Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
5777 | 1576 | 25.5 | 77% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
1299 | 2 | SIGE//STRAINED SI//VIRTUAL SUBSTRATE | 8578 |
5777 | 1 | GESN//GERMANIUM TIN//L NESS | 1576 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | GESN | authKW | 540958 | 2% | 85% | 33 |
2 | GERMANIUM TIN | authKW | 448458 | 2% | 93% | 25 |
3 | L NESS | address | 289037 | 4% | 22% | 69 |
4 | GESN ALLOY | authKW | 272438 | 1% | 94% | 15 |
5 | GERMANIUM | authKW | 183584 | 12% | 5% | 182 |
6 | GERMANIUM TIN ALLOYS | authKW | 174362 | 1% | 100% | 9 |
7 | SIGESN ALLOY | authKW | 135615 | 0% | 100% | 7 |
8 | GE ON SI | authKW | 95371 | 1% | 62% | 8 |
9 | NEAR INFRARED PHOTODETECTORS | authKW | 69740 | 0% | 60% | 6 |
10 | EPITAXIAL NANOSTRUCT SILICON SPINTRON | address | 61994 | 0% | 80% | 4 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 16134 | 64% | 0% | 1008 |
2 | Optics | 3106 | 19% | 0% | 306 |
3 | Physics, Condensed Matter | 3072 | 24% | 0% | 385 |
4 | Materials Science, Coatings & Films | 1874 | 8% | 0% | 130 |
5 | Materials Science, Multidisciplinary | 1710 | 25% | 0% | 398 |
6 | Engineering, Electrical & Electronic | 1164 | 18% | 0% | 283 |
7 | Nanoscience & Nanotechnology | 637 | 8% | 0% | 121 |
8 | Crystallography | 130 | 3% | 0% | 49 |
9 | Physics, Multidisciplinary | 23 | 4% | 0% | 57 |
10 | Chemistry, Physical | 3 | 5% | 0% | 73 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | L NESS | 289037 | 4% | 22% | 69 |
2 | EPITAXIAL NANOSTRUCT SILICON SPINTRON | 61994 | 0% | 80% | 4 |
3 | PHYS SOLID STATE PHYS INTER ES NANOSTRUC | 58121 | 0% | 100% | 3 |
4 | SEMICOND PHOTON | 52379 | 1% | 13% | 21 |
5 | NOOEL NONLINEAR OPT OPTOELECT | 47877 | 1% | 16% | 15 |
6 | PGI 9 | 45039 | 1% | 23% | 10 |
7 | MIT MICROPHOTON | 43589 | 0% | 75% | 3 |
8 | CMRC2 | 38747 | 0% | 100% | 2 |
9 | GIG HOTON NEXT GLP | 38747 | 0% | 100% | 2 |
10 | INSITITUTE IND SCI | 38747 | 0% | 100% | 2 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | APPLIED PHYSICS LETTERS | 15314 | 19% | 0% | 296 |
2 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 6546 | 1% | 2% | 21 |
3 | ECS SOLID STATE LETTERS | 5377 | 1% | 3% | 10 |
4 | THIN SOLID FILMS | 5329 | 6% | 0% | 101 |
5 | OPTICS EXPRESS | 4623 | 6% | 0% | 91 |
6 | IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS | 2504 | 1% | 1% | 23 |
7 | JOURNAL OF APPLIED PHYSICS | 2428 | 8% | 0% | 119 |
8 | JAPANESE JOURNAL OF APPLIED PHYSICS | 2093 | 3% | 0% | 42 |
9 | APPLIED PHYSICS EXPRESS | 1881 | 1% | 1% | 19 |
10 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1861 | 2% | 0% | 28 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | GESN | 540958 | 2% | 85% | 33 | Search GESN | Search GESN |
2 | GERMANIUM TIN | 448458 | 2% | 93% | 25 | Search GERMANIUM+TIN | Search GERMANIUM+TIN |
3 | GESN ALLOY | 272438 | 1% | 94% | 15 | Search GESN+ALLOY | Search GESN+ALLOY |
4 | GERMANIUM | 183584 | 12% | 5% | 182 | Search GERMANIUM | Search GERMANIUM |
5 | GERMANIUM TIN ALLOYS | 174362 | 1% | 100% | 9 | Search GERMANIUM+TIN+ALLOYS | Search GERMANIUM+TIN+ALLOYS |
6 | SIGESN ALLOY | 135615 | 0% | 100% | 7 | Search SIGESN+ALLOY | Search SIGESN+ALLOY |
7 | GE ON SI | 95371 | 1% | 62% | 8 | Search GE+ON+SI | Search GE+ON+SI |
8 | NEAR INFRARED PHOTODETECTORS | 69740 | 0% | 60% | 6 | Search NEAR+INFRARED+PHOTODETECTORS | Search NEAR+INFRARED+PHOTODETECTORS |
9 | GE1 XSNX | 61994 | 0% | 80% | 4 | Search GE1+XSNX | Search GE1+XSNX |
10 | SIGESN | 60539 | 0% | 63% | 5 | Search SIGESN | Search SIGESN |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | WIRTHS, S , BUCA, D , MANTL, S , (2016) SI-GE-SN ALLOYS: FROM GROWTH TO APPLICATIONS.PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS. VOL. 62. ISSUE 1. P. 1 -39 | 128 | 71% | 9 |
2 | SAITO, S , AL-ATTILI, AZ , ODA, K , ISHIKAWA, Y , (2016) TOWARDS MONOLITHIC INTEGRATION OF GERMANIUM LIGHT SOURCES ON SILICON CHIPS.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 31. ISSUE 4. P. - | 83 | 56% | 1 |
3 | WANG, JA , LEE, S , (2011) GE-PHOTODETECTORS FOR SI-BASED OPTOELECTRONIC INTEGRATION.SENSORS. VOL. 11. ISSUE 1. P. 696 -718 | 48 | 89% | 79 |
4 | ZAIMA, S , NAKATSUKA, O , TAOKA, N , KUROSAWA, M , TAKEUCHI, W , SAKASHITA, M , (2015) GROWTH AND APPLICATIONS OF GESN-RELATED GROUP-IV SEMICONDUCTOR MATERIALS.SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS. VOL. 16. ISSUE 4. P. - | 70 | 56% | 14 |
5 | MICHEL, J , LIU, JF , KIMERLING, LC , (2010) HIGH-PERFORMANCE GE-ON-SI PHOTODETECTORS.NATURE PHOTONICS. VOL. 4. ISSUE 8. P. 527 -534 | 39 | 74% | 393 |
6 | CHEN, R , GUPTA, S , HUANG, YC , HUO, YJ , RUDY, CW , SANCHEZ, E , KIM, Y , KAMINS, TI , SARASWAT, KC , HARRIS, JS , (2014) DEMONSTRATION OF A GE/GESN/GE QUANTUM-WELL MICRODISK RESONATOR ON SILICON: ENABLING HIGH-QUALITY GE(SN) MATERIALS FOR MICRO- AND NANOPHOTONICS.NANO LETTERS. VOL. 14. ISSUE 1. P. 37-43 | 43 | 88% | 27 |
7 | KOUVETAKIS, J , MENENDEZ, J , JIANG, L , GALLAGHER, JD , SENARATNE, CL , AOKI, T , MATHEWS, J , (2014) COMPOSITIONAL DEPENDENCE OF THE DIRECT AND INDIRECT BAND GAPS IN GE1-YSNY ALLOYS FROM ROOM TEMPERATURE PHOTOLUMINESCENCE: IMPLICATIONS FOR THE INDIRECT TO DIRECT GAP CROSSOVER IN INTRINSIC AND N-TYPE MATERIALS.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 29. ISSUE 11. P. - | 44 | 85% | 20 |
8 | BOUCAUD, P , EL KURDI, M , GHRIB, A , PROST, M , DE KERSAUSON, M , SAUVAGE, S , ANIEL, F , CHECOURY, X , BEAUDOIN, G , LARGEAU, L , ET AL (2013) RECENT ADVANCES IN GERMANIUM EMISSION [INVITED].PHOTONICS RESEARCH. VOL. 1. ISSUE 3. P. 102-109 | 43 | 84% | 36 |
9 | QUERALES-FLORES, JD , VENTURA, CI , FUHR, JD , BARRIO, RA , (2016) THE TWO GAP TRANSITIONS IN GE1-XSNX: EFFECT OF NON-SUBSTITUTIONAL COMPLEX DEFECTS.JOURNAL OF APPLIED PHYSICS. VOL. 120. ISSUE 10. P. - | 48 | 86% | 0 |
10 | STANGE, D , VON DEN DRIESCH, N , RAINKO, D , SCHULTE-BRAUCKS, C , WIRTHS, S , MUSSLER, G , TIEDEMANN, AT , STOICA, T , HARTMANN, JM , IKONIC, Z , ET AL (2016) STUDY OF GESN BASED HETEROSTRUCTURES: TOWARDS OPTIMIZED GROUP IV MQW LEDS.OPTICS EXPRESS. VOL. 24. ISSUE 2. P. 1358 -1367 | 29 | 97% | 6 |
Classes with closest relation at Level 1 |