Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
29202 | 191 | 15.1 | 70% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | CEA SPE OMETRIE PHYS | address | 213161 | 1% | 67% | 2 |
2 | ATMEL ROUSSET | address | 159871 | 1% | 100% | 1 |
3 | CMOS DEV | address | 159871 | 1% | 100% | 1 |
4 | DEP ISEN | address | 159871 | 1% | 100% | 1 |
5 | DWBA SECOND ORDER | authKW | 159871 | 1% | 100% | 1 |
6 | EPITAXIAL MULTILAYERED GRATINGS | authKW | 159871 | 1% | 100% | 1 |
7 | GAAS GA086IN014AS GAAS | authKW | 159871 | 1% | 100% | 1 |
8 | JOINT GRP MICROSTRUCT SEMICOND 2 6 | address | 159871 | 1% | 100% | 1 |
9 | LA CNRS 250 | address | 159871 | 1% | 100% | 1 |
10 | MAGNETOCONDUCTANCE IN SUBMICRON WIRES | authKW | 159871 | 1% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 1688 | 60% | 0% | 114 |
2 | Physics, Condensed Matter | 875 | 36% | 0% | 69 |
3 | Crystallography | 207 | 9% | 0% | 18 |
4 | Materials Science, Multidisciplinary | 140 | 21% | 0% | 41 |
5 | Nanoscience & Nanotechnology | 139 | 10% | 0% | 19 |
6 | Materials Science, Coatings & Films | 105 | 6% | 0% | 11 |
7 | Engineering, Electrical & Electronic | 86 | 15% | 0% | 28 |
8 | Materials Science, Characterization, Testing | 10 | 1% | 0% | 2 |
9 | Optics | 8 | 4% | 0% | 8 |
10 | Physics, Multidisciplinary | 5 | 4% | 0% | 8 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | CEA SPE OMETRIE PHYS | 213161 | 1% | 67% | 2 |
2 | ATMEL ROUSSET | 159871 | 1% | 100% | 1 |
3 | CMOS DEV | 159871 | 1% | 100% | 1 |
4 | DEP ISEN | 159871 | 1% | 100% | 1 |
5 | JOINT GRP MICROSTRUCT SEMICOND 2 6 | 159871 | 1% | 100% | 1 |
6 | LA CNRS 250 | 159871 | 1% | 100% | 1 |
7 | PROBLEMS COMPREHENS UTILIZAT UNDERGROUND | 159871 | 1% | 100% | 1 |
8 | FRAUNHOFER ZERSTORUNGSFREIE PRUFVERFAHREN | 84633 | 2% | 18% | 3 |
9 | GRP MICROSTRUCT SEMICOND 2 6 | 79935 | 1% | 50% | 1 |
10 | PASTIS CNRSM | 79935 | 1% | 50% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1280 | 7% | 0% | 13 |
2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1149 | 6% | 0% | 11 |
3 | IEEE CIRCUITS AND DEVICES MAGAZINE | 1140 | 1% | 1% | 1 |
4 | APPLIED PHYSICS LETTERS | 1119 | 15% | 0% | 28 |
5 | RUSSIAN ULTRASONICS | 991 | 1% | 1% | 1 |
6 | MICRO | 906 | 1% | 1% | 1 |
7 | PISMA V ZHURNAL TEKHNICHESKOI FIZIKI | 788 | 3% | 0% | 5 |
8 | JOURNAL OF CRYSTAL GROWTH | 726 | 6% | 0% | 12 |
9 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 494 | 3% | 0% | 5 |
10 | PHYSICAL REVIEW B | 361 | 10% | 0% | 20 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | DWBA SECOND ORDER | 159871 | 1% | 100% | 1 | Search DWBA+SECOND+ORDER | Search DWBA+SECOND+ORDER |
2 | EPITAXIAL MULTILAYERED GRATINGS | 159871 | 1% | 100% | 1 | Search EPITAXIAL+MULTILAYERED+GRATINGS | Search EPITAXIAL+MULTILAYERED+GRATINGS |
3 | GAAS GA086IN014AS GAAS | 159871 | 1% | 100% | 1 | Search GAAS+GA086IN014AS+GAAS | Search GAAS+GA086IN014AS+GAAS |
4 | MAGNETOCONDUCTANCE IN SUBMICRON WIRES | 159871 | 1% | 100% | 1 | Search MAGNETOCONDUCTANCE+IN+SUBMICRON+WIRES | Search MAGNETOCONDUCTANCE+IN+SUBMICRON+WIRES |
5 | MBE GROWN CDTE IN | 159871 | 1% | 100% | 1 | Search MBE+GROWN+CDTE+IN | Search MBE+GROWN+CDTE+IN |
6 | PHONON ASSISTED RELAXATION | 159871 | 1% | 100% | 1 | Search PHONON+ASSISTED+RELAXATION | Search PHONON+ASSISTED+RELAXATION |
7 | QUANTUM WIRES AND FILMS | 159871 | 1% | 100% | 1 | Search QUANTUM+WIRES+AND+FILMS | Search QUANTUM+WIRES+AND+FILMS |
8 | SCH LASER DIODE | 159871 | 1% | 100% | 1 | Search SCH+LASER+DIODE | Search SCH+LASER+DIODE |
9 | ZINC MANGANESE TELLURIDE | 159871 | 1% | 100% | 1 | Search ZINC+MANGANESE+TELLURIDE | Search ZINC+MANGANESE+TELLURIDE |
10 | ZN CDSE ZNSE | 159871 | 1% | 100% | 1 | Search ZN+CDSE+ZNSE | Search ZN+CDSE+ZNSE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | BAUMBACH, T , LUBBERT, D , GAILHANOU, M , (2000) STRAIN AND SHAPE ANALYSIS OF MULTILAYER SURFACE GRATINGS BY COPLANAR AND BY GRAZING-INCIDENCE X-RAY DIFFRACTION.JOURNAL OF APPLIED PHYSICS. VOL. 87. ISSUE 8. P. 3744-3758 | 25 | 51% | 18 |
2 | BAUMBACH, T , LUBBERT, D , (1999) GRAZING INCIDENCE DIFFRACTION BY LATERALLY PATTERNED SEMICONDUCTOR NANOSTRUCTURES.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 32. ISSUE 6. P. 726-740 | 21 | 62% | 15 |
3 | MAKINO, H , FUKUSHI, H , YAO, T , (2002) OPTICAL CHARACTERIZATION OF ZNSE-BASED QUANTUM STRUCTURES FABRICATED BY CH4/H-2 REACTIVE ION ETCHING.PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS. VOL. 229. ISSUE 1. P. 567-571 | 10 | 100% | 0 |
4 | TAPFER, L , DE CARO, L , ZHUANG, Y , SCIACOVELLI, P , SACCHETTI, A , (1998) X-RAY SCATTERING STUDY OF QUANTUM WIRES AND LATERAL PERIODIC HETEROSTRUCTURES.THIN SOLID FILMS. VOL. 319. ISSUE 1-2. P. 49-56 | 15 | 71% | 6 |
5 | BAUMBACH, GT , LUBBERT, D , GAILHANOU, M , (1999) X-RAY STRUCTURE INVESTIGATION OF LATERAL SURFACE NANOSTRUCTURES - A FULL QUANTITATIVE ANALYSIS OF NON-UNIFORM LATTICE STRAIN.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 32. ISSUE 10A. P. A208-A211 | 10 | 100% | 9 |
6 | ZHUANG, Y , HOLY, V , STANGL, J , DARHUBER, AA , MIKULIK, P , ZERLAUTH, S , SCHAFFLER, F , BAUER, G , DAROWSKI, N , LUBBERT, D , ET AL (1999) STRAIN RELAXATION IN PERIODIC ARRAYS OF SI SIGE QUANTUM WIRES DETERMINED BY COPLANAR HIGH-RESOLUTION X-RAY DIFFRACTION AND GRAZING INCIDENCE DIFFRACTION.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 32. ISSUE 10A. P. A224-A229 | 11 | 92% | 3 |
7 | TAPFER, L , SCIACOVELLI, P , DECARO, L , (1995) DOUBLE-CRYSTAL AND TRIPLE-CRYSTAL X-RAY-DIFFRACTION ANALYSIS OF SEMICONDUCTOR QUANTUM WIRES.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 28. ISSUE 4A. P. A179 -A183 | 14 | 82% | 5 |
8 | KAGANER, VM , JENICHEN, B , PARIS, G , PLOOG, KH , KONOVALOV, O , MIKULIK, P , ARAI, S , (2002) STRAIN IN BURIED QUANTUM WIRES: ANALYTICAL CALCULATIONS AND X-RAY DIFFRACTION STUDY.PHYSICAL REVIEW B. VOL. 66. ISSUE 3. P. - | 14 | 64% | 11 |
9 | ULYANENKOV, A , DAROWSKI, N , GRENZER, J , PIETSCH, U , WANG, KH , FORCHEL, A , (1999) EVALUATION OF STRAIN DISTRIBUTION IN FREESTANDING AND BURIED LATERAL NANOSTRUCTURES.PHYSICAL REVIEW B. VOL. 60. ISSUE 24. P. 16701 -16714 | 15 | 60% | 7 |
10 | TAKEUCHI, T , TATSUMURA, K , OHDOMARI, I , SHIMURA, T , NAGASE, M , (2011) X-RAY DIFFRACTION PROFILES OF SI NANOWIRES WITH TRAPEZOIDAL CROSS-SECTIONS.PHYSICA B-CONDENSED MATTER. VOL. 406. ISSUE 13. P. 2559 -2564 | 8 | 80% | 0 |
Classes with closest relation at Level 1 |