Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 4090 | 589 | 13.6 | 30% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
| 4090 | 2 | MAGNET SENSOR//SOVIET PHYSICS SEMICONDUCTORS-USSR//RADIATION RESISTANT HALL SENSORS | 589 |
| 25556 | 1 | MAGNET SENSOR//RADIATION RESISTANT HALL SENSORS//OBNINSK BRANCH | 278 |
| 31096 | 1 | ALGAAS DIODES//ALGAASSI//P DEGREES REGION | 158 |
| 31409 | 1 | SELF ORGANIZING PROCESSES//INGN OSTEOARTICULAIRE DENTU791//ROLE OF NATIVE OXIDE | 153 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | MAGNET SENSOR | address | 583209 | 3% | 75% | 15 |
| 2 | SOVIET PHYSICS SEMICONDUCTORS-USSR | journal | 195755 | 25% | 3% | 145 |
| 3 | RADIATION RESISTANT HALL SENSORS | authKW | 103683 | 0% | 100% | 2 |
| 4 | SELF ORGANIZING PROCESSES | authKW | 69121 | 0% | 67% | 2 |
| 5 | OBNINSK BRANCH | address | 68913 | 2% | 12% | 11 |
| 6 | ALGAAS DIODES | authKW | 51842 | 0% | 100% | 1 |
| 7 | ALGAASSI | authKW | 51842 | 0% | 100% | 1 |
| 8 | ANNEALING ELECTRICAL ACTIVATION | authKW | 51842 | 0% | 100% | 1 |
| 9 | CONSORTIUM CREATE | address | 51842 | 0% | 100% | 1 |
| 10 | CONTACTLESS ANGULAR POSITION SENSOR | authKW | 51842 | 0% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 7405 | 58% | 0% | 343 |
| 2 | Physics, Applied | 921 | 27% | 0% | 160 |
| 3 | Nuclear Science & Technology | 199 | 6% | 0% | 36 |
| 4 | Physics, Multidisciplinary | 199 | 10% | 0% | 59 |
| 5 | Instruments & Instrumentation | 137 | 6% | 0% | 33 |
| 6 | Materials Science, Multidisciplinary | 75 | 11% | 0% | 67 |
| 7 | Engineering, Electrical & Electronic | 30 | 7% | 0% | 41 |
| 8 | Physics, Nuclear | 28 | 3% | 0% | 17 |
| 9 | Physics, Fluids & Plasmas | 9 | 2% | 0% | 9 |
| 10 | Materials Science, Coatings & Films | 5 | 1% | 0% | 7 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | MAGNET SENSOR | 583209 | 3% | 75% | 15 |
| 2 | OBNINSK BRANCH | 68913 | 2% | 12% | 11 |
| 3 | CONSORTIUM CREATE | 51842 | 0% | 100% | 1 |
| 4 | INGN OSTEOARTICULAIRE DENTU791 | 51842 | 0% | 100% | 1 |
| 5 | LVIV POLITECHN | 51842 | 0% | 100% | 1 |
| 6 | OBNINSK BRANCH STATE | 51842 | 0% | 100% | 1 |
| 7 | PROBLEMS MICROELECT TECHNOL HIGH PURITY | 51842 | 0% | 100% | 1 |
| 8 | PROBLEMS MICROELECT TECHNOL HIGH PURITY MA | 51842 | 0% | 100% | 1 |
| 9 | TEST MAGNET | 51842 | 0% | 100% | 1 |
| 10 | UNITARY FED STATE ENTERPRISE KARPOV PHYS CHE | 51842 | 0% | 100% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 195755 | 25% | 3% | 145 |
| 2 | SEMICONDUCTORS | 42155 | 13% | 1% | 74 |
| 3 | IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII FIZIKA | 6743 | 3% | 1% | 17 |
| 4 | TECHNICAL PHYSICS LETTERS | 5815 | 5% | 0% | 27 |
| 5 | JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 5656 | 1% | 2% | 7 |
| 6 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2764 | 6% | 0% | 33 |
| 7 | PISMA V ZHURNAL TEKHNICHESKOI FIZIKI | 2299 | 3% | 0% | 15 |
| 8 | JOURNAL OF SURFACE INVESTIGATION | 1481 | 1% | 1% | 4 |
| 9 | RADIATION EFFECTS AND DEFECTS IN SOLIDS | 701 | 1% | 0% | 8 |
| 10 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 526 | 1% | 0% | 3 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | BOLSHAKOVA, IA , BOIKO, VM , BRUDNYI, VN , KAMENSKAYA, IV , KOLIN, NG , MAKIDO, EY , MOSKOVETS, TA , MERKURISOV, DI , (2005) THE EFFECT OF NEUTRON IRRADIATION ON THE PROPERTIES OF N-INSB WHISKER MICROCRYSTALS.SEMICONDUCTORS. VOL. 39. ISSUE 7. P. 780-785 | 11 | 92% | 10 |
| 2 | BRUDNYI, VN , BOIKO, VM , KAMENSKAYA, IV , KOLIN, NG , (2004) ELECTRICAL PROPERTIES AND LIMITING POSITION OF THE FERMI LEVEL IN INSB IRRADIATED WITH PROTONS.SEMICONDUCTORS. VOL. 38. ISSUE 7. P. 769-774 | 11 | 79% | 0 |
| 3 | BOLSHAKOVA, I , VASILEVSKII, I , VIERERBL, L , DURAN, I , KOVALYOVA, N , KOVARIK, K , KOST, Y , MAKIDO, O , SENTKERESTIOVA, J , SHTABALYUK, A , ET AL (2013) PROSPECTS OF USING IN-CONTAINING SEMICONDUCTOR MATERIALS IN MAGNETIC FIELD SENSORS FOR THERMONUCLEAR REACTOR MAGNETIC DIAGNOSTICS.IEEE TRANSACTIONS ON MAGNETICS. VOL. 49. ISSUE 1. P. 50-53 | 6 | 100% | 6 |
| 4 | BRUDNYI, VN , (2009) ELECTRONIC PROPERTIES AND PINNING OF THE FERMI LEVEL IN IRRADIATED II-IV-V-2 SEMICONDUCTORS.SEMICONDUCTORS. VOL. 43. ISSUE 9. P. 1146-1154 | 9 | 75% | 4 |
| 5 | BRUDNYI, VN , GRINYAEV, SN , KOLIN, NG , (2003) ELECTRONIC PROPERTIES OF IRRADIATED SEMICONDUCTORS. A MODEL OF THE FERMI LEVEL PINNING.SEMICONDUCTORS. VOL. 37. ISSUE 5. P. 537-545 | 13 | 59% | 8 |
| 6 | KOLIN, NG , MERKURISOV, DI , SOLOV'EV, SP , (2000) ELECTRICAL PROPERTIES OF TRANSMUTATION-DOPED INDIUM PHOSPHIDE.SEMICONDUCTORS. VOL. 34. ISSUE 2. P. 150-154 | 9 | 90% | 1 |
| 7 | LEVSHUNOVA, VL , POKHIL, GP , TETEL'BAUM, DI , CHERNYKH, PN , (2010) STUDY OF THE LONG-RANGE EFFECT BY THE METHOD OF RUTHERFORD BACKSCATTERING WITH ION CHANNELING UNDER LIGHT IRRADIATION OF SILICON.JOURNAL OF SURFACE INVESTIGATION. VOL. 4. ISSUE 3. P. 515-517 | 6 | 100% | 0 |
| 8 | BRUDNYI, VN , VEDERNIKOVA, TV , (2008) ELECTRICAL PROPERTIES OF PROTON-IRRADIATED CDSNAS2.SEMICONDUCTORS. VOL. 42. ISSUE 1. P. 34 -37 | 7 | 88% | 0 |
| 9 | BRUDNYI, VN , GRINYAEV, SN , KOLIN, NG , (2005) THE ELECTRICAL AND OPTICAL PROPERTIES OF INAS IRRADIATED WITH ELECTRONS (SIMILAR TO 2 MEV): THE ENERGY STRUCTURE OF INTRINSIC POINT DEFECTS.SEMICONDUCTORS. VOL. 39. ISSUE 4. P. 385-394 | 10 | 59% | 6 |
| 10 | LEVSHUNOVA, VL , POKHIL, GP , TETEL'BAUM, DI , CHERNYKH, PN , (2010) COMPARATIVE ANALYSIS OF LONG-RANGE EFFECT USING RBS TECHNIQUE AND MICROHARDNESS MEASUREMENTS.JOURNAL OF SURFACE INVESTIGATION. VOL. 4. ISSUE 2. P. 350-352 | 5 | 100% | 0 |
Classes with closest relation at Level 2 |