Class information for:
Level 1: AUGER PARAMETER//DIFFERENTIAL CHARGING//CHARGE REFERENCING

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
17236 610 28.3 48%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
314 3       ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 39933
2316 2             SURFACE AND INTERFACE ANALYSIS//JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA//SURFACE EXCITATION 4480
17236 1                   AUGER PARAMETER//DIFFERENTIAL CHARGING//CHARGE REFERENCING 610

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 AUGER PARAMETER authKW 632777 5% 40% 32
2 DIFFERENTIAL CHARGING authKW 336484 2% 61% 11
3 CHARGE REFERENCING authKW 200227 1% 100% 4
4 HIGH ENERGY XPS authKW 188669 1% 54% 7
5 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA journal 109295 19% 2% 114
6 ALLOYING BEHAVIOUR authKW 100113 0% 100% 2
7 CHARGE TRANSFER REDISTRIBUTION authKW 100113 0% 100% 2
8 CRK BETA authKW 100113 0% 100% 2
9 CUK ALPHA1 PHOTONS authKW 100113 0% 100% 2
10 DYNAMICAL XPS authKW 100113 0% 100% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Spectroscopy 2983 20% 0% 119
2 Chemistry, Physical 2072 40% 0% 241
3 Materials Science, Coatings & Films 1635 12% 0% 74
4 Classics 698 3% 0% 16
5 Physics, Condensed Matter 572 18% 0% 108
6 Physics, Applied 520 21% 0% 128
7 Materials Science, Multidisciplinary 77 11% 0% 69
8 Physics, Atomic, Molecular & Chemical 37 4% 0% 27
9 Chemistry, Analytical 27 4% 0% 27
10 Chemistry, Multidisciplinary 25 7% 0% 45

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IND COATINGS DEV 100113 0% 100% 2
2 MAT SUR E STUDIES 100113 0% 100% 2
3 AREA RICEWRCA ROMA TORVERGATA 50057 0% 100% 1
4 CSIC CIENCIA MAT Q INORGAN 50057 0% 100% 1
5 F FIS SUPERFIS 50057 0% 100% 1
6 LASSIEP 120 50057 0% 100% 1
7 SURF ANAL 50057 0% 100% 1
8 UMR 380046 50057 0% 100% 1
9 UNITE CHIM INTERFAQCES 50057 0% 100% 1
10 VIII23 50057 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 109295 19% 2% 114
2 SURFACE AND INTERFACE ANALYSIS 73580 16% 1% 99
3 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 2937 5% 0% 29
4 APPLIED SURFACE SCIENCE 1329 5% 0% 31
5 ZEOLITES 826 1% 0% 5
6 SURFACE SCIENCE 786 3% 0% 21
7 HERMES-ZEITSCHRIFT FUR KLASSISCHE PHILOLOGIE 745 1% 0% 4
8 MATERIALI E DISCUSSIONI PER L ANALISI DEI TESTI CLASSICI 519 0% 1% 1
9 ADVANCED PERFORMANCE MATERIALS 470 0% 1% 1
10 LATOMUS 466 0% 0% 3

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 AUGER PARAMETER 632777 5% 40% 32 Search AUGER+PARAMETER Search AUGER+PARAMETER
2 DIFFERENTIAL CHARGING 336484 2% 61% 11 Search DIFFERENTIAL+CHARGING Search DIFFERENTIAL+CHARGING
3 CHARGE REFERENCING 200227 1% 100% 4 Search CHARGE+REFERENCING Search CHARGE+REFERENCING
4 HIGH ENERGY XPS 188669 1% 54% 7 Search HIGH+ENERGY+XPS Search HIGH+ENERGY+XPS
5 ALLOYING BEHAVIOUR 100113 0% 100% 2 Search ALLOYING+BEHAVIOUR Search ALLOYING+BEHAVIOUR
6 CHARGE TRANSFER REDISTRIBUTION 100113 0% 100% 2 Search CHARGE+TRANSFER+REDISTRIBUTION Search CHARGE+TRANSFER+REDISTRIBUTION
7 CRK BETA 100113 0% 100% 2 Search CRK+BETA Search CRK+BETA
8 CUK ALPHA1 PHOTONS 100113 0% 100% 2 Search CUK+ALPHA1+PHOTONS Search CUK+ALPHA1+PHOTONS
9 DYNAMICAL XPS 100113 0% 100% 2 Search DYNAMICAL+XPS Search DYNAMICAL+XPS
10 EXTERNAL BIASING 100113 0% 100% 2 Search EXTERNAL+BIASING Search EXTERNAL+BIASING

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 MORETTI, G , (1998) AUGER PARAMETER AND WAGNER PLOT IN THE CHARACTERIZATION OF CHEMICAL STATES BY X-RAY PHOTOELECTRON SPECTROSCOPY: A REVIEW.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 95. ISSUE 2-3. P. 95 -144 83 48% 192
2 ISLAM, AKMM , MUKHERJEE, M , (2011) APPLICATION OF DIFFERENTIAL CHARGING IN XPS FOR STRUCTURAL STUDY OF LANGMUIR-BLODGETT FILMS.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 23. ISSUE 43. P. - 19 86% 1
3 TASCI, TO , ATALAR, E , DEMIROK, UK , SUZER, S , (2008) ELECTRICAL CIRCUIT MODELING OF SURFACE STRUCTURES FOR X-RAY PHOTOELECTRON SPECTROSCOPIC MEASUREMENTS.SURFACE SCIENCE. VOL. 602. ISSUE 1. P. 365 -368 19 90% 1
4 COHEN, H , (2010) CHEMICALLY RESOLVED ELECTRICAL MEASUREMENTS IN ORGANIC SELF-ASSEMBLED MOLECULAR LAYERS.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 176. ISSUE 1-3. P. 24-34 22 71% 12
5 SEZEN, H , ERTAS, G , SUZER, S , (2010) METHODS FOR PROBING CHARGING PROPERTIES OF POLYMERIC MATERIALS USING XPS.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 178. ISSUE . P. 373 -379 25 64% 3
6 VILAN, A , BENDIKOV, TA , COHEN, H , (2008) SECONDARY ELECTRON EMISSION CONTROL IN X-RAY PHOTOELECTRON SPECTROSCOPY.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 162. ISSUE 2. P. 99-105 19 79% 6
7 SUZER, S , SEZEN, H , ERTAS, G , DANA, A , (2010) XPS MEASUREMENTS FOR PROBING DYNAMICS OF CHARGING.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 176. ISSUE 1-3. P. 52-57 23 61% 7
8 OSWALD, S , GONZALEZ-ELIPE, AR , REICHE, R , ESPINOS, JP , MARTIN, A , (2003) ARE MEASURED VALUES OF THE AUGER PARAMETER ALWAYS INDEPENDENT OF CHARGING EFFECTS?.SURFACE AND INTERFACE ANALYSIS. VOL. 35. ISSUE 12. P. 991-997 20 83% 5
9 DUBEY, M , GOUZMAN, I , BERNASEK, SL , SCHWARTZ, J , (2006) CHARACTERIZATION OF SELF-ASSEMBLED ORGANIC FILMS USING DIFFERENTIAL CHARGING IN X-RAY PHOTOELECTRON SPECTROSCOPY.LANGMUIR. VOL. 22. ISSUE 10. P. 4649-4653 18 69% 43
10 DUBEY, M , RAMAN, A , GAWALT, ES , BERNASEK, SL , (2010) DIFFERENTIAL CHARGING IN X-RAY PHOTOELECTRON SPECTROSCOPY FOR CHARACTERIZING ORGANIC THIN FILMS.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 176. ISSUE 1-3. P. 18-23 17 71% 2

Classes with closest relation at Level 1


Rank Class id link
1 15718 AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//AUGER TRANSITION//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY
2 35905 C 1S CORE LEVEL SHIFTS//CARBA//ESCA CORE LEVEL SHIFTS
3 16275 MAT OPTOELECT PHYS SCI//BOLS//DOW CYCLOTENE
4 2063 SURFACE AND INTERFACE ANALYSIS//SURFACE EXCITATION//INELASTIC MEAN FREE PATH
5 36899 VALENCE BAND XPS//ANAEROBIC CELL//BOND STRUCTURE CALCULATION
6 22356 MND PROBLEM//EDGE EXPONENT//ADSORBATE SUBSTRATE INTERFACE
7 26392 CORE ELECTRON BINDING ENERGIES//HAM 3//VXPS
8 36848 ELECTROMAGNETIC SHEETS//HYDROTHERMAL EXCHANGE//LAHZSM 5 ZEOLITE
9 18100 CONICAL PROTRUSION//FINE PROTRUSION//STRIPE RIB
10 25515 ALUMINUM ANODIZING FILM//AUGER ELECTRON ON SPECTROSCOPY//AUGER ELECTRONIC SPECTROMETER

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