Class information for:
Level 1: MEAN PENETRATION DEPTH//ELECTRON PROBE MICROANALYSIS//STANDARDLESS ANALYSIS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
9414 1157 24.0 38%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
2587 2             SCANNING//BACKSCATTERED ELECTRONS//MICROSCOPY 3648
9414 1                   MEAN PENETRATION DEPTH//ELECTRON PROBE MICROANALYSIS//STANDARDLESS ANALYSIS 1157

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MEAN PENETRATION DEPTH authKW 158341 1% 100% 6
2 ELECTRON PROBE MICROANALYSIS authKW 114854 4% 11% 41
3 STANDARDLESS ANALYSIS authKW 110097 1% 38% 11
4 CONTINUOUS SLOWING DOWN APPROXIMATION authKW 109958 0% 83% 5
5 FU 160 address 105561 0% 100% 4
6 VICANEK AND URBASSEK THEORY authKW 105561 0% 100% 4
7 FIS ECM address 97424 1% 31% 12
8 X-RAY SPECTROMETRY journal 94584 7% 4% 86
9 EPMA authKW 88287 4% 7% 48
10 ATOMIC INNER SHELL IONIZATION authKW 84447 0% 80% 4

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 23972 16% 1% 181
2 Spectroscopy 3168 15% 0% 171
3 Instruments & Instrumentation 2167 14% 0% 164
4 Physics, Atomic, Molecular & Chemical 1567 15% 0% 179
5 Nuclear Science & Technology 1014 9% 0% 108
6 Chemistry, Analytical 827 13% 0% 147
7 Physics, Nuclear 665 8% 0% 91
8 Physics, Applied 566 17% 0% 194
9 Physics, Multidisciplinary 557 12% 0% 134
10 Physics, Condensed Matter 255 10% 0% 114

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 FU 160 105561 0% 100% 4
2 FIS ECM 97424 1% 31% 12
3 RADIAT PHYS TECHNOL 62104 3% 7% 35
4 UMR CNRS 7614 61568 1% 33% 7
5 MAT ELECT SYST LMSE 47500 0% 60% 3
6 SGCSLMAC 46912 0% 44% 4
7 MAT SYST ELECT 43977 0% 33% 5
8 FIS ECM ICC 38381 0% 36% 4
9 FR 2035 35186 0% 67% 2
10 CHIM PHYS MAT RAYONNEMENT 30571 2% 5% 23

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 X-RAY SPECTROMETRY 94584 7% 4% 86
2 SCANNING 65812 6% 4% 65
3 MIKROCHIMICA ACTA 56328 7% 3% 79
4 MICROSCOPY AND MICROANALYSIS 30207 4% 3% 45
5 JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES 16547 1% 4% 17
6 MICROBEAM ANALYSIS 8117 0% 15% 2
7 SURFACE AND INTERFACE ANALYSIS 3512 3% 0% 30
8 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 2922 5% 0% 60
9 MICROSCOPY MICROANALYSIS MICROSTRUCTURES 2508 1% 2% 6
10 MICROCHIMICA ACTA 2498 1% 1% 17

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 MEAN PENETRATION DEPTH 158341 1% 100% 6 Search MEAN+PENETRATION+DEPTH Search MEAN+PENETRATION+DEPTH
2 ELECTRON PROBE MICROANALYSIS 114854 4% 11% 41 Search ELECTRON+PROBE+MICROANALYSIS Search ELECTRON+PROBE+MICROANALYSIS
3 STANDARDLESS ANALYSIS 110097 1% 38% 11 Search STANDARDLESS+ANALYSIS Search STANDARDLESS+ANALYSIS
4 CONTINUOUS SLOWING DOWN APPROXIMATION 109958 0% 83% 5 Search CONTINUOUS+SLOWING+DOWN+APPROXIMATION Search CONTINUOUS+SLOWING+DOWN+APPROXIMATION
5 VICANEK AND URBASSEK THEORY 105561 0% 100% 4 Search VICANEK+AND+URBASSEK+THEORY Search VICANEK+AND+URBASSEK+THEORY
6 EPMA 88287 4% 7% 48 Search EPMA Search EPMA
7 ATOMIC INNER SHELL IONIZATION 84447 0% 80% 4 Search ATOMIC+INNER+SHELL+IONIZATION Search ATOMIC+INNER+SHELL+IONIZATION
8 EXPERIMENTAL STOPPING POWER 79171 0% 100% 3 Search EXPERIMENTAL+STOPPING+POWER Search EXPERIMENTAL+STOPPING+POWER
9 X RAY SPECTRUM SIMULATION 79171 0% 100% 3 Search X+RAY+SPECTRUM+SIMULATION Search X+RAY+SPECTRUM+SIMULATION
10 ELECTRON IMPACT 70165 2% 10% 27 Search ELECTRON+IMPACT Search ELECTRON+IMPACT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 LLOVET, X , POWELL, CJ , SALVAT, F , JABLONSKI, A , (2014) CROSS SECTIONS FOR INNER-SHELL IONIZATION BY ELECTRON IMPACT.JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA. VOL. 43. ISSUE 1. P. - 92 68% 26
2 TRINCAVELLI, J , LIMANDRI, S , BONETTO, R , (2014) STANDARDLESS QUANTIFICATION METHODS IN ELECTRON PROBE MICROANALYSIS.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 101. ISSUE . P. 76 -85 55 65% 5
3 FERNANDEZ-VAREA, JM , JAHNKE, V , MAIDANA, NL , MALAFRONTE, AA , VANIN, VR , (2014) CROSS SECTIONS OF K-SHELL IONIZATION BY ELECTRON IMPACT, MEASURED FROM THRESHOLD TO 100 KEV, FOR AU AND BI.JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS. VOL. 47. ISSUE 15. P. - 34 83% 4
4 ZHU, JJ , AN, Z , LIU, MT , TIAN, LX , (2009) MEASUREMENTS OF THE K-SHELL IONIZATION CROSS SECTIONS OF SI BY 3-25-KEV ELECTRON IMPACT USING THE THICK-TARGET METHOD.PHYSICAL REVIEW A. VOL. 79. ISSUE 5. P. - 40 75% 15
5 ZHAO, JL , AN, Z , ZHU, JJ , TAN, WJ , LIU, MT , (2016) INVESTIGATIONS OF L-SHELL X-RAY PRODUCTION CROSS SECTIONS OF IN AND SN BY LOW-ENERGY ELECTRON IMPACT.JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS. VOL. 49. ISSUE 6. P. - 39 67% 0
6 BOTE, D , SALVAT, F , (2008) CALCULATIONS OF INNER-SHELL IONIZATION BY ELECTRON IMPACT WITH THE DISTORTED-WAVE AND PLANE-WAVE BORN APPROXIMATIONS.PHYSICAL REVIEW A. VOL. 77. ISSUE 4. P. - 39 68% 50
7 MEI, CS , WU, Y , YUAN, Y , CHANG, CH , QIAN, ZC , ZHU, JJ , MOHARRAM, K , (2016) MEASUREMENTS OF K-SHELL IONIZATION CROSS SECTIONS OF AL AND L-SHELL X-RAY PRODUCTION CROSS SECTIONS OF SE BY INTERMEDIATE-ENERGY ELECTRON IMPACT.JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS. VOL. 49. ISSUE 24. P. - 27 90% 0
8 ZHAO, JL , AN, Z , ZHU, JJ , TAN, WJ , LIU, MT , (2016) MEASUREMENTS OF L-SHELL X-RAY PRODUCTION CROSS-SECTIONS OF AG AND SB BY LOW-ENERGY ELECTRON IMPACT.RADIATION PHYSICS AND CHEMISTRY. VOL. 122. ISSUE . P. 66 -72 30 79% 0
9 MOY, A , MERLET, C , DUGNE, O , (2015) STANDARDLESS QUANTIFICATION OF HEAVY ELEMENTS BY ELECTRON PROBE MICROANALYSIS.ANALYTICAL CHEMISTRY. VOL. 87. ISSUE 15. P. 7779 -7786 28 82% 2
10 RINALDI, R , LLOVET, X , (2015) ELECTRON PROBE MICROANALYSIS: A REVIEW OF THE PAST, PRESENT, AND FUTURE.MICROSCOPY AND MICROANALYSIS. VOL. 21. ISSUE 5. P. 1053 -1069 33 67% 4

Classes with closest relation at Level 1


Rank Class id link
1 30555 SURFACE EMISSION RATE//LARGE AREA REFERENCE SOURCES//ISO 8769
2 23128 POLARIZATIONAL BREMSSTRAHLUNG//ORDINARY BREMSSTRAHLUNG//TOTAL BREMSSTRAHLUNG
3 14404 BACKSCATTERED ELECTRONS//DOPANT CONTRAST//SCANNING
4 2063 SURFACE AND INTERFACE ANALYSIS//SURFACE EXCITATION//INELASTIC MEAN FREE PATH
5 24440 CADMIUM YELLOW//ABSORPTION CORRECTION//ENGN 36
6 36971 DOUBLE DYNODE READOUT//NE102//PAVIA SEZ
7 23315 THIN WINDOW EPMA//LOW Z PARTICLE EPMA//LOW Z PARTICLE ELECTRON PROBE X RAY MICROANALYSIS
8 13441 LAMACOP//SECONDARY ELECTRON EMISSION//SECONDARY ELECTRON YIELD
9 8883 ELECTRON IMPACT IONIZATION//ELECTRON IMPACT//IONIZATION CROSS SECTION
10 3716 FLUORESCENCE YIELD//X RAY PRODUCTION CROSS SECTION//NUCL SCI S

Go to start page