Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
19107 | 522 | 17.4 | 52% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
746 | 2 | BETA FESI2//SILICIDES//SERIES RESISTANCE | 12475 |
19107 | 1 | LASER MOL BEAM EPITAXY//PTSI//INTERNAL PHOTOEMISSION EFFECT | 522 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | LASER MOL BEAM EPITAXY | address | 467966 | 2% | 100% | 8 |
2 | PTSI | authKW | 352171 | 3% | 35% | 17 |
3 | INTERNAL PHOTOEMISSION EFFECT | authKW | 175487 | 1% | 100% | 3 |
4 | IRIDIUM SILICIDES | authKW | 131614 | 1% | 75% | 3 |
5 | SCHOTTKY PHOTODETECTORS | authKW | 131614 | 1% | 75% | 3 |
6 | HIP DETECTORS | authKW | 116992 | 0% | 100% | 2 |
7 | IRSI POLYCRYSTALLINE | authKW | 116992 | 0% | 100% | 2 |
8 | MOLECULAR BEAM EPITAXY SYSTEM | authKW | 116992 | 0% | 100% | 2 |
9 | PTSI SCHOTTKY BARRIER DETECTOR SBD | authKW | 116992 | 0% | 100% | 2 |
10 | PTSI SCHOTTKY DETECTORS | authKW | 116992 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 3646 | 53% | 0% | 279 |
2 | Optics | 935 | 19% | 0% | 97 |
3 | Physics, Condensed Matter | 686 | 20% | 0% | 107 |
4 | Materials Science, Coatings & Films | 589 | 8% | 0% | 42 |
5 | Engineering, Electrical & Electronic | 587 | 21% | 0% | 112 |
6 | Materials Science, Multidisciplinary | 381 | 21% | 0% | 112 |
7 | Spectroscopy | 120 | 5% | 0% | 25 |
8 | Instruments & Instrumentation | 119 | 6% | 0% | 29 |
9 | Nanoscience & Nanotechnology | 42 | 4% | 0% | 21 |
10 | Metallurgy & Metallurgical Engineering | 28 | 3% | 0% | 18 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | LASER MOL BEAM EPITAXY | 467966 | 2% | 100% | 8 |
2 | MICROELECT DEVICES | 75205 | 1% | 43% | 3 |
3 | GRP RECH MAT COMPOSANTS MICROSTRUCT | 58496 | 0% | 100% | 1 |
4 | IEMNASEN | 58496 | 0% | 100% | 1 |
5 | INTERETAB | 58496 | 0% | 100% | 1 |
6 | IST MICROELETTRON MICROSISTEMI SEZ | 58496 | 0% | 100% | 1 |
7 | LASERS PLASMA | 58496 | 0% | 100% | 1 |
8 | LS ANGEW PHYS | 58496 | 0% | 100% | 1 |
9 | LS KRISTALLOG | 58496 | 0% | 100% | 1 |
10 | LS MIKROCHARAKTERISIERUNG | 58496 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | RCA REVIEW | 4867 | 1% | 2% | 4 |
2 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 4325 | 4% | 0% | 20 |
3 | QIRT JOURNAL | 2087 | 0% | 4% | 1 |
4 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 2006 | 4% | 0% | 23 |
5 | JOURNAL OF APPLIED PHYSICS | 1858 | 11% | 0% | 59 |
6 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 1251 | 2% | 0% | 11 |
7 | APPLIED PHYSICS LETTERS | 1168 | 9% | 0% | 48 |
8 | IEEE ELECTRON DEVICE LETTERS | 1077 | 2% | 0% | 13 |
9 | THIN SOLID FILMS | 1055 | 5% | 0% | 26 |
10 | SOLID-STATE ELECTRONICS | 983 | 2% | 0% | 13 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | PTSI | 352171 | 3% | 35% | 17 | Search PTSI | Search PTSI |
2 | INTERNAL PHOTOEMISSION EFFECT | 175487 | 1% | 100% | 3 | Search INTERNAL+PHOTOEMISSION+EFFECT | Search INTERNAL+PHOTOEMISSION+EFFECT |
3 | IRIDIUM SILICIDES | 131614 | 1% | 75% | 3 | Search IRIDIUM+SILICIDES | Search IRIDIUM+SILICIDES |
4 | SCHOTTKY PHOTODETECTORS | 131614 | 1% | 75% | 3 | Search SCHOTTKY+PHOTODETECTORS | Search SCHOTTKY+PHOTODETECTORS |
5 | HIP DETECTORS | 116992 | 0% | 100% | 2 | Search HIP+DETECTORS | Search HIP+DETECTORS |
6 | IRSI POLYCRYSTALLINE | 116992 | 0% | 100% | 2 | Search IRSI+POLYCRYSTALLINE | Search IRSI+POLYCRYSTALLINE |
7 | MOLECULAR BEAM EPITAXY SYSTEM | 116992 | 0% | 100% | 2 | Search MOLECULAR+BEAM+EPITAXY+SYSTEM | Search MOLECULAR+BEAM+EPITAXY+SYSTEM |
8 | PTSI SCHOTTKY BARRIER DETECTOR SBD | 116992 | 0% | 100% | 2 | Search PTSI+SCHOTTKY+BARRIER+DETECTOR+SBD | Search PTSI+SCHOTTKY+BARRIER+DETECTOR+SBD |
9 | PTSI SCHOTTKY DETECTORS | 116992 | 0% | 100% | 2 | Search PTSI+SCHOTTKY+DETECTORS | Search PTSI+SCHOTTKY+DETECTORS |
10 | SCHOTTKY BARRIER DETECTOR SBD | 116992 | 0% | 100% | 2 | Search SCHOTTKY+BARRIER+DETECTOR+SBD | Search SCHOTTKY+BARRIER+DETECTOR+SBD |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | SCALES, C , BERINI, P , (2010) THIN-FILM SCHOTTKY BARRIER PHOTODETECTOR MODELS.IEEE JOURNAL OF QUANTUM ELECTRONICS. VOL. 46. ISSUE 5. P. 633 -643 | 19 | 83% | 70 |
2 | CASALINO, M , (2016) INTERNAL PHOTOEMISSION THEORY: COMMENTS AND THEORETICAL LIMITATIONS ON THE PERFORMANCE OF NEAR-INFRARED SILICON SCHOTTKY PHOTODETECTORS.IEEE JOURNAL OF QUANTUM ELECTRONICS. VOL. 52. ISSUE 4. P. - | 18 | 72% | 0 |
3 | BERINI, P , (2014) SURFACE PLASMON PHOTODETECTORS AND THEIR APPLICATIONS.LASER & PHOTONICS REVIEWS. VOL. 8. ISSUE 2. P. 197 -220 | 40 | 24% | 46 |
4 | WAWRO, A , SUTO, S , KASUYA, A , (2005) STM STUDIES OF PTSI FORMATION ON SI(111) BY SOLID STATE EPITAXY.PHYSICAL REVIEW B. VOL. 72. ISSUE 20. P. - | 25 | 60% | 14 |
5 | OLIVIERI, A , AKBARI, A , BERINI, P , (2010) SURFACE PLASMON WAVEGUIDE SCHOTTKY DETECTORS OPERATING NEAR BREAKDOWN.PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS. VOL. 4. ISSUE 10. P. 283 -285 | 12 | 86% | 3 |
6 | ERFANIAN, A , MEHRARA, H , KHAJE, M , AFIFI, A , (2015) A ROOM TEMPERATURE 2 X 128 PTSI/SI-NANOSTRUCTURE PHOTODETECTOR ARRAY COMPATIBLE WITH CMOS PROCESS.SENSOR REVIEW. VOL. 35. ISSUE 3. P. 282 -286 | 10 | 83% | 1 |
7 | CASALINO, M , IODICE, M , SIRLETO, L , RENDINA, I , COPPOLA, G , (2013) ASYMMETRIC MSM SUB-BANDGAP ALL-SILICON PHOTODETECTOR WITH LOW DARK CURRENT.OPTICS EXPRESS. VOL. 21. ISSUE 23. P. 28072-28082 | 14 | 54% | 13 |
8 | ASLAN, B , TURAN, R , (2002) ON THE INTERNAL PHOTOEMISSION SPECTRUM OF PTSI/P-SI INFRARED DETECTORS.INFRARED PHYSICS & TECHNOLOGY. VOL. 43. ISSUE 2. P. 85-90 | 13 | 81% | 10 |
9 | ASLAN, B , TURAN, R , LIU, HC , (2005) STUDY ON THE LONG WAVELENGTH SIGE/SI HETEROJUNCTION INTERNAL PHOTOEMISSION INFRARED PHOTODETECTORS.INFRARED PHYSICS & TECHNOLOGY. VOL. 47. ISSUE 1-2. P. 195-205 | 13 | 72% | 0 |
10 | KANG, BX , CAI, Y , WANG, LX , (2016) IMPROVEMENT OF EXTERNAL QUANTUM EFFICIENCY OF SILICIDE SCHOTTKY-BARRIER DETECTORS IN THE 3 TO 5 MU M WAVEBAND WITH SUBWAVELENGTH-GRATING INCIDENT PLANE.OPTICAL ENGINEERING. VOL. 55. ISSUE 4. P. - | 13 | 52% | 0 |
Classes with closest relation at Level 1 |