Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
11678 | 963 | 17.8 | 71% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
603 | 2 | JOURNAL OF CRYSTAL GROWTH//PHYSICS, APPLIED//QUANTUM WELL INTERMIXING | 14085 |
11678 | 1 | CARBON DOPING//CBR4//INALAS ALLOYS | 963 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | CARBON DOPING | authKW | 244742 | 4% | 20% | 39 |
2 | CBR4 | authKW | 153450 | 1% | 44% | 11 |
3 | INALAS ALLOYS | authKW | 95121 | 0% | 100% | 3 |
4 | CARBON TETRABROMIDE | authKW | 89206 | 1% | 26% | 11 |
5 | C DOPED GAAS | authKW | 71339 | 0% | 75% | 3 |
6 | HETEROJUNCTION BIPOLAR TRANSISTORS | authKW | 70550 | 3% | 7% | 33 |
7 | BE OUTDIFFUSION | authKW | 63414 | 0% | 100% | 2 |
8 | CARBON DOPED GAAS | authKW | 63414 | 0% | 100% | 2 |
9 | CBRCL3 | authKW | 63414 | 0% | 100% | 2 |
10 | GAINAS C | authKW | 63414 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 11482 | 69% | 0% | 662 |
2 | Crystallography | 5080 | 20% | 0% | 192 |
3 | Materials Science, Multidisciplinary | 1338 | 28% | 0% | 270 |
4 | Physics, Condensed Matter | 1289 | 21% | 0% | 199 |
5 | Engineering, Electrical & Electronic | 1076 | 21% | 0% | 206 |
6 | Nanoscience & Nanotechnology | 287 | 7% | 0% | 65 |
7 | Physics, Multidisciplinary | 136 | 7% | 0% | 69 |
8 | Materials Science, Coatings & Films | 21 | 2% | 0% | 15 |
9 | Materials Science, Characterization, Testing | 14 | 1% | 0% | 6 |
10 | Microscopy | 7 | 0% | 0% | 4 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | UP EA 2654 CNRS | 63414 | 0% | 100% | 2 |
2 | UP EA 2654 | 63410 | 0% | 50% | 4 |
3 | LEMI | 54334 | 1% | 14% | 12 |
4 | CNRSNXPP TOUCBN 2UMR 6508LAMIPS COMMUN | 31707 | 0% | 100% | 1 |
5 | COMPONENT ENGN | 31707 | 0% | 100% | 1 |
6 | ELECT MICROTECHOL RUMENTAT | 31707 | 0% | 100% | 1 |
7 | ESC SUP ING MECAN ELECT | 31707 | 0% | 100% | 1 |
8 | FIELD THEORY MICROWAVE ELECTIFH | 31707 | 0% | 100% | 1 |
9 | GEEPS SUPELEC | 31707 | 0% | 100% | 1 |
10 | GRP COMPOSANTS ELECT | 31707 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF CRYSTAL GROWTH | 34983 | 19% | 1% | 185 |
2 | APPLIED PHYSICS LETTERS | 5708 | 15% | 0% | 142 |
3 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 5151 | 4% | 0% | 40 |
4 | SEMICONDUCTORS | 3649 | 3% | 0% | 28 |
5 | JOURNAL OF APPLIED PHYSICS | 2998 | 11% | 0% | 102 |
6 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2656 | 3% | 0% | 25 |
7 | JOURNAL OF ELECTRONIC MATERIALS | 2167 | 3% | 0% | 26 |
8 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2152 | 4% | 0% | 34 |
9 | MICROELECTRONICS RELIABILITY | 1799 | 2% | 0% | 20 |
10 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1484 | 2% | 0% | 24 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | CARBON DOPING | 244742 | 4% | 20% | 39 | Search CARBON+DOPING | Search CARBON+DOPING |
2 | CBR4 | 153450 | 1% | 44% | 11 | Search CBR4 | Search CBR4 |
3 | INALAS ALLOYS | 95121 | 0% | 100% | 3 | Search INALAS+ALLOYS | Search INALAS+ALLOYS |
4 | CARBON TETRABROMIDE | 89206 | 1% | 26% | 11 | Search CARBON+TETRABROMIDE | Search CARBON+TETRABROMIDE |
5 | C DOPED GAAS | 71339 | 0% | 75% | 3 | Search C+DOPED+GAAS | Search C+DOPED+GAAS |
6 | HETEROJUNCTION BIPOLAR TRANSISTORS | 70550 | 3% | 7% | 33 | Search HETEROJUNCTION+BIPOLAR+TRANSISTORS | Search HETEROJUNCTION+BIPOLAR+TRANSISTORS |
7 | BE OUTDIFFUSION | 63414 | 0% | 100% | 2 | Search BE+OUTDIFFUSION | Search BE+OUTDIFFUSION |
8 | CARBON DOPED GAAS | 63414 | 0% | 100% | 2 | Search CARBON+DOPED+GAAS | Search CARBON+DOPED+GAAS |
9 | CBRCL3 | 63414 | 0% | 100% | 2 | Search CBRCL3 | Search CBRCL3 |
10 | GAINAS C | 63414 | 0% | 100% | 2 | Search GAINAS+C | Search GAINAS+C |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | BHUNIA, S , UCHIDA, K , NOZAKI, S , SUGIYAMA, N , FURIYA, M , MORISAKI, H , (2003) METAL ORGANIC VAPOR PHASE EPITAXIAL GROWTH OF HEAVILY CARBON-DOPED GAAS USING A DOPANT SOURCE OF CCL3BR AND QUANTITATIVE ANALYSIS OF THE COMPENSATION MECHANISM IN THE EPILAYERS.JOURNAL OF APPLIED PHYSICS. VOL. 93. ISSUE 3. P. 1613 -1619 | 29 | 94% | 1 |
2 | NITTONO, T , WATANABE, N , ITO, H , SUGAHARA, H , NAGATA, K , NAKAJIMA, O , (1994) CARBON AND INDIUM CODOPING IN GAAS FOR RELIABLE ALGAAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS.JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS. VOL. 33. ISSUE 11. P. 6129 -6135 | 34 | 97% | 14 |
3 | SEREDIN, PV , LENSHIN, AS , ARSENTYEV, IN , TARASOV, IS , PRUTSKIJ, T , LEISTE, H , RINKE, M , (2016) EPITAXIAL ALLOYS OF ALXGA1-XAS:MG WITH DIFFERENT TYPES OF CONDUCTIVITY.PHYSICA B-CONDENSED MATTER. VOL. 498. ISSUE . P. 65 -71 | 24 | 71% | 0 |
4 | ABERNATHY, CR , HOBSON, WS , (1996) CARBON-IMPURITY INCORPORATION DURING THE GROWTH OF EPITAXIAL GROUP ILL-V MATERIALS.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 7. ISSUE 1. P. 1 -21 | 55 | 53% | 8 |
5 | SEREDIN, PV , LENSHIN, AS , ARSENTIEV, IN , ZHABOTINSKII, AV , NIKOLAEV, DN , TARASOV, IS , SHAMAKHOV, VV , PRUTSKIJ, T , LEISTE, H , RINKE, M , (2017) EPITAXIAL AL (X) GA1-X AS:MG ALLOYS WITH DIFFERENT CONDUCTIVITY TYPES.SEMICONDUCTORS. VOL. 51. ISSUE 1. P. 122 -130 | 24 | 69% | 0 |
6 | MIMILA-ARROYO, J , BLAND, S , BARBE, M , (2002) CARBON REACTIVATION KINETICS IN GAAS: ITS DEPENDENCE ON DOPANT PRECURSOR, DOPING LEVEL, AND LAYER THICKNESS.JOURNAL OF APPLIED PHYSICS. VOL. 91. ISSUE 9. P. 5923-5928 | 28 | 85% | 2 |
7 | VAN DEELEN, J , BAUHUIS, GJ , SCHERMER, JJ , LARSEN, PK , (2004) PARAMETER STUDY OF INTRINSIC CARBON DOPING OF ALXGA1-XAS BY MOCVD.JOURNAL OF CRYSTAL GROWTH. VOL. 271. ISSUE 3-4. P. 376 -384 | 29 | 76% | 6 |
8 | SEREDIN, PV , LENSHIN, AS , GLOTOV, AV , ARSENTYEV, IN , VINOKUROV, DA , TARASOV, IS , PRUTSKIJ, T , LEISTE, H , RINKE, M , (2014) STRUCTURAL AND OPTICAL PROPERTIES OF HEAVILY DOPED ALXGA1-XAS1-YPY:MG ALLOYS PRODUCED BY METAL-ORGANIC CHEMICAL VAPOR DEPOSITION.SEMICONDUCTORS. VOL. 48. ISSUE 8. P. 1094 -1102 | 19 | 86% | 2 |
9 | VAN DEELEN, J , BAUHUIS, GJ , SCHERMER, JJ , LARSEN, PK , (2005) INFLUENCE OF GROWTH PARAMETERS ON THE COMPOSITION AND IMPURITY LEVELS OF INTRINSICALLY CARBON DOPED ALXGA1-XAS.JOURNAL OF CRYSTAL GROWTH. VOL. 284. ISSUE 1-2. P. 28-38 | 27 | 73% | 4 |
10 | SUN, ZZ , YOON, SF , TAN, KH , ZHANG, R , JIANG, J , (2004) INCORPORATION EFFICIENCY OF CARBON IN GAAS USING CARBON TETRABROMIDE IN SOLID SOURCE MOLECULAR BEAM EPITAXY.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 22. ISSUE 3. P. 1017-1021 | 21 | 88% | 1 |
Classes with closest relation at Level 1 |