Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
28322 | 209 | 15.4 | 42% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
82 | 3 | METALLURGY & METALLURGICAL ENGINEERING//FRICTION STIR WELDING//WELDING JOURNAL | 79105 |
1199 | 2 | OXIDATION OF METALS//HIGH TEMPERATURE CORROSION//HIGH TEMPERATURE OXIDATION | 9237 |
28322 | 1 | ULTRAMICROTOMY//LOW ANGLE ION MILLING//MAT SCI PROD TECHNOL | 209 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ULTRAMICROTOMY | authKW | 350627 | 6% | 20% | 12 |
2 | LOW ANGLE ION MILLING | authKW | 292205 | 1% | 100% | 2 |
3 | MAT SCI PROD TECHNOL | address | 292205 | 1% | 100% | 2 |
4 | PEELS IMAGING | authKW | 292205 | 1% | 100% | 2 |
5 | XTEM SAMPLE PREPARATION | authKW | 292205 | 1% | 100% | 2 |
6 | ION BEAM THINNING | authKW | 292201 | 2% | 50% | 4 |
7 | MICROSCOPY CHARACTERIZAT MAT | address | 262982 | 1% | 60% | 3 |
8 | TECHNOL PLANNING CENT ELECT S | address | 194802 | 1% | 67% | 2 |
9 | TEM SPECIMEN PREPARATION | authKW | 173924 | 2% | 24% | 5 |
10 | ACCELERATED AGEING PROCEDURE | authKW | 146102 | 0% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 40101 | 47% | 0% | 99 |
2 | Biology | 1122 | 21% | 0% | 44 |
3 | Anatomy & Morphology | 987 | 10% | 0% | 20 |
4 | Metallurgy & Metallurgical Engineering | 195 | 11% | 0% | 23 |
5 | Materials Science, Multidisciplinary | 130 | 20% | 0% | 42 |
6 | Physics, Multidisciplinary | 71 | 10% | 0% | 21 |
7 | Materials Science, Characterization, Testing | 67 | 2% | 0% | 5 |
8 | Nanoscience & Nanotechnology | 34 | 5% | 0% | 11 |
9 | METALLURGY & MINING | 33 | 0% | 0% | 1 |
10 | Physics, Applied | 28 | 11% | 0% | 22 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MAT SCI PROD TECHNOL | 292205 | 1% | 100% | 2 |
2 | MICROSCOPY CHARACTERIZAT MAT | 262982 | 1% | 60% | 3 |
3 | TECHNOL PLANNING CENT ELECT S | 194802 | 1% | 67% | 2 |
4 | KAVLI BIONANOSCI TECHNOL | 146102 | 0% | 100% | 1 |
5 | OR VIII 23 | 146102 | 0% | 100% | 1 |
6 | MAT SCI PROC TECHNOL | 29219 | 0% | 20% | 1 |
7 | MAT SCI 7 | 24349 | 0% | 17% | 1 |
8 | ALLEN CLARK | 13280 | 0% | 9% | 1 |
9 | SOLID SUR ES ANAL | 11237 | 0% | 8% | 1 |
10 | CM2 | 10434 | 0% | 7% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 115551 | 11% | 3% | 24 |
2 | SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS | 19045 | 3% | 2% | 6 |
3 | MICROSCOPY RESEARCH AND TECHNIQUE | 15235 | 10% | 1% | 20 |
4 | ULTRAMICROSCOPY | 12665 | 11% | 0% | 22 |
5 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 4320 | 8% | 0% | 17 |
6 | JOURNAL OF MICROSCOPY | 3668 | 4% | 0% | 8 |
7 | MICROLITHOGRAPHY WORLD | 2808 | 0% | 2% | 1 |
8 | OXIDATION OF METALS | 2784 | 3% | 0% | 6 |
9 | UMSCHAU | 2355 | 0% | 2% | 1 |
10 | METALLOGRAPHY | 2032 | 1% | 1% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | QUINTANA, C , (1997) ULTRAMICROTOMY FOR CROSS-SECTIONS OF NANOSTRUCTURE.MICRON. VOL. 28. ISSUE 3. P. 217-219 | 5 | 100% | 4 |
2 | WESTMAN, AK , WEI, LY , BARRE, F , (1999) PREPARATION FOR TEM OF LAYERED SAMPLES WITH FRAGILE MICROSTRUCTURE AND WEAK LAYER INTERFACE.MICROSCOPY RESEARCH AND TECHNIQUE. VOL. 45. ISSUE 3. P. 198-202 | 4 | 100% | 1 |
3 | ZINKLE, SJ , HALTOM, CP , JENKINS, LC , DUBOSE, CKH , (1991) TECHNIQUE FOR PREPARING CROSS-SECTION TRANSMISSION ELECTRON-MICROSCOPE SPECIMENS FROM ION-IRRADIATED CERAMICS.JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE. VOL. 19. ISSUE 4. P. 452-460 | 7 | 78% | 6 |
4 | FOX, P , (1992) THE PREPARATION OF CROSS-SECTIONAL SPECIMENS OF THIN POORLY ADHERED SCALES FOR TRANSMISSION ELECTRON-MICROSCOPY.MICROSCOPY RESEARCH AND TECHNIQUE. VOL. 21. ISSUE 4. P. 369-370 | 5 | 100% | 0 |
5 | NGUYEN, TD , GRONSKY, R , KORTRIGHT, JB , (1991) CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF X-RAY MULTILAYER THIN-FILM STRUCTURES.JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE. VOL. 19. ISSUE 4. P. 473-485 | 8 | 62% | 5 |
6 | RIEDL, T , GEMMING, T , MICKEL, C , EYMANN, K , KIRCHNER, A , KIEBACK, B , (2012) PREPARATION OF HIGH-QUALITY ULTRATHIN TRANSMISSION ELECTRON MICROSCOPY SPECIMENS OF A NANOCRYSTALLINE METALLIC POWDER.MICROSCOPY RESEARCH AND TECHNIQUE. VOL. 75. ISSUE 6. P. 711-719 | 9 | 26% | 2 |
7 | CHINN, D , OSTENDORP, P , HAUGH, M , KERSHMANN, R , KURFESS, T , CLAUDET, A , TUCKER, T , (2004) THREE DIMENSIONAL IMAGING OF LIGA-MADE MICROCOMPONENTS.JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME. VOL. 126. ISSUE 4. P. 813-821 | 4 | 67% | 13 |
8 | HEFTER, J , OSTREICHER, K , SUNG, C , (1992) IMPROVED METHOD FOR THE PREPARATION OF TIN-COATED WC-CO-BASED SAMPLES FOR CROSS-SECTIONAL AEM INVESTIGATION.MICROSCOPY RESEARCH AND TECHNIQUE. VOL. 23. ISSUE 3. P. 239-242 | 4 | 100% | 0 |
9 | MARDINLY, AJ , (1999) APPLICATIONS AND PROBLEMS FOR TEM OF SEMICONDUCTOR PRODUCTS.MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS. VOL. . ISSUE 164. P. 575-584 | 3 | 100% | 0 |
10 | NEWCOMB, SB , STOBBS, WM , (1991) THE EFFECTS OF A GRAIN-BOUNDARY ON THE COMPOSITIONAL FLUCTUATIONS INHERENT IN THE OXIDATION OF FE-10CR-34NI.OXIDATION OF METALS. VOL. 35. ISSUE 1-2. P. 69-88 | 4 | 100% | 2 |
Classes with closest relation at Level 1 |