Class information for:
Level 2: SCANNING//BACKSCATTERED ELECTRONS//MICROSCOPY

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
2587 3648 20.8 44%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
2587 2             SCANNING//BACKSCATTERED ELECTRONS//MICROSCOPY 3648
9414 1                   MEAN PENETRATION DEPTH//ELECTRON PROBE MICROANALYSIS//STANDARDLESS ANALYSIS 1157
13441 1                   LAMACOP//SECONDARY ELECTRON EMISSION//SECONDARY ELECTRON YIELD 836
14404 1                   BACKSCATTERED ELECTRONS//DOPANT CONTRAST//SCANNING 771
20271 1                   ENVIRONMENTAL SEM//ESEM//ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE 468
21494 1                   VOLTAGE CONTRAST//E BEAM INSPECTION//ELECTRON BEAM TESTING 416

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SCANNING journal 468968 8% 18% 308
2 BACKSCATTERED ELECTRONS authKW 219873 2% 45% 58
3 MICROSCOPY WoSSC 182735 24% 2% 885
4 LAMACOP address 130190 1% 68% 23
5 ESEM authKW 129903 2% 21% 73
6 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE authKW 126539 1% 46% 33
7 ENVIRONMENTAL SEM authKW 122724 1% 67% 22
8 SECONDARY ELECTRON EMISSION authKW 122064 2% 20% 73
9 SECONDARY ELECTRONS authKW 113977 2% 22% 62
10 VOLTAGE CONTRAST authKW 111819 1% 64% 21

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 182735 24% 2% 885
2 Instruments & Instrumentation 9448 17% 0% 602
3 Physics, Applied 5403 27% 0% 968
4 Spectroscopy 1783 7% 0% 243
5 Nanoscience & Nanotechnology 1623 8% 0% 292
6 Engineering, Electrical & Electronic 1073 12% 0% 454
7 Physics, Multidisciplinary 926 9% 0% 326
8 Nuclear Science & Technology 586 4% 0% 163
9 Optics 500 6% 0% 230
10 Physics, Atomic, Molecular & Chemical 460 6% 0% 209

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 LAMACOP 130190 1% 68% 23
2 POLYMERS OIDS GRP 94109 1% 38% 30
3 FIS ECM 36246 0% 33% 13
4 FU 160 33474 0% 100% 4
5 INTEGRATED CIRCUIT ADV PROC TECHNOL 33474 0% 100% 4
6 SCI RUMENTS 28789 1% 8% 43
7 DTI UMR 6107 25106 0% 100% 3
8 WESTERN AUSTRALIAN MICROSCOPY 25106 0% 100% 3
9 RADIAT PHYS TECHNOL 19649 1% 7% 35
10 UMR CNRS 7614 19517 0% 33% 7

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SCANNING 468968 8% 18% 308
2 MICROSCOPY AND MICROANALYSIS 43540 3% 5% 96
3 X-RAY SPECTROMETRY 32008 2% 4% 89
4 MIKROCHIMICA ACTA 26263 3% 3% 96
5 SCANNING ELECTRON MICROSCOPY 24261 2% 5% 55
6 SCANNING MICROSCOPY 20082 2% 4% 55
7 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 8308 4% 1% 130
8 JOURNAL OF ELECTRON MICROSCOPY 8271 1% 2% 43
9 JOURNAL OF MICROSCOPY-OXFORD 8133 1% 2% 50
10 INSTITUTE OF PHYSICS CONFERENCE SERIES 7600 3% 1% 95

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 BACKSCATTERED ELECTRONS 219873 2% 45% 58 Search BACKSCATTERED+ELECTRONS Search BACKSCATTERED+ELECTRONS
2 ESEM 129903 2% 21% 73 Search ESEM Search ESEM
3 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE 126539 1% 46% 33 Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPE Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPE
4 ENVIRONMENTAL SEM 122724 1% 67% 22 Search ENVIRONMENTAL+SEM Search ENVIRONMENTAL+SEM
5 SECONDARY ELECTRON EMISSION 122064 2% 20% 73 Search SECONDARY+ELECTRON+EMISSION Search SECONDARY+ELECTRON+EMISSION
6 SECONDARY ELECTRONS 113977 2% 22% 62 Search SECONDARY+ELECTRONS Search SECONDARY+ELECTRONS
7 VOLTAGE CONTRAST 111819 1% 64% 21 Search VOLTAGE+CONTRAST Search VOLTAGE+CONTRAST
8 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY 96333 1% 24% 48 Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPY Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPY
9 DOPANT CONTRAST 76076 0% 91% 10 Search DOPANT+CONTRAST Search DOPANT+CONTRAST
10 VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE 67784 0% 90% 9 Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPE Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 LLOVET, X , POWELL, CJ , SALVAT, F , JABLONSKI, A , (2014) CROSS SECTIONS FOR INNER-SHELL IONIZATION BY ELECTRON IMPACT.JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA. VOL. 43. ISSUE 1. P. - 92 68% 26
2 TRINCAVELLI, J , LIMANDRI, S , BONETTO, R , (2014) STANDARDLESS QUANTIFICATION METHODS IN ELECTRON PROBE MICROANALYSIS.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 101. ISSUE . P. 76 -85 55 65% 5
3 THIEL, BL , TOTH, M , (2005) SECONDARY ELECTRON CONTRAST IN LOW-VACUUM/ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY OF DIELECTRICS.JOURNAL OF APPLIED PHYSICS. VOL. 97. ISSUE 5. P. - 55 72% 44
4 CAZAUX, J , (2010) SECONDARY ELECTRON EMISSION AND CHARGING MECHANISMS IN AUGER ELECTRON SPECTROSCOPY AND RELATED E-BEAM TECHNIQUES.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 176. ISSUE 1-3. P. 58 -79 42 79% 29
5 FERNANDEZ-VAREA, JM , JAHNKE, V , MAIDANA, NL , MALAFRONTE, AA , VANIN, VR , (2014) CROSS SECTIONS OF K-SHELL IONIZATION BY ELECTRON IMPACT, MEASURED FROM THRESHOLD TO 100 KEV, FOR AU AND BI.JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS. VOL. 47. ISSUE 15. P. - 34 83% 4
6 ZHU, JJ , AN, Z , LIU, MT , TIAN, LX , (2009) MEASUREMENTS OF THE K-SHELL IONIZATION CROSS SECTIONS OF SI BY 3-25-KEV ELECTRON IMPACT USING THE THICK-TARGET METHOD.PHYSICAL REVIEW A. VOL. 79. ISSUE 5. P. - 40 75% 15
7 FENG, GB , CAO, M , YAN, LP , ZHANG, HB , (2013) COMBINED EFFECTS OF SAMPLE PARAMETERS ON POLYMER CHARGING DUE TO ELECTRON IRRADIATION: A CONTOUR SIMULATION.MICRON. VOL. 52-53. ISSUE . P. 62 -66 31 89% 4
8 ZHAO, JL , AN, Z , ZHU, JJ , TAN, WJ , LIU, MT , (2016) INVESTIGATIONS OF L-SHELL X-RAY PRODUCTION CROSS SECTIONS OF IN AND SN BY LOW-ENERGY ELECTRON IMPACT.JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS. VOL. 49. ISSUE 6. P. - 39 67% 0
9 ZHANG, HB , LI, WQ , CAO, M , (2012) SPACE CHARGE CHARACTERISTICS OF AN INSULATING THIN FILM NEGATIVELY CHARGED BY A LOW-ENERGY ELECTRON BEAM.JOURNAL OF ELECTRON MICROSCOPY. VOL. 61. ISSUE 2. P. 85 -97 32 86% 4
10 LI, WQ , ZHANG, HB , (2010) THE POSITIVE CHARGING EFFECT OF DIELECTRIC FILMS IRRADIATED BY A FOCUSED ELECTRON BEAM.APPLIED SURFACE SCIENCE. VOL. 256. ISSUE 11. P. 3482 -3492 32 86% 17

Classes with closest relation at Level 2


Rank Class id link
1 2316 SURFACE AND INTERFACE ANALYSIS//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA//SURFACE EXCITATION
2 3221 SCANDATE CATHODE//DISPENSER CATHODE//IMPREGNATED CATHODES
3 2138 FLUORESCENCE YIELD//X RAY PRODUCTION CROSS SECTION//NUCL SCI S
4 720 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//CHEMICALLY AMPLIFIED RESIST//JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY
5 725 ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY
6 2724 ATOMIC OXYGEN//SPACECRAFT CHARGING//JOURNAL OF SPACECRAFT AND ROCKETS
7 2170 POSITRON ANNIHILATION//POSITRONIUM//FREE VOLUME
8 1138 IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION//PARTIAL DISCHARGE//IEEE TRANSACTIONS ON ELECTRICAL INSULATION
9 1283 X RAY OPTICS//X RAY MICROSCOPY//ZONE PLATE
10 2029 ANTIGEN RETRIEVAL//IN VIVO CRYOTECHNIQUE//AVTOMATIKA

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