Class information for:
Level 1: PHOTOREFLECTANCE//FRANZ KELDYSH OSCILLATIONS//NEW YORK STATE ADV TECHNOL ULTRAFAST PHOTON M

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
10911 1025 20.2 65%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
37 3       PHYSICS, CONDENSED MATTER//PHYSICAL REVIEW B//QUANTUM DOTS 103171
125 2             SUPERLATTICES AND MICROSTRUCTURES//QUANTUM WELLS//PHYSICS, CONDENSED MATTER 24068
10911 1                   PHOTOREFLECTANCE//FRANZ KELDYSH OSCILLATIONS//NEW YORK STATE ADV TECHNOL ULTRAFAST PHOTON M 1025

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PHOTOREFLECTANCE authKW 893552 9% 33% 90
2 FRANZ KELDYSH OSCILLATIONS authKW 248229 1% 56% 15
3 NEW YORK STATE ADV TECHNOL ULTRAFAST PHOTON M address 172074 3% 22% 26
4 FIELD INDUCED CHANGE IN THE PSEUDODIELECTRIC FUNCTION authKW 148945 0% 100% 5
5 PHOTOELLIPSOMETRY authKW 148945 0% 100% 5
6 ELECTROREFLECTANCE authKW 122145 2% 23% 18
7 CONTACTLESS ELECTROREFLECTANCE authKW 120636 1% 45% 9
8 FRANZ KELDYSH THEORY authKW 119156 0% 100% 4
9 EPSRC CENT IL 3 5 address 67024 0% 75% 3
10 ELECTROLYTE ELECTROREFLECTANCE SPECTROSCOPY authKW 59578 0% 100% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 8237 57% 0% 585
2 Physics, Condensed Matter 5103 38% 0% 385
3 Materials Science, Coatings & Films 603 6% 0% 61
4 Materials Science, Multidisciplinary 296 15% 0% 154
5 Physics, Multidisciplinary 249 9% 0% 90
6 Engineering, Electrical & Electronic 223 11% 0% 114
7 Nanoscience & Nanotechnology 130 5% 0% 49
8 Optics 68 5% 0% 50
9 Crystallography 23 2% 0% 20
10 Instruments & Instrumentation 22 2% 0% 24

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 NEW YORK STATE ADV TECHNOL ULTRAFAST PHOTON M 172074 3% 22% 26
2 EPSRC CENT IL 3 5 67024 0% 75% 3
3 HIGH CONCENTRAT PHOTOVOLTA PROJECT 59578 0% 100% 2
4 URA 0357 59578 0% 100% 2
5 ELE ELECT ENGN NANOELE 53618 0% 60% 3
6 MICROWAVE DEVICE DEV 39717 0% 67% 2
7 ADV ELECT OPT SCIAREA SOLID STATE ELECT 29789 0% 100% 1
8 BLECHMAMMER 29789 0% 100% 1
9 COMPOUND SEMICOND DEVICES SECT 29789 0% 100% 1
10 EDLM 29789 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF APPLIED PHYSICS 9731 18% 0% 187
2 SUPERLATTICES AND MICROSTRUCTURES 5059 3% 1% 33
3 APPLIED PHYSICS LETTERS 3782 12% 0% 120
4 SEMICONDUCTORS 2725 2% 0% 25
5 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 2687 3% 0% 27
6 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 1971 4% 0% 37
7 SOLID STATE COMMUNICATIONS 1216 3% 0% 33
8 ADVANCED MATERIALS FOR OPTICS AND ELECTRONICS 1165 0% 1% 3
9 PHYSICAL REVIEW B 1011 8% 0% 79
10 INSTITUTE OF PHYSICS CONFERENCE SERIES 960 2% 0% 18

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 PHOTOREFLECTANCE 893552 9% 33% 90 Search PHOTOREFLECTANCE Search PHOTOREFLECTANCE
2 FRANZ KELDYSH OSCILLATIONS 248229 1% 56% 15 Search FRANZ+KELDYSH+OSCILLATIONS Search FRANZ+KELDYSH+OSCILLATIONS
3 FIELD INDUCED CHANGE IN THE PSEUDODIELECTRIC FUNCTION 148945 0% 100% 5 Search FIELD+INDUCED+CHANGE+IN+THE+PSEUDODIELECTRIC+FUNCTION Search FIELD+INDUCED+CHANGE+IN+THE+PSEUDODIELECTRIC+FUNCTION
4 PHOTOELLIPSOMETRY 148945 0% 100% 5 Search PHOTOELLIPSOMETRY Search PHOTOELLIPSOMETRY
5 ELECTROREFLECTANCE 122145 2% 23% 18 Search ELECTROREFLECTANCE Search ELECTROREFLECTANCE
6 CONTACTLESS ELECTROREFLECTANCE 120636 1% 45% 9 Search CONTACTLESS+ELECTROREFLECTANCE Search CONTACTLESS+ELECTROREFLECTANCE
7 FRANZ KELDYSH THEORY 119156 0% 100% 4 Search FRANZ+KELDYSH+THEORY Search FRANZ+KELDYSH+THEORY
8 ELECTROLYTE ELECTROREFLECTANCE SPECTROSCOPY 59578 0% 100% 2 Search ELECTROLYTE+ELECTROREFLECTANCE+SPECTROSCOPY Search ELECTROLYTE+ELECTROREFLECTANCE+SPECTROSCOPY
9 FKO 59578 0% 100% 2 Search FKO Search FKO
10 PHOTOREFLECTANCE SPECTROSCOPY PRS 59578 0% 100% 2 Search PHOTOREFLECTANCE+SPECTROSCOPY+PRS Search PHOTOREFLECTANCE+SPECTROSCOPY+PRS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 POLLAK, FH , SHEN, H , (1993) MODULATION SPECTROSCOPY OF SEMICONDUCTORS - BULK THIN-FILM, MICROSTRUCTURES, SURFACES INTERFACES AND DEVICES.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 10. ISSUE 7-8. P. 275-374 176 56% 295
2 SHEN, H , DUTTA, M , (1995) FRANZ-KELDYSH OSCILLATIONS IN MODULATION SPECTROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 78. ISSUE 4. P. 2151 -2176 69 78% 237
3 MISIEWICZ, J , SITAREK, P , SEK, G , KUDRAWIEC, R , (2003) SEMICONDUCTOR HETEROSTRUCTURES AND DEVICE STRUCTURES INVESTIGATED BY PHOTOREFLECTANCE SPECTROSCOPY.MATERIALS SCIENCE-POLAND. VOL. 21. ISSUE 3. P. 263 -320 75 64% 84
4 POLLAK, FH , (2001) STUDY OF SEMICONDUCTOR SURFACES AND INTERFACES USING ELECTROMODULATION.SURFACE AND INTERFACE ANALYSIS. VOL. 31. ISSUE 10. P. 938 -953 65 74% 28
5 HUANG, YS , POLLAK, FH , (2005) NON-DESTRUCTIVE, ROOM TEMPERATURE CHARACTERIZATION OF WAFER-SIZED III-V SEMICONDUCTOR DEVICE STRUCTURES USING CONTACTLESS ELECTROMODULATION AND WAVELENGTH-MODULATED SURFACE PHOTOVOLTAGE SPECTROSCOPY.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 202. ISSUE 7. P. 1193 -1207 46 81% 45
6 POLLAK, FH , (2001) CONTACTLESS ELECTROMODULATION AND SURFACE PHOTOVOLTAGE SPECTROSCOPY FOR THE NONDESTRUCTIVE, ROOM TEMPERATURE CHARACTERIZATION OF WAFER-SEALS III-V SEMICONDUCTOR DEVICE STRUCTURES.MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY. VOL. 80. ISSUE 1-3. P. 178 -183 39 89% 15
7 MISIEWICZ, J , SEK, G , SITAREK, P , (1999) PHOTOREFLECTANCE SPECTROSCOPY APPLIED TO SEMICONDUCTORS AND SEMICONDUCTOR HETEROSTRUCTURES.OPTICA APPLICATA. VOL. 29. ISSUE 3. P. 327 -363 55 66% 0
8 MISIEWICZ, J , SITAREK, P , SEK, G , (2000) PHOTOREFLECTANCE SPECTROSCOPY OF LOW-DIMENSIONAL SEMICONDUCTOR STRUCTURES.OPTO-ELECTRONICS REVIEW. VOL. 8. ISSUE 1. P. 1-24 34 85% 17
9 SOARES, JANT , ENDERLEIN, R , BELIAEV, D , LEITE, JR , SAITO, M , (1998) PHOTOREFLECTANCE SPECTRA FROM GAAS HEMT STRUCTURES REINVESTIGATED: SOLUTION OF AN OLD CONTROVERSY.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 13. ISSUE 12. P. 1418-1425 26 96% 7
10 HOSEA, TJC , (2004) ADVANCES IN THE APPLICATION OF MODULATION SPECTROSCOPY TO VERTICAL CAVITY STRUCTURES.THIN SOLID FILMS. VOL. 450. ISSUE 1. P. 3 -13 21 88% 20

Classes with closest relation at Level 1


Rank Class id link
1 35522 BAND EDGE TRANSITIONS//DATA HITURA MINE//FE RH S SYSTEM
2 11862 NANOOPT PROPERTY//SPECTROSCOPIC ELLIPSOMETRY//DIELECTRIC FUNCTION
3 13201 IN DESORPTION//ISOVALENT DELTA LAYERS//ULTRATHIN INAS LAYERS
4 27197 GAASSB//INGAAS GAASSB//BILAYER QUANTUM WELL
5 12915 FRACTIONAL DIMENSIONAL APPROACH//GAAS FILM//FRACTIONAL DIMENSIONAL SPACES
6 16019 INASP INP//INASP//FDN CPQD
7 4061 QUANTUM CONFINED STARK EFFECT//FIVE LAYER ASYMMETRIC COUPLED QUANTUM WELL FACQW//ELECTROABSORPTION MODULATORS
8 11353 DELTA DOPING//MULTISUBBAND ELECTRON MOBILITY//DELTA DOPED QUANTUM WELLS
9 18384 AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//VIBRATING CAPACITOR
10 20238 BERYLLIUM CHALCOGENIDES//BETE//BE CHALCOGENIDES

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