 18% 0% 19
7 Art 46 2% 0% 2
8 Nanoscience & Nanotechnology 30 7% 0% 7
9 Optics 16 7% 0% 7
10 Chemistry, Physical 9 9% 0% 10

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CHARACTERISAT NANOELECT STRUCT 144035 1% 50% 1
2 CHARACTERIZAT NANOELECT STRUCT 144035 1% 50% 1
3 ELE OCHEM ENERGY SOURCES 96021 2% 17% 2
4 UMR CNRS 171 57613 1% 20% 1
5 TECHNOL ENGN IND MANAGEMENT 32006 1% 11% 1
6 MICROTECHNOL CHALMERS MC2 16944 1% 6% 1
7 NASU 13716 1% 5% 1
8 MICROELECT ED 7784 1% 3% 1
9 RECH TAURAT 4571 1% 2% 1
10 CNRS UMR 7635 3599 1% 1% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 BULLETIN OF THE CLEVELAND MUSEUM OF ART 6000 1% 2% 1
2 GOLD BULLETIN 2746 2% 0% 2
3 OPTO-ELECTRONICS REVIEW 1415 2% 0% 2
4 JOURNAL OF THE ELECTROCHEMICAL SOCIETY 1153 10% 0% 11
5 OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS 1007 3% 0% 3
6 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY 972 2% 0% 2
7 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 908 8% 0% 8
8 JOURNAL OF APPLIED PHYSICS 869 17% 0% 18
9 SOLID-STATE ELECTRONICS 725 5% 0% 5
10 MICROELECTRONICS RELIABILITY 660 4% 0% 4

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 CERIUM MAGNETOPLUMBITE 288072 1% 100% 1 Search CERIUM+MAGNETOPLUMBITE Search CERIUM+MAGNETOPLUMBITE
2 EDS SPECTRA 288072 1% 100% 1 Search EDS+SPECTRA Search EDS+SPECTRA
3 ENAMEL INSERT RESTORATION 288072 1% 100% 1 Search ENAMEL+INSERT+RESTORATION Search ENAMEL+INSERT+RESTORATION
4 ENAMEL PATCH RESTORATION 288072 1% 100% 1 Search ENAMEL+PATCH+RESTORATION Search ENAMEL+PATCH+RESTORATION
5 HOT REPAIR 288072 1% 100% 1 Search HOT+REPAIR Search HOT+REPAIR
6 J PAUL GETTY MUSEUM 288072 1% 100% 1 Search J+PAUL+GETTY+MUSEUM Search J+PAUL+GETTY+MUSEUM
7 LEONARD LIMOSIN 288072 1% 100% 1 Search LEONARD+LIMOSIN Search LEONARD+LIMOSIN
8 LIMOGES PAINTED ENAMEL INVESTIGATION 288072 1% 100% 1 Search LIMOGES+PAINTED+ENAMEL+INVESTIGATION Search LIMOGES+PAINTED+ENAMEL+INVESTIGATION
9 LIQUID BRIGHT GOLD 288072 1% 100% 1 Search LIQUID+BRIGHT+GOLD Search LIQUID+BRIGHT+GOLD
10 NICKEL OXIDE 8YTTRIA STABILIZED ZIRCONIA 288072 1% 100% 1 Search NICKEL+OXIDE+8YTTRIA+STABILIZED+ZIRCONIA Search NICKEL+OXIDE+8YTTRIA+STABILIZED+ZIRCONIA

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 PISKORSKI, K , PRZEWLOCKI, HM , ESTEVE, R , BAKOWSKI, M , (2013) DISTRIBUTIONS OF ELECTRIC PARAMETERS IN MOS STRUCTURES ON 3C-SIC SUBSTRATE.CENTRAL EUROPEAN JOURNAL OF PHYSICS. VOL. 11. ISSUE 2. P. 231 -238 8 57% 0
2 DADABHAI, F , GASPARI, F , ZUKOTYNSKI, S , BLAND, C , (1996) REDUCTION OF SILICON DIOXIDE BY ALUMINUM IN METAL-OXIDE-SEMICONDUCTOR STRUCTURES.JOURNAL OF APPLIED PHYSICS. VOL. 80. ISSUE 11. P. 6505-6509 9 82% 11
3 PRZEWLOCKI, HM , (2016) PHOTOELECTRIC PHENOMENA AND PHOTOELECTRIC CHARACTERIZATION METHODS OF THE MOS SYSTEM. BASICS AND NEW DEVELOPMENTS.JOURNAL OF NANO RESEARCH. VOL. 39. ISSUE . P. 69 -+ 5 83% 0
4 BOROWICZ, L , KUDLA, A , MACHALICA, P , NIEMIEC, M , (2002) SOURCES OF ULTRAVIOLET LIGHT AND SYSTEMS FOR ITS SHAPING FOR PHOTOELECTRICAL INVESTIGATION OF SEMICONDUCTOR STRUCTURES.OPTO-ELECTRONICS REVIEW. VOL. 10. ISSUE 2. P. 145-150 4 100% 0
5 PRZEWLOCKI, HM , (2001) THEORY AND APPLICATIONS OF INTERNAL PHOTOEMISSION IN THE MOS SYSTEM AT LOW ELECTRIC FIELDS.SOLID-STATE ELECTRONICS. VOL. 45. ISSUE 8. P. 1241 -1250 4 100% 15
6 POREBSKI, S , MACHALICA, P , ZAJAC, J , BOROWICZ, L , KUDLA, A , PRZEWLOCKI, HM , (2003) UNIVERSAL SYSTEM FOR PHOTOELECTRIC CHARACTERISATION OF SEMICONDUCTOR STRUCTURES.IEE PROCEEDINGS-SCIENCE MEASUREMENT AND TECHNOLOGY. VOL. 150. ISSUE 4. P. 148 -152 4 80% 6
7 ZENG, LJ , GREIBE, T , NIK, S , WILSON, CM , DELSING, P , OLSSON, E , (2013) NANOSCALE INTERACTION LAYER AT THE INTERFACE BETWEEN AL FILMS AND SIO2 SUBSTRATES OF AL/ALOX/AL JOSEPHSON TUNNEL JUNCTIONS.JOURNAL OF APPLIED PHYSICS. VOL. 113. ISSUE 14. P. - 8 31% 1
8 ANANDAN, C , (1995) X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF ROOM-TEMPERATURE EVOLUTION OF OXIDE-COVERED HYDROGENATED AMORPHOUS-SILICON ALUMINUM INTERFACE.APPLIED SURFACE SCIENCE. VOL. 89. ISSUE 1. P. 57-61 6 60% 8
9 MIURA, Y , HIROSE, K , (1995) DIRECT OBSERVATION OF A THIN REACTED LAYER BURIED AT AL/SIO2 INTERFACES.JOURNAL OF APPLIED PHYSICS. VOL. 77. ISSUE 7. P. 3554-3556 5 71% 7
10 PRZEWLOCKI, HM , (1999) INTERNAL PHOTOEMISSION CHARACTERISTICS OF METAL-INSULATOR-SEMICONDUCTOR STRUCTURES AT LOW ELECTRIC FIELDS IN THE INSULATOR.JOURNAL OF APPLIED PHYSICS. VOL. 85. ISSUE 9. P. 6610 -6618 3 100% 7

Classes with closest relation at Level 1


Rank Class id link
1 19608 SI SIO2//GE INSULATOR STRUCTURE//MICROWAVE TRANSIENT PHOTOCONDUCTIVITY
2 37707 MIAB WELDING//CATEDRA ROBOT SI SUDARE//MAGNETICALLY IMPELLED ARC BUTT MIAB WELDING
3 28032 MIS TUNNEL DIODE//ANODIC OXIDE ANO//COMPOSED CAPACITOR
4 24872 DEVICE FUNCT SECT//DIFFUSION TEMPERATURE//MIS SOLAR CELLS
5 32348 EFFECTIVE MEDIUM ANALYSIS EMA//ETCH RATE PROFILE//ETCH RATE PROFILING
6 2603 STRESS INDUCED LEAKAGE CURRENT//OXIDE RELIABILITY//SOFT BREAKDOWN
7 31157 DIFFERENT TYPES OF CARBON CONTAMINATION//FUNCTIONALLY GRADED NANOSTRUCTURED MATERIALS//INVEST ESTUD AVANZADOS FIS
8 3635 SI OXIDATION//SILICON OXIDATION//SIO2 SI INTERFACE
9 30502 AU NI50FE50//ATOMICALLY FLAT GOLD//ATOMICALLY SMOOTH GOLD
10 24432 DIMETHYLALUMINUM HYDRIDE//DIMETHYLALUMINUMHYDRIDE DMAH//SELECTIVE AL CVD

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