Class information for:
Level 1: SURFACE AND INTERFACE ANALYSIS//SURFACE EXCITATION//INELASTIC MEAN FREE PATH

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
2063 2368 27.8 55%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
2316 2             SURFACE AND INTERFACE ANALYSIS//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA//SURFACE EXCITATION 4480
2063 1                   SURFACE AND INTERFACE ANALYSIS//SURFACE EXCITATION//INELASTIC MEAN FREE PATH 2368

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SURFACE AND INTERFACE ANALYSIS journal 823027 28% 10% 652
2 SURFACE EXCITATION authKW 514743 2% 87% 46
3 INELASTIC MEAN FREE PATH authKW 441633 2% 65% 53
4 ELASTIC PEAK ELECTRON SPECTROSCOPY authKW 414011 1% 94% 34
5 IMFP authKW 387197 1% 97% 31
6 EPES authKW 356819 1% 86% 32
7 ELECTRON INELASTIC MEAN FREE PATH authKW 272816 1% 92% 23
8 SURFACE EXCITATION PARAMETER authKW 257864 1% 100% 20
9 REELS authKW 255774 2% 54% 37
10 ELECTRON SOLID INTERACTIONS authKW 244966 2% 33% 58

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Chemistry, Physical 10821 45% 0% 1071
2 Materials Science, Coatings & Films 5662 11% 0% 272
3 Spectroscopy 5369 14% 0% 320
4 Microscopy 3794 4% 0% 105
5 Physics, Condensed Matter 3526 22% 0% 513
6 Physics, Applied 2249 22% 0% 520
7 Instruments & Instrumentation 515 5% 0% 129
8 Chemistry, Analytical 108 4% 0% 106
9 Nuclear Science & Technology 76 2% 0% 58
10 Physics, Multidisciplinary 47 4% 0% 92

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SUR E MICROANAL SCI 180513 3% 23% 60
2 MAT MEASUREMENT TECHNOL 84519 1% 33% 20
3 ALLGEMEINE PHYS 69792 2% 11% 49
4 ATOM MOL PHYS S 45513 1% 16% 22
5 OPT ANALYT MEASUREMENT 42110 0% 47% 7
6 SERV METROL NUCL 41557 1% 16% 20
7 MASK ENGN GRP 38680 0% 100% 3
8 SERV METROL NUCL CP 165 84 38674 0% 50% 6
9 MTA ATOMKI 28442 0% 28% 8
10 GEN PHYS FUS 25786 0% 100% 2

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SURFACE AND INTERFACE ANALYSIS 823027 28% 10% 652
2 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 166018 12% 5% 277
3 SURFACE SCIENCE 22743 9% 1% 219
4 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 11490 5% 1% 113
5 SCANNING 8748 1% 2% 34
6 APPLIED SURFACE SCIENCE 5218 5% 0% 121
7 VACUUM 4959 3% 1% 61
8 SCANNING ELECTRON MICROSCOPY 3985 1% 2% 18
9 JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES 3370 0% 2% 11
10 VIDE-SCIENCE TECHNIQUE ET APPLICATIONS 2661 0% 2% 10

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SURFACE EXCITATION 514743 2% 87% 46 Search SURFACE+EXCITATION Search SURFACE+EXCITATION
2 INELASTIC MEAN FREE PATH 441633 2% 65% 53 Search INELASTIC+MEAN+FREE+PATH Search INELASTIC+MEAN+FREE+PATH
3 ELASTIC PEAK ELECTRON SPECTROSCOPY 414011 1% 94% 34 Search ELASTIC+PEAK+ELECTRON+SPECTROSCOPY Search ELASTIC+PEAK+ELECTRON+SPECTROSCOPY
4 IMFP 387197 1% 97% 31 Search IMFP Search IMFP
5 EPES 356819 1% 86% 32 Search EPES Search EPES
6 ELECTRON INELASTIC MEAN FREE PATH 272816 1% 92% 23 Search ELECTRON+INELASTIC+MEAN+FREE+PATH Search ELECTRON+INELASTIC+MEAN+FREE+PATH
7 SURFACE EXCITATION PARAMETER 257864 1% 100% 20 Search SURFACE+EXCITATION+PARAMETER Search SURFACE+EXCITATION+PARAMETER
8 REELS 255774 2% 54% 37 Search REELS Search REELS
9 ELECTRON SOLID INTERACTIONS 244966 2% 33% 58 Search ELECTRON+SOLID+INTERACTIONS Search ELECTRON+SOLID+INTERACTIONS
10 ARXPS 173303 1% 41% 33 Search ARXPS Search ARXPS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 POWELL, CJ , JABLONSKI, A , (2010) PROGRESS IN QUANTITATIVE SURFACE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPY: CURRENT STATUS AND PERSPECTIVES.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 178. ISSUE . P. 331 -346 105 87% 58
2 WERNER, WSM , (2001) ELECTRON TRANSPORT IN SOLIDS FOR QUANTITATIVE SURFACE ANALYSIS.SURFACE AND INTERFACE ANALYSIS. VOL. 31. ISSUE 3. P. 141 -176 108 89% 196
3 TOUGAARD, S , (2010) ENERGY LOSS IN XPS: FUNDAMENTAL PROCESSES AND APPLICATIONS FOR QUANTIFICATION, NON-DESTRUCTIVE DEPTH PROFILING AND 3D IMAGING.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 178. ISSUE . P. 128-153 91 87% 37
4 GERGELY, G , (2002) ELASTIC BACKSCATTERING OF ELECTRONS: DETERMINATION OF PHYSICAL PARAMETERS OF ELECTRON TRANSPORT PROCESSES BY ELASTIC PEAK ELECTRON SPECTROSCOPY.PROGRESS IN SURFACE SCIENCE. VOL. 71. ISSUE 1-4. P. 31-88 127 77% 80
5 POWELL, CJ , JABLONSKI, A , (1999) EVALUATION OF CALCULATED AND MEASURED ELECTRON INELASTIC MEAN FREE PATHS NEAR SOLID SURFACES.JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA. VOL. 28. ISSUE 1. P. 19 -62 86 82% 274
6 POWELL, CJ , JABLONSKI, A , (2009) SURFACE SENSITIVITY OF X-RAY PHOTOELECTRON SPECTROSCOPY.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. VOL. 601. ISSUE 1-2. P. 54-65 60 92% 61
7 SALMA, K , DING, ZJ , ZHANG, ZM , ZHANG, P , TOKESI, K , VARGA, D , TOTH, J , (2009) QUANTIFICATION OF SURFACE EFFECTS: MONTE CARLO SIMULATION OF REELS SPECTRA TO OBTAIN SURFACE EXCITATION PARAMETER.SURFACE SCIENCE. VOL. 603. ISSUE 9. P. 1236-1243 64 97% 4
8 JABLONSKI, A , (2016) ANALYTICAL THEORY OF ELASTIC ELECTRON BACKSCATTERING FROM ELEMENTS, ALLOYS AND COMPOUNDS: COMPARISON WITH EXPERIMENTAL DATA.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 206. ISSUE . P. 24 -45 48 100% 1
9 JABLONSKI, A , (2009) QUANTIFICATION OF SURFACE-SENSITIVE ELECTRON SPECTROSCOPIES.SURFACE SCIENCE. VOL. 603. ISSUE 10-12. P. 1342 -1352 66 80% 10
10 HAJATI, S , TOUGAARD, S , (2010) XPS FOR NON-DESTRUCTIVE DEPTH PROFILING AND 3D IMAGING OF SURFACE NANOSTRUCTURES.ANALYTICAL AND BIOANALYTICAL CHEMISTRY. VOL. 396. ISSUE 8. P. 2741 -2755 69 70% 16

Classes with closest relation at Level 1


Rank Class id link
1 25515 ALUMINUM ANODIZING FILM//AUGER ELECTRON ON SPECTROSCOPY//AUGER ELECTRONIC SPECTROMETER
2 36899 VALENCE BAND XPS//ANAEROBIC CELL//BOND STRUCTURE CALCULATION
3 17236 AUGER PARAMETER//DIFFERENTIAL CHARGING//CHARGE REFERENCING
4 9414 MEAN PENETRATION DEPTH//ELECTRON PROBE MICROANALYSIS//STANDARDLESS ANALYSIS
5 18100 CONICAL PROTRUSION//FINE PROTRUSION//STRIPE RIB
6 14404 BACKSCATTERED ELECTRONS//DOPANT CONTRAST//SCANNING
7 15718 AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//AUGER TRANSITION//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY
8 36971 DOUBLE DYNODE READOUT//NE102//PAVIA SEZ
9 5232 SIMS//DEPTH RESOLUTION//SCI ANAL MAT SAM
10 8897 PHOTOELECTRON DIFFRACTION//PHOTOELECTRON HOLOGRAPHY//X RAY FLUORESCENCE HOLOGRAPHY

Go to start page