Class information for:
Level 2: AC SURFACE PHOTOVOLTAGE//TECH M PUPIN//SCANNING PHOTON MICROSCOPE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
3874 868 18.7 50%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
3874 2             AC SURFACE PHOTOVOLTAGE//TECH M PUPIN//SCANNING PHOTON MICROSCOPE 868
18384 1                   AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//VIBRATING CAPACITOR 554
30707 1                   TECH M PUPIN//TECH M PUPIN ZRENJANIN//CDS HGS CDS SPHERICAL NANOMETER SYSTEM 164
31635 1                   2D BIFURCATIONS//QUANTUM TUNNELING WITH DISSIPATION//EDUC SCANNING PROBE MICROSCOPY 150

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 AC SURFACE PHOTOVOLTAGE authKW 459651 2% 93% 14
2 TECH M PUPIN address 299763 2% 61% 14
3 SCANNING PHOTON MICROSCOPE authKW 215461 1% 88% 7
4 TECH M PUPIN ZRENJANIN address 156695 1% 64% 7
5 VIBRATING CAPACITOR authKW 143636 1% 58% 7
6 RCA RINSE authKW 140710 0% 100% 4
7 OXIDE CHARGE authKW 118881 1% 26% 13
8 AC PHOTOVOLTAIC METHOD authKW 105533 0% 100% 3
9 CDS HGS CDS SPHERICAL NANOMETER SYSTEM authKW 105533 0% 100% 3
10 RCA SOLUTION authKW 105533 0% 100% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 3783 43% 0% 373
2 Physics, Condensed Matter 3718 35% 0% 304
3 Materials Science, Coatings & Films 518 6% 0% 52
4 Physics, Multidisciplinary 507 13% 0% 109
5 Materials Science, Multidisciplinary 453 19% 0% 163
6 Engineering, Electrical & Electronic 141 10% 0% 87
7 Instruments & Instrumentation 117 4% 0% 39
8 Nanoscience & Nanotechnology 82 4% 0% 37
9 Electrochemistry 43 3% 0% 22
10 Chemistry, Physical 43 8% 0% 70

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 TECH M PUPIN 299763 2% 61% 14
2 TECH M PUPIN ZRENJANIN 156695 1% 64% 7
3 TECHNOL ZVORNIK 73281 1% 42% 5
4 METASTABLE MAT MFG TECHNOL SCI 70355 0% 100% 2
5 EDUC SCANNING PROBE MICROSCOPY 70351 0% 50% 4
6 ZAVOISKY PHYS TECHNOL 46902 0% 67% 2
7 ADV STUDIES SNECTAR 35178 0% 100% 1
8 ANGEW PHOTOPHY 35178 0% 100% 1
9 CARBON CPDS CONTAINING HETEROATOM 35178 0% 100% 1
10 CHRONOENVIRONNEMENT UMR CNRS 6249 35178 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SEMICONDUCTORS 7895 4% 1% 39
2 TECHNICAL PHYSICS LETTERS 2844 3% 0% 23
3 SOVIET PHYSICS SEMICONDUCTORS-USSR 2748 2% 0% 21
4 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 2672 6% 0% 49
5 JOURNAL OF SURFACE INVESTIGATION 2262 1% 1% 6
6 JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE 2144 2% 0% 14
7 SOVIET MICROELECTRONICS 1875 0% 1% 4
8 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 1736 2% 0% 20
9 MOSCOW UNIVERSITY PHYSICS BULLETIN 1587 1% 1% 6
10 SOLID-STATE ELECTRONICS 1396 2% 0% 20

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 AC SURFACE PHOTOVOLTAGE 459651 2% 93% 14 Search AC+SURFACE+PHOTOVOLTAGE Search AC+SURFACE+PHOTOVOLTAGE
2 SCANNING PHOTON MICROSCOPE 215461 1% 88% 7 Search SCANNING+PHOTON+MICROSCOPE Search SCANNING+PHOTON+MICROSCOPE
3 VIBRATING CAPACITOR 143636 1% 58% 7 Search VIBRATING+CAPACITOR Search VIBRATING+CAPACITOR
4 RCA RINSE 140710 0% 100% 4 Search RCA+RINSE Search RCA+RINSE
5 OXIDE CHARGE 118881 1% 26% 13 Search OXIDE+CHARGE Search OXIDE+CHARGE
6 AC PHOTOVOLTAIC METHOD 105533 0% 100% 3 Search AC+PHOTOVOLTAIC+METHOD Search AC+PHOTOVOLTAIC+METHOD
7 CDS HGS CDS SPHERICAL NANOMETER SYSTEM 105533 0% 100% 3 Search CDS+HGS+CDS+SPHERICAL+NANOMETER+SYSTEM Search CDS+HGS+CDS+SPHERICAL+NANOMETER+SYSTEM
8 RCA SOLUTION 105533 0% 100% 3 Search RCA+SOLUTION Search RCA+SOLUTION
9 VOLUME LIFETIME 105533 0% 100% 3 Search VOLUME+LIFETIME Search VOLUME+LIFETIME
10 SURFACE PHOTOVOLTAGE 105052 3% 11% 27 Search SURFACE+PHOTOVOLTAGE Search SURFACE+PHOTOVOLTAGE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 KRONIK, L , SHAPIRA, Y , (1999) SURFACE PHOTOVOLTAGE PHENOMENA: THEORY, EXPERIMENT, AND APPLICATIONS.SURFACE SCIENCE REPORTS. VOL. 37. ISSUE 1-5. P. 1 -206 142 32% 965
2 SHIMIZU, H , NAGASE, S , IKEDA, M , (2011) ALTERNATING CURRENT SURFACE PHOTOVOLTAGE IN THERMALLY OXIDIZED CHROMIUM-CONTAMINATED N-TYPE SILICON WAFERS.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 104. ISSUE 3. P. 929 -934 26 93% 0
3 SHIMIZU, H , SANADA, Y , (2011) ANOMALOUS OXIDE CHARGE VARIATION IDENTIFIED BY ALTERNATING CURRENT SURFACE PHOTOVOLTAGE METHOD IN CR-AQUEOUS-SOLUTION-RINSED P-TYPE SI(001) WAFERS EXPOSED TO AIR.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 50. ISSUE 11. P. - 20 95% 1
4 SHIMIZU, H , SANADA, Y , (2012) COLLAPSE OF CR(OH)3/N-SI SCHOTTKY BARRIER AND GROWTH OF ATOMIC BRIDGING-TYPE SURFACE PHOTOVOLTAGES IN CR-DEPOSITED N-TYPE SI(001) WAFERS.SURFACE AND INTERFACE ANALYSIS. VOL. 44. ISSUE 8. P. 1035-1038 17 100% 0
5 SHIMIZU, H , SANADA, Y , (2012) TRANSLATION FROM SCHOTTKY BARRIER TO ATOMIC BRIDGING-TYPE SURFACE PHOTOVOLTAGES IN CR-AQUEOUS-SOLUTION-RINSED SI(001) WAFERS.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 51. ISSUE 5. P. - 16 89% 0
6 SHIMIZU, H , OTSUKI, T , (2012) METAL-INDUCED NEGATIVE OXIDE CHARGE DETECTED BY AN ALTERNATING CURRENT SURFACE PHOTOVOLTAGE IN THERMALLY OXIDIZED FE-CONTAMINATED N-TYPE SI (001) WAFERS.THIN SOLID FILMS. VOL. 520. ISSUE 14. P. 4808-4811 14 100% 1
7 SHIMIZU, H , SANADA, Y , (2011) SCHOTTKY-BARRIER-INDUCED AC SURFACE PHOTOVOLTAGES IN AU-PRECIPITATED N-TYPE SI(001) SURFACES.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 50. ISSUE 8. P. - 15 94% 1
8 IVANOV, T , DONCHEV, V , GERMANOVA, K , KIRILOV, K , (2009) A VECTOR MODEL FOR ANALYSING THE SURFACE PHOTOVOLTAGE AMPLITUDE AND PHASE SPECTRA APPLIED TO COMPLICATED NANOSTRUCTURES.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 42. ISSUE 13. P. - 17 74% 19
9 MUNAKATA, C , SHIMIZU, H , (2000) FIXED OXIDE CHARGE IN N-TYPE SILICON WAFERS STUDIED BY AC SURFACE PHOTOVOLTAGE TECHNIQUE.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 15. ISSUE 1. P. 40-43 17 94% 5
10 SHIMIZU, H , SHIN, R , IKEDA, M , (2005) BEHAVIOR OF METAL-INDUCED NEGATIVE OXIDE CHARGES ON THE SURFACE OF N-TYPE SILICON WAFERS USING FREQUENCY-DEPENDENT AC SURFACE PHOTOVOLTAGE MEASUREMENTS.JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS. VOL. 44. ISSUE 6A. P. 3778 -3783 14 93% 12

Classes with closest relation at Level 2


Rank Class id link
1 3149 CLEANROOM//PHOTORESIST REMOVAL//MINIENVIRONMENT
2 3264 SOLAR CELLS//SOLID-STATE ELECTRONICS//OPEN CIRCUIT VOLTAGE DECAY OCVD
3 3804 ELECTRON WORK FUNCTION//REGIONAL DENSITY FUNCTIONAL THEORY//THEORY OF CHEMICAL BOND
4 1998 MULTICRYSTALLINE SILICON//IEEE JOURNAL OF PHOTOVOLTAICS//SOLAR CELLS
5 648 OXYGEN PRECIPITATION//OXYGEN PRECIPITATES//GETTERING
6 1210 GALLIUM ARSENIDE//GAAS//REFLECTANCE ANISOTROPY SPECTROSCOPY
7 4045 MIAB WELDING//SOVIET PHYSICS SEMICONDUCTORS-USSR//STARODUBTSEV PHYSICOTECH
8 583 QUANTUM DOTS//SEMICONDUCTOR QUANTUM DOTS//SELF ASSEMBLED QUANTUM DOTS
9 4090 MAGNET SENSOR//SOVIET PHYSICS SEMICONDUCTORS-USSR//RADIATION RESISTANT HALL SENSORS
10 474 FLASH MEMORY//SONOS//NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI

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