Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
13293 | 848 | 21.6 | 38% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
178 | 3 | GAN//PHYSICS, APPLIED//GALLIUM NITRIDE | 57874 |
3252 | 2 | JUNCTION TEMPERATURE//COMPACT THERMAL MODEL//DYNAMIC THERMAL MANAGEMENT | 1976 |
13293 | 1 | DYNAMIC THERMAL MANAGEMENT//COMPACT THERMAL MODEL//DYNAMIC THERMAL MANAGEMENT DTM | 848 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | DYNAMIC THERMAL MANAGEMENT | authKW | 610730 | 2% | 81% | 21 |
2 | COMPACT THERMAL MODEL | authKW | 512218 | 2% | 68% | 21 |
3 | DYNAMIC THERMAL MANAGEMENT DTM | authKW | 300057 | 1% | 83% | 10 |
4 | THERMAL SPREADING RESISTANCE | authKW | 243044 | 1% | 75% | 9 |
5 | ELE ON DEVICES | address | 170448 | 3% | 19% | 25 |
6 | MICROELECT COMP SCI | address | 163670 | 2% | 22% | 21 |
7 | THERMAL PLACEMENT | authKW | 150028 | 1% | 83% | 5 |
8 | THERMAL AWARE | authKW | 145819 | 1% | 45% | 9 |
9 | THERMAL TRANSIENT TESTING | authKW | 128594 | 1% | 71% | 5 |
10 | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | journal | 128239 | 8% | 6% | 64 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Computer Science, Hardware & Architecture | 15089 | 24% | 0% | 202 |
2 | Engineering, Electrical & Electronic | 11234 | 66% | 0% | 562 |
3 | Engineering, Manufacturing | 2111 | 9% | 0% | 75 |
4 | Nanoscience & Nanotechnology | 1873 | 17% | 0% | 140 |
5 | Computer Science, Software Engineering | 753 | 7% | 0% | 62 |
6 | Engineering, Mechanical | 545 | 9% | 0% | 76 |
7 | Materials Science, Multidisciplinary | 507 | 20% | 0% | 168 |
8 | Computer Science, Interdisciplinary Applications | 406 | 6% | 0% | 55 |
9 | Physics, Applied | 297 | 15% | 0% | 125 |
10 | Thermodynamics | 221 | 5% | 0% | 40 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ELE ON DEVICES | 170448 | 3% | 19% | 25 |
2 | MICROELECT COMP SCI | 163670 | 2% | 22% | 21 |
3 | MNT DEE | 72014 | 0% | 100% | 2 |
4 | DRTS | 64811 | 0% | 60% | 3 |
5 | MINIST EDUC CHINA DESIGN ELE OMAG | 48008 | 0% | 67% | 2 |
6 | PHYS ELE OTECHNOL | 44303 | 1% | 15% | 8 |
7 | DACYA | 39130 | 1% | 22% | 5 |
8 | ADV ELECT PACKAGING | 36007 | 0% | 100% | 1 |
9 | ADV OPT MAT | 36007 | 0% | 100% | 1 |
10 | ADV RELIBIL METHODS | 36007 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 128239 | 8% | 6% | 64 |
2 | MICROELECTRONICS JOURNAL | 55677 | 9% | 2% | 77 |
3 | JOURNAL OF ELECTRONIC PACKAGING | 46685 | 5% | 3% | 40 |
4 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A | 44875 | 3% | 6% | 22 |
5 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 15303 | 4% | 1% | 38 |
6 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 14973 | 5% | 1% | 45 |
7 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 14191 | 3% | 2% | 23 |
8 | MICROELECTRONICS RELIABILITY | 13476 | 6% | 1% | 51 |
9 | IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 10055 | 2% | 1% | 19 |
10 | SUSTAINABLE COMPUTING-INFORMATICS & SYSTEMS | 9450 | 1% | 4% | 6 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | RAZAVI, M , MUZYCHKA, YS , KOCABIYIK, S , (2016) REVIEW OF ADVANCES IN THERMAL SPREADING RESISTANCE PROBLEMS.JOURNAL OF THERMOPHYSICS AND HEAT TRANSFER. VOL. 30. ISSUE 4. P. 863 -879 | 22 | 71% | 0 |
2 | CODECASA, L , D'ALESSANDRO, V , MAGNANI, A , RINALDI, N , (2015) STRUCTURE-PRESERVING APPROACH TO MULTI-PORT DYNAMIC COMPACT MODELS OF NONLINEAR HEAT CONDUCTION.MICROELECTRONICS JOURNAL. VOL. 46. ISSUE 12. P. 1129 -1137 | 14 | 100% | 1 |
3 | BENEVENTI, F , BARTOLINI, A , TILLI, A , BENINI, L , (2014) AN EFFECTIVE GRAY-BOX IDENTIFICATION PROCEDURE FOR MULTICORE THERMAL MODELING.IEEE TRANSACTIONS ON COMPUTERS. VOL. 63. ISSUE 5. P. 1097 -1110 | 16 | 84% | 3 |
4 | JANICKI, M , BANASZCZYK, J , VERMEERSCH, B , DE MEY, G , NAPIERALSKI, A , (2011) GENERATION OF REDUCED DYNAMIC THERMAL MODELS OF ELECTRONIC SYSTEMS FROM TIME CONSTANT SPECTRA OF TRANSIENT TEMPERATURE RESPONSES.MICROELECTRONICS RELIABILITY. VOL. 51. ISSUE 8. P. 1351 -1355 | 14 | 100% | 6 |
5 | CODECASA, L , (2014) COMPACT ELECTRO-THERMAL MODELS OF INTERCONNECTS.MICROELECTRONICS JOURNAL. VOL. 45. ISSUE 12. P. 1777 -1785 | 16 | 80% | 0 |
6 | GERSTENMAIER, YC , KIFFE, W , WACHUTKA, G , (2009) COMBINATION OF THERMAL SUBSYSTEMS BY USE OF RAPID CIRCUIT TRANSFORMATION AND EXTENDED TWO-PORT THEORY.MICROELECTRONICS JOURNAL. VOL. 40. ISSUE 1. P. 26-34 | 14 | 100% | 5 |
7 | CODECASA, L , (2014) NONLINEAR DYNAMIC COMPACT THERMAL MODELS BY STRUCTURE-PRESERVING PROJECTION.MICROELECTRONICS JOURNAL. VOL. 45. ISSUE 12. P. 1764 -1769 | 13 | 93% | 1 |
8 | GERSTENMAIER, YC , CASTELLAZZI, A , WACHUTKA, GKM , (2006) ELECTROTHERMAL SIMULATION OF MULTICHIP-MODULES WITH NOVEL TRANSIENT THERMAL MODEL AND TIME-DEPENDENT BOUNDARY CONDITIONS.IEEE TRANSACTIONS ON POWER ELECTRONICS. VOL. 21. ISSUE 1. P. 45 -55 | 13 | 100% | 32 |
9 | LASANCE, CJM , (2008) TEN YEARS OF BOUNDARY-CONDITION-INDEPENDENT COMPACT THERMAL MODELING OF ELECTRONIC PARTS: A REVIEW.HEAT TRANSFER ENGINEERING. VOL. 29. ISSUE 2. P. 149 -168 | 14 | 78% | 39 |
10 | LEE, J , (2003) THERMAL PLACEMENT ALGORITHM BASED ON HEAT CONDUCTION ANALOGY.IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES. VOL. 26. ISSUE 2. P. 473-482 | 13 | 100% | 26 |
Classes with closest relation at Level 1 |