Class information for:
Level 1: LAMACOP//SECONDARY ELECTRON EMISSION//SECONDARY ELECTRON YIELD

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
13441 836 20.0 52%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
2587 2             SCANNING//BACKSCATTERED ELECTRONS//MICROSCOPY 3648
13441 1                   LAMACOP//SECONDARY ELECTRON EMISSION//SECONDARY ELECTRON YIELD 836

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 LAMACOP address 568257 3% 68% 23
2 SECONDARY ELECTRON EMISSION authKW 397058 8% 17% 63
3 SECONDARY ELECTRON YIELD authKW 185679 2% 27% 19
4 DEEP DIELECTRIC CHARGING authKW 149134 1% 58% 7
5 CHARGING authKW 147874 5% 10% 40
6 PROJECTION ELECTRON MICROSCOPE authKW 146096 0% 100% 4
7 X RAY INDUCED SECONDARY ELECTRON EMISSION authKW 146096 0% 100% 4
8 RADIATION INDUCED CONDUCTIVITY RIC authKW 131482 1% 60% 6
9 CURRENT DENSITY EFFECT authKW 109572 0% 100% 3
10 NONCONDUCTIVE SPECIMENS authKW 109572 0% 100% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Microscopy 9282 11% 0% 96
2 Physics, Applied 4117 45% 0% 380
3 Nanoscience & Nanotechnology 1342 14% 0% 119
4 Engineering, Electrical & Electronic 888 21% 0% 175
5 Instruments & Instrumentation 843 11% 0% 89
6 Materials Science, Coatings & Films 541 6% 0% 52
7 Physics, Condensed Matter 274 11% 0% 96
8 Nuclear Science & Technology 189 5% 0% 43
9 Spectroscopy 159 4% 0% 37
10 Materials Science, Multidisciplinary 125 12% 0% 100

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 LAMACOP 568257 3% 68% 23
2 G PI MAT FONCT 83480 0% 57% 4
3 MAU 82178 0% 75% 3
4 ELE ON EMISS SOURCE 77337 1% 35% 6
5 LPIO EA 3254 73048 0% 100% 2
6 LASSI 69195 1% 32% 6
7 DTI UMR 6107 48697 0% 67% 2
8 DTI 45032 2% 9% 13
9 UMR 6107 43639 1% 17% 7
10 ASTRIUM SATELLITES 36524 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SCANNING 26390 4% 2% 35
2 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 9215 8% 0% 65
3 PHILIPS JOURNAL OF RESEARCH 5345 1% 2% 7
4 JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS 4725 1% 1% 11
5 IEEE TRANSACTIONS ON ELECTRICAL INSULATION 3054 1% 1% 11
6 MICROSCOPY AND MICROANALYSIS 2484 1% 1% 11
7 JOURNAL OF APPLIED PHYSICS 2392 10% 0% 85
8 IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 2367 2% 0% 17
9 JOURNAL OF ELECTRON MICROSCOPY 2364 1% 1% 11
10 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 2182 2% 0% 19

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SECONDARY ELECTRON EMISSION 397058 8% 17% 63 Search SECONDARY+ELECTRON+EMISSION Search SECONDARY+ELECTRON+EMISSION
2 SECONDARY ELECTRON YIELD 185679 2% 27% 19 Search SECONDARY+ELECTRON+YIELD Search SECONDARY+ELECTRON+YIELD
3 DEEP DIELECTRIC CHARGING 149134 1% 58% 7 Search DEEP+DIELECTRIC+CHARGING Search DEEP+DIELECTRIC+CHARGING
4 CHARGING 147874 5% 10% 40 Search CHARGING Search CHARGING
5 PROJECTION ELECTRON MICROSCOPE 146096 0% 100% 4 Search PROJECTION+ELECTRON+MICROSCOPE Search PROJECTION+ELECTRON+MICROSCOPE
6 X RAY INDUCED SECONDARY ELECTRON EMISSION 146096 0% 100% 4 Search X+RAY+INDUCED+SECONDARY+ELECTRON+EMISSION Search X+RAY+INDUCED+SECONDARY+ELECTRON+EMISSION
7 RADIATION INDUCED CONDUCTIVITY RIC 131482 1% 60% 6 Search RADIATION+INDUCED+CONDUCTIVITY+RIC Search RADIATION+INDUCED+CONDUCTIVITY+RIC
8 CURRENT DENSITY EFFECT 109572 0% 100% 3 Search CURRENT+DENSITY+EFFECT Search CURRENT+DENSITY+EFFECT
9 NONCONDUCTIVE SPECIMENS 109572 0% 100% 3 Search NONCONDUCTIVE+SPECIMENS Search NONCONDUCTIVE+SPECIMENS
10 ZEUS DISPLAY 109572 0% 100% 3 Search ZEUS+DISPLAY Search ZEUS+DISPLAY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 CAZAUX, J , (2010) SECONDARY ELECTRON EMISSION AND CHARGING MECHANISMS IN AUGER ELECTRON SPECTROSCOPY AND RELATED E-BEAM TECHNIQUES.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 176. ISSUE 1-3. P. 58 -79 39 74% 29
2 FENG, GB , CAO, M , YAN, LP , ZHANG, HB , (2013) COMBINED EFFECTS OF SAMPLE PARAMETERS ON POLYMER CHARGING DUE TO ELECTRON IRRADIATION: A CONTOUR SIMULATION.MICRON. VOL. 52-53. ISSUE . P. 62 -66 30 86% 4
3 ZHANG, HB , LI, WQ , CAO, M , (2012) SPACE CHARGE CHARACTERISTICS OF AN INSULATING THIN FILM NEGATIVELY CHARGED BY A LOW-ENERGY ELECTRON BEAM.JOURNAL OF ELECTRON MICROSCOPY. VOL. 61. ISSUE 2. P. 85 -97 30 81% 4
4 LI, WQ , ZHANG, HB , (2010) THE POSITIVE CHARGING EFFECT OF DIELECTRIC FILMS IRRADIATED BY A FOCUSED ELECTRON BEAM.APPLIED SURFACE SCIENCE. VOL. 256. ISSUE 11. P. 3482 -3492 30 81% 17
5 LI, WQ , ZHANG, HB , LU, J , (2012) CHARGING EFFECTS OF SIO2 THIN FILMS UNDER DEFOCUSED ELECTRON BEAM IRRADIATION.ACTA PHYSICA SINICA. VOL. 61. ISSUE 2. P. - 28 80% 2
6 FENG, GB , WANG, F , CAO, M , (2015) NUMERICAL SIMULATION OF MULTI-COMBINED EFFECTS OF PARAMETERS ON POLYMER CHARGING CHARACTERISTICS DUE TO ELECTRON IRRADIATION.ACTA PHYSICA SINICA. VOL. 64. ISSUE 22. P. - 26 74% 0
7 WANG, F , FENG, GB , ZHANG, XS , CAO, M , (2016) MECHANISM OF ELECTRON MULTIPLICATION DUE TO CHARGING FOR A SIO2 SAMPLE WITH A BURIED MICROSTRUCTURE IN SEM: A SIMULATION ANALYSIS.MICRON. VOL. 90. ISSUE . P. 64 -70 20 87% 0
8 LI, WQ , ZHANG, HB , (2010) THE SURFACE POTENTIAL OF INSULATING THIN FILMS NEGATIVELY CHARGED BY A LOW-ENERGY FOCUSED ELECTRON BEAM.MICRON. VOL. 41. ISSUE 5. P. 416-422 25 76% 13
9 RAU, EI , FAKHFAKH, S , ANDRIANOV, MV , EVSTAFEVA, EN , JBARA, O , RONDOT, S , MOUZE, D , (2008) SECOND CROSSOVER ENERGY OF INSULATING MATERIALS USING STATIONARY ELECTRON BEAM UNDER NORMAL INCIDENCE.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. VOL. 266. ISSUE 5. P. 719-729 22 88% 16
10 WENG, M , HU, TC , ZHANG, N , CAO, M , (2016) DYNAMIC SECONDARY ELECTRON EMISSION CHARACTERISTICS OF POLYMERS IN NEGATIVE CHARGING PROCESS.MODERN PHYSICS LETTERS B. VOL. 30. ISSUE 11. P. - 17 94% 0

Classes with closest relation at Level 1


Rank Class id link
1 14404 BACKSCATTERED ELECTRONS//DOPANT CONTRAST//SCANNING
2 21494 VOLTAGE CONTRAST//E BEAM INSPECTION//ELECTRON BEAM TESTING
3 16085 SPACECRAFT CHARGING//SPACECRAFT ENVIRONM INTERACT ENGN//SUSTAINED ARC
4 20271 ENVIRONMENTAL SEM//ESEM//ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE
5 34214 CHARGE DECAY MODELS//CHARGE MOTION ON SURFACES//ELE ON ION PHYS GRP
6 12762 SURFACE FLASHOVER//NON STANDARD LIGHTNING IMPULSE WAVEFORM//DIELECTRIC BREAKDOWN VOLTAGE TIME CHARACTERISTICS V T CHARACTERISTICS
7 19821 ALKALI ION MIGRATION//ETUD MAT PROC ACTIF//LECL
8 9414 MEAN PENETRATION DEPTH//ELECTRON PROBE MICROANALYSIS//STANDARDLESS ANALYSIS
9 13957 MULTIPACTOR//MICROWAVE BREAKDOWN//AURORA SOFTWARE TESTING SL
10 5528 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//PROXIMITY EFFECT CORRECTION//ELECTRON BEAM LITHOGRAPHY

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