Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
33538 | 123 | 21.8 | 48% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
505 | 3 | ZHURNAL NAUCHNOI I PRIKLADNOI FOTOGRAFII//SOLID STATE IONICS//SOLID ELECTROLYTE | 21947 |
3570 | 2 | ZHURNAL NAUCHNOI I PRIKLADNOI FOTOGRAFII//KAZAN BRANCH//JOINT SUPERCOMP | 1310 |
33538 | 1 | DEBRIS PARTICLES//UNIT ENVIRONM CATALYZES PROC ANAL//MAT PHYS NANOMAT PL ENVIRONM L HYMNE | 123 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | DEBRIS PARTICLES | authKW | 1222181 | 7% | 62% | 8 |
2 | UNIT ENVIRONM CATALYZES PROC ANAL | address | 1105866 | 6% | 64% | 7 |
3 | MAT PHYS NANOMAT PL ENVIRONM L HYMNE | address | 993027 | 3% | 100% | 4 |
4 | UNIV BEREICH STADTMITTE | address | 993027 | 3% | 100% | 4 |
5 | ENERGY OF TRANSFER | authKW | 744770 | 2% | 100% | 3 |
6 | RUBEZHANSK BRANCH | address | 496513 | 2% | 100% | 2 |
7 | UNIT CATALYZES MAT ENVIRONM PROC | address | 496513 | 2% | 100% | 2 |
8 | THIN AND THICK FILMS | authKW | 446860 | 2% | 60% | 3 |
9 | REAL TIME DOSE MONITORING | authKW | 331008 | 2% | 67% | 2 |
10 | SCATTERING OF PARTICLES | authKW | 331008 | 2% | 67% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Multidisciplinary | 189 | 29% | 0% | 36 |
2 | Engineering, Electrical & Electronic | 172 | 24% | 0% | 29 |
3 | Optics | 164 | 16% | 0% | 20 |
4 | Instruments & Instrumentation | 143 | 11% | 0% | 14 |
5 | Nuclear Science & Technology | 119 | 10% | 0% | 12 |
6 | Physics, Applied | 97 | 20% | 0% | 25 |
7 | Nanoscience & Nanotechnology | 86 | 10% | 0% | 12 |
8 | Chemistry, Physical | 33 | 14% | 0% | 17 |
9 | Physics, Condensed Matter | 33 | 11% | 0% | 13 |
10 | Materials Science, Ceramics | 26 | 3% | 0% | 4 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | UNIT ENVIRONM CATALYZES PROC ANAL | 1105866 | 6% | 64% | 7 |
2 | MAT PHYS NANOMAT PL ENVIRONM L HYMNE | 993027 | 3% | 100% | 4 |
3 | UNIV BEREICH STADTMITTE | 993027 | 3% | 100% | 4 |
4 | RUBEZHANSK BRANCH | 496513 | 2% | 100% | 2 |
5 | UNIT CATALYZES MAT ENVIRONM PROC | 496513 | 2% | 100% | 2 |
6 | NANOQAM | 260452 | 7% | 13% | 8 |
7 | ENVIRONM CATAL ANAL METHODS | 248257 | 1% | 100% | 1 |
8 | INSA ROUENUMR6014 FR3038COBRA | 248257 | 1% | 100% | 1 |
9 | MP TS RPAD | 248257 | 1% | 100% | 1 |
10 | SILICON PHOTON SYST GRP CONNECT | 248257 | 1% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF SUPERHARD MATERIALS | 103059 | 11% | 3% | 13 |
2 | SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 5494 | 3% | 1% | 4 |
3 | RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY | 3980 | 6% | 0% | 7 |
4 | MICROELECTRONICS INTERNATIONAL | 2996 | 2% | 1% | 2 |
5 | ADAM HILGER SERIES ON SENSORS | 891 | 1% | 0% | 1 |
6 | NEW DIAMOND AND FRONTIER CARBON TECHNOLOGY | 891 | 1% | 0% | 1 |
7 | JOURNAL OF MECHANICAL WORKING TECHNOLOGY | 823 | 1% | 0% | 1 |
8 | SURFACE ENGINEERING AND APPLIED ELECTROCHEMISTRY | 784 | 1% | 0% | 1 |
9 | PROCEEDINGS OF THE ESTONIAN ACADEMY OF SCIENCES | 716 | 1% | 0% | 1 |
10 | IEEE SENSORS JOURNAL | 675 | 3% | 0% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | FILATOV, OY , SIDORKO, VI , KOVALEV, SV , FILATOV, YD , VETROV, AG , (2016) POLISHED SURFACE ROUGHNESS OF OPTOELECTRONIC COMPONENTS MADE OF MONOCRYSTALLINE MATERIALS.JOURNAL OF SUPERHARD MATERIALS. VOL. 38. ISSUE 3. P. 197 -206 | 12 | 75% | 0 |
2 | FILATOV, OY , SIDORKO, VI , KOVALEV, SV , FILATOV, YD , VETROV, AG , (2016) MATERIAL REMOVAL RATE IN POLISHING ANISOTROPIC MONOCRYSTALLINE MATERIALS FOR OPTOELECTRONICS.JOURNAL OF SUPERHARD MATERIALS. VOL. 38. ISSUE 2. P. 123 -131 | 9 | 69% | 0 |
3 | MAITY, TK , SHARMA, SL , CHOURASIYA, G , (2012) THE REAL-TIME GAMMA RADIATION DOSIMETRY WITH TEO2 THIN FILMS.RADIATION MEASUREMENTS. VOL. 47. ISSUE 2. P. 145-148 | 7 | 88% | 5 |
4 | SHARMA, SL , MAITY, TK , (2011) EFFECT OF GAMMA RADIATION ON ELECTRICAL AND OPTICAL PROPERTIES OF (TEO2)(0.9) (IN2O3)(0.1) THIN FILMS.BULLETIN OF MATERIALS SCIENCE. VOL. 34. ISSUE 1. P. 61-69 | 9 | 69% | 3 |
5 | KOROSTYNSKA, O , ARSHAK, K , HARRIS, J , (2009) COST-EFFECTIVE PERSONAL RADIATION DOSIMETRY.LITHUANIAN JOURNAL OF PHYSICS. VOL. 49. ISSUE 2. P. 183-188 | 7 | 88% | 0 |
6 | MAITY, TK , SHARMA, SL , (2011) EFFECTS OF GAMMA IRRADIATION ON ELECTRICAL, OPTICAL AND STRUCTURAL PROPERTIES OF TELLURIUM DIOXIDE THIN FILMS.INDIAN JOURNAL OF PURE & APPLIED PHYSICS. VOL. 49. ISSUE 9. P. 608-614 | 8 | 62% | 2 |
7 | FILATOV, YD , VETROV, AG , SIDORKO, VI , FILATOV, OY , KOVALEV, SV , KURILOVICH, VD , DANIL'CHENKO, MA , PRIKHNA, TA , BORIMSKII, AI , KATSAI, AM , ET AL (2015) POLISHING OF OPTOELECTRONIC COMPONENTS MADE OF MONOCRYSTALLINE SILICON CARBIDE.JOURNAL OF SUPERHARD MATERIALS. VOL. 37. ISSUE 1. P. 48 -56 | 6 | 67% | 0 |
8 | DEKHTYAR, Y , (2014) WEAK ELECTRON EMISSION CURRENT FOR CHARACTERIZATION OF NANOMATERIALS, GAS AND RADIATION SENSING TOWARDS MEDICAL APPLICATIONS.PROCEEDINGS OF THE ESTONIAN ACADEMY OF SCIENCES. VOL. 63. ISSUE 3. P. 258 -266 | 6 | 67% | 0 |
9 | KULIKOV, BA , LOS', EB , KULIKOVA, NV , (2005) EFFECT OF THE DIELECTRIC CONSTANT OF THE SOLVENT ON THE DISSOLUTION AND TRANSPORT KINETICS IN CESIUM IODIDE-N-ALKANOL SYSTEMS.RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY. VOL. 79. ISSUE 10. P. 1599-1604 | 5 | 100% | 0 |
10 | ARSHAK, K , CORCORAN, J , KOROSTYNSKA, O , (2005) GAMMA RADIATION SENSING PROPERTIES OF TIO2, ZNO, CUO AND CDO THICK FILM PN-JUNCTIONS.SENSORS AND ACTUATORS A-PHYSICAL. VOL. 123-24. ISSUE . P. 194-198 | 7 | 58% | 18 |
Classes with closest relation at Level 1 |