Class information for:
Level 1: DEFECT ELECTRON STATES//DELOCALIZED TRAP//FOURIER TRANSFORM UV VIS REGION

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
37478 56 14.4 30%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
18 3       JOURNAL OF CATALYSIS//CHEMISTRY, PHYSICAL//APPLIED CATALYSIS A-GENERAL 120683
3909 2             FLUE GAS CONDITIONING//MICROFIBROUS MAT MFG CM3//HYDROLYSIS OF UREA 819
37478 1                   DEFECT ELECTRON STATES//DELOCALIZED TRAP//FOURIER TRANSFORM UV VIS REGION 56

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 DEFECT ELECTRON STATES authKW 545281 2% 100% 1
2 DELOCALIZED TRAP authKW 545281 2% 100% 1
3 FOURIER TRANSFORM UV VIS REGION authKW 545281 2% 100% 1
4 OEMS SPECTRA authKW 545281 2% 100% 1
5 DIFFERENTIAL OPTICAL ABSORPTION authKW 545277 5% 33% 3
6 CONCENTRATION CALCULATION authKW 272639 2% 50% 1
7 UV VIS REGION authKW 272639 2% 50% 1
8 OEMS authKW 109055 2% 20% 1
9 SOVIET JOURNAL OF OPTICAL TECHNOLOGY journal 48319 14% 1% 8
10 DOAS authKW 14252 4% 1% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Optics 405 36% 0% 20
2 Physics, Condensed Matter 81 21% 0% 12
3 Instruments & Instrumentation 80 13% 0% 7
4 Spectroscopy 77 11% 0% 6
5 Physics, Applied 72 25% 0% 14
6 Electrochemistry 7 4% 0% 2
7 Engineering, Electrical & Electronic 6 9% 0% 5
8 Materials Science, Multidisciplinary 3 9% 0% 5
9 Materials Science, Ceramics 3 2% 0% 1
10 Materials Science, Coatings & Films 2 2% 0% 1

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SCI TECHNOL OPT MAT SCI 6989 2% 1% 1
2 RECH HETEROEPITAXIE PLICAT 3585 2% 1% 1
3 SI VAVILOV STATE OPT 1309 2% 0% 1
4 CONDENSED MATTER PHYS MAT SCI 273 2% 0% 1
5 CHEM SCI 90 4% 0% 2
6 ENVIRONM SCI ENGN 68 4% 0% 2
7 ELECT ENGN 32 7% 0% 4

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SOVIET JOURNAL OF OPTICAL TECHNOLOGY 48319 14% 1% 8
2 LASER FOCUS WITH FIBEROPTIC TECHNOLOGY 5292 2% 1% 1
3 SOVIET PHYSICS SEMICONDUCTORS-USSR 4792 13% 0% 7
4 JOURNAL OF OPTICAL TECHNOLOGY 2822 7% 0% 4
5 JOURNAL OF ELECTRONIC MATERIALS 1401 9% 0% 5
6 GLASS TECHNOLOGY 800 2% 0% 1
7 PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS 441 7% 0% 4
8 OPTICA APPLICATA 335 2% 0% 1
9 APPLIED SPECTROSCOPY 263 4% 0% 2
10 JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS 236 2% 0% 1

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 DEFECT ELECTRON STATES 545281 2% 100% 1 Search DEFECT+ELECTRON+STATES Search DEFECT+ELECTRON+STATES
2 DELOCALIZED TRAP 545281 2% 100% 1 Search DELOCALIZED+TRAP Search DELOCALIZED+TRAP
3 FOURIER TRANSFORM UV VIS REGION 545281 2% 100% 1 Search FOURIER+TRANSFORM+UV+VIS+REGION Search FOURIER+TRANSFORM+UV+VIS+REGION
4 OEMS SPECTRA 545281 2% 100% 1 Search OEMS+SPECTRA Search OEMS+SPECTRA
5 DIFFERENTIAL OPTICAL ABSORPTION 545277 5% 33% 3 Search DIFFERENTIAL+OPTICAL+ABSORPTION Search DIFFERENTIAL+OPTICAL+ABSORPTION
6 CONCENTRATION CALCULATION 272639 2% 50% 1 Search CONCENTRATION+CALCULATION Search CONCENTRATION+CALCULATION
7 UV VIS REGION 272639 2% 50% 1 Search UV+VIS+REGION Search UV+VIS+REGION
8 OEMS 109055 2% 20% 1 Search OEMS Search OEMS
9 DOAS 14252 4% 1% 2 Search DOAS Search DOAS
10 SIGNAL NOISE RATIO 13298 2% 2% 1 Search SIGNAL+NOISE+RATIO Search SIGNAL+NOISE+RATIO

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 BELYAEV, AA , VORONOVA, IM , ZHEVLAKOV, AP , KARELSKII, VG , MAKSIMOV, YP , (1996) OPTICAL MATERIALS FOR LASERS IN THE MID-IR RANGE.JOURNAL OF OPTICAL TECHNOLOGY. VOL. 63. ISSUE 12. P. 871-877 11 52% 1
2 AXELSSON, L , (1994) MEASUREMENT OF AMMONIA WITH THE DIFFERENTIAL OPTICAL-ABSORPTION TECHNIQUE COMBINED WITH FOURIER-TRANSFORM.APPLIED SPECTROSCOPY. VOL. 48. ISSUE 8. P. 1003-1006 3 100% 2
3 EREMIN, VK , STROKAN, NB , CHIKALOVALUZINA, OP , (1986) INFLUENCE OF TEMPERATURE ON THE CAPTURE OF CARRIERS BY LOCAL IMPURITY CLUSTERS.SOVIET PHYSICS SEMICONDUCTORS-USSR. VOL. 20. ISSUE 2. P. 218-219 4 100% 0
4 CHIU, CH , SWANSON, JG , (2000) DEPTH DEFINED OPTOELECTRONIC MODULATION SPECTROSCOPY.JOURNAL OF ELECTRONIC MATERIALS. VOL. 29. ISSUE 5. P. 591 -597 2 100% 0
5 CHIU, CH , SWANSON, JG , (2003) COMPARISONS USING OPTOELECTRONIC MODULATION SPECTROSCOPY OF N-TYPE GAAS EPITAXIAL LAYERS FORMED ON BUFFER LAYERS PREPARED AT NORMAL AND LOW TEMPERATURES.JOURNAL OF ELECTRONIC MATERIALS. VOL. 32. ISSUE 3. P. 176 -183 4 44% 0
6 KRUSZEWSKI, S , CIURYLO, J , CHOJNACKI, S , (1984) MEASUREMENTS OF SATURATED VAPOR-PRESSURE OVER NA-RB SOLUTIONS BY WAVELENGTH MODULATION SPECTROSCOPY TECHNIQUE.ACTA PHYSICA POLONICA A. VOL. 66. ISSUE 6. P. 687-695 4 100% 1
7 ZOBNIN, AV , NEFEDOV, AP , SINELSHCHIKOV, VA , WONG, SM , LI, DD , SHCHIU, YK , (1997) OPTICAL ULTRAVIOLET GAS ANALYZER FOR MONITORING THE NO AND SO2 CONTENT.HIGH TEMPERATURE. VOL. 35. ISSUE 4. P. 608-613 2 100% 0
8 WANG, QH , SWANSON, JG , (1993) OPTOELECTRONIC MODULATION SPECTROSCOPY APPLIED TO THE CHARACTERIZATION OF FIELD-EFFECT TRANSISTORS.JOURNAL OF APPLIED PHYSICS. VOL. 74. ISSUE 11. P. 7011-7013 3 75% 0
9 CHIU, CH , OMNES, F , GAQUIERE, C , GIBART, P , SWANSON, JG , (2002) THE GAN YELLOW LUMINESCENCE CENTRE OBSERVED USING OPTOELECTRONIC MODULATION SPECTROSCOPY.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 35. ISSUE 7. P. 609 -614 3 50% 4
10 BHATTACHARYYA, J , GHOSH, S , ARORA, BM , (2005) WAVELENGTH MODULATION SPECTROSCOPY USING NOVEL MECHANICAL LIGHT CHOPPER BLADE DESIGNS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 76. ISSUE 8. P. - 3 43% 2

Classes with closest relation at Level 1


Rank Class id link
1 35455 FLUE GAS CONDITIONING//HYDROLYSIS OF UREA//LIQUID NON IDEALITY
2 36050 ABSORPTION SPECTRA OF CLUSTERS//ASHING PLANT//CERRO PRIETO GEOTHERMAL FIELD
3 34912 CATALYTIC LIGAND//DETERMINATION OF LANTHANUM//QUARTERNARY AMMONIUM CELLULOSE
4 23321 1 MONOLAURIN WATER SYSTEMS//ALPHA TICL3//AS TE CD
5 6942 ENVIRONM PHYS//ATMOSPHERIC MEASUREMENT TECHNIQUES//OMI
6 25842 4 DIMETHYLAMINOCHALCONE//BINARY MIXTURES OF SOLVENTS//CHIM THEOR DCMUMR CNRS UJF 5250
7 18384 AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//VIBRATING CAPACITOR
8 16271 GAAS DETECTORS//GRADED GAP ALXGA1 XAS STRUCTURES//SCI PROD STATE ENTERPRISE
9 1145 EL2//GAAS//SEMI INSULATING GAAS
10 24234 MESFET//4H SIC MESFET//SIC MESFET

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