Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 35885 | 90 | 21.9 | 65% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
| 746 | 2 | BETA FESI2//SILICIDES//SERIES RESISTANCE | 12475 |
| 35885 | 1 | CU2SI//ATOMIC ADSORPTION ON SURFACE//CU011 | 90 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | CU2SI | authKW | 678570 | 2% | 100% | 2 |
| 2 | ATOMIC ADSORPTION ON SURFACE | authKW | 339285 | 1% | 100% | 1 |
| 3 | CU011 | authKW | 339285 | 1% | 100% | 1 |
| 4 | FUNCTIONAL THEORY DFF | authKW | 339285 | 1% | 100% | 1 |
| 5 | GE RU GROWTH SYSTEM | authKW | 339285 | 1% | 100% | 1 |
| 6 | HERMES BEAMLINE | address | 339285 | 1% | 100% | 1 |
| 7 | LINEAR COMBINATION OF ATOMIC ORBITALS LCAO | authKW | 339285 | 1% | 100% | 1 |
| 8 | SIHN | authKW | 339285 | 1% | 100% | 1 |
| 9 | SURFACE EXTENDED X RAY ABSORPTION LINE STRUCTURE SEXAFS | authKW | 339285 | 1% | 100% | 1 |
| 10 | THREE FOLD | authKW | 339285 | 1% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Physics, Condensed Matter | 861 | 51% | 0% | 46 |
| 2 | Chemistry, Physical | 463 | 48% | 0% | 43 |
| 3 | Materials Science, Coatings & Films | 201 | 11% | 0% | 10 |
| 4 | Physics, Applied | 78 | 21% | 0% | 19 |
| 5 | Chemistry, Multidisciplinary | 30 | 14% | 0% | 13 |
| 6 | Materials Science, Multidisciplinary | 8 | 10% | 0% | 9 |
| 7 | Physics, Atomic, Molecular & Chemical | 6 | 4% | 0% | 4 |
| 8 | Engineering, Chemical | 5 | 4% | 0% | 4 |
| 9 | Physics, Multidisciplinary | 3 | 4% | 0% | 4 |
| 10 | Nanoscience & Nanotechnology | 1 | 2% | 0% | 2 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | HERMES BEAMLINE | 339285 | 1% | 100% | 1 |
| 2 | AUSTRALIAN NUCL SCI TECHNOL ORG | 67855 | 1% | 20% | 1 |
| 3 | CHEM SCI BUNKYO KU | 48468 | 1% | 14% | 1 |
| 4 | LUCIA BEAMLINE | 37697 | 1% | 11% | 1 |
| 5 | LCSI | 24233 | 1% | 7% | 1 |
| 6 | AUSTRALIAN SYNCHROTRON PROGRAM | 9692 | 1% | 3% | 1 |
| 7 | NANOSCALE PHYS | 9361 | 3% | 1% | 3 |
| 8 | SCPA | 7709 | 1% | 2% | 1 |
| 9 | EXPT PHYS 3 | 2338 | 1% | 1% | 1 |
| 10 | FREDERICK SEITZ MAT | 1938 | 3% | 0% | 3 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | SURFACE SCIENCE | 6681 | 26% | 0% | 23 |
| 2 | JOURNAL OF CATALYSIS | 241 | 3% | 0% | 3 |
| 3 | APPLIED SURFACE SCIENCE | 235 | 6% | 0% | 5 |
| 4 | JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS | 175 | 3% | 0% | 3 |
| 5 | PHYSICAL REVIEW B | 154 | 10% | 0% | 9 |
| 6 | SURFACE REVIEW AND LETTERS | 128 | 1% | 0% | 1 |
| 7 | JOURNAL OF MOLECULAR CATALYSIS | 115 | 1% | 0% | 1 |
| 8 | CHEMICAL PHYSICS LETTERS | 110 | 4% | 0% | 4 |
| 9 | JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS I | 104 | 1% | 0% | 1 |
| 10 | JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY | 100 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | SPENCER, MJS , NYBERG, GL , ROBINSON, AW , STAMPFL, APJ , (2002) ADSORPTION OF SIH4 ON COPPER (110) AND (111) SURFACES.SURFACE SCIENCE. VOL. 505. ISSUE 1-3. P. 308-324 | 20 | 71% | 4 |
| 2 | MENARD, H , TEAR, SP , HORN, AB , (2008) A RAIRS STUDY OF THE ADSORPTION AND DECOMPOSITION OF METHYLSILANE ON CU(111).JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 20. ISSUE 35. P. - | 17 | 57% | 1 |
| 3 | SHUTTLEWORTH, IG , ALLISON, W , (2001) THE ADSORPTION AND DESORPTION PROCESSES ACCOMPANYING THE CHEMICAL VAPOUR DEPOSITION OF SILANE ON CU(111) AND NI(111).SURFACE REVIEW AND LETTERS. VOL. 8. ISSUE 6. P. 613 -620 | 12 | 92% | 4 |
| 4 | SHUTTLEWORTH, IG , FISHER, CJ , LEE, JJ , JONES, RG , WOODRUFF, DP , (2002) A NIXSW STRUCTURAL INVESTIGATION OF THE LOW TEMPERATURE SILYL PHASE FORMED BY SIH4 REACTION WITH CU(111).CHEMICAL PHYSICS LETTERS. VOL. 351. ISSUE 3-4. P. 208-212 | 13 | 81% | 5 |
| 5 | LALMI, B , CHORRO, M , BELKHOU, R , (2013) HIGH RESOLUTION SCANNING TUNNELLING MICROSCOPY AND EXTENDED X-RAY-ABSORPTION FINE STRUCTURE STUDY OF THE (5 X 3) SILICIDE STRUCTURE ON CU(001).JOURNAL OF APPLIED PHYSICS. VOL. 114. ISSUE 6. P. - | 14 | 54% | 0 |
| 6 | MENARD, H , HORN, AB , TEAR, SP , (2005) METHYLSILANE ON CU(111), A STM STUDY OF THE (ROOT 3X ROOT 3)R30 DEGREES-CU2SI SURFACE SILICIDE.SURFACE SCIENCE. VOL. 585. ISSUE 1-2. P. 47-52 | 12 | 60% | 9 |
| 7 | HE, GM , (2004) ADSORPTION OF SI ON CU(100) AND (111) SURFACES.CHINESE PHYSICS LETTERS. VOL. 21. ISSUE 11. P. 2245-2248 | 11 | 65% | 2 |
| 8 | KERSHNER, DC , MEDLIN, JW , (2008) ADSORPTION AND DECOMPOSITION OF SIH4 ON PD(111).SURFACE SCIENCE. VOL. 602. ISSUE 3. P. 693 -701 | 14 | 38% | 4 |
| 9 | HE, GM , LI, SP , ZHOU, ZC , (2004) SI ADSORPTION ON CU(110) SURFACE FROM AB INITIO CALCULATION.SURFACE SCIENCE. VOL. 553. ISSUE 1-3. P. 126-132 | 10 | 48% | 3 |
| 10 | BONDOS, JC , DRUMMER, NE , GEWIRTH, AA , NUZZO, RG , (1999) THERMAL PHASE EVOLUTION OF PT-SI INTERMETALLIC THIN FILMS PREPARED BY THE ACTIVATED ADSORPTION OF SIH4 ON PT(100) AND COMPARISON TO KNOWN STRUCTURAL MODELS.JOURNAL OF THE AMERICAN CHEMICAL SOCIETY. VOL. 121. ISSUE 11. P. 2498 -2507 | 11 | 50% | 9 |
Classes with closest relation at Level 1 |