Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
34214 | 114 | 16.1 | 28% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
263 | 3 | IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION//PARTIAL DISCHARGE//POLYMER ELECTROLYTE | 44523 |
3187 | 2 | TSDC//THERMALLY STIMULATED DEPOLARIZATION CURRENT//THERMALLY STIMULATED CURRENT | 2118 |
34214 | 1 | CHARGE DECAY MODELS//CHARGE MOTION ON SURFACES//ELE ON ION PHYS GRP | 114 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | CHARGE DECAY MODELS | authKW | 267856 | 1% | 100% | 1 |
2 | CHARGE MOTION ON SURFACES | authKW | 267856 | 1% | 100% | 1 |
3 | ELE ON ION PHYS GRP | address | 267856 | 1% | 100% | 1 |
4 | ELECT ENGN TECHNOL FUNDAMENTALS | address | 267856 | 1% | 100% | 1 |
5 | ELECTRIZATION IMPACT | authKW | 267856 | 1% | 100% | 1 |
6 | ELIMINATION OF SPECIMEN ELECTRIFICATION | authKW | 267856 | 1% | 100% | 1 |
7 | GUARDED ELECTRODE SYSTEM | authKW | 267856 | 1% | 100% | 1 |
8 | HIGH DOSE RATE IONIZING RADIATION | authKW | 267856 | 1% | 100% | 1 |
9 | LABERT W FUNCTION | authKW | 267856 | 1% | 100% | 1 |
10 | PI FILMS | authKW | 267856 | 1% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 433 | 40% | 0% | 46 |
2 | Engineering, Electrical & Electronic | 367 | 34% | 0% | 39 |
3 | Materials Science, Characterization, Testing | 346 | 7% | 0% | 8 |
4 | Nuclear Science & Technology | 107 | 10% | 0% | 11 |
5 | Instruments & Instrumentation | 75 | 9% | 0% | 10 |
6 | Computer Science, Hardware & Architecture | 38 | 4% | 0% | 4 |
7 | Polymer Science | 28 | 7% | 0% | 8 |
8 | Physics, Condensed Matter | 24 | 10% | 0% | 11 |
9 | Computer Science, Software Engineering | 20 | 4% | 0% | 4 |
10 | Computer Science, Information Systems | 14 | 4% | 0% | 4 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ELE ON ION PHYS GRP | 267856 | 1% | 100% | 1 |
2 | ELECT ENGN TECHNOL FUNDAMENTALS | 267856 | 1% | 100% | 1 |
3 | ELECT ENGN FUNDAMENTALS | 44637 | 3% | 6% | 3 |
4 | ENGN DIELE ITS PLICAT | 6866 | 1% | 3% | 1 |
5 | SOLID STATE CHEM MINERAL PROC | 6694 | 1% | 3% | 1 |
6 | CHEM KINET COMBUST | 4857 | 4% | 0% | 5 |
7 | ELE OTECHNOL MAT SCI | 2368 | 1% | 1% | 1 |
8 | BUDKER NUCL PHYS | 831 | 2% | 0% | 2 |
9 | SIBERIAN | 541 | 4% | 0% | 5 |
10 | SOLID STATE CHEM MECHANOCHEM | 314 | 1% | 0% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | POLYMER TESTING | 5554 | 7% | 0% | 8 |
2 | IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 4650 | 4% | 0% | 5 |
3 | JOURNAL OF ELECTROSTATICS | 3723 | 5% | 0% | 6 |
4 | IEEE INTERNATIONAL SOLID STATE CIRCUITS CONFERENCE | 2549 | 1% | 1% | 1 |
5 | METROLOGY AND MEASUREMENT SYSTEMS | 1866 | 2% | 0% | 2 |
6 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1604 | 9% | 0% | 10 |
7 | SOLID STATE TECHNOLOGY | 1297 | 3% | 0% | 3 |
8 | JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1275 | 9% | 0% | 10 |
9 | IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1224 | 3% | 0% | 3 |
10 | IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 967 | 4% | 0% | 4 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | CHARGE DECAY MODELS | 267856 | 1% | 100% | 1 | Search CHARGE+DECAY+MODELS | Search CHARGE+DECAY+MODELS |
2 | CHARGE MOTION ON SURFACES | 267856 | 1% | 100% | 1 | Search CHARGE+MOTION+ON+SURFACES | Search CHARGE+MOTION+ON+SURFACES |
3 | ELECTRIZATION IMPACT | 267856 | 1% | 100% | 1 | Search ELECTRIZATION+IMPACT | Search ELECTRIZATION+IMPACT |
4 | ELIMINATION OF SPECIMEN ELECTRIFICATION | 267856 | 1% | 100% | 1 | Search ELIMINATION+OF+SPECIMEN+ELECTRIFICATION | Search ELIMINATION+OF+SPECIMEN+ELECTRIFICATION |
5 | GUARDED ELECTRODE SYSTEM | 267856 | 1% | 100% | 1 | Search GUARDED+ELECTRODE+SYSTEM | Search GUARDED+ELECTRODE+SYSTEM |
6 | HIGH DOSE RATE IONIZING RADIATION | 267856 | 1% | 100% | 1 | Search HIGH+DOSE+RATE+IONIZING+RADIATION | Search HIGH+DOSE+RATE+IONIZING+RADIATION |
7 | LABERT W FUNCTION | 267856 | 1% | 100% | 1 | Search LABERT+W+FUNCTION | Search LABERT+W+FUNCTION |
8 | PI FILMS | 267856 | 1% | 100% | 1 | Search PI+FILMS | Search PI+FILMS |
9 | RIC COEFFICIENT KC | 267856 | 1% | 100% | 1 | Search RIC+COEFFICIENT+KC | Search RIC+COEFFICIENT+KC |
10 | MAXIMUM FIELD | 133927 | 1% | 50% | 1 | Search MAXIMUM+FIELD | Search MAXIMUM+FIELD |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | LEONIDOPOULOS, G , (1996) ATTEMPT TO EXPLAIN WHY THE SURFACE RESISTANCE UNDER MEASUREMENT IN THE THIN POLYMERIC FILM SURFACE RESISTANCE MEASUREMENT METHOD VARIES DURING THE EXPERIMENTAL RESPONSE OF THE SYSTEM.POLYMER TESTING. VOL. 15. ISSUE 5. P. 491-500 | 9 | 90% | 1 |
2 | WINTLE, HJ , (2011) SPREADING OF SURFACE CHARGE ON A THICK INSULATOR.IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION. VOL. 18. ISSUE 1. P. 3-7 | 5 | 100% | 2 |
3 | PEPIN, MP , WINTLE, HJ , (1998) CHARGE INJECTION AND CONDUCTION ON THE SURFACE OF INSULATORS.JOURNAL OF APPLIED PHYSICS. VOL. 83. ISSUE 11. P. 5870-5879 | 13 | 52% | 9 |
4 | WINTLE, HJ , PEPIN, MP , (2000) DECAY OF SURFACE CHARGE BETWEEN ELECTRODES ON INSULATOR SURFACES.JOURNAL OF ELECTROSTATICS. VOL. 48. ISSUE 2. P. 115-126 | 7 | 64% | 6 |
5 | LEONIDOPOULOS, G , (1995) DOES THE SURFACE-RESISTANCE UNDER MEASUREMENT IN THE THIN POLYMERIC FILM SURFACE-RESISTANCE MEASUREMENT METHOD VARY DURING THE EXPERIMENTAL RESPONSE OF THE SYSTEM.POLYMER TESTING. VOL. 14. ISSUE 2. P. 121-128 | 5 | 100% | 1 |
6 | HOLCOMBE, SR , SMITH, ER , (2008) SURFACE CHARGE CARRIER MOTION ON INSULATING SURFACES: ONE DIMENSIONAL MOTION.PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS. VOL. 387. ISSUE 16-17. P. 4133-4147 | 4 | 80% | 0 |
7 | SAVCHENKO, OY , (2010) THE SPECIAL FEATURES OF THE FORMATION OF MOLECULAR IONS ON THE SURFACE OF TANTALUM.RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY B. VOL. 4. ISSUE 3. P. 521-525 | 3 | 100% | 0 |
8 | SOLIMAN, AH , HOLCOMBE, SR , PIGRAM, PJ , LIESEGANG, J , (2005) SURFACE CONDUCTIVITY OF INSULATORS: A RESISTIVITY MEASUREMENT TECHNIQUE UNDER VACUUM.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 17. ISSUE 4. P. 599-617 | 3 | 100% | 2 |
9 | LEONIDOPOULOS, G , (1995) ANALYSIS OF THE EXPERIMENTAL RESPONSE OF THIN POLYMERIC FILM SURFACE-RESISTANCE MEASUREMENT METHOD.POLYMER TESTING. VOL. 14. ISSUE 1. P. 3-11 | 4 | 100% | 19 |
10 | ANG, SS , BROWN, WD , LE, HM , ULRICH, RK , (1990) GAMMA-RADIATION EFFECTS ON POLYIMIDE-PASSIVATED N+P DIODES.SOLID-STATE ELECTRONICS. VOL. 33. ISSUE 7. P. 917-921 | 5 | 100% | 1 |
Classes with closest relation at Level 1 |