Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
3121 | 2060 | 17.6 | 70% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
247 | 2 | GAINNAS//JOURNAL OF CRYSTAL GROWTH//DILUTE NITRIDES | 19852 |
3121 | 1 | GAAS ON SI//GAAS SI//GAAS GE | 2060 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | GAAS ON SI | authKW | 759514 | 3% | 78% | 66 |
2 | GAAS SI | authKW | 445856 | 2% | 79% | 38 |
3 | GAAS GE | authKW | 109135 | 0% | 82% | 9 |
4 | GAP ON SI | authKW | 90778 | 0% | 88% | 7 |
5 | INP ON SI | authKW | 76222 | 0% | 86% | 6 |
6 | ENVIRONM TECHNOL URBAN PLANNING | address | 63484 | 2% | 10% | 41 |
7 | MICROSTRUCT DEVICES SHOWA KU | address | 61753 | 0% | 83% | 5 |
8 | ALGAAS ON SI | authKW | 59285 | 0% | 100% | 4 |
9 | GAAS ON GE | authKW | 59285 | 0% | 100% | 4 |
10 | MICROSTRUCT DEVICES | address | 51606 | 1% | 19% | 18 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 30882 | 77% | 0% | 1579 |
2 | Crystallography | 6251 | 15% | 0% | 315 |
3 | Materials Science, Multidisciplinary | 3081 | 29% | 0% | 596 |
4 | Engineering, Electrical & Electronic | 1313 | 17% | 0% | 348 |
5 | Physics, Condensed Matter | 891 | 13% | 0% | 264 |
6 | Materials Science, Coatings & Films | 689 | 5% | 0% | 95 |
7 | Nanoscience & Nanotechnology | 448 | 6% | 0% | 122 |
8 | Physics, Multidisciplinary | 157 | 6% | 0% | 119 |
9 | Optics | 84 | 4% | 0% | 86 |
10 | Microscopy | 77 | 1% | 0% | 16 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ENVIRONM TECHNOL URBAN PLANNING | 63484 | 2% | 10% | 41 |
2 | MICROSTRUCT DEVICES SHOWA KU | 61753 | 0% | 83% | 5 |
3 | MICROSTRUCT DEVICES | 51606 | 1% | 19% | 18 |
4 | ADV DEVICES SENSOR SYST DEV | 29642 | 0% | 100% | 2 |
5 | INTER MEASUREMENT | 29642 | 0% | 100% | 2 |
6 | FOTON OHM | 22229 | 0% | 50% | 3 |
7 | CRG D2AM | 19760 | 0% | 67% | 2 |
8 | LOW ENERGY ELECT SYST IRG LEES | 19760 | 0% | 67% | 2 |
9 | ELECT COMP ENGN SHOWA KU | 16670 | 0% | 38% | 3 |
10 | MICRO STRUCT DEVICES | 15683 | 0% | 18% | 6 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF CRYSTAL GROWTH | 39477 | 14% | 1% | 288 |
2 | APPLIED PHYSICS LETTERS | 16988 | 17% | 0% | 357 |
3 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 12986 | 5% | 1% | 103 |
4 | JOURNAL OF APPLIED PHYSICS | 7607 | 12% | 0% | 237 |
5 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 6932 | 3% | 1% | 68 |
6 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 6776 | 4% | 1% | 88 |
7 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 5352 | 5% | 0% | 107 |
8 | JOURNAL OF ELECTRONIC MATERIALS | 3889 | 2% | 1% | 51 |
9 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1762 | 1% | 0% | 30 |
10 | IEEE JOURNAL OF PHOTOVOLTAICS | 1653 | 1% | 1% | 11 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | GAAS ON SI | 759514 | 3% | 78% | 66 | Search GAAS+ON+SI | Search GAAS+ON+SI |
2 | GAAS SI | 445856 | 2% | 79% | 38 | Search GAAS+SI | Search GAAS+SI |
3 | GAAS GE | 109135 | 0% | 82% | 9 | Search GAAS+GE | Search GAAS+GE |
4 | GAP ON SI | 90778 | 0% | 88% | 7 | Search GAP+ON+SI | Search GAP+ON+SI |
5 | INP ON SI | 76222 | 0% | 86% | 6 | Search INP+ON+SI | Search INP+ON+SI |
6 | ALGAAS ON SI | 59285 | 0% | 100% | 4 | Search ALGAAS+ON+SI | Search ALGAAS+ON+SI |
7 | GAAS ON GE | 59285 | 0% | 100% | 4 | Search GAAS+ON+GE | Search GAAS+ON+GE |
8 | HETEROEPITAXY | 49689 | 2% | 7% | 48 | Search HETEROEPITAXY | Search HETEROEPITAXY |
9 | THERMAL CYCLE ANNEALING | 48409 | 0% | 47% | 7 | Search THERMAL+CYCLE+ANNEALING | Search THERMAL+CYCLE+ANNEALING |
10 | III V ON SI | 46162 | 0% | 35% | 9 | Search III+V+ON+SI | Search III+V+ON+SI |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | FANG, SF , ADOMI, K , IYER, S , MORKOC, H , ZABEL, H , CHOI, C , OTSUKA, N , (1990) GALLIUM-ARSENIDE AND OTHER COMPOUND SEMICONDUCTORS ON SILICON.JOURNAL OF APPLIED PHYSICS. VOL. 68. ISSUE 7. P. R31 -R58 | 97 | 76% | 402 |
2 | DEMEESTER, P , ACKAERT, A , COUDENYS, G , MOERMAN, I , BUYDENS, L , POLLENTIER, I , VANDAELE, P , (1991) RELAXED LATTICE-MISMATCHED GROWTH OF III-V SEMICONDUCTORS.PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS. VOL. 22. ISSUE 1-2. P. 53-141 | 127 | 79% | 27 |
3 | BOLKHOVITYANOV, YB , PCHELYAKOV, OP , (2008) GAAS EPITAXY ON SI SUBSTRATES: MODERN STATUS OF RESEARCH AND ENGINEERING.PHYSICS-USPEKHI. VOL. 51. ISSUE 5. P. 437-456 | 85 | 41% | 70 |
4 | VAJARGAH, SH , WOO, SY , GHANAD-TAVAKOLI, S , KLEIMAN, RN , PRESTON, JS , BOTTON, GA , (2012) ATOMIC-RESOLUTION STUDY OF POLARITY REVERSAL IN GASB GROWN ON SI BY SCANNING TRANSMISSION ELECTRON MICROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 112. ISSUE 9. P. - | 40 | 89% | 3 |
5 | HUDAIT, MK , KRUPANIDHI, SB , (2001) SELF-ANNIHILATION OF ANTIPHASE BOUNDARIES IN GAAS EPILAYERS ON GE SUBSTRATES GROWN BY METAL-ORGANIC VAPOR-PHASE EPITAXY.JOURNAL OF APPLIED PHYSICS. VOL. 89. ISSUE 11. P. 5972-5979 | 39 | 93% | 28 |
6 | HOUDRE, R , MORKOC, H , (1990) PROPERTIES OF GAAS ON SI GROWN BY MOLECULAR-BEAM EPITAXY.CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES. VOL. 16. ISSUE 2. P. 91 -114 | 62 | 89% | 26 |
7 | BARRETT, CSC , MARTINA, TP , BAO, XY , KENNON, EL , GUTIERREZ, L , MARTIN, P , SANCHEZ, E , JONES, KS , (2016) EFFECT OF BULK GROWTH TEMPERATURE ON ANTIPHASE DOMAIN BOUNDARY ANNIHILATION RATE IN MOCVD-GROWN GAAS ON SI(001).JOURNAL OF CRYSTAL GROWTH. VOL. 450. ISSUE . P. 39 -44 | 25 | 81% | 0 |
8 | KAWANAMI, H , (2001) HETEROEPITAXIAL TECHNOLOGIES OF III-V ON SI.SOLAR ENERGY MATERIALS AND SOLAR CELLS. VOL. 66. ISSUE 1-4. P. 479-486 | 33 | 87% | 27 |
9 | WOO, SY , VAJARGAH, SH , GHANAD-TAVAKOLI, S , KLEIMAN, RN , BOTTON, GA , (2012) DIRECT OBSERVATION OF ANTI-PHASE BOUNDARIES IN HETEROEPITAXY OF GASB THIN FILMS GROWN ON SI(001) BY TRANSMISSION ELECTRON MICROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 112. ISSUE 7. P. - | 27 | 79% | 1 |
10 | JIN, YJ , CHIA, CK , LIU, HF , WONG, LM , CHAI, JW , CHI, DZ , WANG, SJ , (2016) P-TYPE GE EPITAXY ON GAAS (100) SUBSTRATE GROWN BY MOCVD.APPLIED SURFACE SCIENCE. VOL. 376. ISSUE . P. 236 -240 | 20 | 83% | 2 |
Classes with closest relation at Level 1 |