Class information for:
Level 1: ENVIRONMENTAL SEM//ESEM//ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
20271 468 23.4 56%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
2587 2             SCANNING//BACKSCATTERED ELECTRONS//MICROSCOPY 3648
20271 1                   ENVIRONMENTAL SEM//ESEM//ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE 468

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ENVIRONMENTAL SEM authKW 956919 5% 67% 22
2 ESEM authKW 931967 15% 20% 70
3 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE authKW 927900 7% 44% 32
4 POLYMERS OIDS GRP address 733974 6% 38% 30
5 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY authKW 631508 9% 22% 44
6 VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE authKW 528487 2% 90% 9
7 CHARGE CONTRAST IMAGING authKW 417568 2% 80% 8
8 LOW VACUUM SEM authKW 391461 3% 50% 12
9 SKIRT authKW 375802 3% 48% 12
10 PRESSURE LIMITING APERTURE authKW 326227 1% 100% 5

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 69432 42% 1% 195
2 Instruments & Instrumentation 1635 19% 0% 89
3 Anatomy & Morphology 613 5% 0% 24
4 Materials Science, Multidisciplinary 167 16% 0% 76
5 Engineering, Petroleum 154 2% 0% 9
6 Biology 116 5% 0% 24
7 Physics, Applied 79 11% 0% 53
8 Materials Science, Characterization, Testing 73 2% 0% 8
9 Nanoscience & Nanotechnology 71 5% 0% 24
10 Engineering, Chemical 67 6% 0% 30

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 POLYMERS OIDS GRP 733974 6% 38% 30
2 WESTERN AUSTRALIAN MICROSCOPY 195736 1% 100% 3
3 ECOLE MINES DOUAI 145310 1% 32% 7
4 CALCUT MODELISAT LENS 130491 0% 100% 2
5 SCI ENGN IL 232 130491 0% 100% 2
6 GEN SURG PL BIOTECHNOL 9 73397 1% 38% 3
7 MICROSTRUCT ANAL UNIT 68557 3% 9% 12
8 AUSTRALIA KEY ELE ON MICROSCOPY MICROANAL 65245 0% 100% 1
9 BIOMAT POLYME SPECIAL GALILEE 65245 0% 100% 1
10 CHEM ENGN MAT SCI MECH 65245 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SCANNING 183566 15% 4% 69
2 MICRON 12553 5% 1% 22
3 MICROSCOPY AND MICROANALYSIS 9437 3% 1% 16
4 JOURNAL OF MICROSCOPY-OXFORD 9228 4% 1% 19
5 MICROSCOPY RESEARCH AND TECHNIQUE 8975 5% 1% 23
6 JOURNAL OF MICROSCOPY 8294 4% 1% 18
7 MICRON AND MICROSCOPICA ACTA 2651 1% 1% 3
8 MATERIALS FORUM 1862 0% 3% 1
9 IEEE TRANSACTIONS ON NANOBIOSCIENCE 1494 1% 1% 4
10 MICROSCOPY 1121 0% 1% 2

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 ENVIRONMENTAL SEM 956919 5% 67% 22 Search ENVIRONMENTAL+SEM Search ENVIRONMENTAL+SEM
2 ESEM 931967 15% 20% 70 Search ESEM Search ESEM
3 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE 927900 7% 44% 32 Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPE Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPE
4 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY 631508 9% 22% 44 Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPY Search ENVIRONMENTAL+SCANNING+ELECTRON+MICROSCOPY
5 VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE 528487 2% 90% 9 Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPE Search VARIABLE+PRESSURE+SCANNING+ELECTRON+MICROSCOPE
6 CHARGE CONTRAST IMAGING 417568 2% 80% 8 Search CHARGE+CONTRAST+IMAGING Search CHARGE+CONTRAST+IMAGING
7 LOW VACUUM SEM 391461 3% 50% 12 Search LOW+VACUUM+SEM Search LOW+VACUUM+SEM
8 SKIRT 375802 3% 48% 12 Search SKIRT Search SKIRT
9 PRESSURE LIMITING APERTURE 326227 1% 100% 5 Search PRESSURE+LIMITING+APERTURE Search PRESSURE+LIMITING+APERTURE
10 SECONDARY ELECTRON CONTRAST 260982 1% 100% 4 Search SECONDARY+ELECTRON+CONTRAST Search SECONDARY+ELECTRON+CONTRAST

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 MORGAN, SW , PHILLIPS, MR , (2006) GASEOUS SCINTILLATION DETECTION AND AMPLIFICATION IN VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 100. ISSUE 7. P. - 30 73% 2
2 WIGHT, SA , KONICEK, AR , (2012) ELECTRON SCATTERING CROSS SECTION MEASUREMENTS IN A VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE.MICRON. VOL. 43. ISSUE 9. P. 985-991 18 100% 2
3 THIEL, BL , TOTH, M , (2005) SECONDARY ELECTRON CONTRAST IN LOW-VACUUM/ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY OF DIELECTRICS.JOURNAL OF APPLIED PHYSICS. VOL. 97. ISSUE 5. P. - 39 51% 44
4 ZOUKEL, A , KHOUCHAF, L , DI MARTINO, J , RUCH, D , (2014) INTERFACIAL ENERGY-DISPERSIVE SPECTROSCOPY PROFILE X-RAY RESOLUTION MEASUREMENTS IN VARIABLE PRESSURE SEM.MICROSCOPY AND MICROANALYSIS. VOL. 20. ISSUE 5. P. 1565 -1575 21 78% 0
5 UWINS, PJR , (1994) ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPY.MATERIALS FORUM. VOL. 18. ISSUE . P. 51-75 40 71% 19
6 DONALD, AM , (2003) THE USE OF ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY FOR IMAGING WET AND INSULATING MATERIALS.NATURE MATERIALS. VOL. 2. ISSUE 8. P. 511-516 32 55% 122
7 KIRK, S , SKEPPER, J , DONALD, AM , (2009) APPLICATION OF ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY TO DETERMINE BIOLOGICAL SURFACE STRUCTURE.JOURNAL OF MICROSCOPY. VOL. 233. ISSUE 2. P. 205 -224 26 60% 39
8 THIEL, BL , (2004) IMAGING AND ANALYSIS IN MATERIALS SCIENCE BY LOW VACUUM SCANNING ELECTRON MICROSCOPY.INTERNATIONAL MATERIALS REVIEWS. VOL. 49. ISSUE 2. P. 109-122 38 51% 1
9 DANILATOS, GD , (2013) ELECTRON SCATTERING CROSS-SECTION MEASUREMENTS IN ESEM.MICRON. VOL. 45. ISSUE . P. 1-16 16 89% 5
10 STOKES, DJ , (2003) RECENT ADVANCES IN ELECTRON IMAGING, IMAGE INTERPRETATION AND APPLICATIONS: ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY.PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES. VOL. 361. ISSUE 1813. P. 2771-2787 24 67% 81

Classes with closest relation at Level 1


Rank Class id link
1 14404 BACKSCATTERED ELECTRONS//DOPANT CONTRAST//SCANNING
2 13441 LAMACOP//SECONDARY ELECTRON EMISSION//SECONDARY ELECTRON YIELD
3 36590 NINJURIN1//TISSUE REGRESSION//TUNICA VASCULOSA LENTIS
4 15500 ENVIRONMENTAL TEM//LIQUID CELL TEM//CLAIRSCOPE
5 36145 CHITON RADULA//BIOLOGICAL WEALTH//BIOMINERALIZED MAGNETITE
6 30640 GENIE PROCEDES ALIMENTAI BIOTECHNOL//GENIE PROC ALIMENTAI BIOTECHNOL//YEAST ANHYDROBIOSIS
7 33577 DAGUERREOTYPES//HIGH FREQUENCY COLD PLASMA//HF PLASMA
8 25975 FUJINOMIYA//BIOFUNCTIONAL TEXTILES//BATH EXHAUSTION
9 23119 SECONDARY EMISSION NOISE//ADVANCED LITHOGRAPHY//ALTERNATING APERTURE PHASE SHIFTING MASKS
10 28300 NANOMANIPULATION//AFM NANOROBOT//MOL ROBOT

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