Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
5736 | 1581 | 21.8 | 62% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
746 | 2 | BETA FESI2//SILICIDES//SERIES RESISTANCE | 12475 |
5736 | 1 | SURFACE MAGNETO OPTIC KERR EFFECT//VALENCE BAND DENSITY OF STATES//SILICIDES | 1581 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | SURFACE MAGNETO OPTIC KERR EFFECT | authKW | 102993 | 1% | 67% | 8 |
2 | VALENCE BAND DENSITY OF STATES | authKW | 80466 | 0% | 83% | 5 |
3 | SILICIDES | authKW | 60821 | 4% | 5% | 64 |
4 | PHYS PROBLEMS MAT SCI | address | 38624 | 0% | 100% | 2 |
5 | REACTIVE EPITAXY | authKW | 38624 | 0% | 100% | 2 |
6 | VB DOS | authKW | 38624 | 0% | 100% | 2 |
7 | COSI2 | authKW | 32437 | 1% | 15% | 11 |
8 | METAL SEMICONDUCTOR MAGNETIC HETEROSTRUCTURES | authKW | 28085 | 0% | 36% | 4 |
9 | METAL SEMICONDUCTOR THIN FILM | authKW | 25748 | 0% | 67% | 2 |
10 | MN SILICIDES | authKW | 25748 | 0% | 67% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 12137 | 46% | 0% | 728 |
2 | Physics, Applied | 7263 | 44% | 0% | 696 |
3 | Materials Science, Coatings & Films | 5532 | 14% | 0% | 218 |
4 | Chemistry, Physical | 810 | 18% | 0% | 279 |
5 | Materials Science, Multidisciplinary | 542 | 16% | 0% | 253 |
6 | Physics, Multidisciplinary | 467 | 9% | 0% | 150 |
7 | Microscopy | 221 | 1% | 0% | 22 |
8 | Nuclear Science & Technology | 155 | 4% | 0% | 58 |
9 | Nanoscience & Nanotechnology | 152 | 4% | 0% | 68 |
10 | Physics, Nuclear | 146 | 4% | 0% | 58 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PHYS PROBLEMS MAT SCI | 38624 | 0% | 100% | 2 |
2 | ARTS SCI PHYS381 KOMABAMEGURO KU | 19312 | 0% | 100% | 1 |
3 | CL SOLAR ENERGY NEW ENERGY SOURCES | 19312 | 0% | 100% | 1 |
4 | CNRS UMR 7014 | 19312 | 0% | 100% | 1 |
5 | CRNS UPR 5001 | 19312 | 0% | 100% | 1 |
6 | ELECT MAT GROWTH INTER E CHARACTERIZAT EMAGIC | 19312 | 0% | 100% | 1 |
7 | FAR EASTERN BANK | 19312 | 0% | 100% | 1 |
8 | FOR UNGSZENTRUM JULICH ICHT IONENTECH | 19312 | 0% | 100% | 1 |
9 | MECH ENGN MAT NANOTECHNOL | 19312 | 0% | 100% | 1 |
10 | PHYS ASTRON SCI ENGN MAT | 19312 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SURFACE SCIENCE | 14724 | 9% | 1% | 144 |
2 | MATERIALS SCIENCE REPORTS | 14708 | 0% | 19% | 4 |
3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 5263 | 1% | 2% | 18 |
4 | APPLIED SURFACE SCIENCE | 4955 | 6% | 0% | 96 |
5 | PHYSICAL REVIEW B | 3818 | 12% | 0% | 186 |
6 | APPLIED PHYSICS LETTERS | 2496 | 8% | 0% | 123 |
7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2455 | 3% | 0% | 43 |
8 | THIN SOLID FILMS | 2224 | 4% | 0% | 66 |
9 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 1733 | 2% | 0% | 30 |
10 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1702 | 2% | 0% | 39 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SURFACE MAGNETO OPTIC KERR EFFECT | 102993 | 1% | 67% | 8 | Search SURFACE+MAGNETO+OPTIC+KERR+EFFECT | Search SURFACE+MAGNETO+OPTIC+KERR+EFFECT |
2 | VALENCE BAND DENSITY OF STATES | 80466 | 0% | 83% | 5 | Search VALENCE+BAND+DENSITY+OF+STATES | Search VALENCE+BAND+DENSITY+OF+STATES |
3 | SILICIDES | 60821 | 4% | 5% | 64 | Search SILICIDES | Search SILICIDES |
4 | REACTIVE EPITAXY | 38624 | 0% | 100% | 2 | Search REACTIVE+EPITAXY | Search REACTIVE+EPITAXY |
5 | VB DOS | 38624 | 0% | 100% | 2 | Search VB+DOS | Search VB+DOS |
6 | COSI2 | 32437 | 1% | 15% | 11 | Search COSI2 | Search COSI2 |
7 | METAL SEMICONDUCTOR MAGNETIC HETEROSTRUCTURES | 28085 | 0% | 36% | 4 | Search METAL+SEMICONDUCTOR+MAGNETIC+HETEROSTRUCTURES | Search METAL+SEMICONDUCTOR+MAGNETIC+HETEROSTRUCTURES |
8 | METAL SEMICONDUCTOR THIN FILM | 25748 | 0% | 67% | 2 | Search METAL+SEMICONDUCTOR+THIN+FILM | Search METAL+SEMICONDUCTOR+THIN+FILM |
9 | MN SILICIDES | 25748 | 0% | 67% | 2 | Search MN+SILICIDES | Search MN+SILICIDES |
10 | N SI111H | 25748 | 0% | 67% | 2 | Search N+SI111H | Search N+SI111H |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | VONKANEL, H , (1992) GROWTH AND CHARACTERIZATION OF EPITAXIAL NI-SILICADE AND CO-SILICIDE.MATERIALS SCIENCE REPORTS. VOL. 8. ISSUE 5. P. 193-269 | 157 | 84% | 175 |
2 | TUNG, RT , (1992) EPITAXIAL COSI2 AND NISI2 THIN-FILMS.MATERIALS CHEMISTRY AND PHYSICS. VOL. 32. ISSUE 2. P. 107-133 | 123 | 84% | 94 |
3 | ALEKSEEV, AA , OLYANICH, DA , UTAS, TV , KOTLYAR, VG , ZOTOV, AV , SARANIN, AA , (2015) SCANNING TUNNELING MICROSCOPY OBSERVATION OF ULTRATHIN EPITAXIAL COSI2(111) FILMS GROWN AT A HIGH TEMPERATURE.TECHNICAL PHYSICS. VOL. 60. ISSUE 10. P. 1508 -1514 | 36 | 86% | 0 |
4 | CHEN, LJ , TU, KN , (1991) EPITAXIAL-GROWTH OF TRANSITION-METAL SILICIDES ON SILICON.MATERIALS SCIENCE REPORTS. VOL. 6. ISSUE 2-3. P. 53-140 | 85 | 61% | 107 |
5 | YUAN, Z , SONNET, P , HANF, MC , STEPHAN, R , DULOT, F , WETZEL, P , (2013) STRUCTURAL AND ELECTRONIC PROPERTIES OF THE CO-INDUCED SI(111) ROOT 13 X ROOT 13-R13.9 DEGREES SURFACE RECONSTRUCTION.SURFACE SCIENCE. VOL. 607. ISSUE . P. 111 -117 | 32 | 74% | 4 |
6 | BULLELIEUWMA, CWT , (1993) EPITAXIAL-GROWTH OF COSI2/SI STRUCTURES.APPLIED SURFACE SCIENCE. VOL. 68. ISSUE 1. P. 1 -18 | 48 | 87% | 35 |
7 | WARDLE, MG , GOSS, JP , BRIDDON, PR , JONES, R , (2005) STRUCTURAL AND ELECTRONIC PROPERTIES OF THIN FLUORITE-STRUCTURE NISI2, COSI2 AND FESI2 INTERFACES AND PRECIPITATES IN SI.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 202. ISSUE 5. P. 883-888 | 34 | 81% | 7 |
8 | MANTL, S , (1992) ION-BEAM SYNTHESIS OF EPITAXIAL SILICIDES - FABRICATION, CHARACTERIZATION AND APPLICATIONS.MATERIALS SCIENCE REPORTS. VOL. 8. ISSUE 1-2. P. 1 -95 | 66 | 52% | 164 |
9 | VANDERVEEN, JF , FISCHER, AEMJ , VRIJMOETH, J , (1989) NICKEL AND COBALT SILICIDES ON SILICON - THIN-FILM REACTION AND INTERFACE STRUCTURE.APPLIED SURFACE SCIENCE. VOL. 38. ISSUE 1-4. P. 13-26 | 53 | 93% | 12 |
10 | BULLELIEUWMA, CWT , VANDENHOUDT, DEW , HENZ, J , ONDA, N , VONKANEL, H , (1993) INVESTIGATION OF THE DEFECT STRUCTURE OF THIN SINGLE-CRYSTALLINE COSI2 (B) FILMS ON SI(111) BY TRANSMISSION ELECTRON-MICROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 73. ISSUE 7. P. 3220 -3236 | 44 | 90% | 18 |
Classes with closest relation at Level 1 |