Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
19147 | 519 | 22.3 | 76% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
746 | 2 | BETA FESI2//SILICIDES//SERIES RESISTANCE | 12475 |
19147 | 1 | BALLISTIC ELECTRON EMISSION MICROSCOPY//BEEM//BALLISTIC ELECTRON EMISSION MICROSCOPY BEEM | 519 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | BALLISTIC ELECTRON EMISSION MICROSCOPY | authKW | 849552 | 4% | 76% | 19 |
2 | BEEM | authKW | 397124 | 2% | 75% | 9 |
3 | BALLISTIC ELECTRON EMISSION MICROSCOPY BEEM | authKW | 376534 | 2% | 80% | 8 |
4 | SPIN VALVE TRANSISTOR | authKW | 210118 | 1% | 71% | 5 |
5 | MAGNETOCURRENT | authKW | 183852 | 1% | 63% | 5 |
6 | INFORMAT STORAGE TECHNOL GRP | address | 177957 | 2% | 28% | 11 |
7 | MAGNETIC TUNNEL TRANSISTOR | authKW | 176502 | 1% | 100% | 3 |
8 | MAT NANOSCIUMR 6251 | address | 176502 | 1% | 100% | 3 |
9 | FESTKORPERELEKT MIKROSTUKTURZENTRUM | address | 117668 | 0% | 100% | 2 |
10 | FESTKORPERELEKTRON MIKROSTUKTURZENTRUM | address | 117668 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 4255 | 58% | 0% | 299 |
2 | Physics, Condensed Matter | 2151 | 34% | 0% | 179 |
3 | Nanoscience & Nanotechnology | 652 | 13% | 0% | 66 |
4 | Materials Science, Coatings & Films | 426 | 7% | 0% | 36 |
5 | Engineering, Electrical & Electronic | 256 | 15% | 0% | 79 |
6 | Physics, Multidisciplinary | 193 | 10% | 0% | 54 |
7 | Materials Science, Multidisciplinary | 66 | 11% | 0% | 59 |
8 | Microscopy | 32 | 1% | 0% | 5 |
9 | Chemistry, Physical | 16 | 7% | 0% | 37 |
10 | Instruments & Instrumentation | 2 | 2% | 0% | 8 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | INFORMAT STORAGE TECHNOL GRP | 177957 | 2% | 28% | 11 |
2 | MAT NANOSCIUMR 6251 | 176502 | 1% | 100% | 3 |
3 | FESTKORPERELEKT MIKROSTUKTURZENTRUM | 117668 | 0% | 100% | 2 |
4 | FESTKORPERELEKTRON MIKROSTUKTURZENTRUM | 117668 | 0% | 100% | 2 |
5 | MIKROSTRUKT ZENTRUM | 117668 | 0% | 100% | 2 |
6 | MIKROSTUKTURZENTRUM | 117668 | 0% | 100% | 2 |
7 | GORDON MCKAY PL SCI | 102949 | 1% | 25% | 7 |
8 | MIKROSTRUKTURZENTRUM | 88242 | 1% | 25% | 6 |
9 | INTEGRATED ELE | 78440 | 1% | 33% | 4 |
10 | CORP DEV SOLID STATE PHYS | 58834 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 7447 | 9% | 0% | 46 |
2 | APPLIED PHYSICS LETTERS | 3722 | 16% | 0% | 84 |
3 | PHYSICAL REVIEW B | 2143 | 15% | 0% | 79 |
4 | JOURNAL OF APPLIED PHYSICS | 1328 | 10% | 0% | 50 |
5 | FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYSICS | 995 | 0% | 2% | 1 |
6 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 912 | 3% | 0% | 15 |
7 | PHYSICAL REVIEW LETTERS | 674 | 7% | 0% | 34 |
8 | APPLIED SURFACE SCIENCE | 516 | 3% | 0% | 18 |
9 | SOLID STATE TECHNOLOGY | 501 | 1% | 0% | 4 |
10 | SCIENCE REPORTS OF THE RESEARCH INSTITUTES TOHOKU UNIVERSITY SERIES A-PHYSICS CHEMISTRY AND METALLURGY | 398 | 0% | 0% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | NARAYANAMURTI, V , KOZHEVNIKOV, M , (2001) BEEM IMAGING AND SPECTROSCOPY OF BURIED STRUCTURES IN SEMICONDUCTORS.PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS. VOL. 349. ISSUE 6. P. 447-514 | 120 | 65% | 61 |
2 | BELL, LD , (2016) BALLISTIC ELECTRON EMISSION MICROSCOPY AND SPECTROSCOPY: RECENT RESULTS AND RELATED TECHNIQUES.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 34. ISSUE 4. P. - | 86 | 59% | 1 |
3 | BELL, LD , KAISER, WJ , (1996) BALLISTIC-ELECTRON-EMISSION MICROSCOPY: A NANOMETER-SCALE PROBE OF INTERFACES AND CARRIER TRANSPORT.ANNUAL REVIEW OF MATERIALS SCIENCE. VOL. 26. ISSUE . P. 189-222 | 74 | 74% | 68 |
4 | YI, W , STOLLENWERK, AJ , NARAYANAMURTI, V , (2009) BALLISTIC ELECTRON MICROSCOPY AND SPECTROSCOPY OF METAL AND SEMICONDUCTOR NANOSTRUCTURES.SURFACE SCIENCE REPORTS. VOL. 64. ISSUE 5. P. 169 -190 | 68 | 56% | 13 |
5 | WALACHOVA, J , (1998) SOME APPLICATIONS OF BALLISTIC ELECTRON EMISSION MICROSCOPY/SPECTROSCOPY.ACTA PHYSICA POLONICA A. VOL. 93. ISSUE 2. P. 365 -372 | 51 | 89% | 0 |
6 | SMOLINER, J , RAKOCZY, D , KAST, M , (2004) HOT ELECTRON SPECTROSCOPY AND MICROSCOPY.REPORTS ON PROGRESS IN PHYSICS. VOL. 67. ISSUE 10. P. 1863 -1914 | 66 | 48% | 20 |
7 | PRIETSCH, M , (1995) BALLISTIC-ELECTRON-EMISSION MICROSCOPY (BEEM) - STUDIES OF METAL-SEMICONDUCTOR INTERFACES WITH NANOMETER RESOLUTION.PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS. VOL. 253. ISSUE 4. P. 164-233 | 59 | 68% | 33 |
8 | DAHNE-PRIETSCH, M , KALKA, T , (2000) HOT-ELECTRON TRANSPORT PROCESSES IN BALLISTIC-ELECTRON EMISSION MICROSCOPY AT AU-SI INTERFACES.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 109. ISSUE 1-2. P. 211-222 | 37 | 90% | 11 |
9 | BELL, LD , NARAYANAMURTI, V , (1998) BALLISTIC-ELECTRON-EMISSION MICROSCOPY OF SEMICONDUCTOR HETEROSTRUCTURES.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 3. ISSUE 1. P. 38-44 | 38 | 88% | 1 |
10 | ECKES, MW , FRIEND, BE , STOLLENWERK, AJ , (2014) EFFECT OF GROWTH TEMPERATURE ON BALLISTIC ELECTRON TRANSPORT THROUGH THE AU/SI(001) INTERFACE.JOURNAL OF APPLIED PHYSICS. VOL. 115. ISSUE 16. P. - | 28 | 74% | 3 |
Classes with closest relation at Level 1 |