Class information for:
Level 2: X RAY OPTICS//X RAY MICROSCOPY//ZONE PLATE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
1283 8701 21.4 59%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
277 3       NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//JOURNAL OF SYNCHROTRON RADIATION//NUCLEAR SCIENCE & TECHNOLOGY 43290
1283 2             X RAY OPTICS//X RAY MICROSCOPY//ZONE PLATE 8701
2805 1                   MULTILAYER MIRROR//PRECIS OPT ENGN//MULTILAYERS 2144
7837 1                   X RAY OPTICS//ZONE PLATE//X RAY MICROSCOPY 1322
9340 1                   POLYCAPILLARY OPTICS//CAPILLARY OPTICS//POLYCAPILLARY X RAY OPTICS 1165
11037 1                   PHOTOEMISSION MICROSCOPY//SPECTROMICROSCOPY//XPEEM 1013
12923 1                   GAS PUFF TARGET//EUV SOURCE//LASER PRODUCED PLASMA 872
13165 1                   GASSENDI//VARIED LINE SPACING GRATING//SPHERICAL GRATING MONOCHROMATOR 857
16800 1                   STXM//X RAY MICROSCOPY//BIMR 635
24217 1                   X RAY TELESCOPE//ELECTROFORMED OPTICS//SPACE VEHICLES INSTRUMENTATION DETECTORS 319
30199 1                   TRANSMISSION GRATING//FREESTANDING TRANSMISSION GRATING//HIGH TEMP HIGH DENS PLASMA PHYS 172
33607 1                   EBIT IL//PHOTON IRRADIATION EFFECTS//MOVING COIL ACTUATOR 122
36467 1                   MICRO PORE OPTICS//GE MONOCHROMATOR//LOBSTER EYE OPTICS 80

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 X RAY OPTICS authKW 295690 2% 43% 197
2 X RAY MICROSCOPY authKW 243724 2% 44% 158
3 ZONE PLATE authKW 148277 1% 56% 75
4 MULTILAYER MIRROR authKW 114504 1% 56% 58
5 SOFT X RAY authKW 109639 2% 24% 131
6 XRAY OPT address 107874 1% 26% 118
7 JOURNAL OF SYNCHROTRON RADIATION journal 102959 3% 10% 300
8 X RAY MIRROR authKW 100747 1% 57% 50
9 PRECIS OPT ENGN address 92692 1% 36% 74
10 EXTREME ULTRAVIOLET authKW 92677 1% 34% 78

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Instruments & Instrumentation 35234 20% 1% 1775
2 Optics 29088 25% 0% 2158
3 Spectroscopy 25051 15% 1% 1317
4 Physics, Applied 21370 33% 0% 2884
5 Nuclear Science & Technology 9339 10% 0% 891
6 Microscopy 7626 3% 1% 288
7 Physics, Nuclear 6120 9% 0% 749
8 Physics, Particles & Fields 3106 7% 0% 617
9 Physics, Multidisciplinary 1358 7% 0% 646
10 Materials Science, Coatings & Films 1196 3% 0% 273

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 XRAY OPT 107874 1% 26% 118
2 PRECIS OPT ENGN 92692 1% 36% 74
3 RONTGENPHYS 58004 1% 33% 50
4 XRAY MICROSPECT IMAGING GRP XMI 33667 0% 80% 12
5 BIMR 33383 0% 48% 20
6 SIBERIAN SR 32643 0% 85% 11
7 GOLD 31555 0% 60% 15
8 X FRASCATI 28409 0% 90% 9
9 CHIM PHYS MAT RAYONNEMENT 24023 1% 12% 56
10 SOFT XRAY MICROSCOPY 23671 0% 75% 9

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF SYNCHROTRON RADIATION 102959 3% 10% 300
2 X-RAY SPECTROMETRY 55451 2% 9% 181
3 REVIEW OF SCIENTIFIC INSTRUMENTS 32284 6% 2% 532
4 APPLIED OPTICS 27993 6% 2% 534
5 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 27966 7% 1% 582
6 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 16341 2% 3% 168
7 SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY 8015 1% 2% 114
8 ULTRAMICROSCOPY 7690 1% 2% 112
9 JOURNAL DE PHYSIQUE IV 7016 2% 1% 146
10 PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS 5358 1% 2% 92

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 X RAY OPTICS 295690 2% 43% 197 Search X+RAY+OPTICS Search X+RAY+OPTICS
2 X RAY MICROSCOPY 243724 2% 44% 158 Search X+RAY+MICROSCOPY Search X+RAY+MICROSCOPY
3 ZONE PLATE 148277 1% 56% 75 Search ZONE+PLATE Search ZONE+PLATE
4 MULTILAYER MIRROR 114504 1% 56% 58 Search MULTILAYER+MIRROR Search MULTILAYER+MIRROR
5 SOFT X RAY 109639 2% 24% 131 Search SOFT+X+RAY Search SOFT+X+RAY
6 X RAY MIRROR 100747 1% 57% 50 Search X+RAY+MIRROR Search X+RAY+MIRROR
7 EXTREME ULTRAVIOLET 92677 1% 34% 78 Search EXTREME+ULTRAVIOLET Search EXTREME+ULTRAVIOLET
8 POLYCAPILLARY OPTICS 83059 0% 79% 30 Search POLYCAPILLARY+OPTICS Search POLYCAPILLARY+OPTICS
9 X RAY FOCUSING 81927 0% 81% 29 Search X+RAY+FOCUSING Search X+RAY+FOCUSING
10 SPECTROMICROSCOPY 80152 1% 47% 49 Search SPECTROMICROSCOPY Search SPECTROMICROSCOPY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 GUNTHER, S , KAULICH, B , GREGORATTI, L , KISKINOVA, M , (2002) PHOTOELECTRON MICROSCOPY AND APPLICATIONS IN SURFACE AND MATERIALS SCIENCE.PROGRESS IN SURFACE SCIENCE. VOL. 70. ISSUE 4-8. P. 187 -260 123 73% 101
2 SUN, TX , DING, XL , (2015) CONFOCAL X-RAY TECHNOLOGY BASED ON CAPILLARY X-RAY OPTICS.REVIEWS IN ANALYTICAL CHEMISTRY. VOL. 34. ISSUE 1-2. P. 45 -59 83 77% 3
3 BAUER, E , (2012) A BRIEF HISTORY OF PEEM.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 185. ISSUE 10. P. 314-322 85 77% 8
4 LOUIS, E , YAKSHIN, AE , TSARFATI, T , BIJKERK, F , (2011) NANOMETER INTERFACE AND MATERIALS CONTROL FOR MULTILAYER EUV-OPTICAL APPLICATIONS.PROGRESS IN SURFACE SCIENCE. VOL. 86. ISSUE 11-12. P. 255 -294 71 68% 37
5 CHU, YS , YAN, HF , CONLEY, R , BOUET, N , (2014) HARD X-RAY NANOFOCUSING BY MULTILAYER LAUE LENSES.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 47. ISSUE 26. P. - 73 58% 23
6 ADE, H , HITCHCOCK, AP , (2008) NEXAFS MICROSCOPY AND RESONANT SCATTERING: COMPOSITION AND ORIENTATION PROBED IN REAL AND RECIPROCAL SPACE.POLYMER. VOL. 49. ISSUE 3. P. 643 -675 79 52% 94
7 BAUER, E , (2009) CATHODE LENS ELECTRON MICROSCOPY: PAST AND FUTURE.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 21. ISSUE 31. P. - 49 91% 13
8 SNIGIREV, A , SNIGIREVA, I , (2008) HIGH ENERGY X-RAY MICRO-OPTICS.COMPTES RENDUS PHYSIQUE. VOL. 9. ISSUE 5-6. P. 507-516 46 96% 27
9 KILCOYNE, ALD , TYLISZCZAK, T , STEELE, WF , FAKRA, S , HITCHCOCK, P , FRANCK, K , ANDERSON, E , HARTENECK, B , RIGHTOR, EG , MITCHELL, GE , ET AL (2003) INTERFEROMETER-CONTROLLED SCANNING TRANSMISSION X-RAY MICROSCOPES AT THE ADVANCED LIGHT SOURCE.JOURNAL OF SYNCHROTRON RADIATION. VOL. 10. ISSUE . P. 125-136 37 97% 368
10 LACLAVETINE, K , AGER, FJ , ARQUILLO, J , RESPALDIZA, MA , SCRIVANO, S , (2016) CHARACTERIZATION OF THE NEW MOBILE CONFOCAL MICRO X-RAY FLUORESCENCE (CXRF) SYSTEM FOR IN SITU NON-DESTRUCTIVE CULTURAL HERITAGE ANALYSIS AT THE CNA: MU XRF-CONCHA.MICROCHEMICAL JOURNAL. VOL. 125. ISSUE . P. 62 -68 31 94% 4

Classes with closest relation at Level 2


Rank Class id link
1 2962 PHASE RETRIEVAL//PTYCHOGRAPHY//COHERENT DIFFRACTIVE IMAGING
2 3530 UNDULATOR//INSERTION DEVICES//SUPERCONDUCTING UNDULATOR
3 1643 ACTA CRYSTALLOGRAPHICA SECTION A//JOURNAL OF APPLIED CRYSTALLOGRAPHY//JOURNAL OF SYNCHROTRON RADIATION
4 1940 MASS ATTENUATION COEFFICIENT//EFFECTIVE ATOMIC NUMBER//DIFFRACTION ENHANCED IMAGING
5 1759 ARCHAEOMETRY//JOURNAL OF GLASS STUDIES//ARCHAEOLOGY
6 3703 ENGN PLICAT RADIOISOTOPES//NUCLEAR GEOPHYSICS//NUCLEAR SCIENCE AND ENGINEERING
7 347 LASER AND PARTICLE BEAMS//LASER ENERGET//PHYSICS OF PLASMAS
8 1473 JOURNAL OF SYNCHROTRON RADIATION//RESONANT INELASTIC X RAY SCATTERING//RIXS
9 720 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//CHEMICALLY AMPLIFIED RESIST//JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY
10 3585 LODZ BRANCH//RELAT PHYS//INT COMPLEX SYST

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