Class information for:
Level 1: NOISE PARAMETERS//CHANNEL THERMAL NOISE//INDUCED GATE NOISE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
12282 917 16.1 47%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
42 3       IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS//ENGINEERING, ELECTRICAL & ELECTRONIC 97664
131 2             IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS 23908
12282 1                   NOISE PARAMETERS//CHANNEL THERMAL NOISE//INDUCED GATE NOISE 917

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 NOISE PARAMETERS authKW 1179956 7% 58% 61
2 CHANNEL THERMAL NOISE authKW 440701 2% 88% 15
3 INDUCED GATE NOISE authKW 437403 2% 77% 17
4 RF MOSFET authKW 399560 2% 67% 18
5 SUBSTRATE RESISTANCE authKW 304422 2% 57% 16
6 RF NOISE authKW 271920 2% 58% 14
7 KINK PHENOMENON authKW 233084 1% 100% 7
8 NOISE TEMPERATURE authKW 225794 3% 29% 23
9 HIGH FREQUENCY HF NOISE authKW 203947 1% 88% 7
10 GATE RESISTANCE authKW 177574 1% 44% 12

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Engineering, Electrical & Electronic 21817 88% 0% 805
2 Physics, Applied 1341 26% 0% 242
3 Telecommunications 924 9% 0% 82
4 Instruments & Instrumentation 358 7% 0% 64
5 Computer Science, Hardware & Architecture 205 3% 0% 27
6 Optics 139 7% 0% 60
7 Mathematics, Interdisciplinary Applications 100 3% 0% 26
8 Physics, Condensed Matter 87 7% 0% 67
9 Computer Science, Interdisciplinary Applications 33 2% 0% 21
10 Nanoscience & Nanotechnology 12 2% 0% 21

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 UNITA TORINO POLITECN 76106 0% 57% 4
2 MMIC RD 66595 0% 100% 2
3 FLUCTUAT PHENOMENA 49944 0% 50% 3
4 FG MIKROWELLENTECH 44396 0% 67% 2
5 A AMA MICROELE ON SCI TECHNOL 33298 0% 100% 1
6 ADV LARGE SCALE INTEGRAT DEV 33298 0% 100% 1
7 ADV RF SYST 33298 0% 100% 1
8 ANALOG RF DEVICE DEV 33298 0% 100% 1
9 BECKMAN 3041 33298 0% 100% 1
10 BELL SWITCHING SYST 33298 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 64086 17% 1% 156
2 IEEE TRANSACTIONS ON ELECTRON DEVICES 24592 12% 1% 106
3 MICROWAVE JOURNAL 10844 3% 1% 24
4 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 10489 6% 1% 53
5 INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS 8970 2% 2% 16
6 SOLID-STATE ELECTRONICS 7098 5% 0% 46
7 MICROWAVES & RF 6885 1% 2% 12
8 IEEE ELECTRON DEVICE LETTERS 6785 5% 0% 43
9 IEEE MICROWAVE AND GUIDED WAVE LETTERS 5685 1% 1% 12
10 IEEE MICROWAVE MAGAZINE 5360 1% 2% 10

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 NOISE PARAMETERS 1179956 7% 58% 61 Search NOISE+PARAMETERS Search NOISE+PARAMETERS
2 CHANNEL THERMAL NOISE 440701 2% 88% 15 Search CHANNEL+THERMAL+NOISE Search CHANNEL+THERMAL+NOISE
3 INDUCED GATE NOISE 437403 2% 77% 17 Search INDUCED+GATE+NOISE Search INDUCED+GATE+NOISE
4 RF MOSFET 399560 2% 67% 18 Search RF+MOSFET Search RF+MOSFET
5 SUBSTRATE RESISTANCE 304422 2% 57% 16 Search SUBSTRATE+RESISTANCE Search SUBSTRATE+RESISTANCE
6 RF NOISE 271920 2% 58% 14 Search RF+NOISE Search RF+NOISE
7 KINK PHENOMENON 233084 1% 100% 7 Search KINK+PHENOMENON Search KINK+PHENOMENON
8 NOISE TEMPERATURE 225794 3% 29% 23 Search NOISE+TEMPERATURE Search NOISE+TEMPERATURE
9 HIGH FREQUENCY HF NOISE 203947 1% 88% 7 Search HIGH+FREQUENCY+HF+NOISE Search HIGH+FREQUENCY+HF+NOISE
10 GATE RESISTANCE 177574 1% 44% 12 Search GATE+RESISTANCE Search GATE+RESISTANCE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 CHEN, CH , (2008) ACCURACY ISSUES OF ON-WAFER MICROWAVE NOISE MEASUREMENTS.FLUCTUATION AND NOISE LETTERS. VOL. 8. ISSUE 3-4. P. L281-L303 34 92% 0
2 ONG, SN , YEO, KS , CHEW, KWJ , CHAN, LHK , (2014) SUBSTRATE-INDUCED NOISE MODEL AND PARAMETER EXTRACTION FOR HIGH-FREQUENCY NOISE MODELING OF SUB-MICRON MOSFETS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 62. ISSUE 9. P. 1973 -1985 24 100% 3
3 JINDAL, RP , (2006) COMPACT NOISE MODELS FOR MOSFETS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 53. ISSUE 9. P. 2051 -2061 41 57% 50
4 BELOSTOTSKI, L , HASLETT, JW , (2010) EVALUATION OF TUNER-BASED NOISE-PARAMETER EXTRACTION METHODS FOR VERY LOW NOISE AMPLIFIERS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 58. ISSUE 1. P. 236 -250 28 80% 8
5 ANTONOPOULOS, A , BUCHER, M , PAPATHANASIOU, K , MAVREDAKIS, N , MAKRIS, N , SHARMA, RK , SAKALAS, P , SCHROTER, M , (2013) CMOS SMALL-SIGNAL AND THERMAL NOISE MODELING AT HIGH FREQUENCIES.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 60. ISSUE 11. P. 3726-3733 24 83% 8
6 OTEGI, N , COLLANTES, JM , SAYED, M , (2013) COMPARATIVE ANALYSIS OF RECEIVER BANDWIDTH EFFECTS ON Y-FACTOR AND COLD-SOURCE NOISE FIGURE MEASUREMENTS.INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES. VOL. 5. ISSUE 6. P. 659 -667 19 100% 0
7 MOHD, SKK , NOH, NM , SIDEK, O , (2014) EVALUATION OF NOISE PARAMETER CHARACTERIZATION METHODS FOR RADIO FREQUENCY INTEGRATED CIRCUIT (RFIC) DEVICE.JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS. VOL. 16. ISSUE 5-6. P. 591 -599 18 100% 0
8 CHAN, LHK , YEO, KS , CHEW, KWJ , ONG, SN , (2015) HIGH-FREQUENCY NOISE MODELING OF MOSFETS FOR ULTRA LOW-VOLTAGE RF APPLICATIONS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 63. ISSUE 1. P. 141 -154 20 80% 3
9 CHEN, CH , WANG, YL , BAKR, MH , (2008) WAVE-BASED APPROACH FOR MICROWAVE NOISE CHARACTERIZATION.FLUCTUATION AND NOISE LETTERS. VOL. 8. ISSUE 1. P. R1-R14 20 91% 1
10 CHALKIADAKI, MA , ENZ, CC , (2015) RF SMALL-SIGNAL AND NOISE MODELING INCLUDING PARAMETER EXTRACTION OF NANOSCALE MOSFET FROM WEAK TO STRONG INVERSION.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 63. ISSUE 7. P. 2173 -2184 17 74% 4

Classes with closest relation at Level 1


Rank Class id link
1 5693 LARGE SIGNAL MODEL//NONLINEAR MEASUREMENTS//IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
2 33317 NULL BALANCED//NOISE STANDARD//RADIONAVIGATION
3 2344 LOW NOISE AMPLIFIER LNA//LOW NOISE AMPLIFIER//MIXER
4 15902 DISTRIBUTED AMPLIFIERS//QUASI CIRCULATOR//DISTRIBUTED AMPLIFIER DA
5 15683 SIMULAT OPTIMIZAT SYST//SPACE MAPPING//ENGN OPTIMIZAT MODELING
6 6011 SPIRAL INDUCTOR//INDUCTORS//DE EMBEDDING
7 6444 EFFECTIVE CHANNEL LENGTH//IEEE TRANSACTIONS ON ELECTRON DEVICES//LOW TEMPERATURE ELECTRONICS
8 3053 IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//PSEUDOMORPHIC MODFET
9 566 FINFET//SHORT CHANNEL EFFECTS//DOUBLE GATE MOSFET
10 22545 REAL FREQUENCY TECHNIQUE//BROADBAND MATCHING//LOSSLESS NETWORKS

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