Class information for:
Level 1: AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//VIBRATING CAPACITOR

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
18384 554 20.0 54%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
3874 2             AC SURFACE PHOTOVOLTAGE//TECH M PUPIN//SCANNING PHOTON MICROSCOPE 868
18384 1                   AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//VIBRATING CAPACITOR 554

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 AC SURFACE PHOTOVOLTAGE authKW 720191 3% 93% 14
2 SCANNING PHOTON MICROSCOPE authKW 337589 1% 88% 7
3 VIBRATING CAPACITOR authKW 225055 1% 58% 7
4 RCA RINSE authKW 220467 1% 100% 4
5 OXIDE CHARGE authKW 186276 2% 26% 13
6 AC PHOTOVOLTAIC METHOD authKW 165350 1% 100% 3
7 RCA SOLUTION authKW 165350 1% 100% 3
8 VOLUME LIFETIME authKW 165350 1% 100% 3
9 SURFACE PHOTOVOLTAGE authKW 164625 5% 11% 27
10 SURFACE VOLTAGE authKW 152625 1% 46% 6

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 4297 56% 0% 311
2 Physics, Condensed Matter 1520 29% 0% 158
3 Materials Science, Coatings & Films 797 9% 0% 50
4 Materials Science, Multidisciplinary 562 25% 0% 136
5 Engineering, Electrical & Electronic 270 15% 0% 84
6 Instruments & Instrumentation 221 7% 0% 39
7 Electrochemistry 87 4% 0% 22
8 Chemistry, Physical 85 11% 0% 63
9 Nanoscience & Nanotechnology 61 5% 0% 25
10 Physics, Multidisciplinary 22 5% 0% 26

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 METASTABLE MAT MFG TECHNOL SCI 110234 0% 100% 2
2 ADV STUDIES SNECTAR 55117 0% 100% 1
3 ANGEW PHOTOPHY 55117 0% 100% 1
4 CARBON CPDS CONTAINING HETEROATOM 55117 0% 100% 1
5 CHRONOENVIRONNEMENT UMR CNRS 6249 55117 0% 100% 1
6 DERMATOL OPHTHALMOL REGENERAT CU 55117 0% 100% 1
7 EUROPEAN ADV STUDIES 55117 0% 100% 1
8 GAL EL 55117 0% 100% 1
9 METASTABLE MAT MANU TURE TECHNOL 55117 0% 100% 1
10 METASTABLE MAT MANU TURE TECHNOL SCI 55117 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 4241 9% 0% 49
2 SOVIET MICROELECTRONICS 2942 1% 1% 4
3 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 2218 3% 0% 18
4 SOLID-STATE ELECTRONICS 2210 4% 0% 20
5 JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS 1567 1% 1% 4
6 REVIEW OF SCIENTIFIC INSTRUMENTS 933 4% 0% 23
7 JOURNAL OF APPLIED PHYSICS 904 8% 0% 43
8 JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS 856 1% 0% 6
9 JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS 642 2% 0% 12
10 SURFACE SCIENCE 563 3% 0% 17

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 AC SURFACE PHOTOVOLTAGE 720191 3% 93% 14 Search AC+SURFACE+PHOTOVOLTAGE Search AC+SURFACE+PHOTOVOLTAGE
2 SCANNING PHOTON MICROSCOPE 337589 1% 88% 7 Search SCANNING+PHOTON+MICROSCOPE Search SCANNING+PHOTON+MICROSCOPE
3 VIBRATING CAPACITOR 225055 1% 58% 7 Search VIBRATING+CAPACITOR Search VIBRATING+CAPACITOR
4 RCA RINSE 220467 1% 100% 4 Search RCA+RINSE Search RCA+RINSE
5 OXIDE CHARGE 186276 2% 26% 13 Search OXIDE+CHARGE Search OXIDE+CHARGE
6 AC PHOTOVOLTAIC METHOD 165350 1% 100% 3 Search AC+PHOTOVOLTAIC+METHOD Search AC+PHOTOVOLTAIC+METHOD
7 RCA SOLUTION 165350 1% 100% 3 Search RCA+SOLUTION Search RCA+SOLUTION
8 VOLUME LIFETIME 165350 1% 100% 3 Search VOLUME+LIFETIME Search VOLUME+LIFETIME
9 SURFACE PHOTOVOLTAGE 164625 5% 11% 27 Search SURFACE+PHOTOVOLTAGE Search SURFACE+PHOTOVOLTAGE
10 SURFACE VOLTAGE 152625 1% 46% 6 Search SURFACE+VOLTAGE Search SURFACE+VOLTAGE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 KRONIK, L , SHAPIRA, Y , (1999) SURFACE PHOTOVOLTAGE PHENOMENA: THEORY, EXPERIMENT, AND APPLICATIONS.SURFACE SCIENCE REPORTS. VOL. 37. ISSUE 1-5. P. 1 -206 133 30% 965
2 SHIMIZU, H , NAGASE, S , IKEDA, M , (2011) ALTERNATING CURRENT SURFACE PHOTOVOLTAGE IN THERMALLY OXIDIZED CHROMIUM-CONTAMINATED N-TYPE SILICON WAFERS.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 104. ISSUE 3. P. 929 -934 26 93% 0
3 SHIMIZU, H , SANADA, Y , (2011) ANOMALOUS OXIDE CHARGE VARIATION IDENTIFIED BY ALTERNATING CURRENT SURFACE PHOTOVOLTAGE METHOD IN CR-AQUEOUS-SOLUTION-RINSED P-TYPE SI(001) WAFERS EXPOSED TO AIR.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 50. ISSUE 11. P. - 20 95% 1
4 SHIMIZU, H , SANADA, Y , (2012) COLLAPSE OF CR(OH)3/N-SI SCHOTTKY BARRIER AND GROWTH OF ATOMIC BRIDGING-TYPE SURFACE PHOTOVOLTAGES IN CR-DEPOSITED N-TYPE SI(001) WAFERS.SURFACE AND INTERFACE ANALYSIS. VOL. 44. ISSUE 8. P. 1035-1038 17 100% 0
5 SHIMIZU, H , SANADA, Y , (2012) TRANSLATION FROM SCHOTTKY BARRIER TO ATOMIC BRIDGING-TYPE SURFACE PHOTOVOLTAGES IN CR-AQUEOUS-SOLUTION-RINSED SI(001) WAFERS.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 51. ISSUE 5. P. - 16 89% 0
6 SHIMIZU, H , OTSUKI, T , (2012) METAL-INDUCED NEGATIVE OXIDE CHARGE DETECTED BY AN ALTERNATING CURRENT SURFACE PHOTOVOLTAGE IN THERMALLY OXIDIZED FE-CONTAMINATED N-TYPE SI (001) WAFERS.THIN SOLID FILMS. VOL. 520. ISSUE 14. P. 4808-4811 14 100% 1
7 SHIMIZU, H , SANADA, Y , (2011) SCHOTTKY-BARRIER-INDUCED AC SURFACE PHOTOVOLTAGES IN AU-PRECIPITATED N-TYPE SI(001) SURFACES.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 50. ISSUE 8. P. - 15 94% 1
8 IVANOV, T , DONCHEV, V , GERMANOVA, K , KIRILOV, K , (2009) A VECTOR MODEL FOR ANALYSING THE SURFACE PHOTOVOLTAGE AMPLITUDE AND PHASE SPECTRA APPLIED TO COMPLICATED NANOSTRUCTURES.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 42. ISSUE 13. P. - 17 74% 19
9 MUNAKATA, C , SHIMIZU, H , (2000) FIXED OXIDE CHARGE IN N-TYPE SILICON WAFERS STUDIED BY AC SURFACE PHOTOVOLTAGE TECHNIQUE.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 15. ISSUE 1. P. 40-43 17 94% 5
10 SHIMIZU, H , SHIN, R , IKEDA, M , (2005) BEHAVIOR OF METAL-INDUCED NEGATIVE OXIDE CHARGES ON THE SURFACE OF N-TYPE SILICON WAFERS USING FREQUENCY-DEPENDENT AC SURFACE PHOTOVOLTAGE MEASUREMENTS.JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS. VOL. 44. ISSUE 6A. P. 3778 -3783 14 93% 12

Classes with closest relation at Level 1


Rank Class id link
1 31635 2D BIFURCATIONS//QUANTUM TUNNELING WITH DISSIPATION//EDUC SCANNING PROBE MICROSCOPY
2 22804 LIQUID CRYSTAL PROPERTY//PORPHYRIN LIQUID CRYSTAL//SURFACE PHOTOELECTRIC PROPERTY
3 20489 PN JUNCTION LEAKAGE//IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE
4 10286 KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY//SCI CRYSTAL PHYS
5 37478 DEFECT ELECTRON STATES//DELOCALIZED TRAP//FOURIER TRANSFORM UV VIS REGION
6 4246 GETTERING//DLTS//GETTERING EFFICIENCY
7 8494 HYDROGEN TERMINATION//NATIVE OXIDE//HYDRIDE SPECIES
8 24872 DEVICE FUNCT SECT//DIFFUSION TEMPERATURE//MIS SOLAR CELLS
9 10911 PHOTOREFLECTANCE//FRANZ KELDYSH OSCILLATIONS//NEW YORK STATE ADV TECHNOL ULTRAFAST PHOTON M
10 37253 NON ADIABATIC DISSIPATIVE DYNAMICS//ATOM POLYATOMIC//CASCADE THERMALIZATION

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