Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
27888 | 219 | 18.4 | 45% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
3149 | 2 | CLEANROOM//PHOTORESIST REMOVAL//MINIENVIRONMENT | 2235 |
27888 | 1 | ETCHING FACTOR//SPRAY ETCHING//42 ALLOY | 219 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ETCHING FACTOR | authKW | 557724 | 2% | 100% | 4 |
2 | SPRAY ETCHING | authKW | 446178 | 2% | 80% | 4 |
3 | 42 ALLOY | authKW | 278862 | 1% | 100% | 2 |
4 | BOTTOM UP COST MODELING | authKW | 278862 | 1% | 100% | 2 |
5 | ETCH FACTOR | authKW | 278862 | 1% | 100% | 2 |
6 | PATTERN ELECTRODEPOSITION | authKW | 278862 | 1% | 100% | 2 |
7 | POTASSIUM HEXAFLUOROSILICATE | authKW | 278862 | 1% | 100% | 2 |
8 | PHOTOCHEMICAL MACHINING | authKW | 278858 | 2% | 50% | 4 |
9 | MASS TRANSFER EFFECT | authKW | 209143 | 1% | 50% | 3 |
10 | NITROPHOSPHATE | authKW | 209143 | 1% | 50% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 1666 | 20% | 0% | 44 |
2 | Electrochemistry | 1496 | 22% | 0% | 49 |
3 | Engineering, Manufacturing | 1080 | 12% | 0% | 27 |
4 | Engineering, Industrial | 278 | 6% | 0% | 14 |
5 | Mechanics | 169 | 11% | 0% | 23 |
6 | Materials Science, Multidisciplinary | 152 | 21% | 0% | 46 |
7 | Engineering, Mechanical | 147 | 9% | 0% | 20 |
8 | Thermodynamics | 114 | 6% | 0% | 14 |
9 | Nanoscience & Nanotechnology | 91 | 8% | 0% | 17 |
10 | Physics, Applied | 81 | 15% | 0% | 33 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ABT BLWTP | 139431 | 0% | 100% | 1 |
2 | AIST TSUKUBA EAST | 139431 | 0% | 100% | 1 |
3 | BIOTECHNOL CHEM ENGN PROC TECHNOL | 139431 | 0% | 100% | 1 |
4 | CEPREI | 139431 | 0% | 100% | 1 |
5 | ENGN PANDHARPUR | 139431 | 0% | 100% | 1 |
6 | ENVIRONM CONSCIOUS DESIGN MFG SYST GRP | 139431 | 0% | 100% | 1 |
7 | EXCELLENCE NANOCHEM | 139431 | 0% | 100% | 1 |
8 | HBEREICH PROD 4 | 139431 | 0% | 100% | 1 |
9 | MECNAN ENGN | 139431 | 0% | 100% | 1 |
10 | SODIUM FLUOSILICATE PLANT | 139431 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 7073 | 18% | 0% | 39 |
2 | RCA REVIEW | 6530 | 1% | 2% | 3 |
3 | KAGAKU KOGAKU RONBUNSHU | 1988 | 4% | 0% | 8 |
4 | MATHEMATICAL MODELLING | 1491 | 1% | 1% | 2 |
5 | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING | 1111 | 2% | 0% | 4 |
6 | JOURNAL OF MATERIALS PROCESSING TECHNOLOGY | 1033 | 5% | 0% | 10 |
7 | CIRP ANNALS-MANUFACTURING TECHNOLOGY | 972 | 2% | 0% | 4 |
8 | NUMERICAL HEAT TRANSFER PART B-FUNDAMENTALS | 904 | 1% | 0% | 3 |
9 | JOURNAL OF ENGINEERING MATHEMATICS | 724 | 1% | 0% | 3 |
10 | CIRCUIT WORLD | 699 | 0% | 1% | 1 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ETCHING FACTOR | 557724 | 2% | 100% | 4 | Search ETCHING+FACTOR | Search ETCHING+FACTOR |
2 | SPRAY ETCHING | 446178 | 2% | 80% | 4 | Search SPRAY+ETCHING | Search SPRAY+ETCHING |
3 | 42 ALLOY | 278862 | 1% | 100% | 2 | Search 42+ALLOY | Search 42+ALLOY |
4 | BOTTOM UP COST MODELING | 278862 | 1% | 100% | 2 | Search BOTTOM+UP+COST+MODELING | Search BOTTOM+UP+COST+MODELING |
5 | ETCH FACTOR | 278862 | 1% | 100% | 2 | Search ETCH+FACTOR | Search ETCH+FACTOR |
6 | PATTERN ELECTRODEPOSITION | 278862 | 1% | 100% | 2 | Search PATTERN+ELECTRODEPOSITION | Search PATTERN+ELECTRODEPOSITION |
7 | POTASSIUM HEXAFLUOROSILICATE | 278862 | 1% | 100% | 2 | Search POTASSIUM+HEXAFLUOROSILICATE | Search POTASSIUM+HEXAFLUOROSILICATE |
8 | PHOTOCHEMICAL MACHINING | 278858 | 2% | 50% | 4 | Search PHOTOCHEMICAL+MACHINING | Search PHOTOCHEMICAL+MACHINING |
9 | MASS TRANSFER EFFECT | 209143 | 1% | 50% | 3 | Search MASS+TRANSFER+EFFECT | Search MASS+TRANSFER+EFFECT |
10 | NITROPHOSPHATE | 209143 | 1% | 50% | 3 | Search NITROPHOSPHATE | Search NITROPHOSPHATE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | RATH, P , CHAI, JC , LAM, YC , MURUKESHAN, VM , ZHENG, H , (2007) A TOTAL CONCENTRATION FIXED-GRID METHOD FOR TWO-DIMENSIONAL WET CHEMICAL ETCHING.JOURNAL OF HEAT TRANSFER-TRANSACTIONS OF THE ASME. VOL. 129. ISSUE 4. P. 509-516 | 13 | 81% | 3 |
2 | DRIESEN, EH , KUERTEN, JGM , KUIKEN, HK , (2000) MASS TRANSPORT IN A PARTIALLY COVERED FLUID-FILLED CAVITY.INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER. VOL. 43. ISSUE 10. P. 1823-1835 | 15 | 79% | 3 |
3 | RATH, P , CHAI, JC , ZHENG, H , LAM, YC , MURUKESHAN, VM , (2006) MODELING TWO-DIMENSIONAL DIFFUSION-CONTROLLED WET CHEMICAL ETCHING USING A TOTAL CONCENTRATION APPROACH.INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER. VOL. 49. ISSUE 7-8. P. 1480-1488 | 13 | 65% | 7 |
4 | YEH, TK , TSAI, MH , WANG, MY , WENG, CK , (2008) IMPROVED SHAPE EVOLUTION OF COPPER INTERCONNECTS PREPARED BY JET-STREAM ETCHING.JOURNAL OF APPLIED ELECTROCHEMISTRY. VOL. 38. ISSUE 11. P. 1495-1500 | 11 | 73% | 1 |
5 | RATH, P , CHAI, JC , ZHENG, H , LAM, YC , MURUKESHAN, VM , (2006) TOTAL CONCENTRATION APPROACH FOR THREE-DIMENSIONAL DIFFUSION-CONTROLLED WET CHEMICAL ETCHING.INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER. VOL. 49. ISSUE 19-20. P. 3408-3416 | 13 | 65% | 2 |
6 | RATH, P , CHAI, JC , (2008) MODELING CONVECTION-DRIVEN DIFFUSION-CONTROLLED WET CHEMICAL ETCHING USING A TOTAL-CONCENTRATION FIXED-GRID METHOD.NUMERICAL HEAT TRANSFER PART B-FUNDAMENTALS. VOL. 53. ISSUE 2. P. 143-159 | 13 | 50% | 3 |
7 | ZHOU, YF , CHEN, SH , EDMOND, S , BOSSEBOEUF, A , (2013) DEEP WET ETCHING IN HYDROFLUORIC ACID, NITRIC ACID, AND ACETIC ACID OF CAVITIES IN A SILICON WAFER.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 52. ISSUE 7. P. - | 9 | 64% | 0 |
8 | KONDO, K , SUZUKI, Y , SAITO, T , OKAMOTO, N , KOYAMA, Y , (2009) SHAPE EVOLUTION OF ELECTRODEPOSITED BUMPS WITH SHALLOW AND DEEP CAVITIES.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 156. ISSUE 12. P. D548 -D552 | 7 | 88% | 4 |
9 | HAYASHI, K , FUKUI, K , TANAKA, Z , KONDO, K , (2001) SHAPE EVOLUTION OF ELECTRODEPOSITED BUMPS INTO DEEP CAVITIES.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 148. ISSUE 3. P. C145-C148 | 7 | 100% | 8 |
10 | KONDO, K , FUKUI, K , YOKOYAMA, M , SHINOHARA, K , (1997) SHAPE EVOLUTION OF ELECTRODEPOSITED COPPER BUMPS WITH HIGH PECLET NUMBERS.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 144. ISSUE 2. P. 466-470 | 8 | 100% | 8 |
Classes with closest relation at Level 1 |