Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 5693 | 1588 | 16.3 | 47% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | LARGE SIGNAL MODEL | authKW | 260776 | 2% | 47% | 29 |
| 2 | NONLINEAR MEASUREMENTS | authKW | 222255 | 1% | 68% | 17 |
| 3 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | journal | 222217 | 24% | 3% | 382 |
| 4 | MESFET | authKW | 196145 | 4% | 15% | 68 |
| 5 | GAN HEMT | authKW | 155046 | 2% | 21% | 38 |
| 6 | X PARAMETERS | authKW | 141578 | 1% | 82% | 9 |
| 7 | LARGE SIGNAL MEASUREMENTS | authKW | 136724 | 1% | 89% | 8 |
| 8 | LOAD PULL | authKW | 108293 | 1% | 28% | 20 |
| 9 | ELECTRON DEVICE MODELING | authKW | 96136 | 0% | 100% | 5 |
| 10 | HARMONIC LOAD PULL | authKW | 96136 | 0% | 100% | 5 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Engineering, Electrical & Electronic | 41457 | 92% | 0% | 1458 |
| 2 | Telecommunications | 3799 | 13% | 0% | 213 |
| 3 | Computer Science, Interdisciplinary Applications | 1315 | 8% | 0% | 132 |
| 4 | Optics | 504 | 9% | 0% | 139 |
| 5 | Physics, Applied | 421 | 13% | 0% | 211 |
| 6 | Computer Science, Hardware & Architecture | 412 | 3% | 0% | 50 |
| 7 | Instruments & Instrumentation | 74 | 3% | 0% | 48 |
| 8 | Mathematics, Interdisciplinary Applications | 51 | 2% | 0% | 28 |
| 9 | Physics, Condensed Matter | 13 | 4% | 0% | 62 |
| 10 | Nanoscience & Nanotechnology | 4 | 2% | 0% | 25 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | WIRELESS MICROWAVE CIRCUITS SYST PROGRAM | 51270 | 0% | 67% | 4 |
| 2 | CHINA 38 | 38454 | 0% | 100% | 2 |
| 3 | ELECT DRIVE CONTROL SYST | 38454 | 0% | 100% | 2 |
| 4 | DIPARTIMENTO FIS MAT INGN ELETTRON | 35145 | 1% | 12% | 15 |
| 5 | ESAT TELEMIC | 34917 | 1% | 11% | 17 |
| 6 | TELEMIC | 27954 | 1% | 18% | 8 |
| 7 | GHZ | 25635 | 0% | 67% | 2 |
| 8 | IRADIO | 24054 | 1% | 10% | 12 |
| 9 | LEHRSTUHL ANGEW MATH NUMER MATH | 21968 | 0% | 29% | 4 |
| 10 | 3 5TIGERUMR 8520 | 19227 | 0% | 100% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 222217 | 24% | 3% | 382 |
| 2 | INTERNATIONAL JOURNAL OF MICROWAVE AND MILLIMETER-WAVE COMPUTER-AIDED ENGINEERING | 68177 | 2% | 12% | 29 |
| 3 | INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING | 53907 | 4% | 5% | 59 |
| 4 | MICROWAVE JOURNAL | 51849 | 4% | 4% | 69 |
| 5 | IEEE MICROWAVE MAGAZINE | 33764 | 2% | 5% | 33 |
| 6 | INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS | 12641 | 2% | 3% | 25 |
| 7 | MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 11427 | 6% | 1% | 94 |
| 8 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 11315 | 6% | 1% | 95 |
| 9 | IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 10655 | 3% | 1% | 46 |
| 10 | IEEE MICROWAVE AND GUIDED WAVE LETTERS | 8226 | 1% | 2% | 19 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | LARGE SIGNAL MODEL | 260776 | 2% | 47% | 29 | Search LARGE+SIGNAL+MODEL | Search LARGE+SIGNAL+MODEL |
| 2 | NONLINEAR MEASUREMENTS | 222255 | 1% | 68% | 17 | Search NONLINEAR+MEASUREMENTS | Search NONLINEAR+MEASUREMENTS |
| 3 | MESFET | 196145 | 4% | 15% | 68 | Search MESFET | Search MESFET |
| 4 | GAN HEMT | 155046 | 2% | 21% | 38 | Search GAN+HEMT | Search GAN+HEMT |
| 5 | X PARAMETERS | 141578 | 1% | 82% | 9 | Search X+PARAMETERS | Search X+PARAMETERS |
| 6 | LARGE SIGNAL MEASUREMENTS | 136724 | 1% | 89% | 8 | Search LARGE+SIGNAL+MEASUREMENTS | Search LARGE+SIGNAL+MEASUREMENTS |
| 7 | LOAD PULL | 108293 | 1% | 28% | 20 | Search LOAD+PULL | Search LOAD+PULL |
| 8 | ELECTRON DEVICE MODELING | 96136 | 0% | 100% | 5 | Search ELECTRON+DEVICE+MODELING | Search ELECTRON+DEVICE+MODELING |
| 9 | HARMONIC LOAD PULL | 96136 | 0% | 100% | 5 | Search HARMONIC+LOAD+PULL | Search HARMONIC+LOAD+PULL |
| 10 | GAAS FET | 91547 | 1% | 48% | 10 | Search GAAS+FET | Search GAAS+FET |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | AVOLIO, G , VADALA, V , ANGELOV, I , RAFFO, A , MARCHETTI, M , VANNINI, G , SCHREURS, D , (2017) A PROCEDURE FOR THE EXTRACTION OF A NONLINEAR MICROWAVE GAN FET MODEL.INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. VOL. 30. ISSUE 1. P. - | 29 | 97% | 1 |
| 2 | CRUPI, G , CADDEMI, A , SCHREURS, DMMP , DAMBRINE, G , (2016) THE LARGE WORLD OF FET SMALL-SIGNAL EQUIVALENT CIRCUITS.INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING. VOL. 26. ISSUE 9. P. 749 -762 | 59 | 68% | 0 |
| 3 | LIU, LS , MA, JG , NG, GI , (2009) ELECTROTHERMAL LARGE-SIGNAL MODEL OF III-V FETS INCLUDING FREQUENCY DISPERSION AND CHARGE CONSERVATION.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 57. ISSUE 12. P. 3106-3117 | 35 | 100% | 13 |
| 4 | RAFFO, A , VADALA, V , BOSI, G , TREVISAN, F , AVOLIO, G , VANNINI, G , (2017) WAVEFORM ENGINEERING: STATE-OF-THE-ART AND FUTURE TRENDS (INVITED PAPER).INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING. VOL. 27. ISSUE 1. P. - | 35 | 80% | 0 |
| 5 | CRUPI, G , RAFFO, A , AVOLIO, G , BOSI, G , SIVVERINI, G , PALOMBA, F , CADDEMI, A , SCHREURS, DMMP , VANNINI, G , (2015) NONLINEAR MODELING OF GAAS PHEMTS FOR MILLIMETER-WAVE MIXER DESIGN L.SOLID-STATE ELECTRONICS. VOL. 104. ISSUE . P. 25 -32 | 30 | 83% | 2 |
| 6 | AVOLIO, G , RAFFO, A , VADALA, V , VANNINI, G , SCHREURS, DMMP , (2016) DYNAMIC-BIAS S-PARAMETERS: A NEW MEASUREMENT TECHNIQUE FOR MICROWAVE TRANSISTORS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 64. ISSUE 11. P. 3946 -3955 | 27 | 87% | 0 |
| 7 | LUO, DT , SHEN, L , GAO, JJ , (2017) AN IMPROVED LINEAR MODELING TECHNIQUE WITH SENSITIVITY ANALYSIS FOR GAN HEMT.INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. VOL. 30. ISSUE 1. P. - | 14 | 93% | 1 |
| 8 | ESSAADALI, R , JARNDAL, A , KOUKI, AB , GHANNOUCHI, FM , (2016) A NEW GAN HEMT EQUIVALENT CIRCUIT MODELING TECHNIQUE BASED ON X-PARAMETERS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 64. ISSUE 9. P. 2758 -2777 | 19 | 95% | 0 |
| 9 | AVOLIO, G , RAFFO, A , ANGELOV, I , VADALA, V , CRUPI, G , CADDEMI, A , VANNINI, G , SCHREURS, DMMP , (2014) MILLIMETER-WAVE FET NONLINEAR MODELLING BASED ON THE DYNAMIC-BIAS MEASUREMENT TECHNIQUE.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 62. ISSUE 11. P. 2526 -2537 | 18 | 100% | 4 |
| 10 | SANTARELLI, A , NIESSEN, D , CIGNANI, R , GIBIINO, GP , TRAVERSO, PA , FLORIAN, C , SCHREURS, DMMP , FILICORI, F , (2014) GAN FET NONLINEAR MODELING BASED ON DOUBLE PULSE I/V CHARACTERISTICS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 62. ISSUE 12. P. 3262 -3273 | 19 | 95% | 1 |
Classes with closest relation at Level 1 |