Class information for:
Level 1: GESN//GERMANIUM TIN//L NESS

Basic class information

Class id #P Avg. number of
references
Database coverage
of references
5777 1576 25.5 77%



Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
1299 2             SIGE//STRAINED SI//VIRTUAL SUBSTRATE 8578
5777 1                   GESN//GERMANIUM TIN//L NESS 1576

Terms with highest relevance score



rank Term termType Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 GESN authKW 540958 2% 85% 33
2 GERMANIUM TIN authKW 448458 2% 93% 25
3 L NESS address 289037 4% 22% 69
4 GESN ALLOY authKW 272438 1% 94% 15
5 GERMANIUM authKW 183584 12% 5% 182
6 GERMANIUM TIN ALLOYS authKW 174362 1% 100% 9
7 SIGESN ALLOY authKW 135615 0% 100% 7
8 GE ON SI authKW 95371 1% 62% 8
9 NEAR INFRARED PHOTODETECTORS authKW 69740 0% 60% 6
10 EPITAXIAL NANOSTRUCT SILICON SPINTRON address 61994 0% 80% 4

Web of Science journal categories



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with term
in class
1 Physics, Applied 16134 64% 0% 1008
2 Optics 3106 19% 0% 306
3 Physics, Condensed Matter 3072 24% 0% 385
4 Materials Science, Coatings & Films 1874 8% 0% 130
5 Materials Science, Multidisciplinary 1710 25% 0% 398
6 Engineering, Electrical & Electronic 1164 18% 0% 283
7 Nanoscience & Nanotechnology 637 8% 0% 121
8 Crystallography 130 3% 0% 49
9 Physics, Multidisciplinary 23 4% 0% 57
10 Chemistry, Physical 3 5% 0% 73

Address terms



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 L NESS 289037 4% 22% 69
2 EPITAXIAL NANOSTRUCT SILICON SPINTRON 61994 0% 80% 4
3 PHYS SOLID STATE PHYS INTER ES NANOSTRUC 58121 0% 100% 3
4 SEMICOND PHOTON 52379 1% 13% 21
5 NOOEL NONLINEAR OPT OPTOELECT 47877 1% 16% 15
6 PGI 9 45039 1% 23% 10
7 MIT MICROPHOTON 43589 0% 75% 3
8 CMRC2 38747 0% 100% 2
9 GIG HOTON NEXT GLP 38747 0% 100% 2
10 INSITITUTE IND SCI 38747 0% 100% 2

Journals



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 APPLIED PHYSICS LETTERS 15314 19% 0% 296
2 ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY 6546 1% 2% 21
3 ECS SOLID STATE LETTERS 5377 1% 3% 10
4 THIN SOLID FILMS 5329 6% 0% 101
5 OPTICS EXPRESS 4623 6% 0% 91
6 IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS 2504 1% 1% 23
7 JOURNAL OF APPLIED PHYSICS 2428 8% 0% 119
8 JAPANESE JOURNAL OF APPLIED PHYSICS 2093 3% 0% 42
9 APPLIED PHYSICS EXPRESS 1881 1% 1% 19
10 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 1861 2% 0% 28

Author Key Words



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
LCSH search Wikipedia search
1 GESN 540958 2% 85% 33 Search GESN Search GESN
2 GERMANIUM TIN 448458 2% 93% 25 Search GERMANIUM+TIN Search GERMANIUM+TIN
3 GESN ALLOY 272438 1% 94% 15 Search GESN+ALLOY Search GESN+ALLOY
4 GERMANIUM 183584 12% 5% 182 Search GERMANIUM Search GERMANIUM
5 GERMANIUM TIN ALLOYS 174362 1% 100% 9 Search GERMANIUM+TIN+ALLOYS Search GERMANIUM+TIN+ALLOYS
6 SIGESN ALLOY 135615 0% 100% 7 Search SIGESN+ALLOY Search SIGESN+ALLOY
7 GE ON SI 95371 1% 62% 8 Search GE+ON+SI Search GE+ON+SI
8 NEAR INFRARED PHOTODETECTORS 69740 0% 60% 6 Search NEAR+INFRARED+PHOTODETECTORS Search NEAR+INFRARED+PHOTODETECTORS
9 GE1 XSNX 61994 0% 80% 4 Search GE1+XSNX Search GE1+XSNX
10 SIGESN 60539 0% 63% 5 Search SIGESN Search SIGESN

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.



Rank Reference # ref. in
cl.
Shr. of ref. in
cl.
Citations
1 WIRTHS, S , BUCA, D , MANTL, S , (2016) SI-GE-SN ALLOYS: FROM GROWTH TO APPLICATIONS.PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS. VOL. 62. ISSUE 1. P. 1 -39 128 71% 9
2 SAITO, S , AL-ATTILI, AZ , ODA, K , ISHIKAWA, Y , (2016) TOWARDS MONOLITHIC INTEGRATION OF GERMANIUM LIGHT SOURCES ON SILICON CHIPS.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 31. ISSUE 4. P. - 83 56% 1
3 WANG, JA , LEE, S , (2011) GE-PHOTODETECTORS FOR SI-BASED OPTOELECTRONIC INTEGRATION.SENSORS. VOL. 11. ISSUE 1. P. 696 -718 48 89% 79
4 ZAIMA, S , NAKATSUKA, O , TAOKA, N , KUROSAWA, M , TAKEUCHI, W , SAKASHITA, M , (2015) GROWTH AND APPLICATIONS OF GESN-RELATED GROUP-IV SEMICONDUCTOR MATERIALS.SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS. VOL. 16. ISSUE 4. P. - 70 56% 14
5 MICHEL, J , LIU, JF , KIMERLING, LC , (2010) HIGH-PERFORMANCE GE-ON-SI PHOTODETECTORS.NATURE PHOTONICS. VOL. 4. ISSUE 8. P. 527 -534 39 74% 393
6 CHEN, R , GUPTA, S , HUANG, YC , HUO, YJ , RUDY, CW , SANCHEZ, E , KIM, Y , KAMINS, TI , SARASWAT, KC , HARRIS, JS , (2014) DEMONSTRATION OF A GE/GESN/GE QUANTUM-WELL MICRODISK RESONATOR ON SILICON: ENABLING HIGH-QUALITY GE(SN) MATERIALS FOR MICRO- AND NANOPHOTONICS.NANO LETTERS. VOL. 14. ISSUE 1. P. 37-43 43 88% 27
7 KOUVETAKIS, J , MENENDEZ, J , JIANG, L , GALLAGHER, JD , SENARATNE, CL , AOKI, T , MATHEWS, J , (2014) COMPOSITIONAL DEPENDENCE OF THE DIRECT AND INDIRECT BAND GAPS IN GE1-YSNY ALLOYS FROM ROOM TEMPERATURE PHOTOLUMINESCENCE: IMPLICATIONS FOR THE INDIRECT TO DIRECT GAP CROSSOVER IN INTRINSIC AND N-TYPE MATERIALS.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 29. ISSUE 11. P. - 44 85% 20
8 BOUCAUD, P , EL KURDI, M , GHRIB, A , PROST, M , DE KERSAUSON, M , SAUVAGE, S , ANIEL, F , CHECOURY, X , BEAUDOIN, G , LARGEAU, L , ET AL (2013) RECENT ADVANCES IN GERMANIUM EMISSION [INVITED].PHOTONICS RESEARCH. VOL. 1. ISSUE 3. P. 102-109 43 84% 36
9 QUERALES-FLORES, JD , VENTURA, CI , FUHR, JD , BARRIO, RA , (2016) THE TWO GAP TRANSITIONS IN GE1-XSNX: EFFECT OF NON-SUBSTITUTIONAL COMPLEX DEFECTS.JOURNAL OF APPLIED PHYSICS. VOL. 120. ISSUE 10. P. - 48 86% 0
10 STANGE, D , VON DEN DRIESCH, N , RAINKO, D , SCHULTE-BRAUCKS, C , WIRTHS, S , MUSSLER, G , TIEDEMANN, AT , STOICA, T , HARTMANN, JM , IKONIC, Z , ET AL (2016) STUDY OF GESN BASED HETEROSTRUCTURES: TOWARDS OPTIMIZED GROUP IV MQW LEDS.OPTICS EXPRESS. VOL. 24. ISSUE 2. P. 1358 -1367 29 97% 6

Classes with closest relation at Level 1



Rank Class id link
1 9326 GERMANIUM//MBE//GE MOS
2 3619 SIGE//STRAINED SI//SILICON NANOSCI
3 14069 GERMANIUM//L DLTS//CNR IMM MATIS
4 5738 STRAINED SI1 XGEX SI QUANTUM WELLS//SEGREGANT ASSISTED GROWTH//SI BASED NANOSTRUCTURES
5 518 SILICON PHOTONICS//MICRORING RESONATOR//INTEGRATED OPTICS
6 15875 SIGEC//SI1 YCY//SI1 X YGEXCY
7 3121 GAAS ON SI//GAAS SI//GAAS GE
8 7613 PLASMA DISPERSION EFFECT//SILICON WAVEGUIDE//SILICON OPTOELECTRONICS
9 13429 INDIRECT BANDGAP SEMICONDUCTOR//D LINES//EBIC
10 11381 GE NANOCRYSTALS//GE NANOPARTICLES//IBN SINA FUNDAMENTAL SCI STUDIES

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