Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 36570 | 78 | 23.4 | 79% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
| 746 | 2 | BETA FESI2//SILICIDES//SERIES RESISTANCE | 12475 |
| 36570 | 1 | NANOMETER SIZED SCHOTTKY CONTACT//KSRC//BRIDGE METAL ION | 78 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | NANOMETER SIZED SCHOTTKY CONTACT | authKW | 1174449 | 4% | 100% | 3 |
| 2 | KSRC | address | 521976 | 3% | 67% | 2 |
| 3 | BRIDGE METAL ION | authKW | 391483 | 1% | 100% | 1 |
| 4 | CDO GRAIN | authKW | 391483 | 1% | 100% | 1 |
| 5 | ELECTRON DEFORMATION AND ELECTROSTATIC POTENTIALS | authKW | 391483 | 1% | 100% | 1 |
| 6 | HISTIDINE BINDING ION | authKW | 391483 | 1% | 100% | 1 |
| 7 | HOCHFREQUENZTECH QUANTENELEK | address | 391483 | 1% | 100% | 1 |
| 8 | NANO DIODE | authKW | 391483 | 1% | 100% | 1 |
| 9 | NANO SCHOTTKY JUNCTIONS | authKW | 391483 | 1% | 100% | 1 |
| 10 | NANOSCALE METAL SEMICONDUCTOR CONTACT | authKW | 391483 | 1% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 1058 | 73% | 0% | 57 |
| 2 | Nanoscience & Nanotechnology | 943 | 37% | 0% | 29 |
| 3 | Physics, Condensed Matter | 408 | 38% | 0% | 30 |
| 4 | Materials Science, Multidisciplinary | 148 | 32% | 0% | 25 |
| 5 | Chemistry, Multidisciplinary | 107 | 26% | 0% | 20 |
| 6 | Materials Science, Coatings & Films | 33 | 5% | 0% | 4 |
| 7 | Engineering, Electrical & Electronic | 19 | 12% | 0% | 9 |
| 8 | Chemistry, Physical | 17 | 13% | 0% | 10 |
| 9 | Crystallography | 4 | 3% | 0% | 2 |
| 10 | Optics | 0 | 3% | 0% | 2 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | KSRC | 521976 | 3% | 67% | 2 |
| 2 | HOCHFREQUENZTECH QUANTENELEK | 391483 | 1% | 100% | 1 |
| 3 | SHANGHAI HIGH TEMP SUPERCONDUCTOR | 391483 | 1% | 100% | 1 |
| 4 | NANO HLTH | 195740 | 1% | 50% | 1 |
| 5 | INTER E QUANTUM ELECT | 155943 | 9% | 6% | 7 |
| 6 | EEWS NANOCENTURY KI | 130493 | 1% | 33% | 1 |
| 7 | NANOMICROENERGY | 33314 | 3% | 4% | 2 |
| 8 | SCI TECHNOL MICRONANO FABRICAT | 19572 | 1% | 5% | 1 |
| 9 | MICRONANO ELECT | 17793 | 1% | 5% | 1 |
| 10 | UNIV NANOSCI NANOTECHNOL | 16310 | 1% | 4% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | NANOTECHNOLOGY REVIEWS | 2222 | 1% | 1% | 1 |
| 2 | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | 899 | 8% | 0% | 6 |
| 3 | IEEE TRANSACTIONS ON NANOTECHNOLOGY | 875 | 3% | 0% | 2 |
| 4 | APPLIED PHYSICS LETTERS | 691 | 18% | 0% | 14 |
| 5 | CONDENSED MATTER PHYSICS | 561 | 1% | 0% | 1 |
| 6 | NANO LETTERS | 509 | 5% | 0% | 4 |
| 7 | PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES | 425 | 4% | 0% | 3 |
| 8 | JOURNAL OF NANOPARTICLE RESEARCH | 313 | 3% | 0% | 2 |
| 9 | NANOTECHNOLOGY | 301 | 4% | 0% | 3 |
| 10 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 207 | 4% | 0% | 3 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | KRAYA, RA , KRAYA, LY , (2012) CONTROLLING THE INTERFACE DYNAMICS AT AU NANOPARTICLE-OXIDE INTERFACES.IEEE TRANSACTIONS ON NANOTECHNOLOGY. VOL. 11. ISSUE 1. P. 12-15 | 13 | 59% | 3 |
| 2 | ZHDANOV, VP , KASEMO, B , (2011) POTENTIAL PROFILES NEAR THE SCHOTTKY NANOCONTACTS.PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES. VOL. 43. ISSUE 8. P. 1486-1489 | 10 | 63% | 3 |
| 3 | SONG, JQ , DING, T , LI, J , CAI, Q , (2010) SCANNING TUNNELING MICROSCOPE STUDY OF NANOSIZED METAL-SEMICONDUCTOR CONTACTS BETWEEN ERSI2 NANOISLANDS AND SI(001) SUBSTRATE.SURFACE SCIENCE. VOL. 604. ISSUE 3-4. P. 361-365 | 9 | 50% | 9 |
| 4 | KRAYA, R , KRAYA, LY , BONNELL, DA , (2010) ORIENTATION CONTROLLED SCHOTTKY BARRIER FORMATION AT AU NANOPARTICLE-SRTIO3 INTERFACES.NANO LETTERS. VOL. 10. ISSUE 4. P. 1224-1228 | 11 | 35% | 17 |
| 5 | REZEQ, M , ELEDLEBI, K , ISMAIL, M , DEY, RK , CUI, B , (2016) THEORETICAL AND EXPERIMENTAL INVESTIGATIONS OF NANO-SCHOTTKY CONTACTS.JOURNAL OF APPLIED PHYSICS. VOL. 120. ISSUE 4. P. - | 6 | 46% | 1 |
| 6 | KRAYA, RA , KRAYA, LY , (2012) THE ROLE OF CONTACT SIZE ON THE FORMATION OF SCHOTTKY BARRIERS AND OHMIC CONTACTS AT NANOSCALE METAL-SEMICONDUCTOR INTERFACES.JOURNAL OF APPLIED PHYSICS. VOL. 111. ISSUE 6. P. - | 8 | 38% | 9 |
| 7 | GUO, EJ , ZENG, ZG , SHI, XB , LONG, X , WANG, XH , (2016) ELECTRICAL TRANSPORT PROPERTIES OF AU NANOPARTICLES AND THIN FILMS ON GE PROBED USING A CONDUCTING ATOMIC FORCE MICROSCOPE.LANGMUIR. VOL. 32. ISSUE 41. P. 10589 -10596 | 11 | 26% | 0 |
| 8 | KRAYA, RA , (2011) THE REPRODUCIBILITY OF TRANSPORT CONDITIONS AT METAL NANOPARTICLE-SEMICONDUCTOR INTERFACES OVER A RANGE OF LOADING CONDITIONS.APPLIED PHYSICS LETTERS. VOL. 99. ISSUE 5. P. - | 8 | 38% | 0 |
| 9 | HAO, LF , BENNETT, PA , (2010) ANALYTIC MODEL FOR MINORITY CARRIER EFFECTS IN NANOSCALE SCHOTTKY CONTACTS.JOURNAL OF APPLIED PHYSICS. VOL. 108. ISSUE 1. P. - | 7 | 44% | 5 |
| 10 | ELEDLEBI, K , ISMAIL, M , REZEQ, M , (2016) FINITE ELEMENT SIMULATION AND ANALYSIS OF NANOMETAL-SEMICONDUCTOR CONTACTS.NANOTECHNOLOGY REVIEWS. VOL. 5. ISSUE 3. P. 355 -362 | 4 | 67% | 0 |
Classes with closest relation at Level 1 |