Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 31157 | 157 | 22.9 | 23% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | DIFFERENT TYPES OF CARBON CONTAMINATION | authKW | 194494 | 1% | 100% | 1 |
| 2 | FUNCTIONALLY GRADED NANOSTRUCTURED MATERIALS | authKW | 194494 | 1% | 100% | 1 |
| 3 | INVEST ESTUD AVANZADOS FIS | address | 194494 | 1% | 100% | 1 |
| 4 | KHARKIV POLITECH | address | 194494 | 1% | 100% | 1 |
| 5 | MAT SCI MAT CHARACTERIZAT BRANCHPOB 225936 | address | 194494 | 1% | 100% | 1 |
| 6 | MICRO NANO ENGN CEMNE | address | 194494 | 1% | 100% | 1 |
| 7 | MS 147 | address | 194494 | 1% | 100% | 1 |
| 8 | PHYS CNRS ERA 070899 | address | 194494 | 1% | 100% | 1 |
| 9 | 22 NM GATE LENGTH | authKW | 97246 | 1% | 50% | 1 |
| 10 | SIC C COMPOSITE | authKW | 97246 | 1% | 50% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Materials Science, Coatings & Films | 1656 | 24% | 0% | 37 |
| 2 | Physics, Applied | 631 | 41% | 0% | 65 |
| 3 | Microscopy | 185 | 4% | 0% | 6 |
| 4 | Physics, Condensed Matter | 176 | 19% | 0% | 30 |
| 5 | Nuclear Science & Technology | 124 | 9% | 0% | 14 |
| 6 | Electrochemistry | 110 | 8% | 0% | 12 |
| 7 | Materials Science, Multidisciplinary | 93 | 20% | 0% | 31 |
| 8 | Metallurgy & Metallurgical Engineering | 24 | 5% | 0% | 8 |
| 9 | Materials Science, Ceramics | 19 | 3% | 0% | 4 |
| 10 | Physics, Particles & Fields | 18 | 4% | 0% | 7 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | INVEST ESTUD AVANZADOS FIS | 194494 | 1% | 100% | 1 |
| 2 | KHARKIV POLITECH | 194494 | 1% | 100% | 1 |
| 3 | MAT SCI MAT CHARACTERIZAT BRANCHPOB 225936 | 194494 | 1% | 100% | 1 |
| 4 | MICRO NANO ENGN CEMNE | 194494 | 1% | 100% | 1 |
| 5 | MS 147 | 194494 | 1% | 100% | 1 |
| 6 | PHYS CNRS ERA 070899 | 194494 | 1% | 100% | 1 |
| 7 | SKLAO | 97246 | 1% | 50% | 1 |
| 8 | DIP ING INFORMAZ | 11439 | 1% | 6% | 1 |
| 9 | SPECIAL CERAM PM | 9260 | 1% | 5% | 1 |
| 10 | AI LEIPUNSKII PHYS POWER ENGN | 8102 | 1% | 4% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | APPLICATIONS OF SURFACE SCIENCE | 13531 | 4% | 1% | 6 |
| 2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 10524 | 5% | 1% | 8 |
| 3 | PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY | 5772 | 4% | 0% | 7 |
| 4 | SCANNING ELECTRON MICROSCOPY | 4670 | 3% | 0% | 5 |
| 5 | VIDE-SCIENCE TECHNIQUE ET APPLICATIONS | 1613 | 1% | 0% | 2 |
| 6 | PHYSICS OF METALS | 1116 | 1% | 1% | 1 |
| 7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 664 | 4% | 0% | 7 |
| 8 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 649 | 2% | 0% | 3 |
| 9 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 636 | 6% | 0% | 10 |
| 10 | JOURNAL OF NUCLEAR MATERIALS | 618 | 5% | 0% | 8 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | DIFFERENT TYPES OF CARBON CONTAMINATION | 194494 | 1% | 100% | 1 | Search DIFFERENT+TYPES+OF+CARBON+CONTAMINATION | Search DIFFERENT+TYPES+OF+CARBON+CONTAMINATION |
| 2 | FUNCTIONALLY GRADED NANOSTRUCTURED MATERIALS | 194494 | 1% | 100% | 1 | Search FUNCTIONALLY+GRADED+NANOSTRUCTURED+MATERIALS | Search FUNCTIONALLY+GRADED+NANOSTRUCTURED+MATERIALS |
| 3 | 22 NM GATE LENGTH | 97246 | 1% | 50% | 1 | Search 22+NM+GATE+LENGTH | Search 22+NM+GATE+LENGTH |
| 4 | SIC C COMPOSITE | 97246 | 1% | 50% | 1 | Search SIC+C+COMPOSITE | Search SIC+C+COMPOSITE |
| 5 | X RAY FLUORESCENT SPECTRA | 97246 | 1% | 50% | 1 | Search X+RAY+FLUORESCENT+SPECTRA | Search X+RAY+FLUORESCENT+SPECTRA |
| 6 | DRAIN EXTENSION | 64830 | 1% | 33% | 1 | Search DRAIN+EXTENSION | Search DRAIN+EXTENSION |
| 7 | SIC C | 48622 | 1% | 25% | 1 | Search SIC+C | Search SIC+C |
| 8 | CLEANING MECHANISM | 38897 | 1% | 20% | 1 | Search CLEANING+MECHANISM | Search CLEANING+MECHANISM |
| 9 | ATOMIC HYDROGEN CLEANING | 24310 | 1% | 13% | 1 | Search ATOMIC+HYDROGEN+CLEANING | Search ATOMIC+HYDROGEN+CLEANING |
| 10 | SILVACO | 14959 | 1% | 8% | 1 | Search SILVACO | Search SILVACO |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | LUND, CP , CLARE, BW , CORNISH, JCL , HEFTER, GT , JENNINGS, PJ , KLAUBER, C , (1990) AUGER LINESHAPE ANALYSIS OF DISORDER AND REHYDROGENATION INDUCED CHANGES IN THE ELECTRONIC-STRUCTURE OF SILICON SURFACES.AUSTRALIAN JOURNAL OF PHYSICS. VOL. 43. ISSUE 4-5. P. 535-542 | 13 | 62% | 0 |
| 2 | NELSON, AJ , BURNHAM, NA , SCHWARTZLANDER, AB , ASHER, SE , KAZMERSKI, LL , (1986) AUGER ANALYSIS OF SI-H BONDING AND HYDROGEN CONCENTRATION IN HYDROGENATED AMORPHOUS-SILICON.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 4. ISSUE 3. P. 1570-1573 | 9 | 69% | 10 |
| 3 | LUND, CP , KLAUBER, C , JENNINGS, PJ , CORNISH, JCL , CLARE, BW , HEFTER, GT , (1997) SEMI-QUANTITATIVE METHODS FOR STUDYING DISORDER AND HYDROGENATION IN HYDROGENATED AMORPHOUS SILICON USING AUGER LINESHAPE ANALYSIS.APPLIED SURFACE SCIENCE. VOL. 115. ISSUE 3. P. 252-266 | 10 | 37% | 2 |
| 4 | WALKER, E , LUND, CP , KLAUBER, C , JENNINGS, PJ , CORNISH, JCL , CLARE, BW , HEFTER, GT , (1998) A SEMI-QUANTITATIVE STUDY OF DISORDER IN ARGON ION-BOMBARDED CRYSTALLINE SILICON USING AUGER LINESHAPE ANALYSIS.APPLIED SURFACE SCIENCE. VOL. 126. ISSUE 3-4. P. 265-272 | 8 | 44% | 0 |
| 5 | GLAZUNOV, GP , (2013) PURE HYDROGEN GENERATOR FOR PLASMA DEVICES.PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY. VOL. . ISSUE 1. P. 207-209 | 2 | 100% | 0 |
| 6 | CLARE, BW , JENNINGS, PJ , LUND, CP , CORNISH, JCL , HEFTER, GT , (1998) SIMULATION AND ANALYSIS OF X-RAY PHOTOEMISSION AND AUGER VALENCE BAND SPECTRA OF HYDROGENATED AMORPHOUS SILICON.THIN SOLID FILMS. VOL. 326. ISSUE 1-2. P. 160-165 | 5 | 56% | 1 |
| 7 | BURNHAM, NA , SWARTZLANDER, AB , NELSON, AJ , KAZMERSKI, LL , (1987) AUGER LINE-SHAPE ANALYSIS OF HYDROGENATED AMORPHOUS-SILICON.SOLAR CELLS. VOL. 21. ISSUE . P. 135-140 | 6 | 75% | 4 |
| 8 | ACHOUR, S , BENLAHRACHE, MT , HARABI, A , (1994) DEFECT DISTRIBUTION IN ELECTRON-IRRADIATED CDS MATERIALS.THIN SOLID FILMS. VOL. 238. ISSUE 1. P. 110-114 | 3 | 100% | 0 |
| 9 | LUND, CP , CLARE, BW , JENNINGS, PJ , CORNISH, JCL , HEFTER, GT , (1994) AN EXPERIMENTAL AND THEORETICAL-STUDY OF AUGER LINESHAPES IN HYDROGENATED AMORPHOUS-SILICON STRUCTURES.SURFACE SCIENCE. VOL. 303. ISSUE 1-2. P. 266-276 | 7 | 41% | 1 |
| 10 | OHFUJI, S , SHIONO, N , (1985) REDUCTION OF SODIUM-ION DENSITY IN MOLYBDENUM-GATE MOS DEVICES WITH THE ADDITION OF TANTALUM TO GATE ELECTRODES.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 132. ISSUE 7. P. 1689 -1694 | 7 | 64% | 1 |
Classes with closest relation at Level 1 |