Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
21469 | 417 | 23.8 | 49% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
178 | 3 | GAN//PHYSICS, APPLIED//GALLIUM NITRIDE | 57874 |
816 | 2 | LEAD FREE SOLDER//SOLDER//SOLDERING & SURFACE MOUNT TECHNOLOGY | 11969 |
21469 | 1 | TIN WHISKERS//SN WHISKER//WHISKER GROWTH | 417 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | TIN WHISKERS | authKW | 5309532 | 21% | 84% | 86 |
2 | SN WHISKER | authKW | 1664381 | 7% | 78% | 29 |
3 | WHISKER GROWTH | authKW | 1076401 | 5% | 70% | 21 |
4 | TIN PLATING | authKW | 551994 | 3% | 54% | 14 |
5 | METAL WHISKERS | authKW | 448504 | 2% | 88% | 7 |
6 | AUTOMOT ELECT ENGN ASSEMBLY INTERCONNECT TECHNOL | address | 219676 | 1% | 100% | 3 |
7 | ELECTROPLATED TIN | authKW | 219676 | 1% | 100% | 3 |
8 | SN PLATING | authKW | 219676 | 1% | 100% | 3 |
9 | IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING | journal | 201819 | 8% | 8% | 33 |
10 | WHISKER | authKW | 195942 | 12% | 5% | 52 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Multidisciplinary | 2892 | 58% | 0% | 240 |
2 | Metallurgy & Metallurgical Engineering | 2868 | 28% | 0% | 117 |
3 | Engineering, Manufacturing | 1864 | 12% | 0% | 49 |
4 | Physics, Applied | 1641 | 41% | 0% | 171 |
5 | Engineering, Electrical & Electronic | 1058 | 31% | 0% | 128 |
6 | Nanoscience & Nanotechnology | 421 | 12% | 0% | 48 |
7 | Materials Science, Coatings & Films | 370 | 7% | 0% | 30 |
8 | Mining & Mineral Processing | 131 | 2% | 0% | 8 |
9 | Mineralogy | 62 | 2% | 0% | 8 |
10 | Physics, Condensed Matter | 59 | 8% | 0% | 35 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | AUTOMOT ELECT ENGN ASSEMBLY INTERCONNECT TECHNOL | 219676 | 1% | 100% | 3 |
2 | IMPLEMENTAT PROD | 195265 | 1% | 67% | 4 |
3 | MAT SEMICOND STRUCT | 167369 | 1% | 57% | 4 |
4 | ISG GRP | 146451 | 0% | 100% | 2 |
5 | MARITIME MISSION | 146451 | 0% | 100% | 2 |
6 | METALL MAT PROC SECT | 146451 | 0% | 100% | 2 |
7 | ORBITER SUSTAINING ENGN OFF | 146451 | 0% | 100% | 2 |
8 | CORROS STUDIES | 97633 | 0% | 67% | 2 |
9 | PACKAGING FINISHING TECHNOL | 97633 | 0% | 67% | 2 |
10 | ADV ELECT JOINING MAT | 73225 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING | 201819 | 8% | 8% | 33 |
2 | JOURNAL OF ELECTRONIC MATERIALS | 21990 | 13% | 1% | 54 |
3 | MICROELECTRONICS RELIABILITY | 9494 | 7% | 0% | 30 |
4 | CIRCUIT WORLD | 9189 | 1% | 3% | 5 |
5 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 5453 | 2% | 1% | 10 |
6 | TRANSACTIONS OF THE INSTITUTE OF METAL FINISHING | 3854 | 2% | 1% | 8 |
7 | GALVANOTECHNIK | 2814 | 0% | 4% | 1 |
8 | JOURNAL OF MATERIALS RESEARCH | 2716 | 5% | 0% | 21 |
9 | JOM | 2175 | 2% | 0% | 8 |
10 | JOURNAL OF THE JAPAN INSTITUTE OF METALS | 1776 | 3% | 0% | 12 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | TIN WHISKERS | 5309532 | 21% | 84% | 86 | Search TIN+WHISKERS | Search TIN+WHISKERS |
2 | SN WHISKER | 1664381 | 7% | 78% | 29 | Search SN+WHISKER | Search SN+WHISKER |
3 | WHISKER GROWTH | 1076401 | 5% | 70% | 21 | Search WHISKER+GROWTH | Search WHISKER+GROWTH |
4 | TIN PLATING | 551994 | 3% | 54% | 14 | Search TIN+PLATING | Search TIN+PLATING |
5 | METAL WHISKERS | 448504 | 2% | 88% | 7 | Search METAL+WHISKERS | Search METAL+WHISKERS |
6 | ELECTROPLATED TIN | 219676 | 1% | 100% | 3 | Search ELECTROPLATED+TIN | Search ELECTROPLATED+TIN |
7 | SN PLATING | 219676 | 1% | 100% | 3 | Search SN+PLATING | Search SN+PLATING |
8 | WHISKER | 195942 | 12% | 5% | 52 | Search WHISKER | Search WHISKER |
9 | TIN ELECTROPLATING | 195265 | 1% | 67% | 4 | Search TIN+ELECTROPLATING | Search TIN+ELECTROPLATING |
10 | LEADFRAME PACKAGE | 164756 | 1% | 75% | 3 | Search LEADFRAME+PACKAGE | Search LEADFRAME+PACKAGE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | CHASON, E , JADHAV, N , PEI, F , BUCHOVECKY, E , BOWER, A , (2013) GROWTH OF WHISKERS FROM SN SURFACES: DRIVING FORCES AND GROWTH MECHANISMS.PROGRESS IN SURFACE SCIENCE. VOL. 88. ISSUE 2. P. 103 -131 | 80 | 81% | 21 |
2 | ZHANG, PG , ZHANG, YM , SUN, ZM , (2015) SPONTANEOUS GROWTH OF METAL WHISKERS ON SURFACES OF SOLIDS: A REVIEW.JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY. VOL. 31. ISSUE 7. P. 675 -698 | 76 | 70% | 6 |
3 | PEI, F , BOWER, AF , CHASON, E , (2016) QUANTIFYING THE RATES OF SN WHISKER GROWTH AND PLASTIC STRAIN RELAXATION USING THERMALLY-INDUCED STRESS.JOURNAL OF ELECTRONIC MATERIALS. VOL. 45. ISSUE 1. P. 21 -29 | 44 | 96% | 0 |
4 | CHASON, E , PEI, F , (2015) MEASURING THE STRESS DEPENDENCE OF NUCLEATION AND GROWTH PROCESSES IN SN WHISKER FORMATION.JOM. VOL. 67. ISSUE 10. P. 2416 -2424 | 27 | 96% | 2 |
5 | STEIN, J , WELZEL, U , LEINEWEBER, A , HUEGEL, W , MITTEMEIJER, EJ , (2015) THE CRYSTALLOGRAPHIC GROWTH DIRECTIONS OF SN WHISKERS.ACTA MATERIALIA. VOL. 86. ISSUE . P. 102 -109 | 26 | 100% | 2 |
6 | YANG, FQ , (2016) A NONLINEAR VISCOUS MODEL FOR SN-WHISKER GROWTH.METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE. VOL. 47A. ISSUE 12. P. 5882 -5889 | 29 | 85% | 0 |
7 | ASHWORTH, MA , WILCOX, GD , HIGGINSON, RL , HEATH, RJ , LIU, C , MORTIMER, RJ , (2015) THE EFFECT OF ELECTROPLATING PARAMETERS AND SUBSTRATE MATERIAL ON TIN WHISKER FORMATION.MICROELECTRONICS RELIABILITY. VOL. 55. ISSUE 1. P. 180 -191 | 23 | 92% | 6 |
8 | CHEN, H , LEE, HY , KU, CS , WU, AT , (2016) EVOLUTION OF RESIDUAL STRESS AND QUALITATIVE ANALYSIS OF SN WHISKERS WITH VARIOUS MICROSTRUCTURES.JOURNAL OF MATERIALS SCIENCE. VOL. 51. ISSUE 7. P. 3600 -3606 | 22 | 96% | 0 |
9 | IVEY, DG , HE, A , (2015) MICROSTRUCTURAL STUDY OF SN FILMS ELECTRODEPOSITED ON CU SUBSTRATES: SN WHISKERS AND CU6SN5 PRECIPITATES.JOURNAL OF MATERIALS SCIENCE. VOL. 50. ISSUE 7. P. 2944 -2959 | 25 | 78% | 2 |
10 | BUNYAN, D , ASHWORTH, MA , WILCOX, GD , HIGGINSON, RL , HEATH, RJ , LIU, C , (2013) TIN WHISKER GROWTH FROM ELECTROPLATED FINISHES - A REVIEW.TRANSACTIONS OF THE INSTITUTE OF METAL FINISHING. VOL. 91. ISSUE 5. P. 249-259 | 20 | 95% | 7 |
Classes with closest relation at Level 1 |