Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
7233 | 1391 | 17.7 | 72% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
603 | 2 | JOURNAL OF CRYSTAL GROWTH//PHYSICS, APPLIED//QUANTUM WELL INTERMIXING | 14085 |
7233 | 1 | QUANTUM WELL INTERMIXING//QUANTUM WELL INTERDIFFUSION//IMPURITY FREE VACANCY DISORDERING | 1391 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | QUANTUM WELL INTERMIXING | authKW | 1037176 | 5% | 71% | 67 |
2 | QUANTUM WELL INTERDIFFUSION | authKW | 140480 | 1% | 80% | 8 |
3 | IMPURITY FREE VACANCY DISORDERING | authKW | 127707 | 1% | 73% | 8 |
4 | QUANTUM WELL INTERMIXING QWI | authKW | 119650 | 1% | 42% | 13 |
5 | QUANTUM WELL DISORDERING | authKW | 117064 | 1% | 67% | 8 |
6 | IMPURITY FREE DISORDERING | authKW | 109752 | 0% | 100% | 5 |
7 | DIFFUSED QUANTUM WELL | authKW | 65851 | 0% | 100% | 3 |
8 | GRAY MASK | authKW | 65851 | 0% | 100% | 3 |
9 | IMPURITY FREE VACANCY DIFFUSION IFVD | authKW | 65851 | 0% | 100% | 3 |
10 | QUANTUM SEMICOND PHOTON BASED BIONANOTECHNO | address | 53769 | 1% | 35% | 7 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 15640 | 67% | 0% | 930 |
2 | Engineering, Electrical & Electronic | 2157 | 25% | 0% | 343 |
3 | Optics | 1347 | 14% | 0% | 196 |
4 | Physics, Condensed Matter | 1101 | 16% | 0% | 229 |
5 | Materials Science, Multidisciplinary | 485 | 16% | 0% | 224 |
6 | Materials Science, Coatings & Films | 128 | 3% | 0% | 37 |
7 | Physics, Multidisciplinary | 79 | 5% | 0% | 73 |
8 | Microscopy | 67 | 1% | 0% | 12 |
9 | Nanoscience & Nanotechnology | 38 | 3% | 0% | 39 |
10 | Crystallography | 38 | 2% | 0% | 29 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | QUANTUM SEMICOND PHOTON BASED BIONANOTECHNO | 53769 | 1% | 35% | 7 |
2 | ELE OPHOTON MAT DEVICES | 50109 | 1% | 18% | 13 |
3 | ELECT MAT ENGN PHYS SCI | 43901 | 0% | 100% | 2 |
4 | RECH NANOFABRICAT NANOCARACTERISAT | 39826 | 1% | 26% | 7 |
5 | MET FOR | 33851 | 1% | 11% | 14 |
6 | RECH PROPRIETES ELECT MAT AVANCES | 31735 | 1% | 16% | 9 |
7 | ELECT MAT ENGN | 30368 | 4% | 3% | 52 |
8 | ELE OPHOTON MAT DEV | 29266 | 0% | 67% | 2 |
9 | EXCELLENCE INFORMAT ENGN | 28219 | 0% | 43% | 3 |
10 | ANALYT TECHNOL CHARACTERIZAT | 21950 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | APPLIED PHYSICS LETTERS | 19777 | 23% | 0% | 315 |
2 | JOURNAL OF APPLIED PHYSICS | 11193 | 17% | 0% | 234 |
3 | IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS | 7810 | 3% | 1% | 38 |
4 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 4352 | 3% | 1% | 40 |
5 | OPTICAL AND QUANTUM ELECTRONICS | 3694 | 2% | 1% | 26 |
6 | IEEE PHOTONICS TECHNOLOGY LETTERS | 3455 | 4% | 0% | 51 |
7 | DEFECT AND DIFFUSION FORUM/JOURNAL | 3122 | 1% | 2% | 7 |
8 | SUPERLATTICES AND MICROSTRUCTURES | 2474 | 2% | 0% | 27 |
9 | IEEE JOURNAL OF QUANTUM ELECTRONICS | 2123 | 2% | 0% | 29 |
10 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 1977 | 2% | 0% | 30 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | DEPPE, DG , HOLONYAK, N , (1988) ATOM DIFFUSION AND IMPURITY-INDUCED LAYER DISORDERING IN QUANTUM WELL III-V SEMICONDUCTOR HETEROSTRUCTURES.JOURNAL OF APPLIED PHYSICS. VOL. 64. ISSUE 12. P. R93-R113 | 104 | 92% | 324 |
2 | HARRISON, I , (1993) IMPURITY-INDUCED DISORDERING IN III-V MULTIQUANTUM WELLS AND SUPERLATTICES.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 4. ISSUE 1. P. 1-28 | 123 | 81% | 18 |
3 | COHEN, RM , (1997) POINT DEFECTS AND DIFFUSION IN THIN FILMS OF GAAS.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 20. ISSUE 4-5. P. 167 -280 | 51 | 66% | 47 |
4 | MARSH, JH , (1993) QUANTUM-WELL INTERMIXING.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 8. ISSUE 6. P. 1136-1155 | 42 | 72% | 228 |
5 | ALEAHMAD, P , BAKHSHI, S , CHRISTODOULIDES, D , LIKAMWA, P , (2015) CONTROLLABLE RED AND BLUE SHIFTING OF INGAASP QUANTUM WELL BANDGAP ENERGY FOR PHOTONIC DEVICE INTEGRATION.MATERIALS RESEARCH EXPRESS. VOL. 2. ISSUE 8. P. - | 20 | 100% | 1 |
6 | NAGAI, Y , SHIGIHARA, K , KARAKIDA, S , KAKIMOTO, S , OTSUBO, M , IKEDA, K , (1995) CHARACTERISTICS OF LASER-DIODES WITH A PARTIALLY INTERMIXED GAAS-ALGAAS QUANTUM-WELL.IEEE JOURNAL OF QUANTUM ELECTRONICS. VOL. 31. ISSUE 8. P. 1364-1370 | 37 | 95% | 15 |
7 | DU, SC , FU, L , TAN, HH , JAGADISH, C , (2011) INVESTIGATION OF ION IMPLANTATION INDUCED INTERMIXING IN INP BASED QUATERNARY QUANTUM WELLS.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 44. ISSUE 47. P. - | 24 | 86% | 3 |
8 | PODHORODECKI, A , ANDRZEJEWSKI, J , KUDRAWIEC, R , MISIEWICZ, J , WOJCIK, J , ROBINSON, BJ , ROSCHUK, T , THOMPSON, DA , MASCHER, P , (2006) PHOTOREFLECTANCE INVESTIGATIONS OF QUANTUM WELL INTERMIXING PROCESSES IN COMPRESSIVELY STRAINED INGAASP/INGAASP QUANTUM WELL LASER STRUCTURES EMITTING AT 1.55 MU M.JOURNAL OF APPLIED PHYSICS. VOL. 100. ISSUE 1. P. - | 35 | 65% | 9 |
9 | DU, SC , FU, L , TAN, HH , JAGADISH, C , (2010) INVESTIGATIONS OF IMPURITY-FREE VACANCY DISORDERING IN (AL)INGAAS(P)/INGAAS QUANTUM WELLS.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 25. ISSUE 5. P. - | 23 | 88% | 5 |
10 | DEENAPANRAY, PNK , JAGADISH, C , (2001) IMPURITY-FREE INTERMIXING OF GAAS/ALGAAS QUANTUM WELLS USING SIOX CAPPING: EFFECT OF NITROUS OXIDE FLOW RATE.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 19. ISSUE 5. P. 1962 -1966 | 26 | 96% | 7 |
Classes with closest relation at Level 1 |