Class information for:
Level 1: LOW FREQUENCY NOISE//1 F NOISE//FLICKER NOISE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
2527 2218 19.3 54%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
1699 2             HETEROJUNCTION BIPOLAR TRANSISTORS//SIGEHBT//HBT 6741
2527 1                   LOW FREQUENCY NOISE//1 F NOISE//FLICKER NOISE 2218

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 LOW FREQUENCY NOISE authKW 821118 8% 34% 178
2 1 F NOISE authKW 468753 7% 21% 159
3 FLICKER NOISE authKW 193924 3% 23% 61
4 RANDOM TELEGRAPH NOISE RTN authKW 171859 1% 39% 32
5 LOW FREQUENCY LF NOISE authKW 165747 1% 71% 17
6 RTS NOISE authKW 153204 1% 70% 16
7 OXIDE TRAP DENSITY authKW 118967 0% 79% 11
8 RANDOM TELEGRAPH SIGNAL authKW 117128 1% 43% 20
9 LF NOISE authKW 101359 0% 82% 9
10 RANDOM TELEGRAPH SIGNAL RTS NOISE authKW 90089 1% 55% 12

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Physics, Applied 18280 58% 0% 1281
2 Engineering, Electrical & Electronic 14250 47% 0% 1044
3 Physics, Condensed Matter 5378 27% 0% 598
4 Nanoscience & Nanotechnology 1112 8% 0% 187
5 Physics, Multidisciplinary 533 9% 0% 194
6 Instruments & Instrumentation 231 4% 0% 90
7 Mathematics, Interdisciplinary Applications 182 3% 0% 56
8 Materials Science, Multidisciplinary 92 8% 0% 183
9 Optics 41 3% 0% 74
10 Materials Science, Coatings & Films 22 1% 0% 27

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 RADIOPHYS DEP 68826 0% 100% 5
2 GRMNT 30970 0% 75% 3
3 STANDARD ANALOG BUSINESS LINE 27531 0% 100% 2
4 ZA ALP 27531 0% 100% 2
5 CII 9017 18352 0% 67% 2
6 CNRSUMR 5531 18352 0% 67% 2
7 GREYC UMR6072 18352 0% 67% 2
8 DFMTFA 18105 0% 26% 5
9 INTEGRATED ELECT ELECT MFG 18082 1% 9% 14
10 UMR 5507 17773 1% 9% 15

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SOLID-STATE ELECTRONICS 75793 11% 2% 233
2 FLUCTUATION AND NOISE LETTERS 50835 2% 7% 51
3 IEEE TRANSACTIONS ON ELECTRON DEVICES 37204 9% 1% 203
4 IEEE ELECTRON DEVICE LETTERS 22998 6% 1% 123
5 MICROELECTRONICS RELIABILITY 20968 5% 1% 103
6 IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOFIZIKA 13140 2% 2% 44
7 JOURNAL OF APPLIED PHYSICS 3973 8% 0% 180
8 PHYSICA B & C 2690 1% 1% 28
9 SOVIET PHYSICS SEMICONDUCTORS-USSR 2472 1% 1% 32
10 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 2433 2% 0% 38

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 LOW FREQUENCY NOISE 821118 8% 34% 178 Search LOW+FREQUENCY+NOISE Search LOW+FREQUENCY+NOISE
2 1 F NOISE 468753 7% 21% 159 Search 1+F+NOISE Search 1+F+NOISE
3 FLICKER NOISE 193924 3% 23% 61 Search FLICKER+NOISE Search FLICKER+NOISE
4 RANDOM TELEGRAPH NOISE RTN 171859 1% 39% 32 Search RANDOM+TELEGRAPH+NOISE+RTN Search RANDOM+TELEGRAPH+NOISE+RTN
5 LOW FREQUENCY LF NOISE 165747 1% 71% 17 Search LOW+FREQUENCY+LF+NOISE Search LOW+FREQUENCY+LF+NOISE
6 RTS NOISE 153204 1% 70% 16 Search RTS+NOISE Search RTS+NOISE
7 OXIDE TRAP DENSITY 118967 0% 79% 11 Search OXIDE+TRAP+DENSITY Search OXIDE+TRAP+DENSITY
8 RANDOM TELEGRAPH SIGNAL 117128 1% 43% 20 Search RANDOM+TELEGRAPH+SIGNAL Search RANDOM+TELEGRAPH+SIGNAL
9 LF NOISE 101359 0% 82% 9 Search LF+NOISE Search LF+NOISE
10 RANDOM TELEGRAPH SIGNAL RTS NOISE 90089 1% 55% 12 Search RANDOM+TELEGRAPH+SIGNAL+RTS+NOISE Search RANDOM+TELEGRAPH+SIGNAL+RTS+NOISE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 VANDAMME, LKJ , HOOGE, FN , (2008) WHAT DO WE CERTAINLY KNOW ABOUT 1/F NOISE IN MOSTS?.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 55. ISSUE 11. P. 3070 -3085 66 90% 117
2 SIMOEN, E , CLAEYS, C , (1999) ON THE FLICKER NOISE IN SUBMICRON SILICON MOSFETS.SOLID-STATE ELECTRONICS. VOL. 43. ISSUE 5. P. 865 -882 66 92% 171
3 GHIBAUDO, G , BOUTCHACHA, T , (2002) ELECTRICAL NOISE AND RTS FLUCTUATIONS IN ADVANCED CMOS DEVICES.MICROELECTRONICS RELIABILITY. VOL. 42. ISSUE 4-5. P. 573 -582 48 94% 206
4 SIMOEN, E , MERCHA, A , CLAEY, C , LUKYANCHIKOVA, N , (2007) LOW-FREQUENCY NOISE IN SILICON-ON-INSULATOR DEVICES AND TECHNOLOGIES.SOLID-STATE ELECTRONICS. VOL. 51. ISSUE 1. P. 16 -37 65 69% 24
5 ZHIGALSKII, GP , (1997) 1/F NOISE AND NONLINEAR EFFECTS IN THIN METAL FILMS.USPEKHI FIZICHESKIKH NAUK. VOL. 167. ISSUE 6. P. 623-648 63 94% 19
6 JONES, BK , (2002) ELECTRICAL NOISE AS A RELIABILITY INDICATOR IN ELECTRONIC DEVICES AND COMPONENTS.IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS. VOL. 149. ISSUE 1. P. 13 -22 63 63% 30
7 JONES, BK , (1994) ELECTRICAL NOISE AS A MEASURE OF QUALITY AND RELIABILITY IN ELECTRONIC DEVICES.ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS, VOL 87. VOL. 87. ISSUE . P. 201-257 66 73% 77
8 HOOGE, FN , (1994) 1/F NOISE SOURCES.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 41. ISSUE 11. P. 1926-1935 31 100% 541
9 RAYCHAUDHURI, AK , (2002) MEASUREMENT OF 1/F NOISE AND ITS APPLICATION IN MATERIALS SCIENCE.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 6. ISSUE 1. P. 67 -85 56 65% 55
10 WEISSMAN, MB , (1988) 1/F NOISE AND OTHER SLOW, NONEXPONENTIAL KINETICS IN CONDENSED MATTER.REVIEWS OF MODERN PHYSICS. VOL. 60. ISSUE 2. P. 537-571 54 56% 979

Classes with closest relation at Level 1


Rank Class id link
1 14880 SIGEHBT//A AMA MICROELECT SCI TECHNOL//MIXED MODE STRESS
2 27295 FLUCTUATION ENHANCED SENSING//ADSORPTION DESORPTION NOISE//NOISE BASED LOGIC
3 19150 EQUIPE MAT SUPRACONDUCTEURS HAUTE TEMP CRIT//URA 0002//MAT SUPRACONDUCTEURS HAUTE TEMP CRIT
4 24736 1T DRAM//CAPACITORLESS DRAM//CAPACITORLESS
5 12282 NOISE PARAMETERS//CHANNEL THERMAL NOISE//INDUCED GATE NOISE
6 13793 DEVICE MODELLING GRP//RANDOM DOPANT FLUCTUATION//RANDOM DOPANT
7 22058 ALLAN FACTOR//C COGNIT ACT PERCEPT//COGNIT ACT PERCEPT
8 20489 PN JUNCTION LEAKAGE//IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE
9 4469 HOT CARRIERS//HOT CARRIER DEGRADATION//CHARGE PUMPING
10 6444 EFFECTIVE CHANNEL LENGTH//IEEE TRANSACTIONS ON ELECTRON DEVICES//LOW TEMPERATURE ELECTRONICS

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