Class information for:
Level 1: REFLECTANCE ANISOTROPY SPECTROSCOPY//REFLECTANCE DIFFERENCE SPECTROSCOPY//REFLECTION ANISOTROPY SPECTROSCOPY

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
4033 1860 25.3 78%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
47 3       PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER 93961
1210 2             GALLIUM ARSENIDE//GAAS//REFLECTANCE ANISOTROPY SPECTROSCOPY 9166
4033 1                   REFLECTANCE ANISOTROPY SPECTROSCOPY//REFLECTANCE DIFFERENCE SPECTROSCOPY//REFLECTION ANISOTROPY SPECTROSCOPY 1860

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 REFLECTANCE ANISOTROPY SPECTROSCOPY authKW 368369 2% 61% 37
2 REFLECTANCE DIFFERENCE SPECTROSCOPY authKW 270663 2% 57% 29
3 REFLECTION ANISOTROPY SPECTROSCOPY authKW 191003 1% 73% 16
4 SURFACE PHOTOABSORPTION authKW 147724 1% 60% 15
5 ELECTRON COUNTING MODEL authKW 116728 0% 89% 8
6 REFLECTANCE ANISOTROPY SPECTROSCOPY RAS authKW 105054 0% 80% 8
7 GALLIUM ARSENIDE authKW 103408 7% 5% 121
8 SUR E STUDY address 100541 0% 88% 7
9 AS DESORPTION authKW 98491 0% 100% 6
10 SURFACE RECONSTRUCTION authKW 82686 4% 7% 77

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Condensed Matter 18240 52% 0% 962
2 Physics, Applied 7794 42% 0% 785
3 Materials Science, Coatings & Films 2959 9% 0% 176
4 Crystallography 2111 10% 0% 179
5 Chemistry, Physical 1831 23% 0% 428
6 Materials Science, Multidisciplinary 906 18% 0% 340
7 Nanoscience & Nanotechnology 670 7% 0% 136
8 Physics, Multidisciplinary 601 10% 0% 183
9 Engineering, Electrical & Electronic 105 7% 0% 133
10 Microscopy 7 0% 0% 6

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SUR E STUDY 100541 0% 88% 7
2 FESTKORPERTHEORIE THEORET OPT 65402 2% 13% 31
3 INVEST COMUNICAC OPT 42881 1% 13% 20
4 ELECT TELECOMUNICAT 37517 0% 57% 4
5 CHRISTIAN DOPPLER OBERFLACHENOPT 32830 0% 100% 2
6 IMAGING ADV NANOTECHNOL 32830 0% 100% 2
7 OPT ELLIPSOMETRY 32830 0% 100% 2
8 SCI TECHNOL CHEMPOB 88SACKVILLE ST 32830 0% 100% 2
9 COMP SCI ENGN SCI PHYS 22792 0% 28% 5
10 FESTKORPERPHYS THEORET OPT 21885 0% 67% 2

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SURFACE SCIENCE 39190 14% 1% 254
2 JOURNAL OF CRYSTAL GROWTH 16216 9% 1% 176
3 PHYSICAL REVIEW B 11619 19% 0% 346
4 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 9940 5% 1% 101
5 APPLIED SURFACE SCIENCE 5321 6% 0% 108
6 PHYSICAL REVIEW LETTERS 1334 5% 0% 92
7 APPLIED PHYSICS LETTERS 1287 5% 0% 98
8 PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS 1145 2% 0% 38
9 SURFACE REVIEW AND LETTERS 1034 1% 0% 13
10 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 996 2% 0% 36

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 REFLECTANCE ANISOTROPY SPECTROSCOPY 368369 2% 61% 37 Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY
2 REFLECTANCE DIFFERENCE SPECTROSCOPY 270663 2% 57% 29 Search REFLECTANCE+DIFFERENCE+SPECTROSCOPY Search REFLECTANCE+DIFFERENCE+SPECTROSCOPY
3 REFLECTION ANISOTROPY SPECTROSCOPY 191003 1% 73% 16 Search REFLECTION+ANISOTROPY+SPECTROSCOPY Search REFLECTION+ANISOTROPY+SPECTROSCOPY
4 SURFACE PHOTOABSORPTION 147724 1% 60% 15 Search SURFACE+PHOTOABSORPTION Search SURFACE+PHOTOABSORPTION
5 ELECTRON COUNTING MODEL 116728 0% 89% 8 Search ELECTRON+COUNTING+MODEL Search ELECTRON+COUNTING+MODEL
6 REFLECTANCE ANISOTROPY SPECTROSCOPY RAS 105054 0% 80% 8 Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY+RAS Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY+RAS
7 GALLIUM ARSENIDE 103408 7% 5% 121 Search GALLIUM+ARSENIDE Search GALLIUM+ARSENIDE
8 AS DESORPTION 98491 0% 100% 6 Search AS+DESORPTION Search AS+DESORPTION
9 SURFACE RECONSTRUCTION 82686 4% 7% 77 Search SURFACE+RECONSTRUCTION Search SURFACE+RECONSTRUCTION
10 GA ADATOM 82076 0% 100% 5 Search GA+ADATOM Search GA+ADATOM

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 COLE, RJ , FARRELL, T , WEIGHTMAN, P , MARTIN, DS , (2005) REFLECTION ANISOTROPY SPECTROSCOPY.REPORTS ON PROGRESS IN PHYSICS. VOL. 68. ISSUE 6. P. 1251 -1341 174 58% 215
2 OHTAKE, A , (2008) SURFACE RECONSTRUCTIONS ON GAAS(001).SURFACE SCIENCE REPORTS. VOL. 63. ISSUE 7. P. 295-327 106 83% 63
3 SCHMIDT, WG , (2002) III-V COMPOUND SEMICONDUCTOR (001) SURFACES.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 75. ISSUE 1. P. 89 -99 90 87% 84
4 LABELLA, VP , KRAUSE, MR , DING, Z , THIBADO, PM , (2005) ARSENIC-RICH GAAS(001) SURFACE STRUCTURE.SURFACE SCIENCE REPORTS. VOL. 60. ISSUE 1-4. P. 1 -53 99 73% 42
5 XUE, QK , HASHIZUME, T , SAKURAI, T , (1999) SCANNING TUNNELING MICROSCOPY STUDY OF GAAS(001) SURFACES.APPLIED SURFACE SCIENCE. VOL. 141. ISSUE 3-4. P. 244 -263 75 85% 50
6 XUE, QK , HASHIZUME, T , SAKURAI, T , (1997) SCANNING TUNNELING MICROSCOPY OF III-V COMPOUND SEMICONDUCTOR (001) SURFACES.PROGRESS IN SURFACE SCIENCE. VOL. 56. ISSUE 1-2. P. 1 -131 97 62% 136
7 XUE, QK , HASHIZUME, T , ICHIMIYA, A , OHNO, T , HASEGAWA, Y , SAKURAI, T , (1997) SCANNING TUNNELING MICROSCOPY OF THE GAAS(001) SURFACE RECONSTRUCTIONS.SCIENCE REPORTS OF THE RESEARCH INSTITUTES TOHOKU UNIVERSITY SERIES A-PHYSICS CHEMISTRY AND METALLURGY. VOL. 44. ISSUE 2. P. 113 -143 65 82% 10
8 SCHMIDT, WG , BECHSTEDT, F , LU, W , BERNHOLC, J , (2002) INTERPLAY OF SURFACE RECONSTRUCTION AND SURFACE ELECTRIC FIELDS IN THE OPTICAL ANISOTROPY OF GAAS(001).PHYSICAL REVIEW B. VOL. 66. ISSUE 8. P. - 41 80% 23
9 LASTRAS-MARTINEZ, LF , BALDERAS-NAVARRO, RE , LASTRAS-MARTINEZ, A , HINGER, K , (2004) STRESS-INDUCED OPTICAL ANISOTROPIES MEASURED BY MODULATED REFLECTANCE.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 19. ISSUE 9. P. R35-R46 37 84% 9
10 ERKOC, S , KOKTEN, H , (2000) ENERGETICS OF ARSENIC TERMINATED GAAS(001) SURFACES.INTERNATIONAL JOURNAL OF MODERN PHYSICS C. VOL. 11. ISSUE 6. P. 1225-1237 40 89% 2

Classes with closest relation at Level 1


Rank Class id link
1 7568 REFLECTION MASS SPECTROMETRY//ROOT 19X ROOT 19//111B
2 13299 ECR HYDROGEN PLASMA//ELECTROMAGNETIC GREENS FUNCTION//IN SITU VACUUM PROCESS
3 14389 ABSORBING FILMS//ROTATING POLARIZER ANALYZER ELLIPSOMETER//ULTRATHIN DIELECTRIC LAYER
4 23471 X RAY CTR//X RAY CRYSTAL TRUNCATION ROD//SURFACE DIFFRACTION
5 2100 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY//WEBSTER//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
6 8029 SULFUR PASSIVATION//INTERFACE CONTROL LAYER//NH42S X TREATMENT
7 35110 OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE OIRD//OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE//SERIES PHOTODETECTOR FREQUENCY CIRCUIT SYSTEM
8 1618 JOURNAL OF CRYSTAL GROWTH//TRIMETHYLINDIUM//MOMBE
9 10313 LATERAL P N JUNCTION//411A GAAS SUBSTRATES//SUPER FLAT INTERFACES
10 29884 ULYANOVSK BRANCH//BREIT OPERATOR//LIGHT INTENSITY FLUCTUATIONS

Go to start page