Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
2701 | 2169 | 21.1 | 57% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
406 | 3 | ENGINEERING, MANUFACTURING//INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE//CUTTING FORCE | 29578 |
1656 | 2 | CHEMICAL MECHANICAL POLISHING//CMP//GRINDING | 6878 |
2701 | 1 | CHEMICAL MECHANICAL POLISHING//CMP//CHEMICAL MECHANICAL PLANARIZATION | 2169 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | CHEMICAL MECHANICAL POLISHING | authKW | 3629783 | 17% | 70% | 369 |
2 | CMP | authKW | 1799418 | 11% | 55% | 232 |
3 | CHEMICAL MECHANICAL PLANARIZATION | authKW | 1167381 | 5% | 82% | 101 |
4 | CHEMICAL MECHANICAL POLISHING CMP | authKW | 1126688 | 6% | 65% | 123 |
5 | CHEMICAL MECHANICAL PLANARIZATION CMP | authKW | 538393 | 2% | 75% | 51 |
6 | POLISHING PAD | authKW | 338223 | 1% | 83% | 29 |
7 | DISHING | authKW | 306946 | 1% | 84% | 26 |
8 | NANO SOI PROC | address | 255455 | 2% | 55% | 33 |
9 | PLANARIZATION | authKW | 249263 | 3% | 29% | 62 |
10 | REMOVAL RATE | authKW | 241142 | 3% | 31% | 56 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 26760 | 25% | 0% | 552 |
2 | Engineering, Manufacturing | 11585 | 13% | 0% | 278 |
3 | Electrochemistry | 9979 | 18% | 0% | 401 |
4 | Physics, Applied | 7547 | 39% | 0% | 841 |
5 | Materials Science, Multidisciplinary | 3609 | 30% | 0% | 657 |
6 | Engineering, Mechanical | 2106 | 11% | 0% | 234 |
7 | Nanoscience & Nanotechnology | 1861 | 11% | 0% | 232 |
8 | Engineering, Electrical & Electronic | 1822 | 19% | 0% | 411 |
9 | Physics, Condensed Matter | 1738 | 17% | 0% | 359 |
10 | Engineering, Industrial | 504 | 3% | 0% | 63 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | NANO SOI PROC | 255455 | 2% | 55% | 33 |
2 | FAB | 176863 | 1% | 74% | 17 |
3 | ADV MAT PROC | 126370 | 5% | 8% | 112 |
4 | ENERGY OURCES TECHNOL | 124129 | 1% | 42% | 21 |
5 | SHENZHEN MICRO NANO MFG | 100182 | 1% | 65% | 11 |
6 | ADV SEMICOND MAT DEVICE DEV | 74042 | 1% | 48% | 11 |
7 | STATE TRIBOL | 73932 | 4% | 5% | 97 |
8 | GP TECHNOL | 70381 | 0% | 100% | 5 |
9 | ADV SEMICOND MAT DEVICES DEV | 63070 | 1% | 41% | 11 |
10 | SEMICOND DISPLAY | 45043 | 0% | 80% | 4 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 60907 | 3% | 6% | 75 |
2 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 60462 | 17% | 1% | 359 |
3 | ELECTROCHEMICAL AND SOLID STATE LETTERS | 36903 | 5% | 2% | 106 |
4 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 30204 | 3% | 4% | 58 |
5 | MICROELECTRONIC ENGINEERING | 27461 | 7% | 1% | 141 |
6 | SOLID STATE TECHNOLOGY | 20473 | 2% | 3% | 52 |
7 | MICRO | 11495 | 1% | 7% | 12 |
8 | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY | 9303 | 0% | 7% | 10 |
9 | CIRP ANNALS-MANUFACTURING TECHNOLOGY | 4794 | 1% | 1% | 28 |
10 | JAPANESE JOURNAL OF APPLIED PHYSICS | 3773 | 3% | 0% | 66 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | CHEMICAL MECHANICAL POLISHING | 3629783 | 17% | 70% | 369 | Search CHEMICAL+MECHANICAL+POLISHING | Search CHEMICAL+MECHANICAL+POLISHING |
2 | CMP | 1799418 | 11% | 55% | 232 | Search CMP | Search CMP |
3 | CHEMICAL MECHANICAL PLANARIZATION | 1167381 | 5% | 82% | 101 | Search CHEMICAL+MECHANICAL+PLANARIZATION | Search CHEMICAL+MECHANICAL+PLANARIZATION |
4 | CHEMICAL MECHANICAL POLISHING CMP | 1126688 | 6% | 65% | 123 | Search CHEMICAL+MECHANICAL+POLISHING+CMP | Search CHEMICAL+MECHANICAL+POLISHING+CMP |
5 | CHEMICAL MECHANICAL PLANARIZATION CMP | 538393 | 2% | 75% | 51 | Search CHEMICAL+MECHANICAL+PLANARIZATION+CMP | Search CHEMICAL+MECHANICAL+PLANARIZATION+CMP |
6 | POLISHING PAD | 338223 | 1% | 83% | 29 | Search POLISHING+PAD | Search POLISHING+PAD |
7 | DISHING | 306946 | 1% | 84% | 26 | Search DISHING | Search DISHING |
8 | PLANARIZATION | 249263 | 3% | 29% | 62 | Search PLANARIZATION | Search PLANARIZATION |
9 | REMOVAL RATE | 241142 | 3% | 31% | 56 | Search REMOVAL+RATE | Search REMOVAL+RATE |
10 | POST CMP CLEANING | 221691 | 1% | 75% | 21 | Search POST+CMP+CLEANING | Search POST+CMP+CLEANING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | LEE, H , LEE, D , JEONG, H , (2016) MECHANICAL ASPECTS OF THE CHEMICAL MECHANICAL POLISHING PROCESS: A REVIEW.INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING. VOL. 17. ISSUE 4. P. 525 -536 | 73 | 94% | 1 |
2 | ZHAO, DW , LU, XC , (2013) CHEMICAL MECHANICAL POLISHING: THEORY AND EXPERIMENT.FRICTION. VOL. 1. ISSUE 4. P. 306 -326 | 76 | 93% | 12 |
3 | ZANTYE, PB , KUMAR, A , SIKDER, AK , (2004) CHEMICAL MECHANICAL PLANARIZATION FOR MICROELECTRONICS APPLICATIONS.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 45. ISSUE 3-6. P. 89 -220 | 99 | 64% | 244 |
4 | XU, QZ , CHEN, L , (2015) A MATERIAL REMOVAL RATE MODEL FOR ALUMINUM GATE CHEMICAL MECHANICAL PLANARIZATION.ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. VOL. 4. ISSUE 3. P. P101 -P107 | 59 | 98% | 2 |
5 | SRINIVASAN, R , DANDU, PVR , BABU, SV , (2015) SHALLOW TRENCH ISOLATION CHEMICAL MECHANICAL PLANARIZATION: A REVIEW.ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. VOL. 4. ISSUE 11. P. P5029 -P5039 | 61 | 82% | 2 |
6 | XU, QZ , CHEN, L , FANG, JJ , YANG, F , (2015) A CHEMICAL MECHANICAL PLANARIZATION MODEL FOR ALUMINUM GATE STRUCTURES.MICROELECTRONIC ENGINEERING. VOL. 131. ISSUE . P. 58 -67 | 52 | 91% | 3 |
7 | KWON, TY , RAMACHANDRAN, M , PARK, JG , (2013) SCRATCH FORMATION AND ITS MECHANISM IN CHEMICAL MECHANICAL PLANARIZATION (CMP).FRICTION. VOL. 1. ISSUE 4. P. 279 -305 | 56 | 85% | 9 |
8 | WANG, Y , ZHAO, YW , CHEN, X , (2012) CHEMICAL MECHANICAL PLANARIZATION FROM MACRO-SCALE TO MOLECULAR-SCALE.MATERIALS AND MANUFACTURING PROCESSES. VOL. 27. ISSUE 6. P. 641 -649 | 53 | 93% | 7 |
9 | KRISHNAN, M , NALASKOWSKI, JW , COOK, LM , (2010) CHEMICAL MECHANICAL PLANARIZATION: SLURRY CHEMISTRY, MATERIALS, AND MECHANISMS.CHEMICAL REVIEWS. VOL. 110. ISSUE 1. P. 178 -204 | 58 | 67% | 102 |
10 | XU, QZ , FANG, JJ , CHEN, L , (2016) A CHIP-SCALE CHEMICAL MECHANICAL PLANARIZATION MODEL FOR COPPER INTERCONNECT STRUCTURES.MICROELECTRONIC ENGINEERING. VOL. 149. ISSUE . P. 14 -24 | 38 | 93% | 0 |
Classes with closest relation at Level 1 |