Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
595 | 3269 | 21.1 | 74% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
178 | 3 | GAN//PHYSICS, APPLIED//GALLIUM NITRIDE | 57874 |
20 | 2 | GAN//GALLIUM NITRIDE//NITRIDES | 36496 |
595 | 1 | GAN//MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH//YELLOW LUMINESCENCE | 3269 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | GAN | authKW | 419824 | 14% | 10% | 466 |
2 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | journal | 325905 | 4% | 26% | 132 |
3 | YELLOW LUMINESCENCE | authKW | 158309 | 1% | 63% | 27 |
4 | GALLIUM NITRIDE | authKW | 102458 | 4% | 9% | 128 |
5 | GAN MG | authKW | 71834 | 0% | 77% | 10 |
6 | RECH HETEROEPITAXIE PLICAT | address | 62865 | 1% | 21% | 32 |
7 | SEMICOND SCI TECHNOL | address | 60906 | 2% | 13% | 52 |
8 | P TYPE GAN | authKW | 56774 | 0% | 41% | 15 |
9 | MG DOPED GAN | authKW | 47271 | 0% | 56% | 9 |
10 | P TYPE ACTIVATION | authKW | 46695 | 0% | 100% | 5 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 26127 | 57% | 0% | 1861 |
2 | Physics, Condensed Matter | 9845 | 30% | 0% | 973 |
3 | Materials Science, Multidisciplinary | 5564 | 31% | 0% | 1000 |
4 | Crystallography | 4779 | 11% | 0% | 354 |
5 | Materials Science, Coatings & Films | 1081 | 5% | 0% | 150 |
6 | Physics, Multidisciplinary | 1012 | 10% | 0% | 316 |
7 | Engineering, Electrical & Electronic | 895 | 12% | 0% | 396 |
8 | Materials Science, Characterization, Testing | 201 | 1% | 0% | 37 |
9 | Microscopy | 107 | 1% | 0% | 24 |
10 | Nanoscience & Nanotechnology | 49 | 2% | 0% | 77 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | RECH HETEROEPITAXIE PLICAT | 62865 | 1% | 21% | 32 |
2 | SEMICOND SCI TECHNOL | 60906 | 2% | 13% | 52 |
3 | EPITAXIAL SEMICOND GRP | 38911 | 0% | 83% | 5 |
4 | ABT OPTOELEKT | 34576 | 0% | 37% | 10 |
5 | AKASAKI | 30092 | 1% | 16% | 20 |
6 | HIGH P SURE | 28051 | 2% | 6% | 51 |
7 | UNIP S | 26246 | 0% | 18% | 16 |
8 | CRHEA | 25865 | 1% | 8% | 37 |
9 | MICROSTRUCT ANAL UNIT | 24576 | 1% | 14% | 19 |
10 | CHICHIBU | 23343 | 0% | 50% | 5 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | 325905 | 4% | 26% | 132 |
2 | JOURNAL OF CRYSTAL GROWTH | 33482 | 10% | 1% | 335 |
3 | APPLIED PHYSICS LETTERS | 20713 | 15% | 0% | 498 |
4 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 12807 | 3% | 1% | 101 |
5 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 11645 | 3% | 1% | 111 |
6 | SEMICONDUCTORS AND SEMIMETALS | 11465 | 1% | 5% | 25 |
7 | JOURNAL OF APPLIED PHYSICS | 7049 | 9% | 0% | 290 |
8 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 5492 | 3% | 1% | 85 |
9 | JOURNAL OF ELECTRONIC MATERIALS | 5006 | 2% | 1% | 73 |
10 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 3801 | 3% | 0% | 91 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | GAN | 419824 | 14% | 10% | 466 | Search GAN | Search GAN |
2 | YELLOW LUMINESCENCE | 158309 | 1% | 63% | 27 | Search YELLOW+LUMINESCENCE | Search YELLOW+LUMINESCENCE |
3 | GALLIUM NITRIDE | 102458 | 4% | 9% | 128 | Search GALLIUM+NITRIDE | Search GALLIUM+NITRIDE |
4 | GAN MG | 71834 | 0% | 77% | 10 | Search GAN+MG | Search GAN+MG |
5 | P TYPE GAN | 56774 | 0% | 41% | 15 | Search P+TYPE+GAN | Search P+TYPE+GAN |
6 | MG DOPED GAN | 47271 | 0% | 56% | 9 | Search MG+DOPED+GAN | Search MG+DOPED+GAN |
7 | P TYPE ACTIVATION | 46695 | 0% | 100% | 5 | Search P+TYPE+ACTIVATION | Search P+TYPE+ACTIVATION |
8 | CONDUCTIVITY CONTROL | 42686 | 0% | 57% | 8 | Search CONDUCTIVITY+CONTROL | Search CONDUCTIVITY+CONTROL |
9 | LOW TEMPERATURE BUFFER LAYER | 37352 | 0% | 67% | 6 | Search LOW+TEMPERATURE+BUFFER+LAYER | Search LOW+TEMPERATURE+BUFFER+LAYER |
10 | BLUE LEDS | 35150 | 0% | 47% | 8 | Search BLUE+LEDS | Search BLUE+LEDS |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | RESHCHIKOV, MA , MORKOC, H , (2005) LUMINESCENCE PROPERTIES OF DEFECTS IN GAN.JOURNAL OF APPLIED PHYSICS. VOL. 97. ISSUE 6. P. - | 300 | 63% | 825 |
2 | VISWANATH, AK , (2001) GROWTH AND OPTICAL PROPERTIES OF GAN.PROCESSING AND PROPERTIES OF COMPOUND SEMICONDUCTORS. VOL. 73. ISSUE . P. 63 -150 | 253 | 58% | 1 |
3 | ORTON, JW , FOXON, CT , (1998) GROUP III NITRIDE SEMICONDUCTORS FOR SHORT WAVELENGTH LIGHT-EMITTING DEVICES.REPORTS ON PROGRESS IN PHYSICS. VOL. 61. ISSUE 1. P. 1 -+ | 136 | 59% | 394 |
4 | VAN DE WALLE, CG , NEUGEBAUER, J , (2004) FIRST-PRINCIPLES CALCULATIONS FOR DEFECTS AND IMPURITIES: APPLICATIONS TO III-NITRIDES.JOURNAL OF APPLIED PHYSICS. VOL. 95. ISSUE 8. P. 3851 -3879 | 83 | 53% | 1199 |
5 | SHEU, JK , CHI, GC , (2002) THE DOPING PROCESS AND DOPANT CHARACTERISTICS OF GAN.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 14. ISSUE 22. P. R657 -R702 | 99 | 63% | 62 |
6 | VISWANATH, AK , LEE, JI , YU, S , KIM, D , CHOI, Y , HONG, CH , (1998) PHOTOLUMINESCENCE STUDIES OF EXCITONIC TRANSITIONS IN GAN EPITAXIAL LAYERS.JOURNAL OF APPLIED PHYSICS. VOL. 84. ISSUE 7. P. 3848 -3859 | 68 | 77% | 84 |
7 | KERN, RS , GOTZ, W , CHEN, CH , LIU, H , FLETCHER, RM , KUO, CP , (2000) HIGH-BRIGHTNESS NITRIDE-BASED VISIBLE-LIGHT-EMITTING DIODES.ELECTROLUMINESCENCE I. VOL. 64. ISSUE . P. 129 -207 | 89 | 57% | 0 |
8 | STRITE, S , MORKOC, H , (1992) GAN, AIN, AND INN - A REVIEW.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 10. ISSUE 4. P. 1237 -1266 | 55 | 40% | 2125 |
9 | RESHCHIKOV, MA , (2015) POINT DEFECTS IN GAN.DEFECTS IN SEMICONDUCTORS. VOL. 91. ISSUE . P. 315 -367 | 57 | 55% | 1 |
10 | MONEMAR, B , PASKOV, PP , POZINA, G , HEMMINGSSON, C , BERGMAN, JP , KHROMOV, S , IZYUMSKAYA, VN , AVRUTIN, V , LI, X , MORKOC, H , ET AL (2014) PROPERTIES OF THE MAIN MG-RELATED ACCEPTORS IN GAN FROM OPTICAL AND STRUCTURAL STUDIES.JOURNAL OF APPLIED PHYSICS. VOL. 115. ISSUE 5. P. - | 35 | 83% | 10 |
Classes with closest relation at Level 1 |